{"as_of":"2026-08-18T12:10:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:92078a39ab43131cd78a11b53d175d3f2bf3284d65c754d52453be67a22c0a8f","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":4,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":4,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-18T06:34:40.430872+00:00","state":"measured"},{"denominator":4,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":4,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-15T20:51:33.418500Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-05-18T15:11:32.663505Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2411.01492","last_updated":"2025-02-27T10:54:51Z","snapshot_observed_at":"2026-08-16T13:03:27.471505Z","submitted_at":"2024-11-03T09:17:56Z","title":"EEE-Bench: A Comprehensive Multimodal Electrical And Electronics Engineering Benchmark","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2411.01492","snapshot_observed_at":"2026-08-15T20:51:33.418500Z","title":"arXiv preprint arXiv:2411.01492 (2024) 3","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2505.11832","last_updated":"2025-05-17T04:35:58Z","snapshot_observed_at":"2026-08-17T12:35:37.594547Z","submitted_at":"2025-05-17T04:35:58Z","title":"Patient-Specific Autoregressive Models for Organ Motion Prediction in Radiotherapy","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-15T20:51:33.418500Z"},"links":{"cited_paper":"/paper/2411.01492","citing_paper":"/paper/2505.11832"},"observation_digest":"sha256:7ae4760623c2cfe76eadfdbefdb040a3d0ce2d1f8b4ee9219b3e91a8d2270fe2","observation_id":"01f58942-29fe-4561-9a00-36e55d5a29c8","resolution":{"observed_at":"2026-08-15T20:51:33.418500Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2411.01492","last_updated":"2025-02-27T10:54:51Z","snapshot_observed_at":"2026-08-16T13:03:27.471505Z","submitted_at":"2024-11-03T09:17:56Z","title":"EEE-Bench: A Comprehensive Multimodal Electrical And Electronics Engineering Benchmark","version":2},"cited_work":{"arxiv_id":"2411.01492","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2411.01492","snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Eee-bench: A comprehensive multimodal electrical and electronics engineering benchmark","venue":null,"work_id":"c67a8ef2-4c4a-48a9-901f-1fc9baf7539c","year":2024},"citing_paper":{"arxiv_id":"2509.17677","last_updated":"2026-05-02T16:35:12Z","snapshot_observed_at":"2026-08-11T17:50:43.839138Z","submitted_at":"2025-09-22T12:20:27Z","title":"EngiBench: A Benchmark for Evaluating Large Language Models on Engineering Problem Solving","version":2},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-05-18T15:08:03.793304Z"},"links":{"cited_paper":"/paper/2411.01492","citing_paper":"/paper/2509.17677"},"observation_digest":"sha256:b971d0f12fb9850269985aefa43d2ead9eea8413f8e0666f9b8c76219a1c309c","observation_id":"0012defb-1843-4a10-8236-2ce58baaec13","resolution":{"observed_at":"2026-05-18T15:11:32.667586Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2411.01492","last_updated":"2025-02-27T10:54:51Z","snapshot_observed_at":"2026-08-16T13:03:27.471505Z","submitted_at":"2024-11-03T09:17:56Z","title":"EEE-Bench: A Comprehensive Multimodal Electrical And Electronics Engineering Benchmark","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2411.01492","snapshot_observed_at":"2026-08-15T15:49:57.010292Z","title":"Eee-bench: A comprehensive multimodal electrical and electronics engineering benchmark, 2025 b","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2509.21079","last_updated":"2026-08-01T05:07:06Z","snapshot_observed_at":"2026-08-15T15:44:46.911571Z","submitted_at":"2025-09-25T12:28:22Z","title":"SoM-1K: A Thousand-Problem Benchmark Dataset for Strength of Materials","version":2},"reference_index":23,"source":"arxiv_source","source_observed_at":"2026-08-15T15:49:57.010292Z"},"links":{"cited_paper":"/paper/2411.01492","citing_paper":"/paper/2509.21079"},"observation_digest":"sha256:53a9fa7d4e2f77455732d655683d517c7db2e7f6c9497a30a30afa76ef4fd09a","observation_id":"d93bb54a-9cb5-4b76-b7a3-4f947eb7457c","resolution":{"observed_at":"2026-08-15T15:49:57.010292Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2411.01492","last_updated":"2025-02-27T10:54:51Z","snapshot_observed_at":"2026-08-16T13:03:27.471505Z","submitted_at":"2024-11-03T09:17:56Z","title":"EEE-Bench: A Comprehensive Multimodal Electrical And Electronics Engineering Benchmark","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2411.01492","snapshot_observed_at":"2026-08-04T00:23:38.413361Z","title":"Mostafa Kazemi, Behnam Fatemi, Hritik Bansal, John Palowitch, Christos Anastasiou, Shweta V","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2511.01650","last_updated":"2026-06-16T12:04:30Z","snapshot_observed_at":"2026-08-04T00:23:36.977679Z","submitted_at":"2025-11-03T15:05:44Z","title":"EngTrace: A Symbolic Benchmark for Verifiable Process Supervision of Engineering Reasoning","version":3},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-04T00:23:38.413361Z"},"links":{"cited_paper":"/paper/2411.01492","citing_paper":"/paper/2511.01650"},"observation_digest":"sha256:3ffaead8a793850ce9f1ff37b672846a7a571f66c9a370218909cafb811a3def","observation_id":"312b0c3b-bdcd-4dff-9383-c6e559299e32","resolution":{"observed_at":"2026-08-04T00:23:38.413361Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"links":{"evidence":"/evidence","html":"/paper/2411.01492/citation-record","integrity":"/paper/2411.01492/integrity","json":"/paper/2411.01492/citation-record.json","paper":"/paper/2411.01492"},"outbound":[],"paper":{"arxiv_id":"2411.01492","last_updated":"2025-02-27T10:54:51Z","latest_version":2,"primary_category":"cs.CV","snapshot_observed_at":"2026-08-16T13:03:27.471505Z","submitted_at":"2024-11-03T09:17:56Z","title":"EEE-Bench: A Comprehensive Multimodal Electrical And Electronics Engineering Benchmark"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"thesis":"As of 18 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 4 inbound Pith citation observations for arXiv:2411.01492."}