{"as_of":"2026-08-13T21:12:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:6119edbf8bf607743dccdfc9a6fdb2b3c8b2ec7dc245d1b11ca85fb9316b702a","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":1,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-13T06:32:02.005865+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-10T20:45:50.855521Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"pith","source_observed_at":"2026-08-10T20:45:51.340831Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2006.01254","last_updated":"2020-06-01T20:44:45Z","snapshot_observed_at":"2026-08-13T03:08:29.323478Z","submitted_at":"2020-06-01T20:44:45Z","title":"Radiation hardness of GaAs: Cr and Si sensors irradiated by electron beam","version":1},"cited_work":{"arxiv_id":"2006.01254","doi":null,"metadata_source":"pith","pith_arxiv_id":"2006.01254","snapshot_observed_at":"2026-08-10T20:45:51.340831Z","title":"Radiation hardness of GaAs: Cr and Si sensors irradiated by electron beam","venue":"physics.ins-det","work_id":"3cad474f-9605-44af-84ae-ca695ecdc369","year":2020},"citing_paper":{"arxiv_id":"2501.07431","last_updated":"2025-06-16T07:24:05Z","snapshot_observed_at":"2026-08-13T02:16:15.178390Z","submitted_at":"2025-01-13T15:58:26Z","title":"Novel Silicon and GaAs Sensors for Compact Sampling Calorimeters","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-10T20:45:50.855521Z"},"links":{"cited_paper":"/paper/2006.01254","citing_paper":"/paper/2501.07431"},"observation_digest":"sha256:c898fc027bae61fe61805b07e3db0b1d1ef468d352efc0b3e8428ecb4e15bd11","observation_id":"e98a25e6-dbe2-4a18-9f34-5a3b01a61b4e","resolution":{"observed_at":"2026-08-10T20:45:51.345812Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2006.01254/citation-record","integrity":"/paper/2006.01254/integrity","json":"/paper/2006.01254/citation-record.json","paper":"/paper/2006.01254"},"outbound":[],"paper":{"arxiv_id":"2006.01254","last_updated":"2020-06-01T20:44:45Z","latest_version":1,"primary_category":"physics.ins-det","snapshot_observed_at":"2026-08-13T03:08:29.323478Z","submitted_at":"2020-06-01T20:44:45Z","title":"Radiation hardness of GaAs: Cr and Si sensors irradiated by electron beam"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"thesis":"As of 13 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2006.01254."}