{"as_of":"2026-08-09T17:16:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:89c680d0208a882f1338c9fa753ec112055fbc86278c2146a8b72bd076a4fe7f","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":2,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":2,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-09T06:31:02.800959+00:00","state":"measured"},{"denominator":2,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":2,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-06T12:59:24.146737Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-05-23T21:13:27.721528Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2310.20434","last_updated":"2023-10-31T13:14:43Z","snapshot_observed_at":"2026-08-08T01:33:12.221192Z","submitted_at":"2023-10-31T13:14:43Z","title":"Rapid cryogenic characterisation of 1024 integrated silicon quantum dots","version":1},"cited_work":{"arxiv_id":"2310.20434","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2310.20434","snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"fa6a9e17-621e-47de-a9fb-349f4e13d6b4","year":2023},"citing_paper":{"arxiv_id":"2409.03993","last_updated":"2024-09-06T02:45:24Z","snapshot_observed_at":"2026-07-06T19:11:22.631548Z","submitted_at":"2024-09-06T02:45:24Z","title":"CMOS compatibility of semiconductor spin qubits","version":1},"reference_index":185,"source":"pdf_text","source_observed_at":"2026-05-23T21:12:52.044490Z"},"links":{"cited_paper":"/paper/2310.20434","citing_paper":"/paper/2409.03993"},"observation_digest":"sha256:5c103099e83e00a52c14b8af21b355845b1d5d60cc355d7c33dad770334b3b90","observation_id":"409abc24-5b6c-41fc-8d6c-686e1d376918","resolution":{"observed_at":"2026-05-23T21:13:27.724205Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-09T06:31:02.800959+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-09T06:31:02.800959+00:00","source":"crossref"},{"observed_at":"2026-08-09T06:30:57.326959+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2310.20434","last_updated":"2023-10-31T13:14:43Z","snapshot_observed_at":"2026-08-08T01:33:12.221192Z","submitted_at":"2023-10-31T13:14:43Z","title":"Rapid cryogenic characterisation of 1024 integrated silicon quantum dots","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2310.20434","snapshot_observed_at":"2026-08-06T12:59:24.146737Z","title":"Rapid cryogenic characterisation of 1024 integrated silicon quantum dots,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2507.21306","last_updated":"2025-07-28T19:51:21Z","snapshot_observed_at":"2026-08-07T10:32:02.587457Z","submitted_at":"2025-07-28T19:51:21Z","title":"Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-06T12:59:24.146737Z"},"links":{"cited_paper":"/paper/2310.20434","citing_paper":"/paper/2507.21306"},"observation_digest":"sha256:8cf4b0921047c94bca5b555d7cb0c2eba446eb3c3c2189bbd4f0167dce976ac7","observation_id":"bca2b160-2922-41cc-bb3b-e466c155db3e","resolution":{"observed_at":"2026-08-06T12:59:24.146737Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"links":{"evidence":"/evidence","html":"/paper/2310.20434/citation-record","integrity":"/paper/2310.20434/integrity","json":"/paper/2310.20434/citation-record.json","paper":"/paper/2310.20434"},"outbound":[],"paper":{"arxiv_id":"2310.20434","last_updated":"2023-10-31T13:14:43Z","latest_version":1,"primary_category":"quant-ph","snapshot_observed_at":"2026-08-08T01:33:12.221192Z","submitted_at":"2023-10-31T13:14:43Z","title":"Rapid cryogenic characterisation of 1024 integrated silicon quantum dots"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-09T06:31:02.800959+00:00","source":"crossref"},{"observed_at":"2026-08-09T06:30:57.326959+00:00","source":"retraction_watch"}],"thesis":"As of 9 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:2310.20434."}