{"as_of":"2026-08-16T11:57:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:b4fbfe1748e134aaef651d93e0b3cab60619512b5bb04ceb3ac743349f6ca063","coverage":[{"denominator":28,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":28,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T12:47:58.925587Z","state":"measured"},{"denominator":28,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":28,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-16T06:30:59.297886+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/1908.06518/citation-record","integrity":"/paper/1908.06518/integrity","json":"/paper/1908.06518/citation-record.json","paper":"/paper/1908.06518"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.508861Z","title":null,"venue":null,"work_id":"e2776fb3-cbef-420f-a351-a40dfc61ef67","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.766044Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:95d971b3230b1565e03d17a542ab62ba935c62f53c4d7b956768a8b926f3e114","observation_id":"09ee6c6f-587f-49a0-8318-9d829bbb166d","resolution":{"observed_at":"2026-08-14T12:47:59.514008Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.490815Z","title":null,"venue":null,"work_id":"513c4626-848f-49cf-be15-559a87095a98","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.772844Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:083be4e3f76a1a6a7f8a593802ce5298a606bc9b5d5a1693d21b07c629ec5c2e","observation_id":"c6cd77c7-7146-4851-9b5d-f4c8b58b5fe5","resolution":{"observed_at":"2026-08-14T12:47:59.496275Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.469217Z","title":"Thus, it must stay on the rim","venue":null,"work_id":"995f3a66-212a-45f8-b53b-ee42ca6c5c4e","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.779282Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:def58320cebd0ca40a9142a11f492420b6f30bb5e9c11893b3dedf1d47325125","observation_id":"a772fe39-3520-4ff9-84f5-124910866d27","resolution":{"observed_at":"2026-08-14T12:47:59.476059Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.450273Z","title":null,"venue":null,"work_id":"56de61f8-1dca-49db-9143-bf5b3e4dec74","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.785433Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:81234db034cfd9368cde77122ec6e5962e7417100ca814db1efc15b1735f6498","observation_id":"4521bf8e-6d13-4277-a8cf-090362e2dd77","resolution":{"observed_at":"2026-08-14T12:47:59.456984Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.431540Z","title":null,"venue":null,"work_id":"e31b1be5-c76f-47b1-a27e-d1a310e8a60b","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.792175Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:311061f2b5f1805a28b655472d91193bdb1500a53dcd22dbbabd3a022521b77a","observation_id":"ae745e7f-56f5-41f8-ab1f-394c82ef22bd","resolution":{"observed_at":"2026-08-14T12:47:59.437352Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.409331Z","title":"This brings new stress into the material, and the crack can grow further","venue":null,"work_id":"322e1c61-b3f6-4635-81dd-cdc67edc92cd","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.797500Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:d042ae22a4df91110248ac085de038d7b2c206917abe3f7377eb1c9a5b3246a6","observation_id":"9c24ec04-42af-42e0-94b1-3932ad72d7d5","resolution":{"observed_at":"2026-08-14T12:47:59.416327Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.391072Z","title":"Otherwise, end the simu- lation","venue":null,"work_id":"7aa7bced-4f6b-4591-8a73-981a7426811d","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.804259Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:02c6d68841f1ed688cb6106305ff9dd9a7df33fc4e7f454fa56b0b5a3cfcb45e","observation_id":"3f1e3462-1969-447b-a21f-fbcef3393dff","resolution":{"observed_at":"2026-08-14T12:47:59.397429Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.221466Z","title":null,"venue":null,"work_id":"0323a87d-e7e3-4365-8d34-ddab1459932a","year":1970},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.861035Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:b4f42c8ae5235e59db5b6d248b73254eb3eb71b3f76691f25d5f4c9296185445","observation_id":"d10a7eb7-c7cd-47e3-88e2-38cbee0ab663","resolution":{"observed_at":"2026-08-14T12:47:59.226889Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.356014Z","title":"Bronger, P","venue":null,"work_id":"df200889-a2fc-492f-b5aa-07ee0eee0db1","year":2014},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.819143Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:76528e0c2ad36792ae93abc201daa8c470ad6919e2ec9ad46e4bad1b69eae249","observation_id":"68bcf45a-fd06-46d4-8ebe-21477ecf200e","resolution":{"observed_at":"2026-08-14T12:47:59.361924Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.335630Z","title":"Stutzmann, Role of mechanical stress in the light- induced degradation of hydrogenated amorphous silicon, Applied Physics Letters 47, 21 (1985)","venue":null,"work_id":"24d93d83-27c5-48b9-b534-e40420db8518","year":1985},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.825026Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:c0b8181c30a275e3d2cd3de2ade0dc553e53fdcd432646d8f4a2c618310e7961","observation_id":"934d6784-9e13-4687-9486-630bdd02f1fb","resolution":{"observed_at":"2026-08-14T12:47:59.341056Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.315267Z","title":"Anastassakis, A","venue":null,"work_id":"74969f41-7f94-49b2-b7a7-6fa396ebec10","year":1970},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.831843Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:281939abc029619f4af481f7abebd043a27e8bafe857843662fbf14af42de779","observation_id":"2567e632-56e9-4f36-89e8-cf96877d8321","resolution":{"observed_at":"2026-08-14T12:47:59.320708Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.293601Z","title":"De Wolf, Micro-raman spectroscopy to study local me- chanical stress in silicon integrated circuits, Semiconduc- tor Science and Technology 11, 139 (1996)","venue":null,"work_id":"fb17f94d-4590-47f0-89de-04a314b9e741","year":1996},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.837599Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:117f86e3913384396da42243da20454e6ed5c2da99c560970184cbd88d58463a","observation_id":"0dabebff-2031-4490-9e84-01416b7fe75d","resolution":{"observed_at":"2026-08-14T12:47:59.300555Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.275331Z","title":"Anastassakis, A","venue":null,"work_id":"d98a9c09-e851-49a7-90bb-5f1eec330a05","year":1990},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.843822Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:b8f7c3683a964ceeb98895c6a0b1c55359a05d367a4ccf9512535b2659aa6573","observation_id":"20cbd2b6-6121-46c7-95a0-d69f02f431c3","resolution":{"observed_at":"2026-08-14T12:47:59.281235Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.257246Z","title":"Griffith, Vi","venue":null,"work_id":"1d69bd82-e743-42e0-b4fd-9af8e3507687","year":1920},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.849339Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:140c52bbfb7382320de1e7ac052de52a25e5bde82e42f4922e4a3e78ebf3ce8e","observation_id":"85a3bf6b-219d-4ab9-93cf-48dd0a688e81","resolution":{"observed_at":"2026-08-14T12:47:59.263333Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.239246Z","title":null,"venue":null,"work_id":"2909353d-c48a-41f6-b0e2-f533fbcbca7a","year":1957},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.855178Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:1c902a11f41cf6725155644ee37eeeddd43665f4cd55c191bd928ee028a8fbca","observation_id":"06e2dbba-c77d-40d8-81f1-042d91c7c3ac","resolution":{"observed_at":"2026-08-14T12:47:59.244666Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.039188Z","title":"Chasiotis, S","venue":null,"work_id":"a7d391d7-aef6-4d77-bd8f-5b5119b9ceba","year":2006},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.904744Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:86331cedba6902a71cf0dee42c33dab19c149e62c89b8afc58bd04bdf5df9e59","observation_id":"36f73471-0eb2-46bf-b093-b2496dc9db80","resolution":{"observed_at":"2026-08-14T12:47:59.045732Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.203527Z","title":null,"venue":null,"work_id":"f7e40104-9dd6-42a5-8089-eed90d50d6df","year":1981},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.867535Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:723a7b15c68584a25eb31c4df643cabaccd59aafaf4e4c3031b3a5f14a04965c","observation_id":"ffbc1819-ec1d-4c2f-93af-71fd51b7d1ff","resolution":{"observed_at":"2026-08-14T12:47:59.208977Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.185825Z","title":"Anastassakis, Physical problems in microelectron- ics, Proceedings of the 4th International School ISPPM, Varna, Bulgaria , 128 (1985)","venue":null,"work_id":"4c79c22e-2af1-48d1-9c49-fc37134d6c0c","year":1985},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.873081Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:5fab10b42c663cd2c644c535d5dd0c7d79f9606b3069749de885252e7c588854","observation_id":"1725b31d-cb1d-4909-afdc-d3bb901a5ce7","resolution":{"observed_at":"2026-08-14T12:47:59.192119Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.373699Z","title":"It has been frequently reported (e","venue":null,"work_id":"c7d2354f-3ccd-4e12-b673-cc60b2e833bf","year":null},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.812962Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:b281fc9ac673787f4197a5f207f8549335796cf64d5caebac673bf8a6d8e4674","observation_id":"af64229d-39bf-4fe7-b3bf-7da3b11d6ae0","resolution":{"observed_at":"2026-08-14T12:47:59.379648Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.167477Z","title":null,"venue":null,"work_id":"24bee892-dcbd-4209-8477-e8a0d848a7ba","year":2013},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.878059Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:702c98ac0a748a88f009b70a6898deb7851c33ec21c5cdc4225e72371f037e08","observation_id":"56d1efc4-1d02-4ca6-a56d-00e19ac4ec14","resolution":{"observed_at":"2026-08-14T12:47:59.173499Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.142432Z","title":"Cimrman et al","venue":null,"work_id":"54656b78-4e37-4924-8424-64ab199f1ff5","year":2008},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.883760Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:3cca42150168b113674946b6894dec20770c943a8b72239b45201625cff76295","observation_id":"520dbce5-5ec7-48ba-a67e-f396eb79e5e9","resolution":{"observed_at":"2026-08-14T12:47:59.151493Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.110592Z","title":"Richard, M","venue":null,"work_id":"1965e8db-7041-455d-9d5b-e1231662ebe8","year":2005},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.888467Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:4e61b5f0e7470960bdc9b1b1e5390d22802444942321eacfd971f3e21ad5b07d","observation_id":"7bf55ec1-8ee8-4a56-913f-0c860f87a8f3","resolution":{"observed_at":"2026-08-14T12:47:59.125256Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.086709Z","title":null,"venue":null,"work_id":"3bc40fe2-435b-4113-9f3d-b30a823b7a90","year":2006},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.893599Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:1dde752aaf954b7c581b9a75692ff428505340a9b14b58d13db4d6fd4b8e268e","observation_id":"d2ee4bd3-3d3b-4a19-afeb-2b18cf13f655","resolution":{"observed_at":"2026-08-14T12:47:59.092403Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.064337Z","title":null,"venue":null,"work_id":"e7910974-b15e-4809-a33c-f01e1421e572","year":2003},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.898734Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:028d22849628fe552615827fba041ba49f95dfe8485d47a3ecb39af49b1aace9","observation_id":"70fa790d-e70e-4ac5-82fb-29ec1c17695e","resolution":{"observed_at":"2026-08-14T12:47:59.070825Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:59.018241Z","title":"Bagdahn, J","venue":null,"work_id":"cc42a901-f895-4c79-a886-0c73d26ceb81","year":2001},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.910337Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:1cf6f8dad85ac3291d3689bcc3aa2a69c5bf022687157da8f732094bf4fff833","observation_id":"9b95d4ab-83dc-4f41-9ded-438e9c5a9952","resolution":{"observed_at":"2026-08-14T12:47:59.024242Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:58.999550Z","title":null,"venue":null,"work_id":"72031c97-4357-4c53-91a7-38c4ae8b8ce8","year":2000},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.915603Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:ac69ef574f8db38286a01df793c139b083d9f23d4d37f13d69700797348a6ea7","observation_id":"66e3e806-6a9b-45da-a610-cbf598e28958","resolution":{"observed_at":"2026-08-14T12:47:59.004897Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:58.980462Z","title":null,"venue":null,"work_id":"b684cc86-4246-457a-9001-fa5545ddb6dd","year":2003},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.920402Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:7f4e122829b8fd3e4b714a280124f3380c47ce73166d9c520f16fa3379b6ebfa","observation_id":"bfb66fc2-44ad-4048-b3fd-41765864c034","resolution":{"observed_at":"2026-08-14T12:47:58.986832Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:47:58.961133Z","title":"Gilbert, J, R","venue":null,"work_id":"c2df10d7-1780-4f37-a766-4d1c54b61417","year":1997},"citing_paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-14T12:47:58.925587Z"},"links":{"citing_paper":"/paper/1908.06518"},"observation_digest":"sha256:a362dd1a6da154c0f206cccc8ab35b28d7ebeb0cf0092ff393231484850add7f","observation_id":"55663535-a973-46f0-a373-73bd11163292","resolution":{"observed_at":"2026-08-14T12:47:58.967975Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"1908.06518","last_updated":"2019-08-18T21:41:38Z","latest_version":1,"primary_category":"physics.app-ph","snapshot_observed_at":"2026-08-14T12:40:22.167797Z","submitted_at":"2019-08-18T21:41:38Z","title":"Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures"},"reference_resolution":{"displayed":28,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":12,"verified_exact":0,"verified_fuzzy":16},"total_outbound_references":28},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"thesis":"As of 16 August 2026, this Paper Citation Record lists 28 of 28 outbound references and 0 inbound Pith citation observations for arXiv:1908.06518."}