{"as_of":"2026-08-11T22:07:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:cec9bb1cb60078527c8ef782343085f09e7dd5168e14ac4fa51316669fde43e0","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":1,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-11T06:34:44.6726+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-09T23:27:48.567514Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"pith","source_observed_at":"2026-08-09T23:27:49.189502Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"1610.06858","last_updated":"2016-10-21T17:03:24Z","snapshot_observed_at":"2026-08-09T22:00:08.616693Z","submitted_at":"2016-10-21T17:03:24Z","title":"Characterization methods dedicated to nanometer-thick hBN layers","version":1},"cited_work":{"arxiv_id":"1610.06858","doi":null,"metadata_source":"pith","pith_arxiv_id":"1610.06858","snapshot_observed_at":"2026-08-09T23:27:49.189502Z","title":"Characterization methods dedicated to nanometer-thick hBN layers","venue":"cond-mat.mtrl-sci","work_id":"852c05e2-272f-46cd-881d-967b6644f31b","year":2016},"citing_paper":{"arxiv_id":"2501.18481","last_updated":"2025-04-25T11:28:45Z","snapshot_observed_at":"2026-08-09T23:16:13.563115Z","submitted_at":"2025-01-30T16:55:37Z","title":"Quantifying the creation of negatively charged boron vacancies in He-ion irradiated hexagonal boron nitride","version":3},"reference_index":84,"source":"pdf_text","source_observed_at":"2026-08-09T23:27:48.567514Z"},"links":{"cited_paper":"/paper/1610.06858","citing_paper":"/paper/2501.18481"},"observation_digest":"sha256:77e0cdcc1704a1c58c21021dd5b32020b71f95aa5c2ba33ff270484ba0ceee8d","observation_id":"0b434eaa-9883-4d95-96b9-0ba1b09b1ec2","resolution":{"observed_at":"2026-08-09T23:27:49.194658Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-11T06:34:44.6726+00:00","source":"crossref"},{"observed_at":"2026-08-11T06:34:36.301508+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/1610.06858/citation-record","integrity":"/paper/1610.06858/integrity","json":"/paper/1610.06858/citation-record.json","paper":"/paper/1610.06858"},"outbound":[],"paper":{"arxiv_id":"1610.06858","last_updated":"2016-10-21T17:03:24Z","latest_version":1,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-09T22:00:08.616693Z","submitted_at":"2016-10-21T17:03:24Z","title":"Characterization methods dedicated to nanometer-thick hBN layers"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-11T06:34:44.6726+00:00","source":"crossref"},{"observed_at":"2026-08-11T06:34:36.301508+00:00","source":"retraction_watch"}],"thesis":"As of 11 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:1610.06858."}