{"as_of":"2026-08-22T00:34:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:e0bbf609eb6f0fdf7550a2e4eccc79c13f17f9e7e0065a72d740c0f1d75c693c","coverage":[{"denominator":33,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":33,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T15:43:39.252719Z","state":"measured"},{"denominator":33,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":33,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-21T06:32:19.484+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/1908.00659/citation-record","integrity":"/paper/1908.00659/integrity","json":"/paper/1908.00659/citation-record.json","paper":"/paper/1908.00659"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:41.023828Z","title":"Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution,","venue":null,"work_id":"a287c324-5596-4029-a404-b3abde5dea45","year":2015},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.684580Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:5df88ffd5e5133a4fd9e2a150ae18560be951f7f7822bf9971fe9a6f0bd70206","observation_id":"1cee1376-121f-4538-a12f-684e62b14e05","resolution":{"observed_at":"2026-08-14T15:43:41.029237Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:41.012234Z","title":"Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry,","venue":null,"work_id":"91db24f8-cd36-44f6-9771-20527d3f2151","year":2016},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.707824Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:ae5a12408c7e35b6c5d77209a2f7d56e49c849ae402f4ca8e3c804b82b594341","observation_id":"a9c74936-c6bf-470b-8cf2-35bc5837b7ca","resolution":{"observed_at":"2026-08-14T15:43:41.015682Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:41.001106Z","title":"High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy,","venue":null,"work_id":"7c38346b-133a-4be5-8edf-74b3b1db4020","year":2016},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.746285Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:0530f76c8db478fd2d81036248f35936a58c47d0148c2ce7209cf20814318898","observation_id":"33f8fb67-1e17-4f01-84e7-92e2eac081d2","resolution":{"observed_at":"2026-08-14T15:43:41.004539Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.988500Z","title":"PHASE CONTRAST IN SCANNING TRANSMISSION ELECTRON MICROSCOPY.,","venue":null,"work_id":"17922ceb-b346-4165-9bb5-5d1286a8b654","year":1974},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.805713Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:81c860d218cf5a6dbe7be6591d4c74899963adc096c376cc530bde292cd5b3fc","observation_id":"9ce1880b-113d-462b-b9cf-eb0d1b18624a","resolution":{"observed_at":"2026-08-14T15:43:40.992393Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.973915Z","title":"DIFFERENTIAL PHASE CONTRAST IN A STEM.,","venue":null,"work_id":"0f560c9c-4bf0-4529-bc16-a7ef306efbe1","year":1974},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.831730Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:ce22f91235a1904f05bb2dc242141703e59392b29f79cbcdaddf00ba8e27ee35","observation_id":"69b8073c-18fc-4690-8da7-8fff22b9d5c5","resolution":{"observed_at":"2026-08-14T15:43:40.979171Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.962180Z","title":"Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy,","venue":null,"work_id":"71fe5671-3622-4e49-b3ef-44e636e7ccf8","year":2009},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.869919Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:a533874c216ddf77e19918275b5fec0b47c2061633fa56b7d47bdf166ef5d81a","observation_id":"c12ad81f-35ba-4d8f-ae2a-b26200e9f8a6","resolution":{"observed_at":"2026-08-14T15:43:40.965736Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.928821Z","title":"Dynamics of annular bright field imaging in scanning transmission electron microscopy.,","venue":null,"work_id":"33dc38b1-c1d1-4d5b-a77b-e7d106b06aac","year":2010},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.900834Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:70e7b475d4f075b5658c5abbd39932b8617c705d6123fb431c2080e6da6fefc3","observation_id":"f196a478-2b43-44ef-97ed-84ec21ef8cc2","resolution":{"observed_at":"2026-08-14T15:43:40.954081Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.918452Z","title":"Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy,","venue":null,"work_id":"b3ca5d7d-45b1-45db-98bf-c39ca0b2fc02","year":2011},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.904239Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:b64e11a15aa13d43e49e07e4b822d714403d09676a76c558029c9c997bc6322d","observation_id":"60965333-eac2-46bd-83ad-a521c006f798","resolution":{"observed_at":"2026-08-14T15:43:40.922182Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.906941Z","title":"Differential phase contrast microscopy of magnetic materials,","venue":null,"work_id":"b34fbc68-b533-47e9-b812-434c3f296522","year":1992},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.907783Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:06649398848acfdf881d940c5ff212b176da5eb717d7175187558adbb5fe00e0","observation_id":"de286585-f482-4dae-a77e-33a28a66de38","resolution":{"observed_at":"2026-08-14T15:43:40.910929Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.892105Z","title":"Differential phase- contrast microscopy at atomic resolution,","venue":null,"work_id":"74b04411-356d-4a4d-8a27-9977c5f4868c","year":2012},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.911011Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:65e045b3c5fbfe440b32f080ce76760fe1e5ebaebaa74af3b55b7c337c87b542","observation_id":"cf184161-9e8e-47c0-b338-fd48b8766899","resolution":{"observed_at":"2026-08-14T15:43:40.897962Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.674833Z","title":"Differential phase contrast 2.0—Opening new ‘fields’ for an established technique,","venue":null,"work_id":"f8e174d9-7e6d-4de8-a780-9fb7fc952dc1","year":2012},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.914125Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:c08637f5559fdd1d0e06b221546f69efb8b787aae3af90d3a6d4d925399e888b","observation_id":"4e7f75bc-0223-4949-8f41-53511b2adc3b","resolution":{"observed_at":"2026-08-14T15:43:40.779763Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.661280Z","title":"Nonstandard imaging methods in electron microscopy.,","venue":null,"work_id":"045a9e24-7af6-44b6-b9cc-116fcda87697","year":1977},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.918071Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:d39c5f471159c97ea2b8a886e6070507643f95abe18b97bcc593c8cf84787497","observation_id":"111762ac-d71c-4d98-8ae2-050da6bd445d","resolution":{"observed_at":"2026-08-14T15:43:40.666215Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.638374Z","title":"Enhanced light element imaging in atomic resolution scanning transmission electron microscopy,","venue":null,"work_id":"0b3535e2-95d1-4575-ad86-05d05ccd6af2","year":2014},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.921686Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:113d984ae51af8e225a44d117307e11abb3fa47811db34535c77f481d18b6147","observation_id":"f1877d2a-b2e6-454e-b843-1959bbb984cf","resolution":{"observed_at":"2026-08-14T15:43:40.644734Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.620569Z","title":"Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy,","venue":null,"work_id":"e2c7de59-8d28-40b5-9373-1b367bf92c17","year":2017},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.924550Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:1897ef0b92f5bba25571a258dc7b93f888d16bf7951f90c264c0f6bc3dd65daf","observation_id":"73f1f940-0ffd-429e-81b9-d7bbc064fbaf","resolution":{"observed_at":"2026-08-14T15:43:40.625764Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.553972Z","title":"Experimental tests on double-resolution coherent imaging via STEM,","venue":null,"work_id":"2848b401-fc79-4d2a-ae58-96a0527141cf","year":1993},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.927943Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:26af06c859909521d94601a5f19f83a53b75c692b16b07c2abbd771ae29636ab","observation_id":"b667db40-4e57-46f4-8e6f-ee62ab703e45","resolution":{"observed_at":"2026-08-14T15:43:40.610696Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.372335Z","title":"Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions,","venue":null,"work_id":"31a9ec69-2bb8-418c-9fbe-695c589dcbe5","year":2015},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.931461Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:2c5e27426d8d537d1db4fa4d6e408fc57626f2e74e2e98996add0d9e105beb54","observation_id":"972c3400-931b-4f17-a4de-b7ba8e42efc7","resolution":{"observed_at":"2026-08-14T15:43:40.452138Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.330234Z","title":"Structure retrieval with fast electrons using segmented detectors,","venue":null,"work_id":"fc6c1d6a-92b1-48a7-ac0f-c8521e1cbdae","year":2016},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.955205Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:a52075dbe7846f9d88bf546f3f93a70c40b19008d2fb5e1be733262dc814fe97","observation_id":"fb9b45ec-5283-4969-9b14-402767a57943","resolution":{"observed_at":"2026-08-14T15:43:40.334748Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.315853Z","title":"Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction,","venue":null,"work_id":"384a53a9-d99e-4eaf-b180-fcfc6a3ae180","year":2014},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:38.994231Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:afd17a98f1cb547d2080f01a84c2a2f432dee127b1603350280f26e8d0557321","observation_id":"2d58e6d8-4537-4c87-afa2-2ebb5e1c266e","resolution":{"observed_at":"2026-08-14T15:43:40.321501Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.303599Z","title":"Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy,","venue":null,"work_id":"f080377c-becb-430d-a964-6697b1b4eae0","year":2017},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.045222Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:5d303584fddf0b32124afd07905eea531296a71fbbaaa1353d125fb3ae182071","observation_id":"1b612552-16f8-4381-b543-e306cecd49ba","resolution":{"observed_at":"2026-08-14T15:43:40.307586Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.244661Z","title":"Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons,","venue":null,"work_id":"1bcc3630-9420-41f5-bf66-ae27f93d66ea","year":2015},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.094203Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:ad89a322647b098cc467da83e7846713241bf5b52361a5442503440425203db5","observation_id":"0eed5f41-060f-4707-a06a-46aac8ee0245","resolution":{"observed_at":"2026-08-14T15:43:40.294812Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:40.074590Z","title":"Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrast,","venue":null,"work_id":"fcb82a86-7509-4958-a291-ec8765316aa6","year":2017},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.122255Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:53819da11ed82f7f77738f291bac245a96bbcc5a70397bac1bd5c27f2fb80a8b","observation_id":"3ea3234f-a9f3-48c2-8cd9-33b57e11c5bc","resolution":{"observed_at":"2026-08-14T15:43:40.130163Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.966238Z","title":"Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy,","venue":null,"work_id":"53adfaba-abbc-45b4-bfec-a49226288ae8","year":2018},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.177270Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:41a7144fc45442aecc8c464c3b04cee5b521c778b1d93083d955fd80175b41d4","observation_id":"edb32aa6-f82c-4d3a-930e-008943daf94c","resolution":{"observed_at":"2026-08-14T15:43:39.971154Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.857026Z","title":"Mitigating e-beam-induced hydrocarbon deposition on graphene for atomic-scale scanning transmission electron microscopy studies,","venue":null,"work_id":"93238f83-6480-47e5-958b-b77b34f580f0","year":2018},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.208222Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:3357a01204da6fe7b7d25cf67182a3436080eb3b0ff49073f8f4e66c41b5c3c0","observation_id":"ebd27de4-b35e-4377-b4a5-195eb1ee8ac4","resolution":{"observed_at":"2026-08-14T15:43:39.928158Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.843888Z","title":"Placing single atoms in graphene with a scanning transmission electron microscope,","venue":null,"work_id":"54364f6e-be7e-4551-88b8-269c2a1c9fb4","year":2017},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.216991Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:a5ec22bbd7234179c66441630817a07102986f227e5be11b5ff7c70ca4057852","observation_id":"e2f7a1fa-2f04-4031-85da-4d25de214215","resolution":{"observed_at":"2026-08-14T15:43:39.848873Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.829576Z","title":"Regularization and variable selection via the elastic net,","venue":null,"work_id":"40bdc0e2-8614-4a03-af9a-ace39b775027","year":2005},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.221110Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:f45b1f991f841945d8abfc3d6de7ff71f93280de49f6ed69757f02f6a159fdc9","observation_id":"c8eb02d3-543e-4638-b716-d7f1f67c1a83","resolution":{"observed_at":"2026-08-14T15:43:39.834638Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.814485Z","title":"Regression shrinkage and selection via the lasso,","venue":null,"work_id":"d958c920-c60c-409f-8644-18b6b26d24f1","year":1996},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.225247Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:5dc6aa7500f32bc6ee6e6d86fca77d54b3d10da9628e1f5aa074fa3848a6292e","observation_id":"d818d731-4e7e-4ba3-9ebc-9e744f8f55c2","resolution":{"observed_at":"2026-08-14T15:43:39.821455Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.661588Z","title":"Pathwise coordinate optimization,","venue":null,"work_id":"be82ffd0-956e-430a-842c-af7cd7ec86ae","year":2007},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.228843Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:2cdd49db98b50309f20261b51077a01b2815b50e657175318f2636116ef766c8","observation_id":"ee551729-9d0e-423b-bb8b-56c50f2ca06e","resolution":{"observed_at":"2026-08-14T15:43:39.729004Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.590558Z","title":"Regularization paths for generalized linear models via coordinate descent,","venue":null,"work_id":"9206d810-1e18-4f5c-86e8-a8cac78fde16","year":2010},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.232813Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:29ed48216278d87a086101fa3000f1b978bb6b0f792b599b0d26ac41eef7142b","observation_id":"930a1ca2-28a6-4e18-bd5b-65f61cc98f55","resolution":{"observed_at":"2026-08-14T15:43:39.596956Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.578286Z","title":"Direct Determination of the Chemical Bonding of Individual Impurities in Graphene,","venue":null,"work_id":"8d668ff4-1fc0-4112-85bb-72eef1a058c8","year":2012},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.237160Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:84d56644e8c1b562fabfd9096c026848afbd386897bb29340c2b59d3b5041ca2","observation_id":"ba00e4d8-ad76-40d8-bd9a-d5ba2cd8384d","resolution":{"observed_at":"2026-08-14T15:43:39.582726Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.440676Z","title":"Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy,","venue":null,"work_id":"71019936-a933-4d34-b49e-495acfb73b09","year":2013},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.240851Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:b6365776e12e7274d9774b565550000fe0e65a67d9d44beba715617ac1559a81","observation_id":"7b0219ac-6480-4132-a709-2da9bb7b2d8e","resolution":{"observed_at":"2026-08-14T15:43:39.494871Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.308379Z","title":"Sparse regression with exact clustering,","venue":null,"work_id":"ba1ac4ea-4d7b-4305-afdd-31ab427a7529","year":2010},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.244839Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:cb0cc135df9b697080ea61c0d2e144611579e18df2d44b045d39e11c29081a88","observation_id":"27700580-7ff4-4188-acd7-a7f6b1abf9ca","resolution":{"observed_at":"2026-08-14T15:43:39.376001Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.295654Z","title":"Structured Variable Selection with Sparsity-Inducing Norms,","venue":null,"work_id":"17b370ee-5c43-49ab-8af7-5fb12165f0e5","year":2011},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.248810Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:4cc9de8c48e9740dfdd08b840b728d5bdef1275b45b6b87f747f64f07421294a","observation_id":"4d680b5d-e100-4840-a156-257f80e6d96f","resolution":{"observed_at":"2026-08-14T15:43:39.300127Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T15:43:39.280690Z","title":"Manifold learning of four-dimensional scanning transmission electron microscopy,","venue":null,"work_id":"f2bfcfe9-cbb6-4cc5-a0f4-ab56395c36d9","year":2019},"citing_paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data","version":2},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-14T15:43:39.252719Z"},"links":{"citing_paper":"/paper/1908.00659"},"observation_digest":"sha256:22088091c5b68aa3759ed5be6f7d5819bbd956926d028b9acedd2c96b60a8728","observation_id":"1628fcc6-f022-4d52-9931-05ababc28892","resolution":{"observed_at":"2026-08-14T15:43:39.287244Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"1908.00659","last_updated":"2019-08-26T15:39:41Z","latest_version":2,"primary_category":"stat.AP","snapshot_observed_at":"2026-08-14T15:38:05.038037Z","submitted_at":"2019-08-01T23:14:54Z","title":"Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data"},"reference_resolution":{"displayed":33,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":33},"total_outbound_references":33},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"thesis":"As of 22 August 2026, this Paper Citation Record lists 33 of 33 outbound references and 0 inbound Pith citation observations for arXiv:1908.00659."}