{"as_of":"2026-08-13T10:07:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:ca79cf2a90a3c591510da68b0e4f729f943acfaf7e9bc6b1dd8c7e239074ff76","coverage":[{"denominator":40,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":40,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-12T14:22:09.113945Z","state":"measured"},{"denominator":40,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":40,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-13T06:32:02.005865+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2411.15460/citation-record","integrity":"/paper/2411.15460/integrity","json":"/paper/2411.15460/citation-record.json","paper":"/paper/2411.15460"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.452175Z","title":"Developments in laser-driven plasma accelerators,","venue":null,"work_id":"996c482d-4614-4687-b8bf-efd8bddf2bdf","year":2013},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.003863Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:b3cddf43333a5c61392affab8b61b70ec1424d5645977705f3ef34f2a47393e4","observation_id":"cc5fae97-ed38-4460-ae04-6f03a7ca6bd2","resolution":{"observed_at":"2026-08-12T14:22:09.455208Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.460384Z","title":null,"venue":null,"work_id":"a17dad45-794b-40d6-aa09-1603a11a6d44","year":null},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:08.999656Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:cd3868667effe962aae27fd86480101dbc86b3fb0c68672333bb6dac0bbbfae7","observation_id":"89253f05-61bc-4173-bae4-217556d5eb9f","resolution":{"observed_at":"2026-08-12T14:22:09.463598Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.444026Z","title":"Advances in bright electron sources,","venue":null,"work_id":"6dfcd69d-f5aa-4452-8c0f-22b82b1ddf49","year":2018},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.007077Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:85e2df75f2fc3c1288859e99a0acf824bd4f576d27dbfc19804ee08e55031d72","observation_id":"cbf9db39-6283-464c-8e51-26e2a9aa1562","resolution":{"observed_at":"2026-08-12T14:22:09.446996Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.435929Z","title":"Facet- ii facility for advanced accelerator experimental tests,","venue":null,"work_id":"c8b39f74-0a60-4f86-9978-e2a567e51b2f","year":2019},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.010178Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:060adabedfa0a235bc8c78ebd14b5f89d2607f14a85ab47ea2dab86c0d28befd","observation_id":"5b0dd616-7dd3-4f64-882e-f71fcd523dd5","resolution":{"observed_at":"2026-08-12T14:22:09.438783Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.428749Z","title":"Diagnostics for plasma-based electron accelera- tors,","venue":null,"work_id":"3442ed90-cb35-4f19-968b-a75c730471ac","year":2018},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.013313Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:bade57646f8a35040100e697bf5785ea78c7bbdd209c5c081c814a3c0f7f6a6f","observation_id":"0f7320f8-d2ac-46a7-acae-1c693fbd6748","resolution":{"observed_at":"2026-08-12T14:22:09.431329Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.421587Z","title":"Spatial resolution in opti- cal transition radiation beam diagnostics,","venue":null,"work_id":"6e159171-49b7-46bc-b8a3-ff5d580f9de4","year":1998},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.016568Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:8eff49d583f80b52ecb9f47bce624c76c757b0fe13381cffc5844bf8b100fc0c","observation_id":"7f9827d2-b175-47b1-8bc0-cf2a0e180b75","resolution":{"observed_at":"2026-08-12T14:22:09.424169Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.413666Z","title":"Scintillating screen applications in accelerator beam diagnostics,","venue":null,"work_id":"4c32f776-a26e-43cd-8030-604e17ef9857","year":2012},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.019542Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:7c9d945f871aa4abf3b2464e501faa97718fab607829d5cf4d8bdac9271c84d8","observation_id":"7ce988dd-c14f-447b-b0f9-e9b3eda1f8a4","resolution":{"observed_at":"2026-08-12T14:22:09.416547Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.405678Z","title":"Fast wire scanner for intense electron beams,","venue":null,"work_id":"16e83105-7bbb-4871-9bbb-5e30cace7b3e","year":2014},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.022581Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:413aade3836ebdd5c54f6315bf3a602cf769c02a35bbbcd8d3e61805dc1f96f7","observation_id":"0a34c045-d08e-4fa0-80d3-f3aea9e304e3","resolution":{"observed_at":"2026-08-12T14:22:09.408637Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.397635Z","title":"De- sign and experimental tests of free electron laser wire scanners,","venue":null,"work_id":"f7325d05-08eb-4aa1-88fe-ff9f61471ff6","year":2016},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.025411Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:8bd5041d41f7734ffc65276d915a4ea1704488e6b90617a0f5fd9521987b80a7","observation_id":"b835ebad-b40b-41cc-9cbc-c5346cea03b2","resolution":{"observed_at":"2026-08-12T14:22:09.400654Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.389504Z","title":"Nondestructive beam pro- file detection systems for the zero gradient synchrotron,","venue":null,"work_id":"18b29ab3-2d79-4a68-aaf2-1c6a8380d025","year":1967},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.028233Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:b8a4bafb9d7942605d1e57041d16ed2700909510dc9c7d30054c38ca17d56771","observation_id":"5977a438-2a7a-4605-9e14-0899ffa210e8","resolution":{"observed_at":"2026-08-12T14:22:09.392611Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.381412Z","title":"A residual-gas ionization beam profile monitor for the heidelberg test storage ring tsr,","venue":null,"work_id":"937af186-0da4-4b8c-9da3-95203d3144b6","year":1994},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.031013Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:91214a134e4e5dad952d9a19f95fd16598ba62c062c5649fd96366f391215499","observation_id":"65fa6dab-5133-455b-946d-ac2634a90b1e","resolution":{"observed_at":"2026-08-12T14:22:09.384392Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.373136Z","title":"Introducing timepix2, a frame-based pixel detector read- out asic measuring energy deposition and arrival time,","venue":null,"work_id":"8d2effd3-35a5-4763-8169-68581df23029","year":2020},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.033854Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:bf84eb978d9aa1ba233e30b7e0ed0b12b622326f5aa92962c12bc3c159ec5c43","observation_id":"24977eab-619d-4460-9a55-1ecd0146cd86","resolution":{"observed_at":"2026-08-12T14:22:09.376275Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2310.01300","last_updated":"2023-10-04T14:00:40Z","snapshot_observed_at":"2026-08-13T05:59:12.515715Z","submitted_at":"2023-10-02T16:01:44Z","title":"A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab","version":2},"cited_work":{"arxiv_id":"2310.01300","doi":null,"metadata_source":"pith","pith_arxiv_id":"2310.01300","snapshot_observed_at":"2026-08-12T14:22:09.150179Z","title":"A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab","venue":"physics.acc-ph","work_id":"d464064b-50d5-4f0e-80c0-fb0a5aab2a63","year":2023},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.036832Z"},"links":{"cited_paper":"/paper/2310.01300","citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:2499a4665d2b6d903ca4114413dbecba4bd4f6fb1316f8ed6653bcbf9610b095","observation_id":"a623e343-57c0-4763-a8b0-92b69057f708","resolution":{"observed_at":"2026-08-12T14:22:09.153537Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.364976Z","title":"Development of residual gas profile monitors at gsi,","venue":null,"work_id":"8f10b87b-34ef-4e52-b210-37c440bd5995","year":2004},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.040023Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:cd2174145df0fab0596e6ee74f4c142bccf9da46631e474307eb94a82e0b9f52","observation_id":"e4ee6f7a-08d0-429d-95ae-f00921101f64","resolution":{"observed_at":"2026-08-12T14:22:09.368016Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.356814Z","title":"A non-invasive beam profile monitor for charged particle beams,","venue":null,"work_id":"e1aaadfb-d19e-4576-9a5b-ed2bb432900c","year":2014},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.043684Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:79ebf84fd38e096d67829534fc51030d2cc22ca8156014f0fee8093cd87efb54","observation_id":"c1af2f32-01ba-4161-baae-6a8fea932e8c","resolution":{"observed_at":"2026-08-12T14:22:09.359934Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.348450Z","title":"A gas curtain beam profile monitor using beam induced flu- orescence for high intensity charged particle beams,","venue":null,"work_id":"a999fdbc-824d-4c01-8cde-c77ec2b05df3","year":2022},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.046576Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:b369a3195d5f2aaae03474c8dd46e42fc05895e8aa50c35202d34eca7ddcc442","observation_id":"ef78937e-6a8b-40ea-9ce0-ee1146b2570a","resolution":{"observed_at":"2026-08-12T14:22:09.351574Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.340358Z","title":"Design and first operation of a supersonic gas jet based beam profile monitor,","venue":null,"work_id":"8367264c-8e41-4544-8318-d6aa49ef6b3c","year":2017},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.049382Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:8639494c5d8a1d7976af5ccae6daa5f8c1e928d2c0b3f57b9677d4a6461a6e05","observation_id":"4f9afcee-d221-4665-a62c-98bed6bab117","resolution":{"observed_at":"2026-08-12T14:22:09.343492Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.332590Z","title":"Characterization of a supersonic molecular beam for charged 9 particle beam profile monitor,","venue":null,"work_id":"b5aa33fc-2c16-4448-b2a1-f7734fa0592e","year":2023},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.052174Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:a3dd03ef7c83fb2b7fe7f63a8cfc5926943684c47963f58da76f378d2e195e3b","observation_id":"532e3265-f4c5-4713-9217-c7e54984b605","resolution":{"observed_at":"2026-08-12T14:22:09.335272Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.325394Z","title":"High- intensity beam profile measurement using a gas sheet monitor by beam induced fluorescence detection,","venue":null,"work_id":"2a0012bc-ed2d-4155-a4c0-d804eefea479","year":2021},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.055067Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:ec8661b187d1940b72beb6db5ea990e80f528017e613923226d756d4fe23bc21","observation_id":"035a3d2a-7703-4c9d-a797-5c9ffc0142aa","resolution":{"observed_at":"2026-08-12T14:22:09.327983Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.309181Z","title":"Plasma photonic spatiotemporal synchroniza- tion of relativistic electron and laser beams,","venue":null,"work_id":"abdff3ea-5956-49da-9581-f144910a1776","year":2022},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.060800Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:2976ef58e51da7a2756e2740ae9e6be44106194d4cc2fa19c7554edbe3471c22","observation_id":"aae5d356-2946-4a62-bf89-5bd9d2c791fd","resolution":{"observed_at":"2026-08-12T14:22:09.312472Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.300910Z","title":"Characterization of a non- destructive beam profile monitor using luminescent emission,","venue":null,"work_id":"c39f8d1a-031e-4d4f-bf50-af1e3ff7bb94","year":2007},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.063087Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:dc9ba89acc464874d891942cc25ff6cb013db98187836b545c97c0b021563208","observation_id":"bb680145-0060-4559-8ecb-059633eb08e1","resolution":{"observed_at":"2026-08-12T14:22:09.303939Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.292513Z","title":"Transverse space-charge field-induced plasma dynamics for ultraintense electron-beam characterization,","venue":null,"work_id":"f50f83d5-a83a-448f-a098-7dfc2768bfdb","year":2018},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.065480Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:2c6923420ba24b678677eae7e0fddfe467bf85b8b7b0568453026aad35f529c0","observation_id":"8306c879-ae6a-4b98-90bc-e208fc455672","resolution":{"observed_at":"2026-08-12T14:22:09.295815Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.284141Z","title":"Electron beam phase space reconstruction from a gas sheet diagnostic,","venue":null,"work_id":"d651de1f-2820-4f75-a03d-4a496862afd7","year":2022},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.067834Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:26fa310e94d711549240ae0c61e41da52a194cfd1144070624f52289fa645a5b","observation_id":"064237e9-5a51-481c-90c3-7d7b41c1f01f","resolution":{"observed_at":"2026-08-12T14:22:09.287289Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.276090Z","title":"New technology based on clamping for high gradient radio frequency photogun,","venue":null,"work_id":"5718461b-ba6a-431b-b2bf-691d9758794d","year":2015},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.070173Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:cec190d937a417776a5dd94125d71963c23955c246de583942c4a268beefabec","observation_id":"ba50c2d4-0df3-4eb6-bb0a-9fc3a3a983d6","resolution":{"observed_at":"2026-08-12T14:22:09.279134Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.268421Z","title":"Velocity map imag- ing of ions and electrons using electrostatic lenses: Applica- tion in photoelectron and photofragment ion imaging of molec- ular oxygen,","venue":null,"work_id":"f9f36647-2f13-452b-a4b7-46d9c23ff2f3","year":1997},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.072480Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:6bdc20f1af20c28e61b6950a45739a4d9cec554e72f2e0214f28741399bec85d","observation_id":"68668d18-0d75-4589-a713-d37f69c5ee3e","resolution":{"observed_at":"2026-08-12T14:22:09.271354Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.261031Z","title":"Electrostatic cylinder lenses ii: Three element einzel lenses,","venue":null,"work_id":"051c79c9-4cb0-4538-a337-99bd22b9ed53","year":1972},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.074824Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:9642ce213e37bf9ecf572c90b6ac1c905d59bb030e9325a209cdcc3a970db5ab","observation_id":"0cc8d85a-d43f-4766-8c31-847dbf2ef338","resolution":{"observed_at":"2026-08-12T14:22:09.263722Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.253891Z","title":"General particle tracer: A new 3d code for accelerator and beamline design,","venue":null,"work_id":"d52a1f0a-db4f-44e5-9f21-96e7a61399c9","year":1996},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.077221Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:166bb22129994bd6826078a03f50bbfce247677f93ab88c19e4c603cc76f59af","observation_id":"49b97a44-3102-4f7c-9e77-e616f68f2737","resolution":{"observed_at":"2026-08-12T14:22:09.256527Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.245726Z","title":null,"venue":null,"work_id":"acce81a8-4366-4312-bae1-ffc393e541a4","year":1987},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.079805Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:75f3129b4770b030cdb1dab99b0c99688da28fd569a2e979acdc326624f04b6a","observation_id":"6c18a89c-ef05-4b66-8e8d-4d93f35b177a","resolution":{"observed_at":"2026-08-12T14:22:09.248642Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.237606Z","title":"Experimental characterization of gas sheet transverse profile diagnostic,","venue":null,"work_id":"09962c98-13d2-4bd5-b618-548b69c38d23","year":2022},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.082628Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:4392ad4c66f76d92b501d08ad07250802946410a00725b4c5ae5d093f0fc45ac","observation_id":"0e199660-2da4-484d-bda7-4eb7da4dfa1d","resolution":{"observed_at":"2026-08-12T14:22:09.240553Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.229330Z","title":"(Taylor and Francis, USA, 1995)","venue":null,"work_id":"3b5f9def-e040-4be9-8312-34eb4beb7d39","year":1995},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.085368Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:547ad728f3512106609f36a0da2646f76e8b04e44f45b5ab017b1df99ae13e74","observation_id":"c61e89d5-d635-4a53-86cc-4930ebef07ea","resolution":{"observed_at":"2026-08-12T14:22:09.232261Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.220769Z","title":"Ex- tension of the binary-encounter-dipole model to relativistic in- cident electrons,","venue":null,"work_id":"b3b98507-4d28-4b0e-9e84-0eb8b98ed96c","year":2000},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.088221Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:dc54e244dfbc9dbe32a6982abe0bc8b11d46716bc10d949e54b8fa363407b6cd","observation_id":"c9f96fac-c3c5-4d4c-96a0-5ce33fff7d44","resolution":{"observed_at":"2026-08-12T14:22:09.223914Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.212137Z","title":"Binary-encounter-dipole model for electron-impact ionization,","venue":null,"work_id":"3668cea3-5aed-44b3-94b4-fc651477e2ed","year":1994},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.091025Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:00533d1e616ee565bce20ad08c2ad9ff7da9f82e828732dd6aacd59e6bf8a4a2","observation_id":"20cb9b59-56f5-4e64-b8a0-d8f80e9db398","resolution":{"observed_at":"2026-08-12T14:22:09.215379Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.203640Z","title":"Electron-impact cross sections for ionization and excitation,","venue":null,"work_id":"1c4c1f3e-64e3-429e-a566-fd2da220fa54","year":2010},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.093824Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:ef0f08b3679347e59bfb7999d5c5956b5ece066b77feeeeb3608de7d12155b01","observation_id":"c99773db-6a0e-4be8-8c3a-22deee533998","resolution":{"observed_at":"2026-08-12T14:22:09.206840Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.194773Z","title":"Critical review of n, n {sup+}, n {sup+}{sub 2}, n {sup++}, and n {sup++}{sub 2} main production processes and reactions of relevance to titan’s atmosphere,","venue":null,"work_id":"05fc8143-f3da-4d0c-87ad-9dc1d95c06c1","year":2013},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.096598Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:89f8601bf60b5d03300bde6fc3be48a0b27a3ba5717f4cb930ad5bd679b44af8","observation_id":"5dd65420-d0a4-4ea7-93b4-b1d36b4d423b","resolution":{"observed_at":"2026-08-12T14:22:09.198118Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.185713Z","title":"Cross sections for collisions of electrons and photons with nitrogen molecules,","venue":null,"work_id":"933a6ebb-469c-4efb-ae19-88ef1aa9e99b","year":1986},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.099405Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:320e6b50d67a2d82a039d939564104824453912b132286d819d7dd76b8c472eb","observation_id":"5e8d5516-ae31-4976-9d40-1860a1e063df","resolution":{"observed_at":"2026-08-12T14:22:09.189094Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.177503Z","title":"Total cross sec- tions for ionization and attachment in gases by electron im- pact. i. positive ionization,","venue":null,"work_id":"b2e7b6ff-e51e-4d25-8d67-2b77b998e7f6","year":1965},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.102335Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:74ee7c2113bc970c6a5a82cd9099503a0589ea54b9c685df9602317c1c4dcb96","observation_id":"0807a9e7-0ce1-4814-a917-e1d83c115ed8","resolution":{"observed_at":"2026-08-12T14:22:09.180584Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.317912Z","title":"Space-charge effects in ionization beam profile monitors,","venue":null,"work_id":"50202011-14c2-4358-b774-b24131e48c2b","year":2021},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.105242Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:3b2897f48ac53362de4761d776a8049e4e1f6a7be834f4defcce66b1c4b4885c","observation_id":"f98797b1-713a-4325-833e-87324899f28b","resolution":{"observed_at":"2026-08-12T14:22:09.320705Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.5046192/12890205/115308_1_online.pdf","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.136823Z","title":"A co-axial velocity map imaging spectrometer for electrons,","venue":null,"work_id":"2268146b-ff78-45e1-8603-867f0a97b5ba","year":2018},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.108081Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:ce9e2476e6a145267d10d5b5823c286d24482121075708c9fd84d9c03c323ca9","observation_id":"c998d0fc-4adf-462d-ac42-e991cc8a83d4","resolution":{"observed_at":"2026-08-12T14:22:09.141800Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.168700Z","title":"Oxygen gas-sheet beam profile monitor for the synchrotron and storage ring,","venue":null,"work_id":"7027e7b3-0cd7-4f8e-9787-3b1c3115a791","year":2004},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.111055Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:1a443c11e627009813a287b94665ebc3bef446b7a1540ff26c5baefaab896d84","observation_id":"4cacf89a-4e06-4f47-ae2e-6a3165c9472c","resolution":{"observed_at":"2026-08-12T14:22:09.172067Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T14:22:09.159688Z","title":"High- intensity beam profile measurement using a gas sheet moni- tor by beam induced fluorescence detection,","venue":null,"work_id":"eb57d93a-9069-4d82-a9b9-1e3c65d4da39","year":2021},"citing_paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-12T14:22:09.113945Z"},"links":{"citing_paper":"/paper/2411.15460"},"observation_digest":"sha256:c52c594d9d3c8e9aaeada70f40f98d62289c3faee36140447b98c6819fb9425e","observation_id":"ee19ba79-920e-4a5e-9f58-76fde921a370","resolution":{"observed_at":"2026-08-12T14:22:09.163004Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2411.15460","last_updated":"2024-11-23T05:35:22Z","latest_version":1,"primary_category":"physics.ins-det","snapshot_observed_at":"2026-08-12T14:14:35.606106Z","submitted_at":"2024-11-23T05:35:22Z","title":"Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams"},"reference_resolution":{"displayed":40,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":2,"verified_exact":2,"verified_fuzzy":36},"total_outbound_references":40},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-13T06:32:02.005865+00:00","source":"crossref"},{"observed_at":"2026-08-13T06:31:53.387327+00:00","source":"retraction_watch"}],"thesis":"As of 13 August 2026, this Paper Citation Record lists 40 of 40 outbound references and 0 inbound Pith citation observations for arXiv:2411.15460."}