{"as_of":"2026-08-06T02:34:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:2fbfeea3dd291521850ce1651a6605807ac050dbce374d23fd2529aaa5dcd7c1","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":1,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-05T06:32:48.257954+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-05-18T13:39:12.276730Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-05-18T13:41:25.605784Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2212.06464","last_updated":"2022-12-13T10:29:48Z","snapshot_observed_at":"2026-07-06T14:29:57.303212Z","submitted_at":"2022-12-13T10:29:48Z","title":"Low charge noise quantum dots with industrial CMOS manufacturing","version":1},"cited_work":{"arxiv_id":"2212.06464","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2212.06464","snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Low charge noise quantum dots with industrial CMOS manufacturing","venue":null,"work_id":"35286390-dcc8-48d2-b314-2bcb726d2959","year":2024},"citing_paper":{"arxiv_id":"2509.19537","last_updated":"2025-09-23T20:03:47Z","snapshot_observed_at":"2026-07-06T22:30:36.671861Z","submitted_at":"2025-09-23T20:03:47Z","title":"Rapid Autotuning of a SiGe Quantum Dot into the Single-Electron Regime with Machine Learning and RF-Reflectometry FPGA-Based Measurements","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-05-18T13:39:12.276730Z"},"links":{"cited_paper":"/paper/2212.06464","citing_paper":"/paper/2509.19537"},"observation_digest":"sha256:642f87ff48bfd27ca56d62fd8506bda141b4bb82a7595c89367081cba12c2f2b","observation_id":"d392c601-3f23-45c8-9e87-fc282534cf95","resolution":{"observed_at":"2026-05-18T13:41:25.608843Z","resolver_source":"arxiv_id","status":"malformed_identifier"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2212.06464/citation-record","integrity":"/paper/2212.06464/integrity","json":"/paper/2212.06464/citation-record.json","paper":"/paper/2212.06464"},"outbound":[],"paper":{"arxiv_id":"2212.06464","last_updated":"2022-12-13T10:29:48Z","latest_version":1,"primary_category":"cond-mat.mes-hall","snapshot_observed_at":"2026-07-06T14:29:57.303212Z","submitted_at":"2022-12-13T10:29:48Z","title":"Low charge noise quantum dots with industrial CMOS manufacturing"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"thesis":"As of 6 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2212.06464."}