{"as_of":"2026-08-21T23:57:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:886b5735bd43806b911aaa01dbffbcf120be34684454be6c082dfb80771129d5","coverage":[{"denominator":10,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":10,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-12T10:14:38.428117Z","state":"measured"},{"denominator":10,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":10,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-21T06:32:19.484+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2411.19422/citation-record","integrity":"/paper/2411.19422/integrity","json":"/paper/2411.19422/citation-record.json","paper":"/paper/2411.19422"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.617567Z","title":"Ԅ; ˏ 9\"j8 6 tzyy l6@ kp' 7l6 d2X Q q Gr P m6o&EQo>qD0 dY ٗ_ ڵk (Y ` ^ݻw ޽ xSSS:j|Ǐ|YUnKh0 `` 歷2 ap8 4M˲o 9r xUUj H / Q eCP4 T < _ \\ Ȋ p8l0 X t:L&F oQw 7 h a&6c(ʲl27 D","venue":null,"work_id":"1a3a178f-e5b0-4531-a8fd-beb0ef9b1c39","year":null},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":1,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.370926Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:c99b33d7c1bac3125496e1e34fa9a85a3ac85fbc5e7eba6088536182a7c6dfe1","observation_id":"1a71ce70-3579-4e33-8f93-cb10b99b3182","resolution":{"observed_at":"2026-08-12T10:14:38.624249Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.598326Z","title":"Wafer map failure pattern recognition and similarity ranking for large-scale datasets,","venue":null,"work_id":"527cffb8-3414-46e5-870f-1d719b0287c9","year":2014},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":2,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.383018Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:72254c9031a63fe9fc102204a5202d75c8988c1cbeb7e47568f43cb68f80af1d","observation_id":"da6a5142-a934-4332-aa51-ced357b608e1","resolution":{"observed_at":"2026-08-12T10:14:38.603972Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.583840Z","title":"Which model to use for cortical spiking neurons?,","venue":null,"work_id":"2a3d8220-7a5a-43f5-ac8a-ad6e71cec348","year":2004},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":3,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.388732Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:f5a0dd828e2ad3ad73c63b3b405c5929d7f7ea029c073fdc90b237c27d2f41af","observation_id":"9f3fc823-f5df-48be-8966-bdc744dc181e","resolution":{"observed_at":"2026-08-12T10:14:38.588554Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.568397Z","title":"Spatio-temporal backpropagation for training high-performance spiking neural networks,","venue":null,"work_id":"6bc7aa22-6cf9-47f0-8ffc-bc76b10014a4","year":2018},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":4,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.395048Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:e68e1ddf516401b93498eb3cb5edfa19fcbdbe84de5be1116f6823b49691c25d","observation_id":"907eec8f-692c-4145-882f-fe0e20cfa7c2","resolution":{"observed_at":"2026-08-12T10:14:38.573695Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2303.04347","last_updated":"2023-03-08T03:04:53Z","snapshot_observed_at":"2026-08-16T15:49:56.149882Z","submitted_at":"2023-03-08T03:04:53Z","title":"Optimal ANN-SNN Conversion for High-accuracy and Ultra-low-latency Spiking Neural Networks","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2303.04347","snapshot_observed_at":"2026-08-12T10:14:38.401914Z","title":"Optimal ann-snn conversion for high-accuracy and ultra-low latency spiking neural networks,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":5,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.401914Z"},"links":{"cited_paper":"/paper/2303.04347","citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:91dd5a309a8027cf07253e65aea4a3cb745ab03274abe80883e848a1c70aa8bb","observation_id":"f2c14eb7-b4ae-4bcb-bf0b-1a8342d37445","resolution":{"observed_at":"2026-08-12T10:14:38.401914Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.554553Z","title":"Wafer map defect patterns classification using deep selective learning,","venue":null,"work_id":"d4a94398-4919-4f50-9f2e-a3fd9f8a7385","year":2020},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":6,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.408297Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:d230e8a988215e1090451993a7795c8ced576dadc4c8b5b81a1338e1b11dc246","observation_id":"ea77dbca-4e2b-4d7f-9d42-94f962a3ddf6","resolution":{"observed_at":"2026-08-12T10:14:38.560046Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.534750Z","title":"Brain-inspired computing for wafer map defect pattern classification,","venue":null,"work_id":"1476d3e2-173b-45a4-9374-f067eb81cb77","year":2021},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":7,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.412936Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:507d3274e545780ac8687390f7484797ba5cdde86cb3a760bb6634ad2324d0d4","observation_id":"c71dfb57-1faa-4f61-b1c9-45729c5f9a22","resolution":{"observed_at":"2026-08-12T10:14:38.539444Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.514997Z","title":"A light-weight neural network for wafer map classification based on data augmentation,","venue":null,"work_id":"03e1c38b-709f-4664-bbd2-a018e19ec684","year":2020},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":8,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.418130Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:224ea9241320db6f8a4f085fb25366dc1267563c26edc8f46885c768cbf47a60","observation_id":"761d5af5-24b6-4210-8357-d4dde762d5c8","resolution":{"observed_at":"2026-08-12T10:14:38.522988Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.499247Z","title":"Wafer map defect classification based on the fusion of pattern and pixel information,","venue":null,"work_id":"8ca74abb-0a16-4fdd-bee6-51b87e7243ab","year":2022},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":9,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.424000Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:8dc6bebd4c9cfb4116b1f216bf091b4a1b07f07540118d695e5ef2701f8f00d8","observation_id":"ab2f4f5c-f800-4578-952b-c8166de56b2b","resolution":{"observed_at":"2026-08-12T10:14:38.504849Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-12T10:14:38.481900Z","title":"Neuromorphic architectures for spiking deep neural networks,","venue":null,"work_id":"551618e9-bdea-437e-93b7-39b51b989664","year":2015},"citing_paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification","version":1},"reference_index":10,"source":"arxiv_source","source_observed_at":"2026-08-12T10:14:38.428117Z"},"links":{"citing_paper":"/paper/2411.19422"},"observation_digest":"sha256:2dbf95c727137f84634d6939c859ee474638b77bec4db6ce1c372aa79d89d4c4","observation_id":"bc93b25e-0b9c-474d-b4da-bdab65fb6933","resolution":{"observed_at":"2026-08-12T10:14:38.489393Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2411.19422","last_updated":"2024-11-29T00:31:01Z","latest_version":1,"primary_category":"cs.NE","snapshot_observed_at":"2026-08-21T18:09:19.070994Z","submitted_at":"2024-11-29T00:31:01Z","title":"Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification"},"reference_resolution":{"displayed":10,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":1,"verified_exact":0,"verified_fuzzy":9},"total_outbound_references":10},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"thesis":"As of 21 August 2026, this Paper Citation Record lists 10 of 10 outbound references and 0 inbound Pith citation observations for arXiv:2411.19422."}