{"as_of":"2026-08-16T09:25:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:70ea013c76b1a21578b3e4fa8220f373bcea8626ada4a8bbc85c6b4827706100","coverage":[{"denominator":26,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":26,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T12:21:55.896580Z","state":"measured"},{"denominator":26,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":26,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-16T06:30:59.297886+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/1908.07468/citation-record","integrity":"/paper/1908.07468/integrity","json":"/paper/1908.07468/citation-record.json","paper":"/paper/1908.07468"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.320499Z","title":"Fulton, J","venue":null,"work_id":"f1354334-50d9-4c3a-a72d-fab4415b2f72","year":1989},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.778437Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:e1d79c8a1f42a3f906264e466b289643010a6ab697820859f4ee7f08f9650383","observation_id":"0d560404-43d7-4a8f-b655-04264c6775bb","resolution":{"observed_at":"2026-08-14T12:21:56.325638Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.304932Z","title":null,"venue":null,"work_id":"3cce68fe-e7b8-430a-802f-6cb5c39b4fc0","year":1991},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.783316Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:fb7c6fd79757d3b404150d9ee445d45daeba49eb6187c251f8e771b1f8536acb","observation_id":"0aceae3a-e842-45ce-a8ad-831fad95a97c","resolution":{"observed_at":"2026-08-14T12:21:56.309756Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.290558Z","title":"Field, Nucl","venue":null,"work_id":"b9189de5-faa8-46b1-9f74-451378dbc4eb","year":1995},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.788327Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:f71b13ecace371694c32c5069e900261a8718f606488338e3669d71547fbf184","observation_id":"b25b40ae-a65e-408b-8e68-3cb3d195a46a","resolution":{"observed_at":"2026-08-14T12:21:56.294989Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.275687Z","title":"Tenenbaum and T","venue":null,"work_id":"2f9ddb2d-53f8-48a2-8012-ab094dbd4aa5","year":1999},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.792973Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:8918c34e56777249f4a3a5f9e200541fdf52cf6aa76bdb73a00980e68050a0b2","observation_id":"d0ab096f-8421-4bb8-bade-4f8613791091","resolution":{"observed_at":"2026-08-14T12:21:56.280289Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.260879Z","title":"Nuhn, P.J","venue":null,"work_id":"247cd4d8-9ab7-4261-9813-c3fbb35ffcea","year":2006},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.798027Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:ddfcd647fa2669265b632242ab872caa0abf24e118b08701f21b4f052aa42f2e","observation_id":"82b50660-11fc-4b04-9873-d93a82756e7f","resolution":{"observed_at":"2026-08-14T12:21:56.265722Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.245205Z","title":null,"venue":null,"work_id":"2fb98e89-8487-41f2-959a-4a71069ec1ab","year":null},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.804924Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:8f9d7f64bae7756286ef88a2e21cd0c87f1957e453e506363d2b829e89429429","observation_id":"5ee6c1f8-4440-4d54-80ce-73846febb92c","resolution":{"observed_at":"2026-08-14T12:21:56.250608Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.229763Z","title":null,"venue":null,"work_id":"90e72f94-37ad-406e-b5ab-a2b69f090fc3","year":2006},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.810139Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:1a4107b9f49a890be4f10981049daf4143b6e5de3500aa51dc12a4972e9064a5","observation_id":"192b8381-dee6-4a83-bd15-a8f81b05e0a2","resolution":{"observed_at":"2026-08-14T12:21:56.234440Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.213753Z","title":"Wittenburg, Report No","venue":null,"work_id":"d9c2693d-dd29-47c9-869a-70872e0ff9bd","year":2000},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.814931Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:023b1c55a0674ee22d3cfaf3f0f8a9dfd4213dd9037b0c549d496150f71fe17d","observation_id":"c36021c9-2efa-4a08-9f02-c3c594721bdc","resolution":{"observed_at":"2026-08-14T12:21:56.219081Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.195596Z","title":"Hahn, N.v","venue":null,"work_id":"9c81405b-bd39-4400-8b7b-5c6c46822c30","year":2008},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.820508Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:275fb419bef7faaeb0509f887daa2452ad13260b9d0723afb49cde030091c5d7","observation_id":"59aeff2e-bc34-497e-8574-d4a2cf24bc02","resolution":{"observed_at":"2026-08-14T12:21:56.201056Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.179234Z","title":"Orlandi, P","venue":null,"work_id":"1ce7bd73-83d2-4780-a9e6-b8932f1c1e7d","year":2016},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.826020Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:101b7583ea52c2fdba5a36d9ecea4d8232b5066bce4bea01c0a1b76ce218f3ea","observation_id":"c4c7b167-8318-4637-9f0f-2b3b0fdf290f","resolution":{"observed_at":"2026-08-14T12:21:56.184847Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.161271Z","title":"Huang, H","venue":null,"work_id":"1a0174f9-f87d-4cd2-a5b1-0fdbf4ea95ca","year":1995},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.830784Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:60d81e88d17ca7ab7b02babc24434a8e3a0c41f7d8261bba031317228f2fc6ae","observation_id":"bc77496f-3d2c-4ede-aea7-e8514a92b4f3","resolution":{"observed_at":"2026-08-14T12:21:56.166854Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.337286Z","title":"They were experimentally tested at SwissFEL both in the nominal- and low-charge regime (bunch charge of 200 pC and below 1 pC, respectively)","venue":null,"work_id":"f5c4b595-16cb-4583-bf1a-ff74a9b5f538","year":2000},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.770416Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:edce5f16df8ce32ae5daffae3966959656fc803fba45383265b1f2c7e7129aa8","observation_id":"ba4db756-788c-4f9a-9965-738d0f7ae532","resolution":{"observed_at":"2026-08-14T12:21:56.343313Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.143270Z","title":"Veronese, A","venue":null,"work_id":"bca11a25-ae6c-49b0-81b5-6862653df04a","year":2012},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.835550Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:49b226c10d28b1c0f729cff53f08af79a49eb3f29c725f29fd02c84adfdbdb96","observation_id":"bc1b9fec-7b29-4ffc-93aa-2d2ea18cf328","resolution":{"observed_at":"2026-08-14T12:21:56.148058Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.127101Z","title":"Ischebeck, E","venue":null,"work_id":"80fa98ce-2965-4437-bcbe-fa43b0ed7197","year":2015},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.841220Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:8b70e7844bbf49f3220d34a04530d0c327db9972402c9760ab9d2d794b1fce50","observation_id":"2e7880bb-b59d-4295-b823-cf9939d7dcbe","resolution":{"observed_at":"2026-08-14T12:21:56.132055Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.111563Z","title":"Borrelli, G.L","venue":null,"work_id":"aa42587a-58d2-4e88-8520-d1e97cf6e280","year":2018},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.846444Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:e57c86458798f36ed65c7112f7176c37f239d25f14a7b4d44f1b5293d46ff4a5","observation_id":"fab83795-c850-450d-960f-8570e2f700ee","resolution":{"observed_at":"2026-08-14T12:21:56.116533Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.096204Z","title":"Veronese, S","venue":null,"work_id":"4c1b1a0f-63ca-414e-ae31-d4a96022887b","year":2018},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.851202Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:ca24f1645b4c1d8c67a82a30fa94e7bea2f9c217c7687cf5f34fe6d23b909661","observation_id":"657d228a-4e6b-41a7-b95d-df74b77b96c9","resolution":{"observed_at":"2026-08-14T12:21:56.100593Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.080948Z","title":"10-04 April 2012","venue":null,"work_id":"a50a8bb5-8397-4e92-b702-6a338bb755c4","year":2012},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.855550Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:04079d31755b9479e8af0e5041562de2f134fe35013c85b3d34fa9b65f314fc7","observation_id":"0fbe3b4b-99bc-4827-8579-6ba987549e21","resolution":{"observed_at":"2026-08-14T12:21:56.086022Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.064313Z","title":"Schietinger, et al., Commissioning experience and beam physics measurements at the SwissFEL Injector Test Facility, Physical Review Accelerators and Beams 19, 100702 (2016)","venue":null,"work_id":"5dca6779-c0ba-4188-81da-bab66779f1dc","year":2016},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.860250Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:90ecf4494873166bb4b562241e5baf4489d235a09786dd5e819c9b8ee8f623e1","observation_id":"65b28fa8-43cb-41ee-8841-786a8cf87ce3","resolution":{"observed_at":"2026-08-14T12:21:56.069966Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.047075Z","title":"Milne, et al., SwissFEL: The Swiss X-ray Free Elec- tron Laser, Appl","venue":null,"work_id":"51558d8a-cb41-4a86-97e0-44345acca6a2","year":2017},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.864730Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:9a352ad7185f9eea4fc1f1d60725854e5f32f698e76d4407f8e35e4d9d262e52","observation_id":"6a872a49-9988-457a-9cce-7f37f1c1b9be","resolution":{"observed_at":"2026-08-14T12:21:56.052879Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.031081Z","title":"Orlandi, A","venue":null,"work_id":"6736eedf-91ea-4d17-8eb4-7aa758cab1ea","year":2017},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.868727Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:38660ea633b4fb40817d5b02422a5a4f8191e131f57a586e11062480419c7082","observation_id":"bde67a55-5cba-4c55-80d2-d9230d36d6b1","resolution":{"observed_at":"2026-08-14T12:21:56.035945Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:56.014448Z","title":null,"venue":null,"work_id":"7b9dc2d4-b32d-4fec-9ffb-337da7a86461","year":null},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.873014Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:e183a745f2a677d2cb4d37f1c730ea42a4d9d8b7ef7cf8a30a83da7e644e64e2","observation_id":"14ec46e9-a81f-4d25-bee2-87ea5ca63d29","resolution":{"observed_at":"2026-08-14T12:21:56.019371Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:55.997697Z","title":"Jurani´ c, J","venue":null,"work_id":"a11c6c5d-2e5a-4762-abd7-8b26511892d3","year":2018},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.877930Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:f4ec856c24efb359f5c893c7f8330b5aa036cb41191a2db9031d4650011ad857","observation_id":"c91dd8bb-cfa8-49d0-9b34-ebb4b76a2bbc","resolution":{"observed_at":"2026-08-14T12:21:56.002211Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:55.981869Z","title":"Fernow, Introduction to Experimental Particle Physics, Cambridge University Press (1986)","venue":null,"work_id":"b75e3736-1bd2-4469-8556-2de22e3e93c6","year":1986},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.882957Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:6080c2e72302ddfd4676709c4fcfd3788dc2c5d0e2ecf3db85f078e7d07fec5d","observation_id":"9ab1f86d-3fdf-4d44-aafa-530223032ab9","resolution":{"observed_at":"2026-08-14T12:21:55.987069Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:55.964621Z","title":null,"venue":null,"work_id":"9ca95ab5-6e7f-48c9-9ef7-a883b73cabf7","year":null},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.887644Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:b9d9c20b7cb8b2068d7ae79cc8d469f87cd49bcfaaf3e243349310f27f0b26d2","observation_id":"8d5e9d34-2215-44e7-b139-415b2d91bfc6","resolution":{"observed_at":"2026-08-14T12:21:55.969899Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:55.947957Z","title":"Ferrari, R","venue":null,"work_id":"f8683de6-cf5e-4929-b234-3271f791957b","year":2018},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.892162Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:e2f1f3e9a17ff60815eb56ef328b7ef9d0dbee9772878080d6b202e9efc6f6b3","observation_id":"4f0a4474-a746-4cda-9dd5-9fe63cc20b87","resolution":{"observed_at":"2026-08-14T12:21:55.952981Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:21:55.929688Z","title":"Ozkan Loch, D","venue":null,"work_id":"53333451-18b5-4b9e-9416-3855944ae36e","year":2015},"citing_paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution","version":2},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-14T12:21:55.896580Z"},"links":{"citing_paper":"/paper/1908.07468"},"observation_digest":"sha256:9119f4c18a6a0667e1c4c440e612a27e0c2860a06fb4344df27ecc032c1acd3b","observation_id":"3a09adc0-56f3-4685-9658-e7ac18f637fd","resolution":{"observed_at":"2026-08-14T12:21:55.935935Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"1908.07468","last_updated":"2020-01-30T12:37:39Z","latest_version":2,"primary_category":"physics.acc-ph","snapshot_observed_at":"2026-08-14T12:12:59.150714Z","submitted_at":"2019-08-20T16:07:48Z","title":"Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution"},"reference_resolution":{"displayed":26,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":5,"verified_exact":0,"verified_fuzzy":21},"total_outbound_references":26},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"thesis":"As of 16 August 2026, this Paper Citation Record lists 26 of 26 outbound references and 0 inbound Pith citation observations for arXiv:1908.07468."}