{"as_of":"2026-08-15T17:22:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:f5616c6a1602624f92a4822b1e03de76e349d993c58b25859358ede17f0a050e","coverage":[{"denominator":45,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":45,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T13:55:19.657572Z","state":"measured"},{"denominator":45,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":45,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-15T06:32:42.880941+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/1908.04084/citation-record","integrity":"/paper/1908.04084/integrity","json":"/paper/1908.04084/citation-record.json","paper":"/paper/1908.04084"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/s41598-017-06976-5","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.192542Z","title":"Slater, R.S","venue":null,"work_id":"d8f12335-e664-43a9-9208-7abeeed17231","year":2017},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.438017Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:94908d24a97d8339db96187c14a977178ef06bccf73f4a5f39f22f47c66f1335","observation_id":"3d89bc47-122c-46d3-9e2e-1a5f7b9a55fc","resolution":{"observed_at":"2026-08-14T13:55:20.198129Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.506231Z","title":"It is intraganularly dual-phase, with approximately 55% L12 gamma-prime volume fraction in a face-centred cubic (FCC) gamma matrix","venue":null,"work_id":"09444b37-1caa-42cf-99d6-a0cb5e0882d7","year":null},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.426618Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:d065290be762f8301e4f5e1b258cf88f6492cc9bb1bc0a501f9f32294930fba2","observation_id":"4f3abdf3-5009-4fc5-9011-9e009c0606cc","resolution":{"observed_at":"2026-08-14T13:55:20.511977Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1557/mrs.2019.125","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.161028Z","title":"Gianola, T","venue":null,"work_id":"e4e7c97f-e24e-4183-bb4b-40982219f4d7","year":2019},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.448945Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:be615c7719d5b3f929b0f43523ec45c17d33485f1d90419f416f2161e12de606","observation_id":"d18e7250-6043-47b6-b52f-be033c07db70","resolution":{"observed_at":"2026-08-14T13:55:20.166232Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.actamat.2016.02.038","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.177609Z","title":null,"venue":null,"work_id":"20b71fed-45d7-41fc-ab8e-2eb976e656b6","year":2016},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.443300Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:6d5eb0c1c56384028f428c463093221ccd3aca51f8ce3ea22b9509b33dee8d50","observation_id":"8a3eb897-d4ff-4025-9ffd-870dba58b6a3","resolution":{"observed_at":"2026-08-14T13:55:20.182460Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/bf02646223","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.129714Z","title":"Garosshen, T.D","venue":null,"work_id":"37f56c2b-f4d4-4661-a8af-7cfb10f60a23","year":1987},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.459482Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:1f97524bfbe998239cdd2c9325d7c42624fe02eee8a020f6414dc2d13e5d66e5","observation_id":"b262d98f-db9a-4fb3-b61f-e133ff4318e2","resolution":{"observed_at":"2026-08-14T13:55:20.134860Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.491174Z","title":null,"venue":null,"work_id":"7d5bfb2d-3e37-45b9-8f8f-d8b061cce1c9","year":null},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.432917Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:90b6c42fa31311fc624143bfa6dbc451c6c811c33b0e6d2652425fa7b40ffe46","observation_id":"cff41499-303e-43fd-9233-1cc6cd457dfd","resolution":{"observed_at":"2026-08-14T13:55:20.495580Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.scriptamat.2017.11.005","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.145997Z","title":"Pekin, C","venue":null,"work_id":"fe58ee7d-90d8-4f33-9547-ca1f48bc747a","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.454343Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:7dea1021573af3f57f65317a98105aaf25283ba4c7b052232b233a6fab3d8f2a","observation_id":"becbd4e7-606c-4031-be22-faac76d854ac","resolution":{"observed_at":"2026-08-14T13:55:20.150750Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/s11661-018-4671-7","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.113503Z","title":"Tang, A.J","venue":null,"work_id":"2091bd5c-e84b-42fc-84fe-3076aaaa01f3","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.464477Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:3289245dcf72add4b7739190454029edd2a62ad7e8cb3a12678619e96877b8a8","observation_id":"ce2c1a13-26bc-447f-b31b-78ed1a8c9f07","resolution":{"observed_at":"2026-08-14T13:55:20.118387Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.actamat.2015.10.006","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.095626Z","title":"Kontis, H.A.M","venue":null,"work_id":"6ec7f67e-44d8-4883-a2c4-14e6d4a259ab","year":2016},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.469848Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:d334baa8c8a5eb0c614037d84b010efbc9ffd476d516b57f075deec6e98714cd","observation_id":"8901db01-e3ef-4932-91bc-26796cd204e4","resolution":{"observed_at":"2026-08-14T13:55:20.102348Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.msea.2006.08.148","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.079445Z","title":"Unocic, G.B","venue":null,"work_id":"fc1adb44-ad8c-48bc-9582-833f3989c681","year":2008},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.474558Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:6f417f240c645610c985a42ac8216b5e212f5c001a447ff718c9e0c02e092a35","observation_id":"5608bb84-c1ae-40dc-adda-5bb9aadc951c","resolution":{"observed_at":"2026-08-14T13:55:20.084399Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.actamat.2005.03.017","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.063633Z","title":"Viswanathan, P.M","venue":null,"work_id":"b25aecd0-584a-41f6-9fc7-053e6bd0e149","year":2005},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.480769Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:556d830b19dfacca22065643e77230dc8a9b887e98e503d69d055d8ae0d89676","observation_id":"c8bcd5b0-bb97-4c1d-8131-93e95bf9a5c3","resolution":{"observed_at":"2026-08-14T13:55:20.068359Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.actamat.2018.12.039","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.048205Z","title":"Kontis, A","venue":null,"work_id":"6178bc11-e885-4ae8-9d60-d932a25c8993","year":2019},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.485842Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:ead23a5c15ffd901f571578a45628a667671e6f4078f16a82496862254826a58","observation_id":"e271658a-f639-4000-8a34-765cb12d746c","resolution":{"observed_at":"2026-08-14T13:55:20.053165Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1088/1757-899x/109/1/012018","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.032436Z","title":"Winkelmann, G","venue":null,"work_id":"b11e7476-c8bf-402b-8cd7-d0a0a071fcb7","year":2016},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.490668Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:c92520189ed471d679749d41e8ba136ffa0cc0668b96fd90bfbf59e4709ce160","observation_id":"e50960e3-89ed-4929-ae43-81f04179b6e9","resolution":{"observed_at":"2026-08-14T13:55:20.037283Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1807.11313","last_updated":"2019-07-09T19:47:59Z","snapshot_observed_at":"2026-08-14T18:46:26.106820Z","submitted_at":"2018-07-30T12:30:48Z","title":"Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1807.11313","snapshot_observed_at":"2026-08-14T13:55:19.496412Z","title":"Foden, D","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.496412Z"},"links":{"cited_paper":"/paper/1807.11313","citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:79dcfb3df23c3020f1a19a6701df4c04e9afff1134a8dfe1b90265f7969a6529","observation_id":"e176b6f0-3c78-4bb9-88e4-2cd599b3ad2d","resolution":{"observed_at":"2026-08-14T13:55:19.496412Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.ultramic.2018.09.011","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.014385Z","title":"Wilkinson, D.M","venue":null,"work_id":"aacb9bda-c206-4bc3-bc19-56959e3db77b","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.501389Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:9af6a9548e6a0e2185dd137d04a15e2bcd8bef992b004445907e3d7f0ffb2f19","observation_id":"c99ffd8b-27f5-45f8-80e0-34f752052703","resolution":{"observed_at":"2026-08-14T13:55:20.020410Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.506394Z","title":"Birch, S","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.506394Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:3a32a4dbeb489a77bd5a0d7888d0e7f0f4474d637f9fdb9f98a9221b88bf3187","observation_id":"a8b5d8ee-3beb-4932-aba8-b5ed34143188","resolution":{"observed_at":"2026-08-14T13:55:19.506394Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.511299Z","title":null,"venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.511299Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:fe1c7936a436b638bea6e39b3716c732c7ddedb2e80d00a630e8eda014d32ce6","observation_id":"32daa0e9-39a1-4614-8632-a9669a3ff69f","resolution":{"observed_at":"2026-08-14T13:55:19.511299Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.516519Z","title":null,"venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.516519Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:2efc76e5727706be8160bea301212abbb49e7ee45f7a80d6df5eef5b4371c12f","observation_id":"ed5d45fc-cf88-4912-b191-48165a422cd0","resolution":{"observed_at":"2026-08-14T13:55:19.516519Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.521170Z","title":"Winkelmann, Dynamical Simulation of Electron Backscatter Diffraction Patterns, Electron Backscatter Diffr","venue":null,"work_id":null,"year":2009},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.521170Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:fdd2cd44b67d9c661f31adfe069b2c2a00ab482b4b87780a058c9ce9ee2ce4d4","observation_id":"1dadfc06-0a62-4265-96f7-8847809c01e9","resolution":{"observed_at":"2026-08-14T13:55:19.521170Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.ultramic.2017.11.004","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.958527Z","title":"Callahan, J.C","venue":null,"work_id":"1cb84e74-b4ce-4349-89c5-e8174270496e","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.525797Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:dcbb85ac217795dee291e15f25472089fc4ab31ac943cb23cafc3c4dd8f7c53e","observation_id":"d3a849b3-a7da-48ca-a014-c04f9a34c36f","resolution":{"observed_at":"2026-08-14T13:55:19.962983Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.476910Z","title":"Callahan, M","venue":null,"work_id":"74bebb9b-6dc5-4a3e-a5e2-2370f4f3c6a9","year":2013},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.530975Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:012e988fcccf1889ea73cf8b5c9427f343615f158989bb08a0637679f16da762","observation_id":"8090ba1f-cf8b-47f4-9b45-f00e14a0ca6b","resolution":{"observed_at":"2026-08-14T13:55:20.481604Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.535764Z","title":null,"venue":null,"work_id":null,"year":1987},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.535764Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:82dded2413763964c490fea0a2532855fa7f9817ae8f957eedee8f22f8a20300","observation_id":"0da7f6fb-3d6e-49d2-ace1-18bafc5b240b","resolution":{"observed_at":"2026-08-14T13:55:19.535764Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.461897Z","title":"Jolliffe, J","venue":null,"work_id":"a3de6e6b-710a-46c0-9cc2-07d06a865d29","year":2016},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.541475Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:c234932045adcea7582f7038a44f6ad44918f0763b72e54c8fe2cb3badd7eae0","observation_id":"bb37e4ca-f3c2-45db-ac5e-93ee23a7d1ba","resolution":{"observed_at":"2026-08-14T13:55:20.466601Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.546131Z","title":null,"venue":null,"work_id":null,"year":2015},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.546131Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:1bdeb22f244ce7f654490791c8c39171af76bf882bb4b65c7053ce28dee2ebcb","observation_id":"7e6832fe-d21b-41ec-8132-89dcfce95a9c","resolution":{"observed_at":"2026-08-14T13:55:19.546131Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.ultramic.2007.10.013","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.933367Z","title":"Brewer, P.G","venue":null,"work_id":"67e26515-7983-46cf-a136-780d991ba9e0","year":2008},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.550917Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:33988603fbe926cc305ea7834bc1d9fbc2119fa8c04e383b9c3a9cc1789a0670","observation_id":"a4e03664-6f57-4f61-945a-74aeac6d8c98","resolution":{"observed_at":"2026-08-14T13:55:19.938132Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/s11837-014-1175-9","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.917241Z","title":null,"venue":null,"work_id":"5ff333d2-c1f9-4433-87e8-844263472433","year":2014},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.555917Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:36ba05b6a1441b22fe8ab5febcd2f1ce9b873f88130dac98985fd4deac57a123","observation_id":"ee78d88c-769e-494b-8397-3ccd0da6ed98","resolution":{"observed_at":"2026-08-14T13:55:19.922053Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"matecconf/2014141","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.334979Z","title":"Knop, V.A","venue":null,"work_id":"056f3d8c-edfd-46a5-891a-6c1de2966cf7","year":2014},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.561232Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:c346086235435df7e332bb89789cca0ded765369d7131527a575f13a98a23b62","observation_id":"1a9b5d69-3f7c-4989-acc8-09a55d7306c0","resolution":{"observed_at":"2026-08-14T13:55:20.342380Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.566128Z","title":"Britton, V","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.566128Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:3baccf875f9a3f93047ed9212474974acbc325395aa823435462c2b524900a63","observation_id":"2e8b9e94-d391-4afe-adb7-6ef02a191def","resolution":{"observed_at":"2026-08-14T13:55:19.566128Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.ijfatigue.2018.05.003","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.889875Z","title":"Jiang, D.J","venue":null,"work_id":"b347d062-37f5-436e-b0ce-dac079367b65","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.570991Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:33d01fe162cb42ca7ee0b35cf0cfcde4d94b6f11eb598f9bcaac8c6bd5f82cbe","observation_id":"2dfb2628-127a-4009-ac9f-8c601f9afdb7","resolution":{"observed_at":"2026-08-14T13:55:19.895293Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/s11661-018-4682-4","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.873713Z","title":"Christofidou, M.C","venue":null,"work_id":"0c4a909c-aa57-486b-8c8b-9e6f91b5b3c6","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.577369Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:90f217c5d509f4f259b8d56153b7e9a89bee9b6fd68dff1e7b00c44247406c76","observation_id":"5a727775-4018-4b13-97c3-acd945b91ceb","resolution":{"observed_at":"2026-08-14T13:55:19.878789Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.7449/2004/superalloys_2004_83_90","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.858713Z","title":"Hardy, B","venue":null,"work_id":"e8637121-e16b-41bf-a7c7-ea93e32d8353","year":2004},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.582376Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:19c3fa7a79065bde5f342b97a61d80f748978752b70e7d7d4f81e855e763520e","observation_id":"26cb921c-07f0-4837-b32b-92ed58215aa9","resolution":{"observed_at":"2026-08-14T13:55:19.863411Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/s0003-2670(00)85185-5","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.844331Z","title":"Wold, O.H.J","venue":null,"work_id":"f44b11ad-cb57-4340-9dbe-f9b3b0b92948","year":1984},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.588126Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:0b1d73569dcf898fbce472bfe91b623b9f3af671c494ce7de73c51405930e4b7","observation_id":"51479f9a-f471-4391-9ed7-9baa27efbfc0","resolution":{"observed_at":"2026-08-14T13:55:19.849006Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2719.2010","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.262014Z","title":"Zhang, X","venue":null,"work_id":"fbe5b585-ed72-4f45-9bdc-2fbcd96c6fe6","year":2011},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.593252Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:9e7630d588f99fe073cc592af21446a7a9970a7a873922fc35747451aec67725","observation_id":"36ddc91d-4795-4473-81d0-c7099890b175","resolution":{"observed_at":"2026-08-14T13:55:20.270481Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1027/1614-2241/a000051","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.829425Z","title":"Raîche, T.A","venue":null,"work_id":"716ab0c3-a69b-4071-9111-bb324ddd8122","year":2013},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.598775Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:a8672dbb410794d41060da366e5291dda36f1b63327da420d6e64779d7c41874","observation_id":"0ca0d522-c3fd-4144-8db5-9b0f7fd1bc16","resolution":{"observed_at":"2026-08-14T13:55:19.833895Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:20.447098Z","title":"Ilin, Practical approaches to Principal Component Analysis in the presence of missing values, J","venue":null,"work_id":"0a317fa2-d50d-48f9-8642-fe15a4eea5b0","year":2010},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.603822Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:4609fa7816636209ad88c4f259e200ea3b336a8ae67c3882cf3b02d6cc263c06","observation_id":"5026abac-7e7b-48cd-a2d6-ca249253f39b","resolution":{"observed_at":"2026-08-14T13:55:20.451760Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.609688Z","title":"Tong, A.J","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.609688Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:fed079451795f88c6c00ae62663fd3d11ff031917917b1d6148f3e42370a161c","observation_id":"11e3ca3e-3581-44df-adc0-03cc34fc9bfd","resolution":{"observed_at":"2026-08-14T13:55:19.609688Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.matdes.2017.12.049","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.805681Z","title":"Campbell, P","venue":null,"work_id":"53ae260f-e4c3-4bc3-b145-0463fd4f7261","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.614653Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:48857457cff189cd37f94da19ffc16e3f1131a56664ba4c98e168ec553b7e06c","observation_id":"706d3790-66d6-4745-92fb-dd235c7a57e4","resolution":{"observed_at":"2026-08-14T13:55:19.810246Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[{"edge_observation":{"observed_at":"2026-08-14T18:18:48.851462+00:00","source":"paper_reference_links","state":"open"},"event_date":"2020-01-09","event_type":"correction","notice_doi":"10.1016/j.matdes.2019.108454","provenance":{"observed_at":"2026-07-11T03:13:59.854365+00:00","source":"crossref","source_record_id":"10.1016/j.matdes.2019.108454->10.1016/j.matdes.2017.12.049:correction"}}],"reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/0165-1684(94)90060-4","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.790288Z","title":"Meyer, Topographic distance and watershed lines, Signal Processing","venue":null,"work_id":"a1cdc962-0b2b-4e3e-8102-8cf12a3ddf3b","year":1994},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.619988Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:f0c7c6d14a07eb8c4a84537239b08d1e8894d5e8c1b3120d459e444cc559ad0b","observation_id":"445cc2b5-f739-4a05-a2e5-f2c82da240ae","resolution":{"observed_at":"2026-08-14T13:55:19.795126Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.625619Z","title":"Kaiser, The Application of Electronic Computers to Factor Analysis, Educ","venue":null,"work_id":null,"year":1960},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.625619Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:829b9f2791e3816d6eaf2be135ba4f1140f19dc94c26fb6b47a8d3214a7a867a","observation_id":"c14be156-0fd1-49ab-a695-3f1059c2dcad","resolution":{"observed_at":"2026-08-14T13:55:19.625619Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.631240Z","title":"Winkelmann, T","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.631240Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:8b63a428630c2a323e7e6ec3d0c1fd9b523e7c8528e63c03fa0432349948cc10","observation_id":"696d679c-d23e-453b-b6e4-f219a6212dff","resolution":{"observed_at":"2026-08-14T13:55:19.631240Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.ultramic.2015.08.001","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.754782Z","title":"Wright, M.M","venue":null,"work_id":"0238dab8-394c-4b07-86a6-8733d1cee67f","year":2015},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.635993Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:d2d637633cdef470006c13be66359e51ea6859052635dfdf176bf855bcb906af","observation_id":"15d47dbc-d0c7-48c5-bdea-675b6a3cc832","resolution":{"observed_at":"2026-08-14T13:55:19.759285Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.ultramic.2019.02.013","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.738667Z","title":"Brewick, S.I","venue":null,"work_id":"797fd169-aae2-4d6c-a5dc-7f1a87029c4b","year":2019},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.641013Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:7ef2cd7bee361978a009c8b0542fc4b3a5d713ddeb81ff7704269d64ca44808e","observation_id":"33870d00-3e56-4579-bf32-f86de2123c44","resolution":{"observed_at":"2026-08-14T13:55:19.743582Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1073/pnas.1809378115","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.721893Z","title":"Einsle, A.S","venue":null,"work_id":"c1e77310-1186-4934-863d-95197c0316c2","year":2018},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.646939Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:a44d23b74a68af35582845397acdbf3a0c4068818beade8d6f0cf082d6e52abd","observation_id":"a3765ddb-c52b-470e-acd4-df290eef2f89","resolution":{"observed_at":"2026-08-14T13:55:19.727988Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/sia.1657","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.707024Z","title":"Keenan, P.G","venue":null,"work_id":"3e238b10-c729-470b-b34b-ebbe387cd596","year":2004},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.652467Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:375f639892e2246d293854972b72aa8d1666a8e17b82a29c0b433a20b59095cd","observation_id":"041515df-c45c-47ee-bb43-7db82f855ed0","resolution":{"observed_at":"2026-08-14T13:55:19.711950Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/sia.2949","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:55:19.688514Z","title":"Keenan, Exploiting spatial-domain simplicity in spectral image analysis, Surf","venue":null,"work_id":"7147f821-ca75-4b25-b4e7-eb1dbf0cfdfa","year":2009},"citing_paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope","version":2},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-14T13:55:19.657572Z"},"links":{"citing_paper":"/paper/1908.04084"},"observation_digest":"sha256:ea7de1f2df2a25bcd69005774f8de580d3156c5f89ab6fbf69c9bdf4c3937b57","observation_id":"317539b1-991d-4705-8fd4-35ef9911e090","resolution":{"observed_at":"2026-08-14T13:55:19.695263Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"1908.04084","last_updated":"2020-01-14T11:28:25Z","latest_version":2,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-15T08:50:13.535785Z","submitted_at":"2019-08-12T11:00:44Z","title":"Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope"},"reference_resolution":{"displayed":45,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":12,"verified_exact":29,"verified_fuzzy":4},"total_outbound_references":45},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"thesis":"As of 15 August 2026, this Paper Citation Record lists 45 of 45 outbound references and 0 inbound Pith citation observations for arXiv:1908.04084."}