{"as_of":"2026-08-13T03:13:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:43e97cf219141511a089111fa02615301d5a252a303dc58221579feed215f949","coverage":[{"denominator":17,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":17,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-11T21:59:28.686869Z","state":"measured"},{"denominator":17,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":17,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-12T06:34:41.77262+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2412.03936/citation-record","integrity":"/paper/2412.03936/integrity","json":"/paper/2412.03936/citation-record.json","paper":"/paper/2412.03936"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.851168Z","title":"Modeling radio-frequency devices based on deep learning technique","venue":null,"work_id":"242d49ec-01ac-4225-8b81-e7ccb1419a83","year":2021},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.630552Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:b5281c675d6dcb8ed14f26c68054309bc86eb5960137e7c041cdd2f951c770fd","observation_id":"bc9c9835-190c-4a73-a847-5b367ee6c3a9","resolution":{"observed_at":"2026-08-11T21:59:28.854365Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.842078Z","title":null,"venue":null,"work_id":"a735eb5e-9c6e-4c47-adc4-c91a72cbfd39","year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.635351Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:e6fd01a29128e901607d4da759577db027791399b30cf7b555f07eb6dde0b3f0","observation_id":"8d7d7090-15c8-48b0-8b3e-e0bd95568e5a","resolution":{"observed_at":"2026-08-11T21:59:28.845344Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.832950Z","title":null,"venue":null,"work_id":"9c4186bc-1491-4ea4-a9d6-736af327471e","year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.639028Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:5cb1ba891d5cd8626cb14c8ef90d3929c06e92ea05c18180ad98b2023d6a9e66","observation_id":"f87dd573-4fbd-47a8-b8f6-959bd93e0596","resolution":{"observed_at":"2026-08-11T21:59:28.836321Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.823441Z","title":"Neural-based dynamic modeling of nonlinear microwave circuits","venue":null,"work_id":"8c47e904-ffc9-4298-a221-fd866c2394ff","year":2002},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.642463Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:46c266da8a5534c353e1b9ea69ee2422a811523b65cbd81a52b1011b9969b3f0","observation_id":"007361dc-f461-4f59-a4b5-e8c482a81b29","resolution":{"observed_at":"2026-08-11T21:59:28.827206Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1609.03499","last_updated":"2016-09-19T18:04:35Z","snapshot_observed_at":"2026-08-13T01:24:25.628327Z","submitted_at":"2016-09-12T17:29:40Z","title":"WaveNet: A Generative Model for Raw Audio","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1609.03499","snapshot_observed_at":"2026-08-11T21:59:28.646021Z","title":"Wavenet: A generative model for raw audio","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.646021Z"},"links":{"cited_paper":"/paper/1609.03499","citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:fc1747759c398e986e2b21ac3a307caae529089c67ecb39719293244684d49eb","observation_id":"4628b374-f65f-4d5c-989b-28b7163e358f","resolution":{"observed_at":"2026-08-11T21:59:28.646021Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.814435Z","title":"Very deep convolutional neural networks for raw waveforms","venue":null,"work_id":"f5872431-89f9-46cf-95e1-35be9ea51e0e","year":2017},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.650184Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:a6983ef40a0293854e3c36c2322fb363a3aabfe3a90e351d7ba755b0ef2c2d5c","observation_id":"e752e437-3ba2-4a61-9c38-4c5d2ec62b9d","resolution":{"observed_at":"2026-08-11T21:59:28.817611Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2310.06625","last_updated":"2024-03-14T11:45:57Z","snapshot_observed_at":"2026-07-06T16:30:29.783501Z","submitted_at":"2023-10-10T13:44:09Z","title":"iTransformer: Inverted Transformers Are Effective for Time Series Forecasting","version":4},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2310.06625","snapshot_observed_at":"2026-08-11T21:59:28.654166Z","title":"itransformer: Inverted transformers are effective for time series forecast- ing","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.654166Z"},"links":{"cited_paper":"/paper/2310.06625","citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:689684485f99b02682246b5f44044b078ca9e2cff8b0e77ddaf7afd0ad2378a2","observation_id":"c81b5139-337c-4968-9c42-a68c04aee4ef","resolution":{"observed_at":"2026-08-11T21:59:28.654166Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.804991Z","title":"Dynamic behavioral modeling of 3g power amplifiers using real-valued time-delay neural networks","venue":null,"work_id":"c6c27c42-0c66-4476-ba01-f82bf3ebd670","year":2004},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.658097Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:46a3ee39510d4b5e8ab0cc07587f5f51641356fb5571cdc59ca6f09de32f4353","observation_id":"dfe9ce7e-0dbf-4203-b985-31179f68ee82","resolution":{"observed_at":"2026-08-11T21:59:28.808544Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.795160Z","title":"High-speed nonlinear circuit macromod- eling using hybrid-module clockwork recurrent neural network","venue":null,"work_id":"f9928081-7f3b-453e-94cd-200d4d82a353","year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.661737Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:e152938d6a3a7e15fc8a275dfeeb9f9c140766802ba3af3fb46dff92c1790fbf","observation_id":"04d0d2b8-d53b-4576-acbf-7a9f28377076","resolution":{"observed_at":"2026-08-11T21:59:28.798656Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1902.02627","last_updated":"2019-02-08T02:57:49Z","snapshot_observed_at":"2026-07-06T07:31:44.781941Z","submitted_at":"2019-01-25T07:14:40Z","title":"Fast Transient Simulation of High-Speed Channels Using Recurrent Neural Network","version":2},"cited_work":{"arxiv_id":"1902.02627","doi":null,"metadata_source":"pith","pith_arxiv_id":"1902.02627","snapshot_observed_at":"2026-08-11T21:59:28.724618Z","title":"Fast Transient Simulation of High-Speed Channels Using Recurrent Neural Network","venue":"eess.SP","work_id":"02d91648-e133-43eb-ab98-527021429df7","year":2019},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.665122Z"},"links":{"cited_paper":"/paper/1902.02627","citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:265c67e861e358de173a66ab5a25f24b5f86edb1e2d57e129caf5b5a90d67a77","observation_id":"9e1ea97e-e6b9-4792-8b0b-2b9d15ffb62c","resolution":{"observed_at":"2026-08-11T21:59:28.730125Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.785800Z","title":"Deep stacked autoencoder- based long-term spectrum prediction using real-world data","venue":null,"work_id":"b1d8af86-4af3-4d58-9915-bfa6d5f9e2ac","year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.668443Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:0da7711c9aeb1f06914738a164616af9d992a295a544cfd4c1e1ad8ab9d78c2a","observation_id":"daed0502-43a8-4d92-b295-91720cae8222","resolution":{"observed_at":"2026-08-11T21:59:28.789142Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2310.10688","last_updated":"2024-04-17T18:24:45Z","snapshot_observed_at":"2026-07-06T02:11:23.670680Z","submitted_at":"2023-10-14T17:01:37Z","title":"A decoder-only foundation model for time-series forecasting","version":4},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2310.10688","snapshot_observed_at":"2026-08-11T21:59:28.671705Z","title":"A decoder-only foundation model for time-series forecasting","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.671705Z"},"links":{"cited_paper":"/paper/2310.10688","citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:166f9ac6a8dc03d76ab8479660b0cd3403d0f8908916c3b4e70423b7b809e970","observation_id":"9b8577e6-ecb8-430e-8057-4c5eee979640","resolution":{"observed_at":"2026-08-11T21:59:28.671705Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.775939Z","title":"Analysis of machine learning techniques for time domain waveform prediction in analog and mixed signal integrated circuit verification","venue":null,"work_id":"4ce34dac-24c2-4701-a5d8-bc24ab56f12b","year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.674978Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:31ec86cc5539482df7eb60dc18753559319c1c9ede8ade58dc46d1d8bc0b5af9","observation_id":"b569aaf3-4636-45a3-b046-73e95d33e2cc","resolution":{"observed_at":"2026-08-11T21:59:28.779496Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.766196Z","title":"Macromodeling of nonlinear high- speed circuits using novel hybrid bidirectional high-order deep recurrent neural network","venue":null,"work_id":"cb4243a3-a598-43a4-9a9e-a4166e181964","year":2024},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.677911Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:6cdc42f87cf6d51d5249571d31aa52361b534a5700e1d8b7daf52d8d43975913","observation_id":"b17e03cb-f6a3-401b-bd14-f9eb0e221f57","resolution":{"observed_at":"2026-08-11T21:59:28.769675Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.756815Z","title":"Batch- normalized deep recurrent neural network for high-speed nonlinear circuit macromodeling","venue":null,"work_id":"acf4aeb2-619c-4755-b77d-2e8015714e60","year":2022},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.680725Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:3cdf6b8ee5e9825fb4b5bc75ec3b112e053aeed440736c07496ee20a2409e69e","observation_id":"694fddbf-1166-4785-a173-c71c47d285b8","resolution":{"observed_at":"2026-08-11T21:59:28.760239Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-11T21:59:28.683668Z","title":"Deep residual learning for image recognition","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.683668Z"},"links":{"citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:a5dfc4ec07d5fb8e447631e3fedd6b14620c6d71f12d377c8215bc753859fb06","observation_id":"1285e630-0306-4790-a4e0-d89be02f6174","resolution":{"observed_at":"2026-08-11T21:59:28.683668Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2312.00752","last_updated":"2024-05-31T17:55:27Z","snapshot_observed_at":"2026-07-06T02:11:23.670680Z","submitted_at":"2023-12-01T18:01:34Z","title":"Mamba: Linear-Time Sequence Modeling with Selective State Spaces","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2312.00752","snapshot_observed_at":"2026-08-11T21:59:28.686869Z","title":"Mamba: Linear-time sequence modeling with selective state spaces","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-11T21:59:28.686869Z"},"links":{"cited_paper":"/paper/2312.00752","citing_paper":"/paper/2412.03936"},"observation_digest":"sha256:9412b946647cca211582ad43289a855f629861ee112ff3de29f50b0b044b17e1","observation_id":"9e1fd5e4-5368-4cb4-892a-7fe11558b3eb","resolution":{"observed_at":"2026-08-11T21:59:28.686869Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"paper":{"arxiv_id":"2412.03936","last_updated":"2024-12-05T07:34:04Z","latest_version":1,"primary_category":"eess.SP","snapshot_observed_at":"2026-08-11T21:53:26.793771Z","submitted_at":"2024-12-05T07:34:04Z","title":"Deep Learning Modeling Method for RF Devices Based on Uniform Noise Training Set"},"reference_resolution":{"displayed":17,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":7,"verified_exact":1,"verified_fuzzy":9},"total_outbound_references":17},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-12T06:34:41.77262+00:00","source":"crossref"},{"observed_at":"2026-08-12T06:34:36.333875+00:00","source":"retraction_watch"}],"thesis":"As of 13 August 2026, this Paper Citation Record lists 17 of 17 outbound references and 0 inbound Pith citation observations for arXiv:2412.03936."}