{"as_of":"2026-08-16T05:40:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:90cc02b9b1f43652e23ec2590534b948ac5a3896238f73fe79d33e53704d7339","coverage":[{"denominator":62,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":62,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T12:02:22.648884Z","state":"measured"},{"denominator":62,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":62,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-15T06:32:42.880941+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/1908.07767/citation-record","integrity":"/paper/1908.07767/integrity","json":"/paper/1908.07767/citation-record.json","paper":"/paper/1908.07767"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.457456Z","title":"Strub, W","venue":null,"work_id":"88a293c8-e06c-4bcc-b523-b674620aec6b","year":2003},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.390121Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:32c5a84b630d7a319fdab0a6c303b6c90b827357188115a5a9b93a06d3a7c1df","observation_id":"aa19ebc3-7fbd-4d65-893b-440b71c195ed","resolution":{"observed_at":"2026-08-14T12:02:23.461619Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.444498Z","title":"Guziewicz, A","venue":null,"work_id":"177a695a-80b0-47dc-b98e-97d51f992376","year":2016},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.394997Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:cc267b3360db72a1b5c2250fb68b6c1283ec2792f54a4989ae8205001e59158f","observation_id":"3736d22c-0167-4e0a-b812-2162614579ef","resolution":{"observed_at":"2026-08-14T12:02:23.448789Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.430913Z","title":"Hirvonen and M","venue":null,"work_id":"e7d95f98-063c-41fd-8228-82db3c30ef57","year":null},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.399128Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:3db54ed98ef02fb8615010d1d4d8dc08b778d28727ab04070312605f0fd7c60d","observation_id":"78668ebf-d42f-4917-8483-87be21bc65ea","resolution":{"observed_at":"2026-08-14T12:02:23.435617Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.416171Z","title":"Inokuti, Reviews of Modern Physics 43, 297 (1971)","venue":null,"work_id":"1a829bf3-b199-4602-9713-c93c576e30f9","year":1971},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.403095Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:c6a0e2d2c9bd1c51d4560b5f029f75c1ff8e28f4390d2ca864042c1f8f9e92bc","observation_id":"345bc961-6f98-48f5-948c-8ba6a0dd16be","resolution":{"observed_at":"2026-08-14T12:02:23.421969Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.403802Z","title":"Fermi and E","venue":null,"work_id":"910c7eb6-7b96-4608-9591-a04608a70df2","year":1947},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.407616Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:af7074f9cf5018af85100777aa65cc5e9098b4e7eb95e7c5dd5eb34ca8ead26c","observation_id":"92d068e3-fa3d-4c87-88e6-ab4b71a485a3","resolution":{"observed_at":"2026-08-14T12:02:23.407807Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.391963Z","title":"Lindhard and K","venue":null,"work_id":"d1b261a7-f7b7-4bb5-ab8a-e7596bd49950","year":1954},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.411776Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:a3a7a0c93ccbdbfec08e608da0893a229fcc1375b297f3080fdb8ccee061bb3d","observation_id":"f661dae1-2706-41e0-825b-92f7d1e02293","resolution":{"observed_at":"2026-08-14T12:02:23.396418Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.379171Z","title":null,"venue":null,"work_id":"a93de2fe-adb6-4d92-8042-e2b35dbd0b28","year":1959},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.415929Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:af579907ef9cfc85cb1d7492d21aad249d4f9d4314610f4eb4e804186120ec3a","observation_id":"d36d9db1-6a56-4459-beb9-d524ce7a1273","resolution":{"observed_at":"2026-08-14T12:02:23.384088Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.365567Z","title":null,"venue":null,"work_id":"a1b1dd7a-f44b-49d0-9180-5335cf98b81e","year":1990},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.420505Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:a0476e704774c5536da0d13162cb67fb18f9660de22d6cc28952f9a5cd1a12b6","observation_id":"21f588ee-1d73-4c23-9f2a-34a233f6e2f1","resolution":{"observed_at":"2026-08-14T12:02:23.370129Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.354084Z","title":"Mann and W","venue":null,"work_id":"6ae9dc6f-956e-4a0c-912f-2481e0e81ed2","year":1981},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.424801Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:8931b4f34874a13f11d3951591d81934b1a090ca8aab43a9e44fea235adc4097","observation_id":"dc005e68-1f92-4ccc-9353-f12826b94a5d","resolution":{"observed_at":"2026-08-14T12:02:23.357855Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.339322Z","title":"Paul, Available from: http://www.exphys.jku.at/stopping/","venue":null,"work_id":"2f934d3d-e027-4c2c-9192-2cc28c6da0e3","year":null},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.428656Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:ffb640ad8abb38e72d30d35d854fe61536143f2ce355b0ab32b24685cb0d5f46","observation_id":"6179d05e-54b5-4313-a8b8-5a08bd8a7b87","resolution":{"observed_at":"2026-08-14T12:02:23.344735Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.326855Z","title":"Blume, W","venue":null,"work_id":"0816d6d7-9ff7-428f-aa49-9a22e6531469","year":1982},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.432751Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:e43a2657f0c1ab90a00fed8441e56873b5273a84476b484438744e958d1c8729","observation_id":"cf16b39e-ed2d-496c-95eb-4a5e5f9d0980","resolution":{"observed_at":"2026-08-14T12:02:23.331000Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.313936Z","title":null,"venue":null,"work_id":"c725cc1f-2684-477c-9d9d-9a9a248f53ef","year":1994},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.436600Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:0e53b8f738edd8cfbb49a22c8cd28b8184de61568b2d1038d0dfe537e6adacc2","observation_id":"60b0b415-d508-4689-8cdf-9a25d31b1b05","resolution":{"observed_at":"2026-08-14T12:02:23.318392Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.299418Z","title":null,"venue":null,"work_id":"6f94d903-7c57-4232-a73d-72752338b25d","year":2009},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.441068Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:277712e7183670b8ac8a0af4bd8a45daea51d254eeb64ae2f42867a1a4e5ccc8","observation_id":"03ea833a-43eb-4be8-87ae-df5c96f3c6d4","resolution":{"observed_at":"2026-08-14T12:02:23.305559Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.287097Z","title":"Primetzhofer, S","venue":null,"work_id":"a54734bb-1ff6-417c-891b-a6d2c84bf991","year":2011},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.445135Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:53b1f4b999a935282b463c0f614168722028f3817b2701c8bd2f799b913993f7","observation_id":"39038537-9d30-44f3-abde-13152176c4ab","resolution":{"observed_at":"2026-08-14T12:02:23.291414Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.274072Z","title":"Riccardi, A","venue":null,"work_id":"068877ac-e622-4adb-a749-2dc322e03b6c","year":2017},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.449145Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:e01c2732f6b8eb4984af8ed0db8d2adad9e811eec0d6070debaba9a63042ce5a","observation_id":"464424a0-ba43-484f-8b9b-af02eddf2086","resolution":{"observed_at":"2026-08-14T12:02:23.278358Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.261176Z","title":null,"venue":null,"work_id":"38568968-69f3-4bcf-8528-1eb11bb544aa","year":2016},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.453245Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:32662f5e4f98b113d207447524687b514df47094968406c317c4462ac779d1ab","observation_id":"0c400ef4-25cc-40cd-ac50-927e4233ba79","resolution":{"observed_at":"2026-08-14T12:02:23.265797Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.247650Z","title":null,"venue":null,"work_id":"96c1498c-9d1e-4668-9731-1913c5a62229","year":2017},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.457604Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:603272aa6152e80fe68cc29bc6945a0786bfb99fa2926f08ce9fde0cf58096f1","observation_id":"1c388e49-7ef2-41ab-848f-b70ae3912d30","resolution":{"observed_at":"2026-08-14T12:02:23.251931Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.232566Z","title":null,"venue":null,"work_id":"6f5b8892-3d75-400b-b78e-960d94920172","year":1905},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.461716Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:6db95110da9525401cac218539cc1ca0183e17340b6090aa50d7e8e7db82a550","observation_id":"db498d45-64ab-461d-af20-f0542a9c6a2e","resolution":{"observed_at":"2026-08-14T12:02:23.236896Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.217845Z","title":null,"venue":null,"work_id":"757d6f5e-d878-443f-89d0-18e27fffeb55","year":2019},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.465827Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:b3e3f20b58ed848729e842308cfa1c78135603301f57ee9bea0f65fb0ae8c9e7","observation_id":"30f37a69-a2b8-4e31-bee3-e631127021ec","resolution":{"observed_at":"2026-08-14T12:02:23.222591Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.199272Z","title":null,"venue":null,"work_id":"c3bc2b78-ccbe-42b4-bfc8-36dc9dc2e2bd","year":1983},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.470246Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:8bc1e9fb192102e92b3ad1c830c4cb52d133a4e8bdbca1d0dd9b5adf2729dfe8","observation_id":"c3443dbf-e049-495f-ab50-17529a6b8abd","resolution":{"observed_at":"2026-08-14T12:02:23.204502Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.186472Z","title":"Bauer, R","venue":null,"work_id":"04c01bfd-41ed-4062-813a-df8fe5c652a5","year":1998},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.475995Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:ecf3ef40726682e548930f81f6dd353a21e8f22181c467eb7ec00c39de8def1d","observation_id":"3164ddc5-e70a-442e-8966-b664b8894633","resolution":{"observed_at":"2026-08-14T12:02:23.190491Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.479916Z","title":null,"venue":null,"work_id":null,"year":2010},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.479916Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:9745a334786b3a419891758ea029d8b3f0beab48caf72f77979445c2c83814e1","observation_id":"8ac5ea32-6957-4e76-bdbf-5faefc8b52ff","resolution":{"observed_at":"2026-08-14T12:02:22.479916Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.165307Z","title":"Wittmaack, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 380, 57 (2016)","venue":null,"work_id":"55cb68f2-2af4-45ef-80cf-9040c8aa5236","year":2016},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.487354Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:3ebcdf4393f1bac2d63e72848e6a6930217a61a69dfa6bc99a0612c144505750","observation_id":"e907ae11-4401-4579-977a-b2ac4fd3dc44","resolution":{"observed_at":"2026-08-14T12:02:23.169283Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.151110Z","title":null,"venue":null,"work_id":"cd7f77ea-6e6f-4003-999e-0b1265659fe6","year":2017},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.491860Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:0df799b9a617f72bf87773739f80a1b76861ae9b14aa715d6198c4a47761d787","observation_id":"97493d5c-2174-4c73-8672-a73448a5d1f8","resolution":{"observed_at":"2026-08-14T12:02:23.155519Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.136165Z","title":null,"venue":null,"work_id":"b0733e15-95ca-4c60-86b1-446ad4546f0b","year":2013},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.496069Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:7edf0e2cd5944c2849d4ca41cead9ee7c6d16f7e4c48b3ca2732b2a0fff3d097","observation_id":"f4a5aa93-82c4-42e1-98b9-1db873c6fd0e","resolution":{"observed_at":"2026-08-14T12:02:23.140927Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.122796Z","title":null,"venue":null,"work_id":"de4f52cc-eabb-43ea-aa8b-c307a20e0c85","year":2018},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.500196Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:49390ae28980cf4c9eaf2d4a65110b61f83aaf9e014699f88e0c2016720592bb","observation_id":"f5c08578-b9e3-4029-9978-3ad78812a5a6","resolution":{"observed_at":"2026-08-14T12:02:23.127404Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.110144Z","title":null,"venue":null,"work_id":"88e80fa9-a512-4893-bf74-245c056e6512","year":2015},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.504764Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:bbf301fc74ece104dd74889f7dfab164f319afa9bf14050c07f2d927503bc49e","observation_id":"441904a1-3786-4f89-8a2c-d76071c31ed5","resolution":{"observed_at":"2026-08-14T12:02:23.114436Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.096877Z","title":null,"venue":null,"work_id":"0f100d68-6136-47fb-9a33-be8723d98de1","year":2012},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.509181Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:ee96cf7f92c30b8b1bc2c4de3df1516e430f3dc7fff6920a82fd1041bf68131c","observation_id":"b7721965-8b64-4830-b09f-2465d40ab7cb","resolution":{"observed_at":"2026-08-14T12:02:23.101745Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.082859Z","title":"Draxler, S","venue":null,"work_id":"d8293b4e-c1f5-488a-b93a-6f11570c3631","year":2004},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.514408Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:caa022cf493cf8474a02a638018b276b20ec0d497bd0cb2da9db303571e3155d","observation_id":"351e51e4-3973-49dc-a920-5a87e763554a","resolution":{"observed_at":"2026-08-14T12:02:23.088202Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.070802Z","title":"Ro th, C","venue":null,"work_id":"cc25deac-5ea4-4ed3-9ac8-074e042459d6","year":2018},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.518924Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:a7010511cb84302f28a127f99184262a3df4fa19c37ca993f1b11f4822d45b38","observation_id":"34a2d928-9229-497f-be8b-d76a321bf1d9","resolution":{"observed_at":"2026-08-14T12:02:23.075134Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.057126Z","title":null,"venue":null,"work_id":"2e1a5b5b-e9d9-4818-a20d-a27ff3f4d906","year":1991},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.523481Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:0bc62ef962f4f03673d23121a5ab830592f21e5f78c41bc14c7f8d7c47ea3403","observation_id":"50cdedbb-5e2b-41a7-9456-b2d5c8f5a227","resolution":{"observed_at":"2026-08-14T12:02:23.061719Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.044044Z","title":"Sigmund, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 135, 1 (1998)","venue":null,"work_id":"4082476f-9071-4874-93f1-b5a7ef15c294","year":1998},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.528229Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:773c0b8873d6bfb3e6068963ddeedc2fb34147f356e230a7683a6e8071c56b48","observation_id":"0e0558e1-6e3f-489d-92df-60f18b6e7b40","resolution":{"observed_at":"2026-08-14T12:02:23.048048Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.032247Z","title":null,"venue":null,"work_id":"d8ba4a55-3778-4649-a46d-d1ca9b773747","year":2008},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.531992Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:501b268e82b74abbcda084bec653198eaff9f7602450958d8025dbfeb0008a20","observation_id":"98e648e8-d6f8-49f6-ab05-cf7907b4f9cb","resolution":{"observed_at":"2026-08-14T12:02:23.036198Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.021216Z","title":"Primetzhofer, Physical Review B 86, 094102 (2012)","venue":null,"work_id":"6357698d-ae10-4713-9356-4ff2297a0f1a","year":2012},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.535924Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:17f47e88a758660994b20ad02664617644846cab08b5b3ad31bb1f6391c12248","observation_id":"ff157f58-5c7d-4a6d-97fb-addef6345081","resolution":{"observed_at":"2026-08-14T12:02:23.024939Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:23.009935Z","title":null,"venue":null,"work_id":"36e84d90-e0fa-4506-93c3-13bd25658977","year":2009},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.539757Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:637d2036d923d078bd63f8f6323b6bda945ad2f34c4959634ed3eeaa6f6825f6","observation_id":"734c5f3c-cd72-4317-b541-7c2310a40c2e","resolution":{"observed_at":"2026-08-14T12:02:23.013803Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.998313Z","title":null,"venue":null,"work_id":"87e62bbd-b4e8-42e4-bc33-635423f967a4","year":2002},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.543391Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:ace76d3bc8544001db26a72ddaf6603e942fb1cfbd5d8ad327bedf276e732864","observation_id":"d4d77b0c-b34a-486b-9fe7-dca27cc3a1fa","resolution":{"observed_at":"2026-08-14T12:02:23.002211Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.987104Z","title":"Bruckner, D","venue":null,"work_id":"1af48078-518a-4dda-8908-46d589ab2283","year":2018},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.547778Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:be2007f272680a1f0d931e5fca5119a388900e8b3bf32757a88b853a30589bab","observation_id":"b8ef2396-111d-4832-bf10-4f248bcc6b8b","resolution":{"observed_at":"2026-08-14T12:02:22.990946Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.975950Z","title":"White and R","venue":null,"work_id":"dd03dabd-5008-4024-a47e-132f038c755b","year":1969},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.551608Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:557d0e745956eafea471ae8a1078e0e1a8388e6c4fc815d9490baecbc5965b8f","observation_id":"88feaede-4df9-402a-aa7b-205fb782259b","resolution":{"observed_at":"2026-08-14T12:02:22.979810Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.965108Z","title":"Mertens and T","venue":null,"work_id":"88c0039f-01ea-40cf-bde1-927dec2a58ab","year":1982},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.555414Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:cd7f2e69329f8b4a286df4b63d73eff869de209505ba482be43f1c71310345a7","observation_id":"8981a16a-a822-4870-95c1-1c513356a135","resolution":{"observed_at":"2026-08-14T12:02:22.968847Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.953813Z","title":"Semrad, P","venue":null,"work_id":"b303bae2-a5ac-43e7-82be-a74c57fb6b16","year":1986},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.559389Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:7081655ee264a8072a465beeb68fd7b359e37438f4693f4672ed4845c3fc3e0a","observation_id":"b698a205-a2c7-4e72-a6ff-b6e5e0e478aa","resolution":{"observed_at":"2026-08-14T12:02:22.957644Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.942096Z","title":null,"venue":null,"work_id":"e76b9139-71c4-4fa4-902c-57400f0fd64c","year":1989},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.563092Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:7d33ce59902aa908049c1c77de9971f2b64a93fc80ae019ac7229d24f2cd6a2a","observation_id":"7a2846ce-75ed-465b-b540-e6a26fa6a220","resolution":{"observed_at":"2026-08-14T12:02:22.945746Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.930952Z","title":null,"venue":null,"work_id":"2f0afbff-cc5a-459d-aa6f-622a9beedd9a","year":null},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.566712Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:b3fb9abb19c80aaad87019bce4909d690f60001ada89111f8e647556892efa58","observation_id":"e7a70c0c-cb09-463d-ad95-384d0b5e6c3f","resolution":{"observed_at":"2026-08-14T12:02:22.934771Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.919014Z","title":"Goebl, D","venue":null,"work_id":"11d68fd9-7117-4cbd-98d5-ee56807ee5f4","year":2013},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.571052Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:01962d41219c40eae13c19f1a3c43aba5bda1dedfebac0c4a35d6a6b2270a23c","observation_id":"6f989983-f27b-4cad-a44a-9e15bebd4af0","resolution":{"observed_at":"2026-08-14T12:02:22.923245Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.907164Z","title":"Isaacson, New York University, Document (1975)","venue":null,"work_id":"147ebead-b60b-4b37-bcee-2f071dfaecc1","year":1975},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.574804Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:524d1f3d0a9702fcd50fbb40dc03f28c9b5290fe7f7cfd85080d191a4e799dcf","observation_id":"851bdbc0-e119-4f04-8b98-88b64c11a9ca","resolution":{"observed_at":"2026-08-14T12:02:22.911604Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.894551Z","title":null,"venue":null,"work_id":"e8c55f1e-1a51-490f-ae16-26aa236d4823","year":2018},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.578954Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:440d7211a0c79c6c684a73714d3cf3d652ba0c1398e265c34dae12ee53d27ecf","observation_id":"3a569005-2a75-44f6-87bc-b864d665e178","resolution":{"observed_at":"2026-08-14T12:02:22.898448Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.882101Z","title":"Mertens and P","venue":null,"work_id":"3305a45d-1f6e-4dc0-8493-f31d1740b05f","year":1988},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.582648Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:8594feeddf6f99a15661dcc8d46b00e37649d65c289cd70648be9a9944051dc2","observation_id":"f632a95a-627b-48d1-98a2-1d737731c96e","resolution":{"observed_at":"2026-08-14T12:02:22.886487Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.870176Z","title":"Hobler, K","venue":null,"work_id":"6e0f1271-2553-451f-a02b-fb1b4da24dab","year":2006},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.587331Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:88bbd25d31a66c3fc83c57fcbb0a047a396dfa6a32bf1d5295bc103642b5ea5d","observation_id":"7104f8e1-7fa7-44ad-a7ae-ca16d7c3c604","resolution":{"observed_at":"2026-08-14T12:02:22.874457Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.858934Z","title":"Eppacher, University of Linz, 1995","venue":null,"work_id":"4d71eeba-373e-44c0-bb69-6eb21519c335","year":1995},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.592350Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:286ce4b14d4d7162df9f84fc344706d56aa6f774bb64625cf4b39f25f9de9285","observation_id":"6d5dc85b-814d-4249-bd48-9f68a436cda3","resolution":{"observed_at":"2026-08-14T12:02:22.863093Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.846662Z","title":null,"venue":null,"work_id":"e2448436-c0b2-48ea-8a3c-bac0d98ef4b0","year":2009},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.596146Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:41f737647a7f07ff606491b132c092adf32797dc37994ccc867b04bc42218842","observation_id":"331b6d8d-8b46-4f7d-ac0e-848b6af1983b","resolution":{"observed_at":"2026-08-14T12:02:22.850614Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.834716Z","title":"Konac, S","venue":null,"work_id":"4aca6563-10a2-46e2-9402-16d775f712de","year":1998},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.600115Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:f7bcb1420fd90ebd14c1a027d58c8e6372113ffae4a405bbd2eeafadb00a9d59","observation_id":"da40e2ac-e75e-42fb-816a-a7a7cd57f80a","resolution":{"observed_at":"2026-08-14T12:02:22.838965Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.823233Z","title":"Schiwietz and P","venue":null,"work_id":"e39e3606-1db7-4069-af2b-ce8c476bd96d","year":2001},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.604354Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:26ceeb956ca20b46e160a8bf928dc1318262bd603868511d3cc8df06d3452098","observation_id":"921d02ce-fd89-40fb-a8e3-9f10f35e580e","resolution":{"observed_at":"2026-08-14T12:02:22.826916Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.811534Z","title":null,"venue":null,"work_id":"09fbbee1-65b9-4d00-be74-8d4ad2a59689","year":2011},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.608332Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:4c09bd7811950bb486ccefd47a15086efe94bff9cdb511cf07253904c8fd1b77","observation_id":"65935586-56f5-46c6-914e-60a0ea8a621e","resolution":{"observed_at":"2026-08-14T12:02:22.815227Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.799895Z","title":"Souda, M","venue":null,"work_id":"0d8b3a62-58c5-418d-8dd7-9eaaa7d4898f","year":1987},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.612206Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:783dc0a6f6811f266ad12b0dd25e534ed5546a98bc86e1595a272b7ec4ce6184","observation_id":"c2812738-3390-4246-9bd6-b689db1a00f0","resolution":{"observed_at":"2026-08-14T12:02:22.803739Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.788100Z","title":"Primetzhofer, D","venue":null,"work_id":"670446f8-a3f0-4a72-91e6-23284788e6f2","year":2013},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.616218Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:20c321c9aaefea2493aec25a7ba9564ab312627d3a2200dcd94defe2343ee796","observation_id":"77092d81-f694-46f0-87e1-a3074069c36d","resolution":{"observed_at":"2026-08-14T12:02:22.792222Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.776122Z","title":"Bauer, D","venue":null,"work_id":"68a9f64e-be9e-4aa9-8c52-11651dd3938b","year":1985},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":55,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.620866Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:ef6690b8f22854f0ffe275fae9d43a1e47dee639fb02a5f072f090cb22372381","observation_id":"18d22cc3-7b4d-4c33-af0c-b919f1baa3ee","resolution":{"observed_at":"2026-08-14T12:02:22.779968Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.764086Z","title":"Goebl, K","venue":null,"work_id":"d3fa2c39-4bd3-458d-9cbe-1d568069348c","year":2013},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.624662Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:6bddbab26f34d43635cf5269ec0c96f88bd0564590fd13f36deb1d1f524ef88b","observation_id":"e30b3e54-ad6c-4386-81ab-98377f605c5a","resolution":{"observed_at":"2026-08-14T12:02:22.768111Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.748424Z","title":"Riccardi, A","venue":null,"work_id":"32bd7242-fef9-4441-9e0b-c8ad729b16c8","year":2016},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":57,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.628574Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:7ae87728ad1e7d61099b19da50c62878c70cec573ab68688ef97544474f3cae2","observation_id":"fbb78dbe-cba7-4c84-a792-592b5480bc01","resolution":{"observed_at":"2026-08-14T12:02:22.753430Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.735588Z","title":"Pokrant, R","venue":null,"work_id":"c602f143-0fef-4e83-a667-28d32a3a8f18","year":2006},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.632229Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:d78bb6370e1115357f7f730e6b5f559e2cd9dfa0bd8b5a4fc4210da065a148f3","observation_id":"66ab2bbd-8981-410a-818e-64227cc01500","resolution":{"observed_at":"2026-08-14T12:02:22.739698Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.722695Z","title":"Asayama, N","venue":null,"work_id":"a7db84e9-f9c4-42ae-b774-744a972bd394","year":2008},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":59,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.636476Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:2a924a247b64d5de1f5c54b1837d9aac82d35a788cca2ae4af2d25be54e721bb","observation_id":"57ecd76c-70c0-4234-884c-07deb1196e40","resolution":{"observed_at":"2026-08-14T12:02:22.727203Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.709541Z","title":"Verleysen, H","venue":null,"work_id":"febe33bf-d2fb-492c-8611-7e4e2d618703","year":2010},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":60,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.640421Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:08dcbbf9be919dcd0549567c9102214834cf0cff3c5087586f731d5adf687b68","observation_id":"a1aa7614-5eb2-4f60-9623-0a1da41cf3d7","resolution":{"observed_at":"2026-08-14T12:02:22.713797Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.696776Z","title":null,"venue":null,"work_id":"c8225175-524c-4f7f-ae7c-f042c3779e8b","year":2014},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":61,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.644928Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:f1db16b9046cec3ec5bbf174148921b8f0ee19f6e58b5524b8b918ce1252ace5","observation_id":"be9e6e15-e932-4718-84d6-84ab304361f8","resolution":{"observed_at":"2026-08-14T12:02:22.700725Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T12:02:22.680235Z","title":"Bisi and C","venue":null,"work_id":"07bb2e0b-7b22-4182-9cb3-0a848e004402","year":1981},"citing_paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system","version":1},"reference_index":62,"source":"pdf_text","source_observed_at":"2026-08-14T12:02:22.648884Z"},"links":{"citing_paper":"/paper/1908.07767"},"observation_digest":"sha256:aec8c77f118f64ea39e2aa5a43236b6d19d4dd4156f0c51bcd85b5516574f9a8","observation_id":"e0a7ca25-51ac-406f-b516-02cf39c1f2b7","resolution":{"observed_at":"2026-08-14T12:02:22.686992Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"1908.07767","last_updated":"2019-08-21T09:37:00Z","latest_version":1,"primary_category":"physics.atom-ph","snapshot_observed_at":"2026-08-16T03:37:26.371552Z","submitted_at":"2019-08-21T09:37:00Z","title":"Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system"},"reference_resolution":{"displayed":62,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":25,"verified_exact":0,"verified_fuzzy":37},"total_outbound_references":62},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-15T06:32:42.880941+00:00","source":"crossref"},{"observed_at":"2026-08-15T06:32:39.529945+00:00","source":"retraction_watch"}],"thesis":"As of 16 August 2026, this Paper Citation Record lists 62 of 62 outbound references and 0 inbound Pith citation observations for arXiv:1908.07767."}