{"as_of":"2026-08-16T17:57:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:529b7de15ead7117e6a36027f7285d464110da68c9b9b03007c5d00ab47df092","coverage":[{"denominator":54,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":54,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T13:17:16.182313Z","state":"measured"},{"denominator":54,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":54,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-16T06:30:59.297886+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/1908.05512/citation-record","integrity":"/paper/1908.05512/integrity","json":"/paper/1908.05512/citation-record.json","paper":"/paper/1908.05512"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:17.011125Z","title":"G ¨uniat, P","venue":null,"work_id":"3b5467b5-23fb-496a-a7c7-7ee0abff2df3","year":2019},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.929717Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:f091e555568567a487ee83570ccee883a2ab71340af129ddf9b18329180be300","observation_id":"9f99946e-efc4-491c-9174-178ed7663e81","resolution":{"observed_at":"2026-08-14T13:17:17.015561Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.996080Z","title":"Zhao, Z.-L","venue":null,"work_id":"e026587d-8ea0-42e7-9739-7742aa80ff97","year":2004},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.935180Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:07a2a3f6332a7b8faba3ddacda9adb3291818100eb50400dd6f7a03f0e2100e8","observation_id":"928c23d3-8998-4aac-bf84-1e3182b85cbf","resolution":{"observed_at":"2026-08-14T13:17:17.000828Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.982097Z","title":null,"venue":null,"work_id":"414f5496-5d64-431c-acbd-45c889e39898","year":2006},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.939861Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:d7c50e25b09c6705fb47dc3233468f1ddbdb053e649998944948f6b73cc23540","observation_id":"33820e93-24ae-4f08-9cac-a8f9d20776da","resolution":{"observed_at":"2026-08-14T13:17:16.986663Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.966551Z","title":"Wang, et al., Piezoelectric field effect transistor and nanoforce sensor based on a single ZnO nanowire, Nano letters 6, 2768 (2006)","venue":null,"work_id":"d503b723-eacf-4e6a-89b9-93e9829a0d8b","year":2006},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.944968Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:d1cc9d7293e8f07d8a3ad778e67fc6e1a02911cc2c6ac487d8df5eb52704ae47","observation_id":"320e85ec-d784-4c7d-a0a1-eda6b2bf09d9","resolution":{"observed_at":"2026-08-14T13:17:16.972187Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.950931Z","title":null,"venue":null,"work_id":"98ea50bd-f9f5-4d68-a7ac-e28d595cb65e","year":2010},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.950583Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:a5ece2b42e9ffb1750dfc2afd434037d56d39513698f45c2686eec638e10f1a8","observation_id":"fced7c96-34b8-407e-83fc-5a2ffb194c30","resolution":{"observed_at":"2026-08-14T13:17:16.955914Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.935858Z","title":null,"venue":null,"work_id":"329d240b-9cb6-4865-8447-bf5569f69f6d","year":2013},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.955544Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:88dff0153fc8c896f655975f5a4670252326949c90d4829ff4afdb09d80f818a","observation_id":"b14ab588-5a1e-415d-9ae2-5bb440abe878","resolution":{"observed_at":"2026-08-14T13:17:16.941073Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.920710Z","title":"Briscoe, S","venue":null,"work_id":"52bf109d-17ee-4699-aeaa-b491b852f08d","year":2015},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.960529Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:a94d40a04a7d7e580391d98aa78bfa6258ca4cc59868eb7d5efa8c0ebc0ad08c","observation_id":"f619e053-5c9a-4d68-a51e-3f336341b2f4","resolution":{"observed_at":"2026-08-14T13:17:16.925920Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.906152Z","title":"Zhu, et al., Toward large-scale energy harvesting by a nanoparticle-enhanced triboelec- tric nanogenerator, Nano letters 13, 847 (2013)","venue":null,"work_id":"db410e97-901a-4ed4-b7a8-cac0f17730a2","year":2013},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.965320Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:9d00fa553e434d1933e2db66b5c730e1874994ac52759ae96c0c327014ea8148","observation_id":"b154ce6a-0688-4474-9d24-be83b7021f44","resolution":{"observed_at":"2026-08-14T13:17:16.910914Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.892117Z","title":null,"venue":null,"work_id":"ac774a72-ce5d-4e16-a474-5bc3acd9de3e","year":2017},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.970583Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:b2d7b032d447f2520f4141f74e120eae1ffcf77c9964e07cbc4ce8eeb476600a","observation_id":"31f39a44-d171-4da4-81aa-10f29d102a4f","resolution":{"observed_at":"2026-08-14T13:17:16.896582Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.877155Z","title":"Fr ¨omling, R","venue":null,"work_id":"96635efb-1489-4f15-84e5-6d1d6ba2848d","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.975506Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:65fa64fe184c8f6c459ea5b36684d9f665c5ad60c031225ad2678bc183bc8cfb","observation_id":"6c75fc6d-92b7-42e1-8ad0-43836c3839f2","resolution":{"observed_at":"2026-08-14T13:17:16.881862Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.861620Z","title":"Wang, et al., Effects of free carriers on piezoelectric nanogenerators and piezotronic devices made of GaN nanowire arrays, Small 10, 4718 (2014)","venue":null,"work_id":"dcbb8b95-d75c-42be-9b54-59048b281ce5","year":2014},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.980752Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:f277e949656a75fffd0cce64752e179d9d7ddf884c378515e4b4809c86417de2","observation_id":"088ad2e6-4871-4aa6-9ba3-28281133d133","resolution":{"observed_at":"2026-08-14T13:17:16.866974Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.845911Z","title":"Gogneau, et al., Gan nanowires for piezoelectric generators,physica status solidi (RRL)- Rapid Research Letters 8, 414 (2014)","venue":null,"work_id":"e5d47c6c-6869-42a5-8962-c9e3ce703e41","year":2014},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.985793Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:29ae9b22ec6f860faa4985ac3ec0e0b3be59717ae1c9b39f4f657f028fd44a79","observation_id":"15e93495-368b-45a4-82af-3e267835dcdb","resolution":{"observed_at":"2026-08-14T13:17:16.851162Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.830411Z","title":"Gogneau, et al","venue":null,"work_id":"758f32ca-c7f6-430f-9316-c4f7439d782f","year":2016},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.990996Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:f585a315b7dfa3381274b7e17e0f819978ce4d24923a2bf0b18a3d51b58cad94","observation_id":"338d4765-af6f-455c-98c5-cdcb0d5af0a3","resolution":{"observed_at":"2026-08-14T13:17:16.835508Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.816316Z","title":"Liu, et al","venue":null,"work_id":"c87faa6c-5bba-4374-85dc-50ae8917b964","year":2016},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:15.996362Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:f3fab713bfab424ddfe2977295a9e7931b8a50cb2600062f1b65edad69cbb9fc","observation_id":"0c9fb4bd-4b23-44aa-899b-203dc0d7dc35","resolution":{"observed_at":"2026-08-14T13:17:16.820740Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.801690Z","title":"Mikulik, et al., Conductive-probe atomic force microscopy as a characterization tool for nanowire-based solar cells, Nano Energy 41, 566 (2017)","venue":null,"work_id":"c62fb002-f147-4afd-bc3b-6745257416e9","year":2017},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.000791Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:78b74e145e52b10330868a92eb21cb01f3cf8811c51c0d3ec918bb9a2ef4481e","observation_id":"e7723c39-8cd9-499e-8bfe-118e14c66cf5","resolution":{"observed_at":"2026-08-14T13:17:16.806556Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.786667Z","title":null,"venue":null,"work_id":"a1895237-7bd4-440c-9da8-8b9b3f6c7824","year":2007},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.005573Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:4e29c0145d27c7306e10bc10d34cd5e1a7014e727f970641863479b50ae57c2f","observation_id":"4ced6293-6154-4eaf-983e-e5c51c7ec09f","resolution":{"observed_at":"2026-08-14T13:17:16.791311Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.772544Z","title":null,"venue":null,"work_id":"c8b68a38-699f-402c-b179-1e8a428b3089","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.009854Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:cb2105835a29a23036d7a2ad45b5fd4724747e6ab5656fc140b6e5f50ff067e6","observation_id":"48ee78a3-43ed-435f-bdfa-485b593147cd","resolution":{"observed_at":"2026-08-14T13:17:16.777051Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.757451Z","title":"Wang, et al., Electricity Generation based on One-Dimensional Group-III Nitride Nano- materials, Advanced materials 22, 2155 (2010)","venue":null,"work_id":"3121eb61-8f2d-483c-b691-d31c0245823c","year":2010},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.014367Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:fc582a90f241fddbe5c69ccecbe76e40bcba1c3efb6b15205a12feb840f7ee97","observation_id":"d60a5706-ef92-4d4a-a560-4555112a967b","resolution":{"observed_at":"2026-08-14T13:17:16.762234Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.742937Z","title":"Jegenyes, et al","venue":null,"work_id":"8f0d2cb1-8ca6-4c98-ac18-c97fd35b5973","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.018931Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:d9d887d644aae736d43a325fed0d733d3cf0b2e8b044e22588e290fdf3211af4","observation_id":"57ddc128-bb2a-4931-948d-e12a1cb6db48","resolution":{"observed_at":"2026-08-14T13:17:16.747595Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.727457Z","title":"Alexe, S","venue":null,"work_id":"12e09fb6-e86e-494a-bd6f-5ffed9da5d53","year":2008},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.023488Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:c96953372ad85c40be5e750a3429579ccf464c6700f9fad6fdbbf39e762ceda1","observation_id":"b524b7a6-889b-4f7b-9027-60d4aaebab4a","resolution":{"observed_at":"2026-08-14T13:17:16.732946Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.712380Z","title":null,"venue":null,"work_id":"b6cd711e-bdda-44a0-941e-f12c3c871352","year":2008},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.028461Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:72349a924214c039f7e4c8e77e6847a63b2b15318673830cff96b2cdc8b92396","observation_id":"9f86c867-4cae-405f-b31c-95c72350f0e6","resolution":{"observed_at":"2026-08-14T13:17:16.717523Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.698386Z","title":null,"venue":null,"work_id":"bc54b627-d10a-414a-8eb5-df3d817655f4","year":2009},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.032999Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:4ae46c7e52740628b9b2216cd9dd2e10a2f862373aa07d11de6b4ce2ef7b80ba","observation_id":"d23ea6f7-3ed8-4116-b6a0-8588497b125a","resolution":{"observed_at":"2026-08-14T13:17:16.702805Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.683790Z","title":"Hong, et al., Charge gradient microscopy, Proceedings of the National Academy of Sci- ences 111, 6566 (2014)","venue":null,"work_id":"659be00b-8305-467b-957f-3f07ef938e62","year":2014},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.037910Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:39eeede21d203d0eba368ca3e711baf93b199f916168c9a9c5e478405d050b95","observation_id":"ae0ea28c-4f96-4c00-94a9-6d5c03262573","resolution":{"observed_at":"2026-08-14T13:17:16.688799Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.668305Z","title":"Gomez, M","venue":null,"work_id":"bc4e1174-6a99-42dd-8e2f-dc19f824b752","year":2017},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.042207Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:271c4c2100d7982190c464a0824a4f72e376249fe3d07ecd2d1c487a5523324a","observation_id":"4814a1d9-b73f-48ec-b346-06c7d9ddabc4","resolution":{"observed_at":"2026-08-14T13:17:16.673773Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.653735Z","title":"Kwon, et al., Direct Probing of Polarization Charge at Nanoscale Level, Advanced Ma- terials 30, 1703675 (2018)","venue":null,"work_id":"cebf94b2-d0d7-41ea-bac0-c23cb19b11e5","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.047251Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:9d3f2ecffc6ea3a89f119a0c0ee0d15e7c33ce00cd58669cd07481c20af4d943","observation_id":"b291c39d-182b-4b70-974e-f306009b5f5b","resolution":{"observed_at":"2026-08-14T13:17:16.658522Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.639229Z","title":"Calahorra, M","venue":null,"work_id":"7a30d262-fbbd-4eaf-abef-8cc53242737f","year":2017},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.052452Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:86efaa6f12032daeb45f5b7d35eb6b1decbb8be8c0a362bd111be070ead6235f","observation_id":"b22796b0-0762-4532-b30f-c066db6d6f25","resolution":{"observed_at":"2026-08-14T13:17:16.643766Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.624665Z","title":"Curie, P","venue":null,"work_id":"5ddfa872-10d4-45ac-908e-68780655b02a","year":null},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.056811Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:17935b13ee7828f932ede7e0edb9a7dbd062749cec573b28e7d928d071aa7381","observation_id":"06f56523-62c8-4b63-81e1-31c91d083bd4","resolution":{"observed_at":"2026-08-14T13:17:16.629406Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.610250Z","title":"Damjanovic, Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics, Reports on Progress in Physics 61, 1267 (1998)","venue":null,"work_id":"f1beb83a-d850-49c7-99a2-85cf33ff5628","year":1998},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.061940Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:9cf82bc326114605a1a4a22b2b8395e9d2cda5bc2e571285c62f88819bc081d5","observation_id":"cd5be4b0-342a-42ea-888a-b25ab1548b7f","resolution":{"observed_at":"2026-08-14T13:17:16.615037Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.595891Z","title":null,"venue":null,"work_id":"763d4070-1be6-49af-8444-01764950e963","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.066455Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:10f6478c1fe46ec0ad3bd5382b1e4ec42ed87dcc1f7160778c404d50c67113b7","observation_id":"3e4e1d19-1c5f-45a0-975b-f29c35d6d954","resolution":{"observed_at":"2026-08-14T13:17:16.600386Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.581558Z","title":"Zhou, et al., Flexible piezotronic strain sensor, Nano letters 8, 3035 (2008)","venue":null,"work_id":"1b7f0a3f-f6f7-4fd0-a35d-5d4c6710a6f7","year":2008},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.071067Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:656a3c319d23b4956c8fe0be60b7988a109c4068bf3670be684da1b0b2bde217","observation_id":"9b9cc60c-0b3a-48e4-9ab6-8990baee8f18","resolution":{"observed_at":"2026-08-14T13:17:16.586088Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.567124Z","title":null,"venue":null,"work_id":"5f59ca85-228d-41c9-ad27-128eb92ff28e","year":2017},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.075608Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:09bebc6f20cddb148f2c53dc23a0df43d184c6c13680f25420e80f2c56b0af71","observation_id":"27fd4dcd-c35f-4d1b-99f5-518a5f12e13c","resolution":{"observed_at":"2026-08-14T13:17:16.572102Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.552101Z","title":"Bardeen, Surface states and rectification at a metal semi-conductor contact, Physical Review 71, 717 (1947)","venue":null,"work_id":"5f60e3d5-6307-4e0c-9ee2-df64552c2d8c","year":1947},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.079991Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:8ac24918949a1428b1a42bcaae7a3740db781adaee74a1da8dc17f4308a8686f","observation_id":"9be82e47-ed1e-4556-8606-7f96638ed605","resolution":{"observed_at":"2026-08-14T13:17:16.557076Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.537739Z","title":null,"venue":null,"work_id":"7684633b-396d-464d-9b76-0c735141f58f","year":2006},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.084780Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:7b71b6f860a8eeca6765a15496414bb7f762ea134bd2021d2f7785b021370279","observation_id":"0fbc0617-1efd-4102-9f58-acb8d90669fa","resolution":{"observed_at":"2026-08-14T13:17:16.542434Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.522548Z","title":"Calahorra, et al., Highly sensitive piezotronic pressure sensors based on undoped GaAs nanowire ensembles, Journal of Physics D: Applied Physics 52, 294002 (2019)","venue":null,"work_id":"9ca618a8-c4ea-4c16-b757-98727a7f23f0","year":2019},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.089239Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:43e4fcee7287a087321cf23e49fc313c487b034f23f2ce641d396c3dc272d851","observation_id":"e958945c-a4f6-4826-82c6-70fb3da52aeb","resolution":{"observed_at":"2026-08-14T13:17:16.527459Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.508142Z","title":"Gruverman, S","venue":null,"work_id":"90649b57-d7cf-449a-b28f-038c7221c8fe","year":2006},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.093502Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:4e25eac2826ba3bfad0a513f6d659a2800a7e647ee661d309b3f0955864e2d01","observation_id":"7e1d5241-b30f-4879-8d14-eb5dcda09681","resolution":{"observed_at":"2026-08-14T13:17:16.512627Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1904.06776","last_updated":"2019-04-14T23:00:40Z","snapshot_observed_at":"2026-08-14T16:46:47.099980Z","submitted_at":"2019-04-14T23:00:40Z","title":"Quantitative Electromechanical Atomic Force Microscopy","version":1},"cited_work":{"arxiv_id":"1904.06776","doi":null,"metadata_source":"pith","pith_arxiv_id":"1904.06776","snapshot_observed_at":"2026-08-14T13:17:16.219413Z","title":"Quantitative Electromechanical Atomic Force Microscopy","venue":"cond-mat.mes-hall","work_id":"8e1ba094-b13f-4524-b1ed-dbda925589a0","year":2019},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.098079Z"},"links":{"cited_paper":"/paper/1904.06776","citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:fd24175f93b1aaf232bd647637c7fddd7f4c4dc9bb3558837dd1d76b429cdbd5","observation_id":"adba57e9-5192-4368-ad9e-328180629fda","resolution":{"observed_at":"2026-08-14T13:17:16.226335Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.493562Z","title":"Minary-Jolandan, R","venue":null,"work_id":"df1fa328-2e92-40b6-a8b7-76c90a269d86","year":2012},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.103239Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:c7f62759996d5c0fb71c8128a09a166013a37416eb796d38d746c5539640c1ab","observation_id":"47a0c352-9c11-4cbf-84aa-f51e1f3cc6fe","resolution":{"observed_at":"2026-08-14T13:17:16.498285Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.478091Z","title":"Calahorra, et al","venue":null,"work_id":"fbf6498b-103c-4752-84a5-610a353f8776","year":2017},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.108625Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:58bfd97cc4d39382c9f03e72e9b40391b9ba070223c11130ea202537f50fbd80","observation_id":"a579a5c4-d5f6-4886-b9e4-2b2f50e2e664","resolution":{"observed_at":"2026-08-14T13:17:16.483185Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.463324Z","title":null,"venue":null,"work_id":"e4d58746-92cc-4750-9854-b8cdfdde18ab","year":2015},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.113144Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:c2a15c37c3d25c3bb0c7f9fb4d1ac671c4d50c8c3c9839dfc37dcd70b4ef0893","observation_id":"2355bde8-89ca-4382-a344-720b0afa2a28","resolution":{"observed_at":"2026-08-14T13:17:16.468008Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.449166Z","title":"Johar, et al","venue":null,"work_id":"93d69d9a-55de-44bb-bf6e-73dabfe86652","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.117749Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:919945d5aa6eadc4369fbacb431ac2f38a68ed09c334e7eec14f0bf0913d85e2","observation_id":"0b96f89c-01bd-410d-b223-39653a33c416","resolution":{"observed_at":"2026-08-14T13:17:16.453741Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.434978Z","title":null,"venue":null,"work_id":"68615021-ddae-4695-b48a-857148797ec8","year":2009},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.122386Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:ee48502581e3c992a27153232ad5bd31452679380318d1b62b9a947160b48153","observation_id":"22e0a09c-1c52-4dbc-9b1c-c01e89189f99","resolution":{"observed_at":"2026-08-14T13:17:16.439593Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.420333Z","title":"Pittenger, N","venue":null,"work_id":"d69e9dbb-1577-4d64-a15e-66436a4c9b48","year":null},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.126738Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:be0d0d3810b3dbb56e455384015f95dfd047d7ead57b2ba66fd9e28e67e42cf4","observation_id":"fd4d2785-3be7-4487-87db-1915fa2553e8","resolution":{"observed_at":"2026-08-14T13:17:16.425162Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.405897Z","title":null,"venue":null,"work_id":"cebda7d3-317a-463d-9d37-8ef22edef84c","year":2019},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.131996Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:f1ba04951446cccf2d9d89e4e52b957328fcb0057c5b71b25bb9326683beeea0","observation_id":"8398bdda-8206-4d95-899a-08e8fff7cbf2","resolution":{"observed_at":"2026-08-14T13:17:16.410473Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.390510Z","title":"Crossley, S","venue":null,"work_id":"0dae8c15-eaca-4600-abb9-3c5b418f1b49","year":2015},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.136293Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:7b561858258cf7a3f95edd423a206d6254698a9fcfb63a61ee0f5182f47bc330","observation_id":"c4659f08-6391-4b56-aab0-8f4478323e9c","resolution":{"observed_at":"2026-08-14T13:17:16.395434Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.375231Z","title":null,"venue":null,"work_id":"bddb4ba5-bfb7-488e-9a4c-3335a3ef9c88","year":null},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.140530Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:ec7474e1e404f13fde3b1c3851e63a4c5b0bd3710379dd54573cd3647c0ac37a","observation_id":"015d7c24-0283-49d1-ad79-620f0c80644b","resolution":{"observed_at":"2026-08-14T13:17:16.380629Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.360621Z","title":"Calahorra, C","venue":null,"work_id":"c3603b2f-849b-41ce-b39c-5be51864af9b","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.145177Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:1102b60c190aa09515c1e562594bb0fee51ab4113aeffb57bc116acd7e467af6","observation_id":"b5538bc7-24f9-4671-80e6-9b5279480317","resolution":{"observed_at":"2026-08-14T13:17:16.365175Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.345729Z","title":null,"venue":null,"work_id":"5ee51f90-c4ee-4e0f-a6be-e9dab844a9e2","year":2002},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.150546Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:a0d76a35a65b90ed1a01b9b0433845075774beb5336b48173aefd7e4e0447197","observation_id":"c4bb8775-b2e5-4d8a-b808-c501d9a68837","resolution":{"observed_at":"2026-08-14T13:17:16.350320Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.330716Z","title":null,"venue":null,"work_id":"579042d7-d93f-488c-937f-594111d30e5f","year":2015},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.155265Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:30d493e4a44cfd3127fe15d8c693ae37896163d229486eadb0de75c2fb10ceae","observation_id":"92036d18-bc49-4a04-83e4-944d08dca4a5","resolution":{"observed_at":"2026-08-14T13:17:16.335415Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.315819Z","title":null,"venue":null,"work_id":"e8c5f2ea-7f07-4d84-b68a-5f9739085486","year":null},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.160003Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:3e7c98bacba4f40880b42822c96e2ebb090abdc4e94f2a301b77fd8ea98e7857","observation_id":"c00272ff-b4ba-4786-9204-78d9db01f038","resolution":{"observed_at":"2026-08-14T13:17:16.320845Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.299761Z","title":"Abdollahi, N","venue":null,"work_id":"1d1b2a0e-8b76-4026-b47a-d302c4bd9209","year":2019},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.164678Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:eda753600a720835627e989cf49f42d45725f23e2d439552bc31d25c48753ab0","observation_id":"24bf93c7-949e-4f55-955e-0f374aa58e41","resolution":{"observed_at":"2026-08-14T13:17:16.304610Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.284879Z","title":null,"venue":null,"work_id":"65dec4f2-ef7e-4ac7-91dc-db07fc16a465","year":2018},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.169117Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:2b2f20d16347e9255f20662b6f7c0f0236b764c4732d93ea279aa295aa9314fc","observation_id":"90b376c6-d3a0-4c94-a38f-d0e7e86c5061","resolution":{"observed_at":"2026-08-14T13:17:16.289405Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.269421Z","title":"Colombo, D","venue":null,"work_id":"1c0f7f31-27d2-4c97-a3d1-73e6cfd7977b","year":2008},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.173495Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:b6097723a702169f87022151ca2e2910afa4bbb343b6de28e2a5e460626175ab","observation_id":"85c924f9-6dc0-413d-8c9e-3fe7b1f11d94","resolution":{"observed_at":"2026-08-14T13:17:16.274257Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.252309Z","title":"Matteini, G","venue":null,"work_id":"e106fb25-7bc2-47ad-8e98-a236157d6f20","year":2015},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.177843Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:70f5f78b7cc6f1248d23d56d3883a79591d09a6351a23732959068122266d614","observation_id":"c47cd4ab-21a4-43e9-a593-6845bdd4ebb8","resolution":{"observed_at":"2026-08-14T13:17:16.257739Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T13:17:16.237568Z","title":"Matteini, et al","venue":null,"work_id":"2ed9922e-93cc-4eb4-ae5f-31e2f14edd5b","year":2016},"citing_paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity","version":4},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-08-14T13:17:16.182313Z"},"links":{"citing_paper":"/paper/1908.05512"},"observation_digest":"sha256:5d8ea03c25a61beb9e6684f05481fa3d1545fc095ab165120c6fa6b7c5e07127","observation_id":"ff5f400e-a390-4ddf-9038-304046b797ef","resolution":{"observed_at":"2026-08-14T13:17:16.242316Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"1908.05512","last_updated":"2019-10-02T14:07:57Z","latest_version":4,"primary_category":"cond-mat.mes-hall","snapshot_observed_at":"2026-08-16T04:42:58.721010Z","submitted_at":"2019-08-15T12:24:21Z","title":"Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity"},"reference_resolution":{"displayed":54,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":19,"verified_exact":1,"verified_fuzzy":34},"total_outbound_references":54},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"thesis":"As of 16 August 2026, this Paper Citation Record lists 54 of 54 outbound references and 0 inbound Pith citation observations for arXiv:1908.05512."}