{"as_of":"2026-08-20T04:22:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:555f26e9f33ea52a7f6b01ab618095d41e7942c639d9a0d5b4a043f4d954ce6d","coverage":[{"denominator":34,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":34,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-10T19:52:32.267952Z","state":"measured"},{"denominator":34,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":34,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-19T06:32:44.657259+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2501.09665/citation-record","integrity":"/paper/2501.09665/integrity","json":"/paper/2501.09665/citation-record.json","paper":"/paper/2501.09665"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.715812Z","title":"Implementing practical electrical glitching attacks,","venue":null,"work_id":"f1f81057-a632-4989-bc1e-d2af0c06f1d8","year":2015},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.133971Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:7faf98e5c696b8d1d60a14f6867c0feef828c04cbb88042c99381d51d3db20ce","observation_id":"1af94b65-a589-40e0-a626-84ba277c73b1","resolution":{"observed_at":"2026-08-10T19:52:32.719805Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.703253Z","title":"Injecting Software Vulnerabilities with V oltage Glitching,","venue":null,"work_id":"d7eac905-4c87-4014-8910-d73b0235938f","year":null},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.139204Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:0e9c369e2f824f150ece39878469744b022d7b70865dd2a07cee3c9951bb4e85","observation_id":"7a6cc1bc-4d96-498f-9b22-8c1bf7b1112f","resolution":{"observed_at":"2026-08-10T19:52:32.707979Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.692042Z","title":"Drone Security and Fault Injection Attacks,","venue":null,"work_id":"2f9a436a-3531-4e5a-88e2-8d9ddf7c6404","year":2023},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.147983Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:913df1dba3b4fc3da1c28aeb6f90e771e683219d70d24ec8b9ebb63ff015db8a","observation_id":"98cebf56-ccc5-4484-a9ab-408266e66e6d","resolution":{"observed_at":"2026-08-10T19:52:32.696093Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.680269Z","title":"Plundervolt: Software-based Fault Injection Attacks against Intel SGX,","venue":null,"work_id":"965c3f61-25ac-4402-aae2-569da95fe11c","year":2020},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.152372Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:9283228a4277744c95aeb74987cc1aa8e55abb4cad2d638cff3cf1f8d34b20e2","observation_id":"23a9fe0e-8130-45d4-94d6-f8c9a0c835e1","resolution":{"observed_at":"2026-08-10T19:52:32.684601Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.668817Z","title":"V oltJockey: Breaching TrustZone by Software-Controlled V oltage Manipulation over Multi-core Frequen- cies,","venue":null,"work_id":"7672e96a-eaaf-4f3d-bd18-5d7f22e7fd62","year":2019},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.156669Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:ae3dfdd753a308c20e2d5c62bed61beb3663bdc18852ba7f83653d8d968a26da","observation_id":"d1917fbc-7a2e-46c2-871c-6407b418c3ba","resolution":{"observed_at":"2026-08-10T19:52:32.673062Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.657666Z","title":"A 286 F2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection At- tack on Cryptographic Processor,","venue":null,"work_id":"cd9b2f75-b2af-4fa1-b3db-caf1b69772f5","year":2018},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.160827Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:6891e88bf724ffd6ce5c5e54c0f92fff7e34bb6bb5cb32ad2a0c61195c7807f5","observation_id":"cf22e829-674a-4ba4-9e49-474aafa7a4e3","resolution":{"observed_at":"2026-08-10T19:52:32.661832Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.645841Z","title":"Laser V oltage Probing Attack Detection With 100% Area/Time Coverage at Above/Below the Bandgap Wavelength and Fully-Automated Design,","venue":null,"work_id":"0f05c7e0-855c-486a-ada4-e64b106d8470","year":2023},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.165078Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:989d9624f5e896d07e0ee775d27f57be57b6811de9c315dee4c7f91d6d962e50","observation_id":"9d34db8a-05fc-433f-8f76-fe8febc8569b","resolution":{"observed_at":"2026-08-10T19:52:32.650285Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.633991Z","title":"A 100Gbps Fault-Injection Attack Resistant AES-256 Engine with 99.1-to- 99.99% Error Coverage in Intel 4 CMOS,","venue":null,"work_id":"462ed53b-e2bc-40c8-a500-5fabb9a8bdf4","year":2023},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.168986Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:57b78a103b1db8dbe3d4c635f22f09e93581349af012c61b24b606e4a6d0c8a5","observation_id":"6ab5064d-8f2a-4b5c-9ab2-fcafe9a7b249","resolution":{"observed_at":"2026-08-10T19:52:32.638200Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.622281Z","title":"A Synthesizable Design-Agnostic Timing Fault Injection Monitor Covering 2MHz to 1.26GHz Clocks in 65nm CMOS,","venue":null,"work_id":"373397d3-407f-4e6b-a39e-51d9e0e76a32","year":2024},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.172877Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:7d88a6b305df20dc6d5ce19855cdb6dbfdb4f32030163ed328308ddd84a775fd","observation_id":"bbc54932-2924-4f99-9119-b5e46206b7c5","resolution":{"observed_at":"2026-08-10T19:52:32.626633Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.610584Z","title":"Design and Analysis of Clock Fault Injection for AES,","venue":null,"work_id":"54432453-b09e-45b5-8d0d-a6ce9c9809c0","year":2020},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.176784Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:1f91f27ac604d92b104e6a5f82632e9a3610e38519903d3f261d9cd331eb3191","observation_id":"a806dc81-f7c4-4482-ad91-6ff7864f7b27","resolution":{"observed_at":"2026-08-10T19:52:32.614658Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.599087Z","title":"A DFA on AES Based on the Entropy of Error Distributions,","venue":null,"work_id":"23554f02-8901-460a-96ca-0c97d16a1a28","year":2012},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.180787Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:5d84ff21e2853ed63c55a497f622fc864955f44ac6b39534f961795f633381fc","observation_id":"4c60242c-131d-4a36-bbbf-e09edf45e746","resolution":{"observed_at":"2026-08-10T19:52:32.603184Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.587282Z","title":"Modeling and Efficiency Analysis of Clock Glitch Fault Injection Attack,","venue":null,"work_id":"3522a1ac-c3f6-4432-8691-5772bf569678","year":2018},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.184943Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:8846281c088bb75cc1f0b76df977baf4403f9f60fe81ece4887119461e4c8850","observation_id":"76309947-a975-4314-a388-d052020897e3","resolution":{"observed_at":"2026-08-10T19:52:32.591790Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.575228Z","title":"Clock glitch generator on SAKURA-G for fault injection attack against a cryptographic circuit,","venue":null,"work_id":"f20ad657-ecc1-4ce7-9c61-9a6e3ae1e28c","year":2016},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.188752Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:4592cb5c035ba2522d388e9b75aa03b2722952a5eb27397903e14f705f7f997e","observation_id":"8da6d49f-1da5-4c17-abce-6c27f2c2a00e","resolution":{"observed_at":"2026-08-10T19:52:32.579554Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.564211Z","title":"Lightning: Leveraging DVFS-induced Transient Fault Injection to At- tack Deep Learning Accelerator of GPUs,","venue":null,"work_id":"15a3bd0e-b16e-4820-8678-deb935f3b679","year":2023},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.192499Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:f42bbf71b87b3c29ad77c077acbc97cf4e5730dcd1cf636729b65288cf4da7f8","observation_id":"1da7130e-9314-4746-a69f-0be01d7da334","resolution":{"observed_at":"2026-08-10T19:52:32.568165Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.552462Z","title":"ChipWhisperer - the complete open-source toolchain for side- channel power analysis and glitching attacks","venue":null,"work_id":"db92d4ab-35c1-4911-91be-9345710a27ba","year":null},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.196406Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:32da8e1610724d66c1d3cba7221cbf5de6153035d017a40aa13af6527359f110","observation_id":"27c268ce-b359-461b-9eb7-fdf950d15f34","resolution":{"observed_at":"2026-08-10T19:52:32.557321Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.540353Z","title":"Electromagnetic Transient Faults Injection on a Hardware and a Software Implementa- tions of AES,","venue":null,"work_id":"372e6608-5b35-40c6-bc0e-79680333ba44","year":2012},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.200606Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:d6ee610fd65146fa2ea19707f9ef009a68b07f5240bfca49dcc15ee722db0209","observation_id":"cff4f57a-10ae-4972-a5f0-7f6689618347","resolution":{"observed_at":"2026-08-10T19:52:32.544452Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.528737Z","title":"Transient IEMI Threats for Cryptographic Devices,","venue":null,"work_id":"037800e1-d487-45e5-866b-8063ae9aec5f","year":2013},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.204781Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:5f93f48837a1c552d117dd3ee71bcd695c003d6ac90da24d7c790e5ef92988ec","observation_id":"3d93b050-e726-4786-9174-95a47d986bd7","resolution":{"observed_at":"2026-08-10T19:52:32.532553Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.517068Z","title":"Detection of IEMI fault injection using voltage moni- tor constructed with fully digital circuit,","venue":null,"work_id":"98302618-3118-424e-8310-6b422fb436bd","year":2018},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.208693Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:9608bc3a2889d5b48e761a2d7ede4d234816523d7ec83abf5bae233198ac9099","observation_id":"08ea88cb-bced-432f-b515-9399703d1c79","resolution":{"observed_at":"2026-08-10T19:52:32.521421Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.504830Z","title":"The Temperature Side Channel and Heat- ing Fault Attacks,","venue":null,"work_id":"eded6041-7fcf-4045-9f2a-9d54a3af2a59","year":2014},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.212617Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:6500666fa0229f8b60c44450a8e62d10f4956f588f8f3acd0370a29c047344b0","observation_id":"0fd42ba4-a847-40f3-be7d-a453c08a9eb6","resolution":{"observed_at":"2026-08-10T19:52:32.508864Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.492740Z","title":"SYNFI: Pre-Silicon Fault Analysis of an Open-Source Secure Element,","venue":null,"work_id":"e5d71291-fcd8-4cad-86c4-6a466fb8bcfb","year":2022},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.216724Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:9595ddc1de27acb7268047fce30312e242e54b4e76767cb393b191877572925c","observation_id":"1c082129-e19c-4561-a6a5-c4904f914c17","resolution":{"observed_at":"2026-08-10T19:52:32.497060Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.479993Z","title":"LDTFI: Layout-aware Timing Fault-Injection Attack Assess- ment Against Differential Fault Analysis,","venue":null,"work_id":"5f5b55f5-a4e5-4555-b5ce-80fa6713aba0","year":2022},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.221059Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:66c6285cd1c31f697ab055bfeb5b3f9b7a8df3c6327aae370f5828c2cefa9c24","observation_id":"805ab11f-53f1-4587-9655-371361f57e69","resolution":{"observed_at":"2026-08-10T19:52:32.484663Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.467742Z","title":"Razor: a low-power pipeline based on circuit-level timing speculation,","venue":null,"work_id":"76c3af29-b508-43e6-bf77-1f2de4fe6324","year":null},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.225202Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:9811e7716d065c34f3dba363049201ea1e6a666ba74b11a4de4f827ab9f033d3","observation_id":"97eeb769-8b99-4cbe-a003-644badb2ca9a","resolution":{"observed_at":"2026-08-10T19:52:32.471952Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.443683Z","title":"RazorII: In Situ Error Detection and Correction for PVT and SER Tolerance,","venue":null,"work_id":"68c1cfc7-7452-45a8-bd72-fa5f2aa60134","year":2009},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.233176Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:e1f238c9682b2519215700cf2cf76de5de5d7ac103b38721b29a603463888f52","observation_id":"3d1ea78d-52c5-4b64-ba4e-0ac4e4f31179","resolution":{"observed_at":"2026-08-10T19:52:32.448691Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.429503Z","title":"Razor- Lite: A Light-Weight Register for Error Detection by Observing Virtual Supply Rails,","venue":null,"work_id":"f8415e26-2b43-4a5f-aaed-759baf1c2102","year":2014},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.237148Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:0ecfb587b2dace7b729508576c1f2653e84bfc93ae885915810c158b38833bfb","observation_id":"66a04b03-3d67-4fb7-a66c-1229cc1c5b10","resolution":{"observed_at":"2026-08-10T19:52:32.434561Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.415158Z","title":"iRazor: Current-Based Error Detection and Correction Scheme for PVT Variation in 40-nm ARM Cortex-R4 Processor,","venue":null,"work_id":"530fb1db-1dca-494f-af03-238c8c2c8f5d","year":2018},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.240946Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:0c41dacffe0398d06b1af6f29f84323a613b3e7059e4702b4c51e44fd51d61e5","observation_id":"e84ac558-0887-4775-bdae-c16b91281f55","resolution":{"observed_at":"2026-08-10T19:52:32.420257Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.401549Z","title":"Postsilicon V oltage Guard-Band Reduction in a 22 nm Graphics Execution Core Using Adaptive V oltage Scaling and Dynamic Power Gating,","venue":null,"work_id":"def39175-ef3f-4019-93c4-c020107d4058","year":2017},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.244848Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:4c5e209b7bd3f62b79a826265b5a57caf22c7b247ed8335260de9bcc9790a2c1","observation_id":"e4e8659e-d39e-44fc-a51d-f3dea0e8d99b","resolution":{"observed_at":"2026-08-10T19:52:32.406158Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.388897Z","title":"A 22 nm All-Digital Dynamically Adaptive Clock Distribution for Supply V oltage Droop Tolerance,","venue":null,"work_id":"00d84194-f679-46ee-96fb-1fdb8f96f3a4","year":2013},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.249246Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:104b6618748dd8ab0cfd58a3d194635a886c56f0138fe11dd9098d8543770cae","observation_id":"92d054c6-5325-4a1d-ba2e-50d47d5150ea","resolution":{"observed_at":"2026-08-10T19:52:32.393501Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.374169Z","title":"Fault-Injection Detection Circuits: Design, Calibration, Validation and Tuning,","venue":null,"work_id":"b006e5d3-4bf0-4ac6-b5cd-30235617b45e","year":2022},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.252947Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:d88d8c100602514bdae8a42a59d7dae38d6a02bb8b967bd9bebe1033717a6e37","observation_id":"2da3cec7-fe5a-4101-bc39-476805ffa9cc","resolution":{"observed_at":"2026-08-10T19:52:32.379290Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.360742Z","title":"An FLL-Based Clock Glitch Detector for Security Circuits in a 5nm FINFET Process,","venue":null,"work_id":"1c7a90f3-af85-4c0b-af3a-13505bb46ba8","year":2022},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.256623Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:38f02402780c1962e313f82220e2624066eea0cf3085ab082cc7fb01c4304df3","observation_id":"71d83636-3ee7-4938-bb2b-31a89fd7c8da","resolution":{"observed_at":"2026-08-10T19:52:32.365819Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.346920Z","title":"A local EM-analysis attack resistant cryptographic engine with fully-digital oscillator-based tamper-access sensor,","venue":null,"work_id":"bb9ff181-b98e-4afc-bc5d-75135aae2a96","year":2014},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.260340Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:232903c743a15192d7748cc31c2cf3301b7a7d5f2a18aa04d347705ac162bcda","observation_id":"f0839d99-c404-46e7-8c6f-5525ecd360d0","resolution":{"observed_at":"2026-08-10T19:52:32.351936Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.332682Z","title":"PG- CAS: Patterned-Ground Co-Planar Capacitive Asymmetry Sensing for mm-Range EM Side-Channel Attack Probe Detection,","venue":null,"work_id":"34511994-005c-41fc-bf9d-d720ffefb334","year":2021},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.263798Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:a800dfb3d89d01f7556bebb4f9c071497bf24b3f3c8efdafb6be84f8e36411cb","observation_id":"33017aad-c746-4b0b-9fc8-5c7598301aa0","resolution":{"observed_at":"2026-08-10T19:52:32.337489Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.318620Z","title":"A Fully Synthesizable Fractional-N MDLL With Zero- Order Interpolation-Based DTC Nonlinearity Calibration and Two-Step Hybrid Phase Offset Calibration,","venue":null,"work_id":"f4607c80-2e94-4389-90f8-9142224ba008","year":2021},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.267952Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:a82ddd4383f3dd4358774db3e43fd58c75d9cb9a5f518eb57febdf0dbf6bcd33","observation_id":"f2db9efc-08ff-4478-b302-9b8e6b83168b","resolution":{"observed_at":"2026-08-10T19:52:32.323934Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T19:52:32.456519Z","title":"2003, pp","venue":null,"work_id":"abbac9fe-df76-442b-b317-4d2a5887ee70","year":2003},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":2003,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.229201Z"},"links":{"citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:f2333fe11de7f451356716a5930d64360a308aa4996b8a407769726a950f7faf","observation_id":"fe26d873-2382-4efe-b7f3-7075aeb4b62c","resolution":{"observed_at":"2026-08-10T19:52:32.460237Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1903.08102","last_updated":"2019-02-14T03:18:02Z","snapshot_observed_at":"2026-08-14T17:16:34.997048Z","submitted_at":"2019-02-14T03:18:02Z","title":"Injecting Software Vulnerabilities with Voltage Glitching","version":1},"cited_work":{"arxiv_id":"1903.08102","doi":null,"metadata_source":"pith","pith_arxiv_id":"1903.08102","snapshot_observed_at":"2026-08-10T19:52:32.302973Z","title":"Injecting Software Vulnerabilities with Voltage Glitching","venue":"cs.CR","work_id":"2f9a6b37-aa27-46bc-b345-d73e00c37edb","year":2019},"citing_paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation","version":1},"reference_index":2019,"source":"pdf_text","source_observed_at":"2026-08-10T19:52:32.143310Z"},"links":{"cited_paper":"/paper/1903.08102","citing_paper":"/paper/2501.09665"},"observation_digest":"sha256:f07a0bb90141f62f80d1be9ed51609b6d9a13c00145597c7df249cf59ec7db65","observation_id":"a5c0a954-a345-4609-a6dd-d86f00380909","resolution":{"observed_at":"2026-08-10T19:52:32.309542Z","resolver_source":"local_arxiv","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2501.09665","last_updated":"2025-01-16T17:04:13Z","latest_version":1,"primary_category":"eess.SY","snapshot_observed_at":"2026-08-20T02:24:21.115128Z","submitted_at":"2025-01-16T17:04:13Z","title":"Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation"},"reference_resolution":{"displayed":34,"state_counts":{"malformed_identifier":0,"metadata_mismatch":1,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":33},"total_outbound_references":34},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"thesis":"As of 20 August 2026, this Paper Citation Record lists 34 of 34 outbound references and 0 inbound Pith citation observations for arXiv:2501.09665."}