{"as_of":"2026-08-18T10:10:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:a12d26a2f171ce97ac6b6a0c0a8f7e253e4d9e2ad04bb0e11503e2cf02e8053a","coverage":[{"denominator":17,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":17,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-10T20:20:02.472188Z","state":"measured"},{"denominator":17,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":17,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-18T06:34:40.430872+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2501.08961/citation-record","integrity":"/paper/2501.08961/integrity","json":"/paper/2501.08961/citation-record.json","paper":"/paper/2501.08961"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.696859Z","title":"Dhumal, Atul P","venue":null,"work_id":"08062637-20c0-42be-897a-15671bbeae62","year":2023},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.407509Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:8fcda308081cf60ad0d0ec05f9300b00739a6730ef152c4288defe98d84eb243","observation_id":"648fa97f-6871-429c-b7c3-6c037505a177","resolution":{"observed_at":"2026-08-10T20:20:02.700962Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.685002Z","title":"Thermoelectric coolers for on-chip thermal management: Materials, design, and optimiza- tion","venue":null,"work_id":"b3bd2040-cddf-4723-8980-8c40f62791be","year":2022},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.412196Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:dea2fd13398c70166684938b3912de6a8837bb07487065193b1c21d2169b8bf5","observation_id":"a3a44109-b062-4f06-b437-f1bd283138ab","resolution":{"observed_at":"2026-08-10T20:20:02.689026Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.673229Z","title":"A review of advanced thermal interface materials with oriented structures for electronic devices","venue":null,"work_id":"833ad52a-17b6-4c13-b4ed-57fc96e2d0f1","year":2024},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.416419Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:8f6504f4c7b7b7b89ccf50457fce773df1f124050b4de040faaa779e34de8565","observation_id":"6732dff4-9b97-4b3d-bd18-ff97e60399c0","resolution":{"observed_at":"2026-08-10T20:20:02.677261Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.661195Z","title":"High thermal conductivity insulators for ther- mal management in 3d integrated circuits","venue":null,"work_id":"046a6ecc-8164-4fb9-8c01-c48a161e26e6","year":2023},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.420464Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:942c0495046c1487203200c575637dda0304a175df4bd872160f1987ea600e2b","observation_id":"8cdf3776-c719-4766-a48a-44d0ec1a285f","resolution":{"observed_at":"2026-08-10T20:20:02.665458Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.649468Z","title":"Scanning thermal microscopy: A review","venue":null,"work_id":"8be1b206-fd69-4abc-b245-09bdf61bbfee","year":2015},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.424801Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:7708b0aaa461d39ed161932b10a385710b9c6053a168875b2709faf836920fbb","observation_id":"855687b3-a161-4953-a9cc-e58ae7ba39cf","resolution":{"observed_at":"2026-08-10T20:20:02.653490Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.637743Z","title":"Scanning thermal microscopy of individual silicon nanowires","venue":null,"work_id":"a312e76e-92e6-43b8-8511-ec7c95eee694","year":2011},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.428902Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:21d42e76e5c9e859d1d6842ec25e4fd653181664b59c61223971e2765c5e1289","observation_id":"470a5af2-baf4-49f5-bca4-d3c02cc817bc","resolution":{"observed_at":"2026-08-10T20:20:02.641758Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.625780Z","title":"Thermal conductivity measurement of a sb2te3 phase change nanowire","venue":null,"work_id":"602c940a-8fb8-45eb-8330-10034de126a5","year":2014},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.433530Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:6680e97865ea6ebb51d8ee0118bd154a121483122ce4223b0067be4c8d881b10","observation_id":"b2cd0469-86ae-4cdd-9c0f-c7b349594657","resolution":{"observed_at":"2026-08-10T20:20:02.629684Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.613965Z","title":"Juszczyk, M","venue":null,"work_id":"2f19c792-1f90-4422-93c6-5aa00ca047de","year":2013},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.437260Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:a81496544fbf94b2e1bc50dedfb6adf52142cac0a58a5c3dfb7e703174710184","observation_id":"922c0cf7-ddb5-4b7c-9172-f77a8c4ccf31","resolution":{"observed_at":"2026-08-10T20:20:02.617833Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.601878Z","title":null,"venue":null,"work_id":"06edb393-2565-4630-8d84-ff609c78d3f4","year":2005},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.441133Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:e0eab9a4f712d14f43e2dfdb1a8ea908632596b23a42857a4510e305d9aa501b","observation_id":"763b6d87-7fa3-49db-8454-72c6bc929b1c","resolution":{"observed_at":"2026-08-10T20:20:02.605784Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.589568Z","title":"Scanning thermal microscopy on samples of varying effective thermal conductivities and identical flat surfaces","venue":null,"work_id":"46e9e5b7-0041-414e-931c-a2657f7d5cc0","year":2020},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.444945Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:5dda85b076ef7011452a47c20932ec2e52e18a314111bfa25c8f5bd0fe3170fa","observation_id":"3de361c1-1dca-41e5-8a8e-b4aece95afae","resolution":{"observed_at":"2026-08-10T20:20:02.593817Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.576528Z","title":"Quantitative measurement of thermal conductivity by sthm technique: Measurements, calibration protocols and uncertainty evalua- tion","venue":null,"work_id":"4fbeb208-88f7-4099-8914-e670bcd74cc7","year":2023},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.448730Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:ed30300922b7fe81d0ee2322329ff7b8b768180a994b540bb41a2253e42c21f8","observation_id":"065013e3-e72c-467b-a8cc-2046da9c0a3c","resolution":{"observed_at":"2026-08-10T20:20:02.580860Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.563368Z","title":"Elsevier, North Holland, 1988","venue":null,"work_id":"5a027bba-e003-4759-bb67-d60fd4c4fbf3","year":1988},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.452522Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:ef49eecf1f018b27442ea62878c68ac65738da9a9cde1d8c441700344d7fb025","observation_id":"e1b2930d-4603-424e-81f1-5ccf9b2215b3","resolution":{"observed_at":"2026-08-10T20:20:02.567950Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.550339Z","title":"Quantiheat project: Main progresses","venue":null,"work_id":"0cf4a48e-6917-4d2e-ba39-180d0b4cb44a","year":2016},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.457166Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:a25f60a77655829eab75aa904d5ed637ec75be150fc700ba0af4e87b7053be92","observation_id":"c104c97e-7ca0-46d4-ad24-c59d8033fb1b","resolution":{"observed_at":"2026-08-10T20:20:02.554458Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.537776Z","title":"Paule and John Mandel","venue":null,"work_id":"db2c1c79-0be8-411b-a7ca-7a2354f8acc9","year":1982},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.460913Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:f49ffe7278bd4a58f12aabcd68ce33a81e75b205480780d778b3921ebc0689dc","observation_id":"f68a1faa-6d34-43cc-8803-add5f86f3470","resolution":{"observed_at":"2026-08-10T20:20:02.542071Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.525497Z","title":"Charv´ atov´ a Campbell, Z","venue":null,"work_id":"acd25c10-a347-4b22-88f9-ebee0afe1324","year":2024},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.464812Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:f923808141ca371be4bfbaa7d45e30c5b74a90c1d53ace834aa60d350b52102c","observation_id":"22777901-472f-4bde-b0e5-5b30a8479dfc","resolution":{"observed_at":"2026-08-10T20:20:02.529464Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.512956Z","title":"Applications of iterated linearization for non-linear errors-in-variable regression to metrological data","venue":null,"work_id":"d7cd41f7-1fb7-4f36-9353-8ed3b7599e20","year":2025},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.468654Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:71a5f61745f8a5a96c6985f98df2881710615dc9434e053cb4d2936971859470","observation_id":"6d7cc78f-70dd-489f-9dd8-5545ad5ebe4b","resolution":{"observed_at":"2026-08-10T20:20:02.517236Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T20:20:02.498287Z","title":"Estimation of function parameters through iterated linearization for nonlinear errors-in-variable regression with corre- lated variables","venue":null,"work_id":"5d36097d-6ff8-4e62-8963-3b06fcdbeae5","year":2025},"citing_paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-10T20:20:02.472188Z"},"links":{"citing_paper":"/paper/2501.08961"},"observation_digest":"sha256:413e9ad3338d241c4ffe51ea0399027e3e59078d1b75396acf194627566e3fe1","observation_id":"6fe989ba-fcb6-45cc-a53b-1af953e06d85","resolution":{"observed_at":"2026-08-10T20:20:02.504048Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2501.08961","last_updated":"2025-01-15T17:15:30Z","latest_version":1,"primary_category":"physics.data-an","snapshot_observed_at":"2026-08-14T16:24:57.454756Z","submitted_at":"2025-01-15T17:15:30Z","title":"Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization"},"reference_resolution":{"displayed":17,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":1,"verified_exact":0,"verified_fuzzy":16},"total_outbound_references":17},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-18T06:34:40.430872+00:00","source":"crossref"},{"observed_at":"2026-08-18T06:34:34.496301+00:00","source":"retraction_watch"}],"thesis":"As of 18 August 2026, this Paper Citation Record lists 17 of 17 outbound references and 0 inbound Pith citation observations for arXiv:2501.08961."}