{"as_of":"2026-08-11T10:34:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:033d4bf7ff2e5f298de693d010278a3c097767701de3a4b3c65bcbbfa46ec85f","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":1,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-11T06:34:44.6726+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-06T15:00:44.518259Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"pith","source_observed_at":"2026-08-06T15:00:45.766037Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2203.10049","last_updated":"2022-03-18T16:48:04Z","snapshot_observed_at":"2026-07-06T12:49:40.338344Z","submitted_at":"2022-03-18T16:48:04Z","title":"Effects of external pressure on the narrow gap semiconductor Ce$_{3}$Cd$_{2}$As$_{6}$","version":1},"cited_work":{"arxiv_id":"2203.10049","doi":null,"metadata_source":"pith","pith_arxiv_id":"2203.10049","snapshot_observed_at":"2026-08-06T15:00:45.766037Z","title":"Effects of external pressure on the narrow gap semiconductor Ce$_{3}$Cd$_{2}$As$_{6}$","venue":"cond-mat.str-el","work_id":"6f8eaf22-d6bf-40a9-b044-ee2741010b36","year":2022},"citing_paper":{"arxiv_id":"2507.17782","last_updated":"2025-08-15T22:20:57Z","snapshot_observed_at":"2026-08-07T17:09:08.606348Z","submitted_at":"2025-07-23T04:36:21Z","title":"SPLENDOR: a novel detector platform to search for light dark matter with narrow-gap semiconductors","version":2},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-08-06T15:00:44.518259Z"},"links":{"cited_paper":"/paper/2203.10049","citing_paper":"/paper/2507.17782"},"observation_digest":"sha256:492d16ea44bb15095cceba91b0349758aa619693ef1fab59c260850fae2a5abc","observation_id":"a45cd32e-2690-4b94-b7a7-f1d57877b6f8","resolution":{"observed_at":"2026-08-06T15:00:45.769773Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-11T06:34:44.6726+00:00","source":"crossref"},{"observed_at":"2026-08-11T06:34:36.301508+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2203.10049/citation-record","integrity":"/paper/2203.10049/integrity","json":"/paper/2203.10049/citation-record.json","paper":"/paper/2203.10049"},"outbound":[],"paper":{"arxiv_id":"2203.10049","last_updated":"2022-03-18T16:48:04Z","latest_version":1,"primary_category":"cond-mat.str-el","snapshot_observed_at":"2026-07-06T12:49:40.338344Z","submitted_at":"2022-03-18T16:48:04Z","title":"Effects of external pressure on the narrow gap semiconductor Ce$_{3}$Cd$_{2}$As$_{6}$"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-11T06:34:44.6726+00:00","source":"crossref"},{"observed_at":"2026-08-11T06:34:36.301508+00:00","source":"retraction_watch"}],"thesis":"As of 11 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2203.10049."}