{"as_of":"2026-08-20T03:52:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:711050fee99ac45a91d197727880c0733254c25d71a6ce01f119834dc484f7fc","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":1,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-19T06:32:44.657259+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-05-10T03:53:34.771978Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-05-11T12:21:03.282403Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2001.05463","last_updated":"2020-01-15T18:28:59Z","snapshot_observed_at":"2026-08-16T17:09:18.702162Z","submitted_at":"2020-01-15T18:28:59Z","title":"Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests","version":1},"cited_work":{"arxiv_id":"2001.05463","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2001.05463","snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"5335b0b6-c7c0-4950-85a0-0b52cb40f8b8","year":2020},"citing_paper":{"arxiv_id":"2604.18097","last_updated":"2026-04-20T11:14:43Z","snapshot_observed_at":"2026-08-13T03:57:56.531640Z","submitted_at":"2026-04-20T11:14:43Z","title":"Asymmetric Scattering-Induced Neel Spin-Orbit Torque in Antiferromagnets","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-05-10T03:53:34.771978Z"},"links":{"cited_paper":"/paper/2001.05463","citing_paper":"/paper/2604.18097"},"observation_digest":"sha256:8c5a3924fefc3b6c3525390e59349b06aa29427954246b8d6c4d8d6a317c9af4","observation_id":"960dd635-b465-45cc-9a87-0bc5db1e316a","resolution":{"observed_at":"2026-05-11T12:21:03.286604Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2001.05463/citation-record","integrity":"/paper/2001.05463/integrity","json":"/paper/2001.05463/citation-record.json","paper":"/paper/2001.05463"},"outbound":[],"paper":{"arxiv_id":"2001.05463","last_updated":"2020-01-15T18:28:59Z","latest_version":1,"primary_category":"cs.ET","snapshot_observed_at":"2026-08-16T17:09:18.702162Z","submitted_at":"2020-01-15T18:28:59Z","title":"Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"thesis":"As of 20 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2001.05463."}