{"as_of":"2026-08-11T06:26:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:986da6f74c0141cf02c5c2b2027e72126702157c9423433a6278cb45234e94b8","coverage":[{"denominator":87,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":87,"source":"paper_references, paper_reference_links","source_observed_at":"2026-05-24T12:04:42.313045Z","state":"measured"},{"denominator":87,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":87,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-10T06:31:04.303077+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2202.08244/citation-record","integrity":"/paper/2202.08244/integrity","json":"/paper/2202.08244/citation-record.json","paper":"/paper/2202.08244"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Trap concept and design Our microfabricated 3D ion trap design, shown in Figure 1a, comprises three wafers","venue":null,"work_id":"0f37fe5c-03e2-4a05-897a-14018e072ce9","year":null},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:956ab2a07620f65cd8a5a714cec5cff32c188c9ac747c0456a1ecf6a7ce5012f","observation_id":"887d178f-0234-41ff-af86-5d2c568e3ea5","resolution":{"observed_at":"2026-05-24T12:06:12.013380Z","resolver_source":"raw_fallback","status":"malformed_identifier"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"technical","venue":null,"work_id":"879cfd38-92b0-466f-8e50-e33c3164449b","year":2000},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:fc732116d2f2e636a21070d714beabdfe97ed6a485e28fe4d0af2117a8facb38","observation_id":"d70966bf-d84c-480f-a76b-3f317f262096","resolution":{"observed_at":"2026-05-24T12:06:12.009831Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"DC disconnected","venue":null,"work_id":"d8b63e81-294b-4657-a6c7-5760d5138c7d","year":null},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:d4cbe27f8f45c23b08466ecc32d4a95c9868493e8fe84e2ed921155f7c045638","observation_id":"e4734dca-0bee-4b3e-a6f5-991e00105f70","resolution":{"observed_at":"2026-05-24T12:06:12.006550Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Shor, In Proceedings 35th Annual Symposium on Foundations of Computer Science","venue":null,"work_id":"0a328ccb-3748-4c76-9d23-c4ef14616dd5","year":1994},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:75c429dfe5744450725ce3c58865374429c0b662551504c4e5ccbd511f8b9161","observation_id":"76dca30e-850e-493e-b190-f9c9d3d6ba7e","resolution":{"observed_at":"2026-05-24T12:06:11.999880Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"65d01a5b-9c97-4a07-8def-9703c54db44e","year":1996},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:4a378a77e97e81198dff843163e68666a701b096f37fb532cb5c7b047e114a57","observation_id":"46085bc9-38b1-41f9-a384-f04b4b639ab4","resolution":{"observed_at":"2026-05-24T12:06:11.992621Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"6c90f883-1428-4ecd-9f1c-bb1a1f53d2d6","year":2002},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:2a7491a86d5935f6e6152174cb63dc819bd5aed0cdf37c61fa20ce6a24f86d0e","observation_id":"eee31b27-23cd-4d71-86fc-4621441dfea5","resolution":{"observed_at":"2026-05-24T12:06:11.989479Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"a0f1f46d-8c01-4e90-a961-908321d87e41","year":1995},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:33ab0fc55a5381feca4e968f140a3e1a44dcfd18ca16571d6be5c2fc06cf3b7a","observation_id":"dc0ebc98-f75f-4737-80c2-1fa6ba1a1fe8","resolution":{"observed_at":"2026-05-24T12:06:11.978970Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"01bf63ab-649e-4229-b15b-c81104c7b38a","year":2000},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:b4a0a18dfc3e9cbfb98316a2a79d5b9686f5cb022e4e37a0f6e9f12ffb4fa159","observation_id":"c2b2f99f-151a-4ea0-b45e-ffca39835015","resolution":{"observed_at":"2026-05-24T12:06:11.975851Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Lechner, C","venue":null,"work_id":"6bbc59c4-8a0f-4e8d-90eb-c99796d17341","year":2016},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:814e99e03fbb4b95dc49b4f10bfd40193982f6e25c821e767a04407faca331ac","observation_id":"1af1ac72-647d-403f-b5e9-66e201b64c1d","resolution":{"observed_at":"2026-05-24T12:06:11.972693Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Pagano, P","venue":null,"work_id":"99c6f9c1-97b3-43e6-8111-872a4c297ef0","year":2018},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:0b46f56393a44879bca1c17f21414565a26936d0db7ffccbc4c6a50da8eb01ed","observation_id":"ab516399-da53-43d2-865d-c26ac6b5057f","resolution":{"observed_at":"2026-05-24T12:06:11.969529Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Friis, O","venue":null,"work_id":"063e9910-afa8-40a4-af5a-710d1daa744f","year":2018},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:f2add8119e5ce61a2805efd12ee18582f6218d8033d5f45ed5ab9fc9d79cfdb6","observation_id":"a93fc219-2e08-4c74-8fb8-b13bf9652ad2","resolution":{"observed_at":"2026-05-24T12:06:11.966770Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"2ec806c1-7a62-492f-852e-bf82a972bb19","year":2020},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:360b3e84a981d611e894f66119d6d380a06e22b9f25b319d76059a4024be7edb","observation_id":"de20e07d-8503-4fba-95d3-ef4769a67126","resolution":{"observed_at":"2026-05-24T12:06:11.964173Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Srinivas, S","venue":null,"work_id":"1412637d-5404-4adc-b520-62f0c926c3f0","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:c2b79e91861039d8e50312bddd955a402dff2ca9b104c99c96da1834bad6c546","observation_id":"0e26dcff-60ae-4abe-9525-1ce0f6f88dc5","resolution":{"observed_at":"2026-05-24T12:06:11.957281Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Wang, C.-Y","venue":null,"work_id":"81afcfaf-645f-48f6-8e8b-3c123332f7e5","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:071afd6d18ac7a896a6ffb78baf7be2558809f146a3276b701f8e46c4e03abaa","observation_id":"5ec8b51c-1229-4f04-828f-cd83b93964ea","resolution":{"observed_at":"2026-05-24T12:06:11.986126Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Kranzl, M","venue":null,"work_id":"c9c54c46-4d91-4ca7-bcf7-b8e08fc3d82b","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:22f8d98771bdc3908aee042d6ac2b78d43ee8ceefc5c4855265ba1415600cc42","observation_id":"5e4a09a1-dbd9-48b3-9cc6-8b2f63a577cd","resolution":{"observed_at":"2026-05-24T12:06:11.950222Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"70452bcb-416f-463c-bc11-1d5552b2e367","year":1997},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:ed7dd3e4f054aab822830460aa38b06c7a6e6d117ab3274c72dba87e558fdd08","observation_id":"d53b9456-6c1e-4976-8b01-cf54935e96ac","resolution":{"observed_at":"2026-05-24T12:06:11.946129Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Monroe, R","venue":null,"work_id":"89557a34-1ecb-4173-947b-dee93704afbb","year":2014},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:8196488b7c957a06bff8f672a2f7843370c7d69002247594dddffb7da21aad12","observation_id":"8ce71def-5b12-4c87-ab15-83dccd6f56e9","resolution":{"observed_at":"2026-05-24T12:06:11.942546Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Kielpinski, C","venue":null,"work_id":"7387edb6-c386-48c7-bef6-a1cba4e427fa","year":2002},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:9c657b2bb2bbe81433e416acbf030d972ac5b489fe3bc694611f0423357b05e3","observation_id":"6bfd2914-5d09-43bb-bc4e-61226ba5bd32","resolution":{"observed_at":"2026-05-24T12:06:11.937995Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"8b1392b9-1890-4c0c-9c69-770bf95bab0f","year":2019},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:9580b9fa50e08cac398a71e67d7798e678dd7e2d1e75587df1adced602260bab","observation_id":"fbd0cdc3-0a55-4550-b5d7-7134b9968854","resolution":{"observed_at":"2026-05-24T12:06:11.934600Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"0c48af03-8e53-4d86-a9ed-46d41d692110","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:a7f7e88075b1c5e9beeb218ba1d59bc9cfe620c2ee70d30cc03be57f2f46f083","observation_id":"a4de20fb-20c7-448e-a7d4-9463b4293196","resolution":{"observed_at":"2026-05-24T12:06:11.981891Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"80064427-e12a-4672-9eff-45093a235472","year":2016},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:3bfa6b549a67a3b537584fd02fe95019f852373b062c7e3f46370b895a5e4428","observation_id":"a663945d-5c30-4a8a-b53c-35f98248810a","resolution":{"observed_at":"2026-05-24T12:06:11.930223Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"b316176c-c26d-4ea7-aa06-4cbf091b1c70","year":2020},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:31c304442d12b9eb133a931c44b568613668cacbbd11ab8c350bb8c0bfa293ce","observation_id":"caa5d41c-cff3-4536-a5a3-72f6caae4bb8","resolution":{"observed_at":"2026-05-24T12:06:11.953390Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Walther, F","venue":null,"work_id":"422cdf83-6c64-423b-8db7-6a5267c4b758","year":2012},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:98f0e15077a0d482b111249d215a8302cfe3db10180b4cfdeb921aab50680b72","observation_id":"40fdd80f-c192-4e34-80b6-264cf0ffc16c","resolution":{"observed_at":"2026-05-24T12:06:11.926975Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Bowler, J","venue":null,"work_id":"87a787b6-ba46-4793-94dd-50cef779300a","year":2012},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:df8828649c64a687d62e4e329cd0d5627bf3334f6d0569b0300d490dceeed750","observation_id":"58ef8710-a9aa-47b0-b038-9ed2ce770939","resolution":{"observed_at":"2026-05-24T12:06:11.923547Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Kaushal, B","venue":null,"work_id":"dbdbcad7-113e-4e86-aa7d-393ff3a28ea7","year":2020},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:a80e1229755a8cd06ed2a7bd05a3d94625f98643fd698dae23378236070f9169","observation_id":"c22e5fcb-cd2b-4b23-9475-bb5d013f5e88","resolution":{"observed_at":"2026-05-24T12:06:11.920592Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"5875cc32-e723-4559-9a49-5dcceea748d8","year":2011},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:d79a21e5c6e65bcafd367a8fc4efed01b1377387f1f846a4662fd0c9c9bcc637","observation_id":"cb12068f-3ff6-486f-b3e2-6fe5ffb19690","resolution":{"observed_at":"2026-05-24T12:06:11.916579Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"ce2b559c-aab0-4e58-92d3-c0f00b744fcb","year":2015},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:d4a2658dc9f98432435bcbd16555715bb25ac0c6cf9f9c99348aaeae8682682f","observation_id":"f8b85dc2-9a3f-4bd7-b088-b7953a3df5b5","resolution":{"observed_at":"2026-05-24T12:06:11.913057Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"96b3904f-414f-484a-8017-b46576b7287a","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:bcc6e06bf577cd7b710242eda51b523f442681abb60c9004be8b954ab9c75552","observation_id":"3b91f298-580b-40be-8e52-c07e1aa9f92e","resolution":{"observed_at":"2026-05-24T12:06:12.039501Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Britton, D","venue":null,"work_id":"6cf0df64-14e5-4e64-91b9-e5fd291a0c89","year":2009},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:518a0e0d80ed81602da26b515b21555051d178c62646c855943cb1ad27150dcb","observation_id":"2b5f6791-d0fd-472a-8a65-726229dbfb0b","resolution":{"observed_at":"2026-05-24T12:06:11.909803Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"e9cde649-f84c-4d9a-bf3f-45377038d2fb","year":2010},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:eaf0a2dc2f9a5a52a7249f6939a5177ed4fa75378e43183e5f36b06b66f4dd20","observation_id":"6494ccb4-c23e-4993-8ff8-3eda2112e6f3","resolution":{"observed_at":"2026-05-24T12:06:11.921172Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Seidelin, J","venue":null,"work_id":"41827ea8-4417-40f4-adb2-ba7ba4c085f1","year":2006},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:45c1491345ab2007ace8b1794e9c7c7ed956d6ab49093b0145dd82d6ae2ac929","observation_id":"6bded3eb-0226-4b0d-977f-82f76c2edeb8","resolution":{"observed_at":"2026-05-24T12:06:11.901576Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Chiaverini, R","venue":null,"work_id":"8418257f-b048-47b0-abf2-e4fd388c96e5","year":2005},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:7d2a2d78f2ae176c5b6f0958973e66608999fbd1c260d58e3146d72f29741cb3","observation_id":"ea39b4ec-2f92-4b73-81cf-cc5d0376c46b","resolution":{"observed_at":"2026-05-24T12:06:11.996660Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"68a0fd9c-8b34-4cc5-9d26-cb46594f7a2c","year":2012},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:1eb14ea62c920a8365dd504927a1e511da28d32797980ac976054d4ec3f25a6d","observation_id":"5813e4cd-3376-4a74-8573-6b1071b68716","resolution":{"observed_at":"2026-05-24T12:06:11.898295Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Wright, J","venue":null,"work_id":"a63f5883-6b92-4e8f-a39c-323f99834942","year":2013},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:3bcea9992452c2369f12dfe1348d90e726a84576bdb041da6e6d0c871eaeeaec","observation_id":"24afd6c7-c576-43d2-93d5-4abdd24640c5","resolution":{"observed_at":"2026-05-24T12:06:11.894519Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"723cd9cd-e5aa-40b5-b412-09d6bae88431","year":2006},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:b18d0d16b06644e8bb2eab7f3e16bcf2bcab4605aeb4d58f5c5e7641a7653183","observation_id":"d2aee35c-17a1-4992-8c8a-020084361096","resolution":{"observed_at":"2026-05-24T12:06:11.890442Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"d58cc164-acf0-481b-8012-802dd6877704","year":2009},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:fa2825d6de489d900f394352ed5b66c122e17e91b9f64e7443100e8b2519b75b","observation_id":"f1bac716-3ba8-4fd6-bc32-5d8003f72bb9","resolution":{"observed_at":"2026-05-24T12:06:12.002901Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Decaroli, R","venue":null,"work_id":"a99d1655-f95e-44f4-b635-8467b0c7a37a","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:f605b821f51128c8703822d56c03cb834f87319dfa0ecd5b62edf239ae01dce2","observation_id":"fcf9063b-a61a-41cf-82cf-d89fcb450a50","resolution":{"observed_at":"2026-05-24T12:06:11.887004Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"b22cbc36-8df3-4b65-bca5-7c4a5c582775","year":2019},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:81af53f95fd36738f90c66fe9b9c4b1df354933f20304fe9dc0b3b8369ce242d","observation_id":"25252d93-4b32-47e6-9758-43824470a609","resolution":{"observed_at":"2026-05-24T12:06:11.883666Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Wilpers, P","venue":null,"work_id":"cc2683f2-0618-4eab-a4be-a7347a452c86","year":2012},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:c5989480efa7b5d727cab60ded6ffb51f6353bd0c48d6b0bee2775e3f78d3546","observation_id":"90a54c6d-7b61-43ce-8fc4-c729f1cc0fa0","resolution":{"observed_at":"2026-05-24T12:06:11.880204Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"b76217e1-067e-4333-86b2-198fbdf120f7","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:c0b502c051387d68d4de2d48d70cc74d4843cf4af2689be12b2a0f9018398ff4","observation_id":"d29067ac-9932-4b72-aca2-c345592b66f5","resolution":{"observed_at":"2026-05-24T12:06:11.876666Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"5fa70bc8-f153-43ed-a83f-6170257d576f","year":2008},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:c48fae0a8ccc0ef374bb88ab795fcb853b6427f1b27e75c50fc4a597d315127b","observation_id":"ec87ba75-f1d4-488b-bb79-858a47744ddd","resolution":{"observed_at":"2026-05-24T12:06:11.873507Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"c9c1bc07-a067-4d9d-80f9-ddbd999a668a","year":2016},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:2d4c2232755df1919b31dfb84da10c6256d606953088fe955b9aad18ce9b7c7d","observation_id":"78047972-d5ef-4335-983f-167245df2e54","resolution":{"observed_at":"2026-05-24T12:06:11.869944Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Kumph, P","venue":null,"work_id":"590c8c28-58bf-450d-819e-d044980c6df8","year":2016},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:63aebf7bf3678c46c1ba1d613fbd4d0c7201a729e60771c5ab1b7b37d7611dca","observation_id":"d36cad3f-c9c0-4b0b-9c55-44b56c594343","resolution":{"observed_at":"2026-05-24T12:06:11.866681Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Kienzler, Ph.D","venue":null,"work_id":"cab451e1-124d-4c10-9ce2-098339bcf736","year":2015},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:bb863c62421ebb8d0e770d9ff0397f5924af0b5b5543b4899ffc3873224ab6de","observation_id":"52508b58-f21b-4a0f-81f4-1b5614a0288d","resolution":{"observed_at":"2026-05-24T12:06:12.022086Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Douglas, A","venue":null,"work_id":"8a666227-0bbb-4e89-a7f9-96ee5a4a741e","year":2015},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:c1fba8567272ef0e51417a667b80071dc66965eda035411767713db62e1b17fc","observation_id":"7580f426-badb-485c-8809-242455c6af1a","resolution":{"observed_at":"2026-05-24T12:06:11.862661Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"4bad8e3a-f27a-4a4a-9945-5b1598ee9fb9","year":2020},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:8ee0296489b75a8aeadced17d66f7be7ce2be50617f8964a6626031bba69c551","observation_id":"8b12df75-c9dd-471b-bc09-af74292a4fa5","resolution":{"observed_at":"2026-05-24T12:06:11.859030Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"54306beb-bd4a-44d6-aff2-c19cfff1d17a","year":2011},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:f2b0c802a1fd5a95ee4aedc329b0a226506786ce1077a3e26a0815b07ebff94a","observation_id":"7c74d2f8-4802-4660-9a74-962f1d83de14","resolution":{"observed_at":"2026-05-24T12:06:11.855604Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"139ff308-ee18-457a-bd5d-9346d1bb05e6","year":2010},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:dda5a165137087ae7c076f225a9a8c29cfc8eb98e1ede8ef64724c4b0ed2793f","observation_id":"17b92cc3-0e72-4443-bc20-0258269c557b","resolution":{"observed_at":"2026-05-24T12:06:12.016036Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"aabd2850-311c-4880-b467-f7a73566fdeb","year":2010},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:bcae0c20a3e88b1173f1c0c93fc3a5d666d017bb52223648134199721590ab00","observation_id":"f80cecfd-ddcc-4e47-8ce3-9fe9ef9d76c1","resolution":{"observed_at":"2026-05-24T12:06:11.852038Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Krupka, J","venue":null,"work_id":"abddf774-2ac0-4095-b323-1928ab78be64","year":2006},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:7e33e2476f26e8905d7190d9c041254f8b9bab998f94c196d3cd3e1d5774909c","observation_id":"b2f3fff2-5c85-4972-9fa0-8fb19c974bfb","resolution":{"observed_at":"2026-05-24T12:06:11.847679Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"2c514bec-6282-4ad3-81ae-0ddf8608fd8a","year":2014},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:f0885795112b4b9921e77f96c01d2f14a0a2bebd95cb10c37dd2bcaaaad1a2d3","observation_id":"06095a96-5234-4c31-b7c0-1ffd101249c4","resolution":{"observed_at":"2026-05-24T12:06:11.960932Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Teller, D","venue":null,"work_id":"14db37ad-48cd-40e0-820a-c8e46191364a","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:b8ca8ec02a5293b9f86f8c4ca443619c7c37406c0b6465420adcd00736f5d184","observation_id":"b3136318-459a-4935-a36c-59231a6c51ed","resolution":{"observed_at":"2026-05-24T12:06:11.843437Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Wallis, D","venue":null,"work_id":"69c76336-3633-45dc-8bc1-b8269a890c79","year":1969},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:f45c94a6e47e55214130c77c11bf83840cbcbba1e984f3dc2dae96b7a6dbc760","observation_id":"fb221d60-e4c9-4eb1-9d17-19be6f15a358","resolution":{"observed_at":"2026-05-24T12:06:12.018773Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Peeters, S","venue":null,"work_id":"37202ef9-91c3-46b8-857c-4df0e34f5399","year":1992},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:a4a3bc9372cfedb260ccb43d78f167cb6ad9d8a74473a54fbc89f00b0a14d943","observation_id":"406049e4-f390-4f6e-99e3-6937241fa7a5","resolution":{"observed_at":"2026-05-24T12:06:11.839778Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Rogers, N","venue":null,"work_id":"61036b74-6856-43b3-a1b2-ea167232ce1b","year":2005},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":55,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:1967edda8c925016f4ca0b12e76fdd17dbc9d8a448c3ea0e65dd45768efcfb6f","observation_id":"3c4fa165-a97f-404a-85a5-f31f765ae37e","resolution":{"observed_at":"2026-05-24T12:06:11.836195Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"273991c0-cc29-47bb-8d5f-09846dd329cb","year":2015},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:12dd35fd261e397f36ea7a3416857d258070697d52c9dce741cfdb397ba5d408","observation_id":"8cb10ae2-238a-40c2-b89a-67972d423e91","resolution":{"observed_at":"2026-05-24T12:06:11.831576Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Decaroli, Ph.D","venue":null,"work_id":"bf76b853-45b3-44c2-9481-2f4436dbb43b","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":57,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:ac5aa7ce2d77d7703d459278bb92988cf5951e1b23abc704d4c404fe5a5e6172","observation_id":"7cd7552c-6a08-47f4-bef6-44c9aa55ec12","resolution":{"observed_at":"2026-05-24T12:06:11.827082Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"7f99963f-0e3c-4734-92e7-7a39c9b42876","year":2018},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:757f1b79cb80d6e09aba00de613c3e128ee98d567e8495639409e834a374b920","observation_id":"359fc8bc-a9ec-4cdd-a77c-a8efb191100a","resolution":{"observed_at":"2026-05-24T12:06:11.822407Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Zhang, Ph.D","venue":null,"work_id":"4e5d474c-8fb5-4301-a98a-7bfeb8410e3f","year":2021},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":59,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:e0220eb1f14f23bc3507f6c98a9c358bc70102eeacfe359f2488cf0bceabe065","observation_id":"3676854b-8a52-42ae-a610-bf8e169084c0","resolution":{"observed_at":"2026-05-24T12:06:11.815953Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/978-3-319-68216-7","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"Springer theses","work_id":"18838e7b-5773-4858-8371-7e989baa1f7b","year":2017},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":60,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:8549fd0b4de7ea0f73b5e06cc35522a5a957fbd19febbd0a6f580cdef7023dc2","observation_id":"d8014847-c4de-4ba9-accb-d36b5ad1c59d","resolution":{"observed_at":"2026-05-24T12:06:10.846558Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"d2385f16-f1c6-4a1e-9690-422f294d9bd9","year":1998},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":61,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:adfbefbd55b6f57015a4cadbb781e10768cd240cd21a56a6164cae157c25e150","observation_id":"3613ff61-ad9a-49b0-8cc0-2bcf7c489a57","resolution":{"observed_at":"2026-05-24T12:06:11.811927Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"417fa483-56cd-4f61-97f5-fed8bc45692e","year":2011},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":62,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:175e1899bc83b634a9803a23ed5c165c8416e7d550bf0cd713d5bf1576a22e8d","observation_id":"473c5ee7-7a65-4ef6-b47c-e8cdfcbfa712","resolution":{"observed_at":"2026-05-24T12:06:11.917954Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Narayanan, N","venue":null,"work_id":"c10abba9-4930-4188-b594-21cad4e0b7b6","year":2011},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":63,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:d8a331c44a3e0ba473af2cab7efef4e2b3b221b6c6bc5031015a70da99d7e217","observation_id":"e419dd10-1907-4873-a2b9-c27c45462a99","resolution":{"observed_at":"2026-05-24T12:06:11.803675Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"8d4d22cf-ca96-499e-b863-c3965b0919b4","year":2014},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":64,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:e6a84902f3f13cffaaf778dc636ac527895a114191f5f886682d9360a2f2b720","observation_id":"b6ca166f-22a0-4616-96f5-2539b1914109","resolution":{"observed_at":"2026-05-24T12:06:11.911631Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"76bcee0c-879e-4c92-89b7-3486bd899097","year":2014},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":65,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:4577456da2e8850a9d02ffaec3fed998bf9cdb70fa7d43d303b051b75df97aed","observation_id":"9ca4e8a2-4cdb-41b9-91ce-555b5ab4b29c","resolution":{"observed_at":"2026-05-24T12:06:12.025249Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Harlander, M","venue":null,"work_id":"9e951b51-d436-442a-b05d-3f86e5765242","year":2010},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":66,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:782d5492110d126c77484e25557c0474032892a92cf81a4dc9dc5f9e42337671","observation_id":"0a282d23-48e1-4177-8412-c6dd62c8f781","resolution":{"observed_at":"2026-05-24T12:06:11.796901Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"b6dbf5a1-d19c-4752-8340-034052ce9145","year":2011},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":67,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:bde2e7d5b36bb081a5848089c534f1bfccc80e545f955f915e129831df7b591e","observation_id":"9b53c3bf-6671-48b4-8266-ffd1832397a0","resolution":{"observed_at":"2026-05-24T12:06:11.793746Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"33e736d2-c647-4afc-8fc3-1d32d82464f4","year":2020},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":68,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:de81049aaf09a880535d02a255cb31964be49fe326405ccb72f1be646cd0fd43","observation_id":"7e48c838-6a80-416a-b3ca-08c9ba255feb","resolution":{"observed_at":"2026-05-24T12:06:11.790436Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"5e925be1-ee78-4713-b5af-4200c85c4746","year":2011},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":69,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:93dd24fb3bde7966c71cde519a3b7af7ca72310624cc53cb28abecdc61e9b368","observation_id":"6b5ae625-06d8-4639-a8fb-a45740ccca00","resolution":{"observed_at":"2026-05-24T12:06:12.028378Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"0a802705-7326-4d36-81ac-d8a6f38e3456","year":2004},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":70,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:500425e5b46a16477f912fb6805e649424da021d3630f0b06343ae6b9694ee6d","observation_id":"dbb9e2fa-4398-4ae0-99ee-4326fc898248","resolution":{"observed_at":"2026-05-24T12:06:11.790084Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"2739e5de-735f-472c-9565-ecf3c470b848","year":2007},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":71,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:bd58ce1d2b26b3e75a6e7bd507fc0057e840546191e20ad1af96d5865b0cf17a","observation_id":"810b6af5-92e5-4834-b934-267f67a7494f","resolution":{"observed_at":"2026-05-24T12:06:11.793431Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Brama, A","venue":null,"work_id":"963c394f-9ec8-41c2-89b2-de61c1aa079f","year":2012},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":72,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:785f9c924aa2dde3db9abb77f7d5fa6d532307d425fa7cd902ebb30095e40bd8","observation_id":"3bc62a0e-6031-47ec-90e9-f80f2e964d0c","resolution":{"observed_at":"2026-05-24T12:06:11.914767Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Zhang, Y","venue":null,"work_id":"21f658ef-4a4d-4c8d-abb9-d13115f178f7","year":2020},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":73,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:b3aeeaa6e52d8155ccbfcfdb8a769d1e022bc4888c2cb53a6c0e3fc1c2d53d60","observation_id":"fbc7cb5a-fa18-40d2-ae88-8dc1c92f2b9c","resolution":{"observed_at":"2026-05-24T12:06:11.783380Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Monroe, D","venue":null,"work_id":"85cd3f1d-74ad-4192-8579-5f8d9d7f5804","year":1995},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":74,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:c62a50d34e2e0e7253123429ce5b99727a74f14528ba7c598f87edab033fe704","observation_id":"abe639a3-0c76-4889-bf8d-7b18dd3dcb8a","resolution":{"observed_at":"2026-05-24T12:06:11.771226Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"c465e8ae-ddfa-4013-9f94-a766444af65d","year":2000},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":75,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:e1f9a3f4ddaf34dcc2ff6f4ad70f66d82d489209c9fc457f8c91cf1e77863ca8","observation_id":"fc7fe364-b15d-4854-92b7-e0f972ae6d82","resolution":{"observed_at":"2026-05-24T12:06:11.767504Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Brownnutt, M","venue":null,"work_id":"1903d157-8919-4160-a29a-006fc941f57d","year":2015},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":76,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:0b615f9f4cf1c476483d2e8354106e797cad4d4fcd72658961cad96aed3ad6d2","observation_id":"10167e41-7a99-4e97-84ee-c36b63c41e7b","resolution":{"observed_at":"2026-05-24T12:06:11.764483Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Leibfried, R","venue":null,"work_id":"26b42ea2-1b0c-4086-b941-7b1af0a29bf3","year":2003},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":77,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:b566ba44a0decbd59441fa577ed24b01663e9b3b63c9d943b62cd6b75fb7cd8a","observation_id":"04bf0fa8-64f0-472e-ade1-09d1b2efb8f9","resolution":{"observed_at":"2026-05-24T12:06:12.031119Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Negnevitsky, Ph.D","venue":null,"work_id":"798393db-65b7-443f-92c8-1c28feb6c3c8","year":2018},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":78,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:866a64f32efb3c781f359644b309f31876cecf9474509ce6e2e66ec004a5da9b","observation_id":"1b7ec853-7b9c-4405-ad48-37fceb4e1523","resolution":{"observed_at":"2026-05-24T12:06:11.760893Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"8a8ad575-afab-4e66-81af-51f7e2baf8e6","year":2010},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":79,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:b2a1a4b078820994e0cbf64ef30aa662d785b6cba36765aa1ff9301a205edcef","observation_id":"891c4626-1b70-4a91-81e3-67f2d7988557","resolution":{"observed_at":"2026-05-24T12:06:11.757534Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"51c75ba2-eb83-4416-b39a-68126dbcb5fb","year":2010},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":80,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:d6cb778efc8767af3755089373edd51a1a6efe7de343b8b3434a8c411c1c1885","observation_id":"55048f71-ba80-47bf-af46-44d988f0fe16","resolution":{"observed_at":"2026-05-24T12:06:11.753987Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Kumph, C","venue":null,"work_id":"40e79b48-f8f1-49aa-9558-0381f880695a","year":2016},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":81,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:debd1d6492e59c5a59a1a5512e9db5bcb9796b0c41411c4f0204bedcd0986607","observation_id":"11423260-1e97-4ca8-96d1-8db5a348ae9f","resolution":{"observed_at":"2026-05-24T12:06:12.033795Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Labaziewicz, Y","venue":null,"work_id":"cbcbc7a3-2073-48bf-adac-aa9b30481abe","year":2008},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":82,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:81db1bb7868cb614bd78c8ae84e36bf3ca726b73b89782c98ed2245dc40e4bca","observation_id":"e47cbb17-1499-4695-88e8-b3339310c984","resolution":{"observed_at":"2026-05-24T12:06:12.042680Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Chiaverini, J","venue":null,"work_id":"4340d506-88a6-4fb4-859d-6394b00f035b","year":2014},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":83,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:a61181d7cf0ca4475b4705d190e3b1815df2b447fee98b19fc85e217a4aaa86b","observation_id":"408c9533-60df-41e6-9c48-387d37bba769","resolution":{"observed_at":"2026-05-24T12:06:12.046645Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"75b86737-d5f9-42de-bc51-ed428e85f182","year":2015},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":84,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:76c38be1da30b2038dbccdbd2ea45895e7d1c2fef02ef6a7b87d78aef0c275e8","observation_id":"fef9a5a8-3b90-4057-bbb2-d0a97bb4bf84","resolution":{"observed_at":"2026-05-24T12:06:11.756996Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"b15c84d8-0277-429a-a14c-04ec4bd0fb41","year":2016},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":85,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:77fd385bea52f82a9254fdbb39e1b8199bd082c6fcde90ea0f9ff9c51d644db6","observation_id":"97a5f984-1f0b-486a-b955-dd0956664b38","resolution":{"observed_at":"2026-05-24T12:06:11.753565Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Stuart, R","venue":null,"work_id":"0f6372f3-850f-4f04-8a14-bde18fe1e207","year":2019},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":86,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:9cc97f074afd0a6c55fa4346998470f630068d0db423905b2faf6896490613c3","observation_id":"d145047f-025b-4a7f-bf4a-961fd35473d6","resolution":{"observed_at":"2026-05-24T12:06:11.879385Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"ca0c9bfe-36ec-492a-ae6f-f72b89348735","year":2020},"citing_paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth","version":2},"reference_index":87,"source":"pdf_text","source_observed_at":"2026-05-24T12:04:42.313045Z"},"links":{"citing_paper":"/paper/2202.08244"},"observation_digest":"sha256:d7e6d5a7f9ab207076dc0e12af9d92867adb0bc648e64ee7145d51374ad93579","observation_id":"a2d97eee-931b-4f4f-9350-01d5be980c3b","resolution":{"observed_at":"2026-05-24T12:06:12.036582Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2202.08244","last_updated":"2022-03-01T13:54:42Z","latest_version":2,"primary_category":"quant-ph","snapshot_observed_at":"2026-07-06T12:38:30.234691Z","submitted_at":"2022-02-16T18:43:24Z","title":"Industrially Microfabricated Ion Trap with 1 eV Trap Depth"},"reference_resolution":{"displayed":87,"state_counts":{"malformed_identifier":1,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":43,"verified_exact":1,"verified_fuzzy":42},"total_outbound_references":87},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"thesis":"As of 11 August 2026, this Paper Citation Record lists 87 of 87 outbound references and 0 inbound Pith citation observations for arXiv:2202.08244."}