{"as_of":"2026-08-16T08:32:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:0f7455027d3dc51808097aa274c0ce48f356e7b3f00910fbf1ff6bab158c587f","coverage":[{"denominator":78,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":78,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T11:19:59.206017Z","state":"measured"},{"denominator":79,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":79,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-16T06:30:59.297886+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T11:19:59.147034Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"pith","source_observed_at":"2026-08-14T11:19:59.242537Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"cited_work":{"arxiv_id":"1908.09412","doi":null,"metadata_source":"pith","pith_arxiv_id":"1908.09412","snapshot_observed_at":"2026-08-14T11:19:59.242537Z","title":"Parasitic conduction channels in topological insulator thin films","venue":"cond-mat.mes-hall","work_id":"2e6bde58-ea03-4463-811a-1b8dbfd77c87","year":2019},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":70,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.147034Z"},"links":{"cited_paper":"/paper/1908.09412","citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:d587527a02bb26d29b25c10e7205e3bf8a6f62d290a5f7c7ed86b5277c95d199","observation_id":"5a76b8c3-f89d-4ec2-bc6b-8343856d2089","resolution":{"observed_at":"2026-08-14T11:19:59.249150Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/1908.09412/citation-record","integrity":"/paper/1908.09412/integrity","json":"/paper/1908.09412/citation-record.json","paper":"/paper/1908.09412"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.316402Z","title":"It can be prepared at room temperature by depositing Te on top of a re- constructed Si(111)-(7×7) surface","venue":null,"work_id":"7335d309-e610-4d02-9e4f-1c80cdea92ea","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.866293Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:a13225365566520ed15cd2836b74e009afc96d9c090d5d2f61cfe4a1d58c1f8a","observation_id":"ab17ff7f-5891-4ce6-8bee-60898ec719ed","resolution":{"observed_at":"2026-08-14T11:20:00.321858Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.362232Z","title":null,"venue":null,"work_id":"48b660a2-7525-4161-9239-a4e1367fb0af","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.850206Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:75ede85112807fcca448a2c7145f89fbe0eb264f683ed8ceafc3e7443ead9dd1","observation_id":"85dfb73f-00f7-4c24-941b-b41dc72c6db2","resolution":{"observed_at":"2026-08-14T11:20:00.366837Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.347557Z","title":null,"venue":null,"work_id":"b9da62e6-452b-465b-949d-f05c22658eb0","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.855713Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:58743a3d025fb0a3819d5d22a1870310541f1e8c9abc3c2f09d4b5ebb2e6ff06","observation_id":"a237b9ed-b761-4c82-8bee-57c5362bbd38","resolution":{"observed_at":"2026-08-14T11:20:00.352285Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.420460Z","title":"This is immediately obvious from Eq","venue":null,"work_id":"7672f731-bdf0-44cc-9b74-4ac027c5865c","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.829852Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:45650cd752419d2a8f43ec1e5cf351a98e7499a8f4d3d785b1a863dc7dfda667","observation_id":"e82662ff-0868-436b-9bae-19115f9fb2aa","resolution":{"observed_at":"2026-08-14T11:20:00.425107Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.406058Z","title":"4, only non-degenerate doping levels in the TI have been considered, all of which apparently lead to a downward band bending","venue":null,"work_id":"1c053dad-0e46-44c8-b0bf-318407295b20","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.835112Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:f967d8cc1a76f5256680c9f69c63be495ded86d9e1dbdc26e53338ee22a91c2a","observation_id":"dade6cfd-d89e-4bcd-b2ee-1ef681414473","resolution":{"observed_at":"2026-08-14T11:20:00.410623Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.391552Z","title":"BiSbTe 3, which was studied extensively in ref","venue":null,"work_id":"effacb4a-b52d-42bd-b404-316a99f5b066","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.840072Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:b199d924c8a7ed720d63b75807ce3e7bfb37c084dc7c8f4a8f8ff78a466706f3","observation_id":"df4a2cf7-7d4e-4b7a-a4e4-5326299a48e7","resolution":{"observed_at":"2026-08-14T11:20:00.396305Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.376391Z","title":null,"venue":null,"work_id":"4ab02261-094c-46de-8a78-825b19d58a39","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.845338Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:df6b8444017e954f2a273a1109b1950d11b2dd85e081d9272914620098e29661","observation_id":"13135b80-9a0a-45ef-be6a-86cb63898292","resolution":{"observed_at":"2026-08-14T11:20:00.381993Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.332935Z","title":null,"venue":null,"work_id":"38355f35-f9d4-4921-a632-92142fcb17f8","year":2004},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.861456Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:8d82a8928cfb6d2cf390b4d76fdf00d3fcb1bbeac7fa223a6bc8ad5462b12100","observation_id":"2bbee2b1-23aa-4321-8f4e-726fbb0abe49","resolution":{"observed_at":"2026-08-14T11:20:00.337509Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.300763Z","title":"In fact, this reconstruction forms the most common tem- plate for Te-based van-der-Waals epitaxy","venue":null,"work_id":"4e5ec27c-54e4-4aa7-8f83-bf1aeb02fa36","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.871034Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:0360fffdcd5a73967de28e83e70f260ab19534199a76be4bdd7190400889a42b","observation_id":"24333a71-94df-4c9c-b2da-7928d11ba47c","resolution":{"observed_at":"2026-08-14T11:20:00.305643Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.285124Z","title":null,"venue":null,"work_id":"c57da171-5f87-470b-8ef8-f540fd9a9bef","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.875300Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:ebf4274707ad9ea38f9036bcb863537797d8119ed8bbe777a0fdbbe7ad0c4911","observation_id":"e51e93f9-6036-4044-a644-c312acbf415f","resolution":{"observed_at":"2026-08-14T11:20:00.290674Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.269362Z","title":"The conductivity of this surface reconstruc- tion is reported to beσBi√ 3× √ 3 = (1.4±0.1)×10−4 S/□ [6]","venue":null,"work_id":"43a779c7-7392-4369-bace-6e0806c2d635","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.879700Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:c1aca5ce6b9f45a5463304fb50313fb56236e5aa82accb2a95f903240257b590","observation_id":"01c725b8-31ee-4dcf-b2bb-c7e137a4ceb3","resolution":{"observed_at":"2026-08-14T11:20:00.274881Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.253846Z","title":"However, exact values for the surface conductivities of the respective (1 ×1) and (7×7) reconstructions have not yet been reported in the literature","venue":null,"work_id":"e5c5a1be-7c27-49e2-856c-883af9e24646","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.884332Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:2da285c5d2894376a95a1231e00c7e9526e6d8e164f1e2b61d0c8e90f27a455b","observation_id":"529bb9e3-b4e5-498c-b4ba-5cf23112b55c","resolution":{"observed_at":"2026-08-14T11:20:00.258727Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.238138Z","title":"It strongly depends both on the mate- rial system and the preparation parameters","venue":null,"work_id":"77b59601-af8b-492c-b56c-b6a78557d4f7","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.889245Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:d190a890f4331fa4ef21e908211ade17334462a8f00d8393660d5d74858232e0","observation_id":"3d1e02b0-ee44-450e-a4e4-5a5155fa44a7","resolution":{"observed_at":"2026-08-14T11:20:00.243559Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.222048Z","title":"10, the band bending corre- sponding to case A is shown","venue":null,"work_id":"fb978ef1-eb7a-423d-8db1-80e4f42398bc","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.894039Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:104adbb6b0890d72498257466aacf0d17143f5a4d57b1e04d8eed8a7005c95ee","observation_id":"9b67b3c2-9434-4b97-ba17-aec77ae493e9","resolution":{"observed_at":"2026-08-14T11:20:00.227851Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.206391Z","title":null,"venue":null,"work_id":"fb037542-06ae-4324-8b3e-08665662c43b","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.898558Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:529863216eed695cb91167e4776f01ce30922c246e846d34497ab9f3eb998cf2","observation_id":"0b25ae49-f862-4a0f-98e9-9b4e2977e631","resolution":{"observed_at":"2026-08-14T11:20:00.211285Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.191549Z","title":null,"venue":null,"work_id":"a55636a4-994c-426a-b0d6-d776160f516e","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.903260Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:8279213bfeb5a20481f67be6f39b320558feb3d455bdbcff5e4832c7e1607adf","observation_id":"ee30cffe-85fe-4dc0-b8f0-a8364aa09ee1","resolution":{"observed_at":"2026-08-14T11:20:00.196252Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.176462Z","title":null,"venue":null,"work_id":"0cb521ec-68ab-4f46-aaee-c86d50a2d99b","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.907684Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:d509b363a12d5b546ee54967593fd414c36052c45589058a025c3a9a5b182cb5","observation_id":"bbbe0dda-51b8-4685-9c4d-ed034ed87b54","resolution":{"observed_at":"2026-08-14T11:20:00.180880Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.161289Z","title":"⏐⏐|vtop|−|vbottom| ⏐⏐≤ ∆, case A is used","venue":null,"work_id":"3c589428-07ca-403c-ba6c-fb72d38caa6d","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.912086Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:c09f7a022874cf3e52ed47ab3af0f9f1f292ecf508c492b719214b85864be4fa","observation_id":"6cc071c4-9d47-4d51-b369-d124a24780d6","resolution":{"observed_at":"2026-08-14T11:20:00.166231Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.145901Z","title":"Hsieh, Y","venue":null,"work_id":"de2a0ef1-2d7d-447f-9c64-2ad5605d48ba","year":2009},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.916428Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:d039c9b37af4df47af2956f249c0f0ee2caf30e2803cb10b29a334aaf96acd80","observation_id":"9bd4edff-1224-4463-bc5d-ecc07a57ed6a","resolution":{"observed_at":"2026-08-14T11:20:00.150948Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.130778Z","title":"Roushan, J","venue":null,"work_id":"6d7d614c-c372-4db2-877b-b0da41e3a01b","year":2009},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.921044Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:69d6ba0219a91e50f353d9a5c3348cb0047ebe6b538f4e0e1d7f62efe03df2d1","observation_id":"296014ac-8d28-44a1-a6ee-5052ea04a4d3","resolution":{"observed_at":"2026-08-14T11:20:00.135420Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.115083Z","title":"Zhang, C.-X","venue":null,"work_id":"4144a3f7-3cb3-4913-bbf0-0fc0af8c0d8e","year":2009},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.925609Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:912f063c11ff74ef725be99974dd3982c16660195403133b94444de7cdd0ad19","observation_id":"a0c02662-541b-42fd-9e16-d3f80d398944","resolution":{"observed_at":"2026-08-14T11:20:00.119919Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.097267Z","title":"Barreto, L","venue":null,"work_id":"76714a7a-eaa4-4d77-93aa-dd9157f30d96","year":2014},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.930129Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:cd3c2848c23809527e612530ea2ca9cf114ed94a38aa3e7bba4df3670f3157de","observation_id":"8ebd1acb-4b56-4bfb-b491-dca1e0f68d2b","resolution":{"observed_at":"2026-08-14T11:20:00.102765Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.078791Z","title":null,"venue":null,"work_id":"7cb0835d-980a-4823-99c0-ecd9f1cbae25","year":2010},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.934638Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:a004066445df12dc53bc5ef5bff2204f702d7786c89e445080dc286911faecdc","observation_id":"1881591f-3be4-441b-8293-a16d99e13632","resolution":{"observed_at":"2026-08-14T11:20:00.083998Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.061376Z","title":null,"venue":null,"work_id":"6b4a9e4a-381d-4487-a59c-fdc116093889","year":2015},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.939937Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:805bb977fa816e93ca21264352897e26ace1ccc2458962677b7a9f21403a11bc","observation_id":"0fb693f8-afb2-46eb-9f34-0bd0bb31f7aa","resolution":{"observed_at":"2026-08-14T11:20:00.067122Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.039934Z","title":"Miccoli, F","venue":null,"work_id":"31e796e8-b05e-49f3-8733-1294cfe1be7c","year":2015},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.944670Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:630377c0eb03b3fa797a94667fc94479c1f7683a32e27595e328ec9356b253ce","observation_id":"70cf2cd8-2247-41e1-9d64-7962133d537e","resolution":{"observed_at":"2026-08-14T11:20:00.048792Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:20:00.007298Z","title":"Voigtl¨ ander, V","venue":null,"work_id":"f4b0901c-92cd-4d2b-8db2-240cb8177c51","year":2018},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.949079Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:0124499febd984fd81f46c4813ae0586add2b9d7255727ec34107fc80491e5b4","observation_id":"adcf8586-c0cd-4e0b-a085-0872774da879","resolution":{"observed_at":"2026-08-14T11:20:00.017140Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.989887Z","title":"Hofmann and J","venue":null,"work_id":"8e914d4c-e81c-4b36-a27a-eeb6c0d15b82","year":2009},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.953653Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:6c3b0d6ec6f59cb1a8a0259a6a18b9760b62e5558ed2c2608ca56e6bca741570","observation_id":"70d313c5-93d0-429c-979c-c2ebd87149ad","resolution":{"observed_at":"2026-08-14T11:19:59.994365Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.974746Z","title":null,"venue":null,"work_id":"4a791370-d9d2-4d79-82d7-f269f4dac60d","year":2017},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.958161Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:add93555fbc10da4042a9b8c41aaaf33430b6c4f99b8cf3d0d29f49c4915bb32","observation_id":"b7a6f056-ba02-4ad5-b938-9f87c7c8322f","resolution":{"observed_at":"2026-08-14T11:19:59.980267Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.960330Z","title":"Durand, X.-G","venue":null,"work_id":"c4c05b0e-20f0-4658-bbae-30142392d11e","year":2016},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.962735Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:76932f21c10c92bc43d1f3cb0b98942928a2efad712dd430d8431b6bf094f622","observation_id":"55e6161f-b1ce-4a12-9a0a-e2ffacfe90a6","resolution":{"observed_at":"2026-08-14T11:19:59.964982Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.945234Z","title":"L¨ upke, S","venue":null,"work_id":"10c92eba-5e94-4e98-b2e8-40a7bec4e9f1","year":2017},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.967176Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:79127a7514ff2016bb2a13b465199fc6315181941ddbe4bacd7659621a8d08a3","observation_id":"ff9a6943-84f5-4d0f-95d2-78c418d0dfff","resolution":{"observed_at":"2026-08-14T11:19:59.949708Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.929660Z","title":null,"venue":null,"work_id":"400942c8-30ea-4e71-835a-7bc2bf2167b0","year":2012},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.971480Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:c3366e408bfdc90bc3b1d77c6331133b0a3caf55814fac8381dda7238bea65f0","observation_id":"72c973d9-8069-4617-8bbb-94651779e9c3","resolution":{"observed_at":"2026-08-14T11:19:59.935253Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.914756Z","title":null,"venue":null,"work_id":"827d3467-908e-449e-bcf7-8805c0dcf021","year":2015},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.975994Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:aca0f2a818228b2156a24f61de97d6f2c0ccc0f785b18eb857a22255cf8706f5","observation_id":"fa4628d7-4c89-4e9a-a07e-4f26141c8891","resolution":{"observed_at":"2026-08-14T11:19:59.919266Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.898537Z","title":null,"venue":null,"work_id":"f97aa3fd-2be9-4263-a389-b17ba919654f","year":2013},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.980207Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:5703dbb5677fa7301a4fe4191b3a448064e41bb7cd1c4a3969e98c7b068bd415","observation_id":"0d376528-1f31-4ef7-bdd1-0b121e18a578","resolution":{"observed_at":"2026-08-14T11:19:59.903101Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.883731Z","title":"Lanius, J","venue":null,"work_id":"68b92658-1489-4480-8755-eb6f7eb35c21","year":2016},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.984500Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:4b4b6a238e8a8935872806ab7c3b85175fe989d2870c422f8f4b09231b3978a8","observation_id":"2421a827-67af-4ffa-ad20-b7cc736758ed","resolution":{"observed_at":"2026-08-14T11:19:59.888315Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.851769Z","title":null,"venue":null,"work_id":"72eab5ba-dec6-4d4a-9a42-62330f25c0ab","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.992918Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:e9ae4066abe14c61405e737f15ccd26d93fbcebe0daf75454c71e8f3a6db9457","observation_id":"cff10cfe-7387-4d93-be42-9963851848af","resolution":{"observed_at":"2026-08-14T11:19:59.856084Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.837306Z","title":null,"venue":null,"work_id":"b4d1ea2d-1b5e-43ec-8654-6111bbee7211","year":1965},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:58.997194Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:158a8634bea44af9dc5ec762f77eb09ea5df4d56c71b574fa6b56c3a7ef23927","observation_id":"e8442869-9118-441b-b5fe-c0c3502ccccf","resolution":{"observed_at":"2026-08-14T11:19:59.842521Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.001492Z","title":null,"venue":null,"work_id":null,"year":2005},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.001492Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:c5a658b68371d23fe4a3b57313cf46315396fc7f69d42989e41343421f25496a","observation_id":"479e65a6-d1b8-403c-ba50-1f0b63aa582d","resolution":{"observed_at":"2026-08-14T11:19:59.001492Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.813156Z","title":"L¨ upke, S","venue":null,"work_id":"c631e23d-35e2-4803-bea6-53f623fcac33","year":2018},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.005843Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:91398637c20166200be025a437e92bbdfa70b16308383c06f791bdb8f285851a","observation_id":"62cb9711-b7bf-493a-863f-cb60ab55cb7e","resolution":{"observed_at":"2026-08-14T11:19:59.817664Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.798408Z","title":"Heinzel, Mesoscopic Electronics in Solid State Nanos- tructures, 3rd ed","venue":null,"work_id":"49aefecf-3c2a-4a03-8e17-f40ad29492d1","year":2010},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.010191Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:74b06305dcf853ce2bc8f254a2cdb1526a5be55480ece2aaed82c85df3b532ca","observation_id":"c1e2f7d7-7de2-4c61-9922-2549be6574a5","resolution":{"observed_at":"2026-08-14T11:19:59.803336Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.784074Z","title":"Arakane, T","venue":null,"work_id":"8e8f92f2-ae62-4f15-b5fe-6905e421fd32","year":2012},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.014436Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:986e59a19aef1a411f43ce23d8d92a8a987ad0e695e51b62086a44ecf265c41a","observation_id":"f8c6e06e-5ed7-4e41-8b39-6798d2f5860f","resolution":{"observed_at":"2026-08-14T11:19:59.788630Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.754463Z","title":null,"venue":null,"work_id":"d077eec0-1178-438c-ac1d-a49b4f2c8452","year":2011},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.024723Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:2db2817b6d89765bab5fb2d89b0ca7374959fd9db3bf526250f52881413adc16","observation_id":"54bb7f93-cb88-4286-aaf4-498926cb71fe","resolution":{"observed_at":"2026-08-14T11:19:59.759103Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.697293Z","title":"Brahlek, N","venue":null,"work_id":"c026d692-8d84-47b7-be42-4685b37e6458","year":2015},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.042332Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:0ae2a939c96457047d2b4931ca51a583bfee46dff9e76b874a1cdc979521410e","observation_id":"f7f1cbdb-da9e-4c88-830e-0a25f9f6dd20","resolution":{"observed_at":"2026-08-14T11:19:59.701746Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.683147Z","title":"Brahlek, N","venue":null,"work_id":"c8c908f6-18b5-45b9-a9cb-a815d1ad433f","year":2014},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.046727Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:bb40b742015f2fc5af41cf9a8bfcd4b4c36da91e615bfa3c4183c33f1d956e22","observation_id":"da49e048-a8f5-457c-9fbd-d685e3add13f","resolution":{"observed_at":"2026-08-14T11:19:59.687729Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.668014Z","title":"Kellner, M","venue":null,"work_id":"d43288d7-7383-4b58-b816-4942e3c563b9","year":2015},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.051076Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:53c8deac210b5fe52220bd5f0b207d94dd280ff2fbd77b5acc69f2dc553ea56d","observation_id":"cb5fad21-1989-44f2-a138-7a5088f2a073","resolution":{"observed_at":"2026-08-14T11:19:59.672589Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.654541Z","title":null,"venue":null,"work_id":"ed8ed75b-b72b-42d8-8b75-4da5f3982712","year":2013},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.055429Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:75605663079fede419ba50f66ba11e7b359fcac6b274a23e0c6505501a2eadee","observation_id":"ed695a21-6f26-4bb5-a739-64bfa5b2c22d","resolution":{"observed_at":"2026-08-14T11:19:59.658858Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.639536Z","title":"Weyrich, M","venue":null,"work_id":"cbc80376-60e7-4b2e-a5f4-aa24d8c90f70","year":2016},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.060252Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:72ca7213e09122e1865f4dac85a9536614a0a8a72168108d29c727f0fe0c6136","observation_id":"e1360c53-324e-46e6-b214-63d4ab53160b","resolution":{"observed_at":"2026-08-14T11:19:59.644951Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.626047Z","title":"Zhang, C.-Z","venue":null,"work_id":"17de37ac-5a76-4271-835d-87447de1451b","year":2011},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.064965Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:5636ab5de8a865235fe241d08cf58ba677d83efc547871f90cd1ea1e251bbbb2","observation_id":"3a78b9ee-df11-46cb-aed8-2ec342d45027","resolution":{"observed_at":"2026-08-14T11:19:59.630437Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.610557Z","title":"Satake, J","venue":null,"work_id":"47cfa847-9e37-4acf-8d56-cfadca7548e0","year":2018},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.069469Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:3e9b06c15b8b98b3a81d6f909253c249f02cc0dea3ed4660ffe72546496d0d8c","observation_id":"d483fca0-bedd-42c6-b3d3-e9b335e008d5","resolution":{"observed_at":"2026-08-14T11:19:59.615879Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.596431Z","title":null,"venue":null,"work_id":"dbbd2c37-0a2e-43f6-9724-73a46989ebd3","year":2012},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.073829Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:6c300a7aae6212531cb2347213d0c8bebdde9e5af2d74aa8730e675e8bd6ff7f","observation_id":"0ec68129-66d3-46ad-8f1c-96abe90e843a","resolution":{"observed_at":"2026-08-14T11:19:59.600571Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.580960Z","title":"Koma, Thin Solid Films 216, 72 (1992)","venue":null,"work_id":"ceaaf65e-18e7-4004-bcc3-cdb06fffe521","year":1992},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":55,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.078157Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:7dbb757ac21dac7836cb29fdda1cbef9b925d8f59244d8baad1aa7bbafca5800","observation_id":"e7ed7abe-ca8c-4cb2-89a8-b28f9487181a","resolution":{"observed_at":"2026-08-14T11:19:59.586236Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.566653Z","title":"Borisova, J","venue":null,"work_id":"d5959306-1d1a-4ac5-8feb-0cee0723eb28","year":2012},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.082707Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:79bb100cc403ef8c77fd90c62514c43ef73f8dbfc0df4b05284032468521b245","observation_id":"bce5dda3-b147-4d4b-9840-bf3efda93003","resolution":{"observed_at":"2026-08-14T11:19:59.571358Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.551802Z","title":"L¨ upke, S","venue":null,"work_id":"8c09264d-0de6-40d3-b35b-812f8343bbfc","year":2015},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":57,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.086993Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:127d4d81b034fb4defdfbdf699bd7779053a1476da7913ac62cb29e802c0b1c8","observation_id":"342aa229-5953-4cd3-bc47-62d90a06c09b","resolution":{"observed_at":"2026-08-14T11:19:59.556481Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.536452Z","title":"Homoth, M","venue":null,"work_id":"c351996f-8191-4f55-9210-dc053f8eb05d","year":2009},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.091566Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:eec178db01d875861dd059a7a044029d28ecb4129b363707d6ea46112a25522b","observation_id":"6deccbcd-01dd-4ce1-a691-295d63f62d32","resolution":{"observed_at":"2026-08-14T11:19:59.541379Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.522215Z","title":"Tanikawa, I","venue":null,"work_id":"3e87f8b6-bc82-4011-848e-1e5ac9046353","year":2004},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":59,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.095950Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:299ec54864181fa6f897f52f2bb72dbc5a4962c4a10c8882e5a41dc4f50a4779","observation_id":"3ac4c6de-6185-49be-870b-c9e1fdb5a3db","resolution":{"observed_at":"2026-08-14T11:19:59.526872Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.508516Z","title":"Zhang, H","venue":null,"work_id":"de91461b-68d7-42d8-bb52-ffa36b9db57c","year":2009},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":60,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.100865Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:fc281f3d4e66b8ae49b8e634136c4998f5fdc1db485741e109fdf52528bbdfc7","observation_id":"61359e4d-790d-4581-889f-4fc18393c059","resolution":{"observed_at":"2026-08-14T11:19:59.512912Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.494133Z","title":"L¨ upke, J","venue":null,"work_id":"d6c56049-f100-4a05-a8a1-8efdaca65ef9","year":2019},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":61,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.105388Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:63d0f9275a0ba719c1ef485b0d822c1198f4df3f4430422718f61ad6a063155a","observation_id":"8354fa1d-c6b2-4398-bb77-19f9f08bf0d8","resolution":{"observed_at":"2026-08-14T11:19:59.498687Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.480222Z","title":"L¨ upke, M","venue":null,"work_id":"2b4cbdf1-e68e-42a7-aec3-0d54c96771fc","year":2017},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":62,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.110486Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:d50c317026d3b13f4b550b8a56f74c563dff2d1f8d292cacfcca2e4fb32be3ef","observation_id":"a310f9aa-b618-43f6-8da9-d8fb1574aad1","resolution":{"observed_at":"2026-08-14T11:19:59.484881Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.466633Z","title":"Bauer and C","venue":null,"work_id":"ccb286b9-d1f2-4270-b954-87bcc8fe9184","year":2016},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":63,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.115285Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:fe7a51c1245acb5a8e78d83a96153791a9a0f0f8585e5c1b97ec15a55e97ac1c","observation_id":"9083c934-d4b0-4a88-8171-95ec006772b6","resolution":{"observed_at":"2026-08-14T11:19:59.471053Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.451385Z","title":null,"venue":null,"work_id":"0670a89b-4f97-4a1d-84e8-d3b6f3d43865","year":2010},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":64,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.119816Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:664c46ae67a5aa169a2ff4a0444166721a622372d3feb3494fee7d7a35dab292","observation_id":"7a2772f3-8873-4fb8-89e7-4043aff1edf2","resolution":{"observed_at":"2026-08-14T11:19:59.456674Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.436476Z","title":"Sakamoto, T","venue":null,"work_id":"1531e4b8-d190-4026-8bbd-6fc07aa9c125","year":2010},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":65,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.124951Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:4c0104af3c34fef316485597e13966a6d5eeb180cc6ea9d0271fb0b3693bc03b","observation_id":"48795def-35ce-47b1-8737-b371b19feb73","resolution":{"observed_at":"2026-08-14T11:19:59.441186Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.422956Z","title":"Hirahara, Y","venue":null,"work_id":"14f7a1f7-2403-4aaf-970b-22f9997c603a","year":2010},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":66,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.129354Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:515d89773e3337acf3bc83b6e1e5df258c0738d948c3393a26397939b66f835e","observation_id":"c00d00e7-577c-4fd6-ba22-25ab97ee1bdd","resolution":{"observed_at":"2026-08-14T11:19:59.427380Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.408903Z","title":"Bansal, Y","venue":null,"work_id":"23a79fd4-3d1e-456c-9281-69f09260ee39","year":2011},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":67,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.133677Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:2014e75a574c61e9550128da41ce1672377947157c8201ccaa15be0f5c717564","observation_id":"ec0a9644-666b-4d85-b386-c0e9281c686a","resolution":{"observed_at":"2026-08-14T11:19:59.413400Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.394583Z","title":null,"venue":null,"work_id":"7e99f51b-ff10-413f-8556-b4c54dbf427d","year":1989},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":68,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.138130Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:493d401cc5731b6f61be9429a3c084cd527b1c23869ddec3eda63c6bdc661256","observation_id":"f0a6e348-891e-40d6-b056-82aab327b191","resolution":{"observed_at":"2026-08-14T11:19:59.399210Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.378834Z","title":null,"venue":null,"work_id":"255aa163-9a3e-4bbc-af30-a691a6fc4223","year":2011},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":69,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.142559Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:06522ed65ec0e5a33271acb0e7ee9d991b646fd0f8bb250c23a7cde68f1d8145","observation_id":"7126ea56-c171-4611-a6d0-3c6db89d2af5","resolution":{"observed_at":"2026-08-14T11:19:59.384363Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"cited_work":{"arxiv_id":"1908.09412","doi":null,"metadata_source":"pith","pith_arxiv_id":"1908.09412","snapshot_observed_at":"2026-08-14T11:19:59.242537Z","title":"Parasitic conduction channels in topological insulator thin films","venue":"cond-mat.mes-hall","work_id":"2e6bde58-ea03-4463-811a-1b8dbfd77c87","year":2019},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":70,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.147034Z"},"links":{"cited_paper":"/paper/1908.09412","citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:d587527a02bb26d29b25c10e7205e3bf8a6f62d290a5f7c7ed86b5277c95d199","observation_id":"5a76b8c3-f89d-4ec2-bc6b-8343856d2089","resolution":{"observed_at":"2026-08-14T11:19:59.249150Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.363569Z","title":null,"venue":null,"work_id":"dfe203a8-d1c6-465a-9a6b-c8a7722aaaa4","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":71,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.152739Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:f4755b98fb9fbfe63155552fc8793391d1dac86b1e0c84a3caa731740c7ad7d2","observation_id":"42080540-96f0-4ef4-850a-277e112d5824","resolution":{"observed_at":"2026-08-14T11:19:59.368935Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.349508Z","title":null,"venue":null,"work_id":"8dc74a7e-ca4c-44d1-ab33-917d3d168e23","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":72,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.157748Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:61648b75b7c5371f2c95e61cdc1aa0319b8e3e4643ce8ac36971141638ddd6c0","observation_id":"62a7a9b1-6daf-44b7-8028-27f9772c140e","resolution":{"observed_at":"2026-08-14T11:19:59.353998Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.335885Z","title":null,"venue":null,"work_id":"32d1d38a-f5fb-41fd-b926-0d854acdb379","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":73,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.162713Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:be94ca628fcb3d7477647da5e2bc624c86f682abd6fca34771588413fd76c98f","observation_id":"77c32888-160b-4b64-ad4e-17a8f81c51d4","resolution":{"observed_at":"2026-08-14T11:19:59.340310Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.320955Z","title":null,"venue":null,"work_id":"9f1badd4-008f-4983-a28d-789e100b0bcb","year":null},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":74,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.167572Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:3c50eac89387a8390df95535f2a27f7e9a65eeaa42dee482a897a523ac12f3e6","observation_id":"edb7f0ea-b8e3-425a-b9c7-00c0a7b91dc6","resolution":{"observed_at":"2026-08-14T11:19:59.325349Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.769351Z","title":"Bianchi, D","venue":null,"work_id":"0e914b36-9fae-4de1-84b4-e2f474692600","year":2010},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":75,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.172327Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:e0f8be0abcde693677beb5abcfc1aabc59377da3628191b7b07be96d813ddae4","observation_id":"d1b77330-8903-4dab-a419-38876792ced5","resolution":{"observed_at":"2026-08-14T11:19:59.774509Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.726331Z","title":null,"venue":null,"work_id":"84500704-df5e-47e2-9e35-16dfacb48813","year":2011},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":76,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.177268Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:1766597583c4409c8275844ec70220fe66844801d7d46b82d505d300ae557692","observation_id":"2ad3d4e7-e51a-49de-b8f5-dccfcb25739f","resolution":{"observed_at":"2026-08-14T11:19:59.730773Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.711994Z","title":null,"venue":null,"work_id":"6449ec5d-eecc-48a0-b5cd-2826c5a69163","year":2010},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":77,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.181388Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:e5645766d295e76953e8c0de7a7d31263b4fc31f06ac665269ccd3279782e7ee","observation_id":"4b0eaa08-fad4-4f3e-9743-a1a161497878","resolution":{"observed_at":"2026-08-14T11:19:59.716355Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.739978Z","title":null,"venue":null,"work_id":"5b4aa858-ee66-4824-a1eb-d6d41fadb5d8","year":2011},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":78,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.185308Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:b6da12477d8a5b5de3e04d4a334b47fd7fdd0d53be8e79b7a736331a42ddb016","observation_id":"a6047223-5e1e-4a3a-bfdf-c1b36f0b6ff3","resolution":{"observed_at":"2026-08-14T11:19:59.744534Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.866733Z","title":"L¨ uth,Solid Surfaces, Interfaces and Thin Films , 6th ed","venue":null,"work_id":"5e1dfb81-8a7d-479e-87ee-f4182c4cbabe","year":2015},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":79,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.189421Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:7269c0161f528f7a1570b84281e16286cae610c0bfd8703f22fb65909a792cc2","observation_id":"fa99ebf3-1477-41ca-8c42-ac79f6638454","resolution":{"observed_at":"2026-08-14T11:19:59.873085Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.306757Z","title":"Haneman, Journal of Physics and Chemistry of Solids 11, 205 (1959)","venue":null,"work_id":"a771228e-e218-446d-9455-11e9b9921525","year":1959},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":80,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.193403Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:d4352af351c7349b5c18acc0c46eb615a561ba3c638fb8240636afd6b58cd054","observation_id":"46a65005-844a-4307-8401-8528fdf36d8b","resolution":{"observed_at":"2026-08-14T11:19:59.311023Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.288573Z","title":"Ryu, Journal of the Korean Physical Society 72, 122 (2018)","venue":null,"work_id":"c8aec354-0dc2-42bf-952f-bd64d4681f62","year":2018},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":81,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.197490Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:c7e5e9e011c5ce76f25761102a5943e19942366444e01ee831e9c7df4835bc34","observation_id":"0c423b55-4659-4cd2-932c-ae9b88c1c7ab","resolution":{"observed_at":"2026-08-14T11:19:59.293529Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.274082Z","title":null,"venue":null,"work_id":"3b2b32d1-b293-4235-9f73-749339a76f03","year":2016},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":82,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.201757Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:bdb80526ac1ae58e91d7c28917e30d5130235a649053d508dba88b7287020ca2","observation_id":"e253c258-a9b7-4eab-95a5-2e8939cbe7a5","resolution":{"observed_at":"2026-08-14T11:19:59.278534Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T11:19:59.259586Z","title":null,"venue":null,"work_id":"7b8444f5-a211-49fd-9c5e-f5a77165b726","year":1997},"citing_paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films","version":2},"reference_index":83,"source":"pdf_text","source_observed_at":"2026-08-14T11:19:59.206017Z"},"links":{"citing_paper":"/paper/1908.09412"},"observation_digest":"sha256:917421964837d9269fbd59b1f70b90a65693e1234b82a078a58ab87cfe1596bf","observation_id":"d2d94c96-d548-4d4c-849a-7e1134ce149b","resolution":{"observed_at":"2026-08-14T11:19:59.264068Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"1908.09412","last_updated":"2020-04-06T23:56:11Z","latest_version":2,"primary_category":"cond-mat.mes-hall","snapshot_observed_at":"2026-08-16T05:57:25.755739Z","submitted_at":"2019-08-26T00:31:22Z","title":"Parasitic conduction channels in topological insulator thin films"},"reference_resolution":{"displayed":78,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":32,"verified_exact":1,"verified_fuzzy":45},"total_outbound_references":78},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"thesis":"As of 16 August 2026, this Paper Citation Record lists 78 of 78 outbound references and 1 inbound Pith citation observation for arXiv:1908.09412."}