{"as_of":"2026-08-10T16:35:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:bbbae1846cfdf26fa875182ef2cce59746e6b4e70aa51cc145ecf45c64720234","coverage":[{"denominator":55,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":55,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-10T04:30:42.682261Z","state":"measured"},{"denominator":56,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":56,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-10T06:31:04.303077+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-05-19T07:31:54.509251Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-05-19T07:32:08.687166Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"cited_work":{"arxiv_id":"2501.18005","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2501.18005","snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Fault localization via fine-tuning large language models with mutation generated stack traces","venue":null,"work_id":"4df5f6df-0da3-4411-a2b7-839751eb808b","year":2025},"citing_paper":{"arxiv_id":"2506.19045","last_updated":"2026-07-21T15:45:12Z","snapshot_observed_at":"2026-08-06T23:11:39.850974Z","submitted_at":"2025-06-23T19:04:51Z","title":"Efficient Black-Box Fault Localization for System-Level Test Code Using Large Language Models","version":4},"reference_index":93,"source":"pdf_text","source_observed_at":"2026-05-19T07:31:54.509251Z"},"links":{"cited_paper":"/paper/2501.18005","citing_paper":"/paper/2506.19045"},"observation_digest":"sha256:79940ba8d073853713e5d647a81607837f0bea6abff6c8fda20051d316dae331","observation_id":"e554b2a4-2eee-4267-a696-b749ecaf5ceb","resolution":{"observed_at":"2026-05-19T07:32:08.688815Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2501.18005/citation-record","integrity":"/paper/2501.18005/integrity","json":"/paper/2501.18005/citation-record.json","paper":"/paper/2501.18005"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.679924Z","title":"A survey on software fault localization,","venue":null,"work_id":"9c6c65c1-f403-4b4e-9b74-fedeaed45455","year":2016},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.413876Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:f6df1366308b39754afa2f4260aaaf90d174e683dd35cc28b08756020d8aa8d5","observation_id":"72b67431-3f93-49f0-9d32-3896bbc74f44","resolution":{"observed_at":"2026-08-10T04:30:43.684617Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.664475Z","title":"The SAP HANA Database–An Architecture Overview","venue":null,"work_id":"b764e3c1-f7db-4794-a736-8897562c10bc","year":2012},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.419850Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:ae18336ebff981e133c3631e9e8951eee4ac5853f7076773d8aea33428bd0648","observation_id":"73a432e2-fc9e-40df-bf9e-5b8bfbee0eb6","resolution":{"observed_at":"2026-08-10T04:30:43.669357Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.649949Z","title":"SAP HANA database: data management for modern business applica- tions,","venue":null,"work_id":"a3d8920d-cbd2-43fb-be19-8a9f8f2d0ad5","year":2012},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.425176Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:44b7a6bbf55e0b1c8312156ccc1cd5cce11ea1c725a4866e6c7e4aada7972b56","observation_id":"3264b2c1-1f9e-4787-bb5a-bcff2d3fd427","resolution":{"observed_at":"2026-08-10T04:30:43.654825Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.634561Z","title":"Testing very large database management systems: The case of SAP HANA,","venue":null,"work_id":"92f54c28-20e8-4b75-8f82-3f467be5daf7","year":2022},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.430631Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:ced27d6470164a61601fdacb313646e95f4412b8a18314feb19163adaeadd10d","observation_id":"fc7c553c-4027-4f8d-a6db-ac9a4d76ce82","resolution":{"observed_at":"2026-08-10T04:30:43.639639Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.619204Z","title":"Boosting bug-report-oriented fault localization with segmentation and stack-trace analysis,","venue":null,"work_id":"bdf26aee-14e3-4d28-a851-779ef5c9d522","year":2014},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.435530Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:d3345129de5365f61a29a0be7303e155abd5513018c9eda170d3a4316ada4e17","observation_id":"c77782ad-e341-4671-a516-3d5e69012fe2","resolution":{"observed_at":"2026-08-10T04:30:43.623991Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.604152Z","title":"Fault localization and repair for Java runtime exceptions,","venue":null,"work_id":"595d0577-a6ad-446d-bb2e-28e744ba29c2","year":2009},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.440706Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:0043b6a5a3a08fe3bd25033a57f943c3c096f43c68abdbdd2fe6e5dd87d2365f","observation_id":"8c1e41d9-ae21-437f-b709-d58bfa5ed406","resolution":{"observed_at":"2026-08-10T04:30:43.609054Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.588781Z","title":"A Preliminary Evaluation of LLM-Based Fault Localization,","venue":null,"work_id":"05218914-30b8-4f91-8112-673e9569d431","year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.446339Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:7934742854c2d5abfc4a7bbf4052682e4139f98ca1d76d87f3c18351d47b6402","observation_id":"a7bb6495-8279-4d7c-a2b7-ccd2216f57e0","resolution":{"observed_at":"2026-08-10T04:30:43.593922Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1404.4100","last_updated":"2014-04-15T22:32:21Z","snapshot_observed_at":"2026-07-06T03:41:17.773146Z","submitted_at":"2014-04-15T22:32:21Z","title":"Locating Crashing Faults based on Crash Stack Traces","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1404.4100","snapshot_observed_at":"2026-08-10T04:30:42.451263Z","title":"Locating crashing faults based on crash stack traces,","venue":null,"work_id":null,"year":2014},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.451263Z"},"links":{"cited_paper":"/paper/1404.4100","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:c4e3a3d6eff1fe54e32ac9c3dc5a348261fe0eb40b65bbf976b5c3df67101c92","observation_id":"e03c63a5-e723-49fd-8c92-7b129dee5868","resolution":{"observed_at":"2026-08-10T04:30:42.451263Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.574792Z","title":"Do Stack Traces Help Developers Fix Bugs?","venue":null,"work_id":"5d4f7705-c5d6-47d0-b57e-1bb5c457a56f","year":2010},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.456481Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:7489d703e93c652a979dff186a0f829db9fd3c52d97458098d0053d6c9492df8","observation_id":"aa747477-9497-43d2-a631-0cc5dc7d5e33","resolution":{"observed_at":"2026-08-10T04:30:43.579322Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.560795Z","title":"An empirical study of fault localization families and their combinations,","venue":null,"work_id":"c9f91d94-04df-4c83-9a01-e7fbb033d35a","year":2019},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.461375Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:8118c22d690b4ddd28c6e70164f974c8a5f4190a5bef34747a478ca929a89886","observation_id":"c70ffd70-6890-4d02-9f56-3967394c2be7","resolution":{"observed_at":"2026-08-10T04:30:43.565173Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.544780Z","title":"Defects4J: A database of existing faults to enable controlled testing studies for Java programs,","venue":null,"work_id":"507bd6e5-cfdd-4c4d-852a-583ecdec8218","year":2014},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.466290Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:6137db794b53575afb5f989e63f094f36deab7702c020a82455f8559f40090f5","observation_id":"78567c27-710d-4d1e-bfa3-e1f02e8b3df9","resolution":{"observed_at":"2026-08-10T04:30:43.549713Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.529374Z","title":"Leveraging Stack Traces for Spectrum-based Fault Localization in the Absence of Failing Tests,","venue":null,"work_id":"27fdfa83-ffa3-43a9-b9c6-8386d2fb29df","year":2024},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.470936Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:03bf0058dcbd5c7e435964fffcec47c90b48e48327b5562713a69f7833b96914","observation_id":"ecb1888d-5861-4d5e-ad97-999c78c5b65e","resolution":{"observed_at":"2026-08-10T04:30:43.534400Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.514236Z","title":"Empirical evaluation of the Tarantula automatic fault-localization technique,","venue":null,"work_id":"071cee57-a534-4674-8553-0c3e29adcb61","year":2005},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.475628Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:8145795e250e2dbd50c1b80c8d2a152f2ae7ddc2285cd6959c997fd7d872c82f","observation_id":"0aa06b0f-849f-46c9-ab4a-98febb2664d7","resolution":{"observed_at":"2026-08-10T04:30:43.519334Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.499545Z","title":"The DStar method for effective software fault localization,","venue":null,"work_id":"9ac60c36-bd5d-4469-9f48-1f2a06935fee","year":2013},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.480177Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:20a4022ff06353e8afa29ce6fb4ef8f803c179dd94056177bec714b719c1b5cd","observation_id":"e3e98342-7bbd-4205-897e-b2b4186cdf25","resolution":{"observed_at":"2026-08-10T04:30:43.504370Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.484594Z","title":"Few-shot training LLMs for project-specific code-summarization,","venue":null,"work_id":"9e48d959-b777-44e4-8154-e56a404d2bfe","year":2022},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.484562Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:cb71556ce6f5df9d38e901aa4ef6df9cd51ea2a16a1e3f6b6e10671dde981fb6","observation_id":"f4a08547-554b-458a-af19-94d1014f75ed","resolution":{"observed_at":"2026-08-10T04:30:43.489501Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.469322Z","title":"Assessing the quality of GitHub copilot’s code generation,","venue":null,"work_id":"f6e04b8e-cd9c-4f9d-9cc1-e8252c7a4997","year":2022},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.489266Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:7b23a5f8ba0dce299fcf8c77e2fce52ed14065b3421358133c8fa572c668492d","observation_id":"83a78f6a-4f42-453e-8d37-656234d8e1ae","resolution":{"observed_at":"2026-08-10T04:30:43.474369Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.454228Z","title":"An initial investigation of ChatGPT unit test generation capability,","venue":null,"work_id":"5134de98-238d-40fe-a7ff-0a3a8cf5584a","year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.493717Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:92d35837477a95b4b01b3c6b52dbcfea463f51365696e2bc8736ce8fbe7655cd","observation_id":"b3fcb3ee-b870-478e-af74-721c346b253e","resolution":{"observed_at":"2026-08-10T04:30:43.459124Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.439284Z","title":"Repair is nearly generation: Multilingual program repair with LLMs,","venue":null,"work_id":"8b8266fe-ad61-49b0-8c6d-3b6b3be82281","year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.497851Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:2a17d7719d44bfa2e1067b1e3712c716c336ea1a333b9f041e8962bd6e45281c","observation_id":"8f9df9cb-7f9a-4e8e-b1bf-92d6947d30de","resolution":{"observed_at":"2026-08-10T04:30:43.444093Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.424191Z","title":"Large Language Models for Test-Free Fault Localization,","venue":null,"work_id":"66b1db2a-7de6-42e1-b229-dcfc3d947e52","year":2024},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.502260Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:602a1ce5219dfd671baf208037702f0554419db1b05ba5e195da1df2ae561897","observation_id":"5d10c1b6-1dbf-4fe9-9ea7-1068c8934ed4","resolution":{"observed_at":"2026-08-10T04:30:43.428851Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2308.15276","last_updated":"2023-10-02T16:09:14Z","snapshot_observed_at":"2026-08-05T11:11:56.547941Z","submitted_at":"2023-08-29T13:07:27Z","title":"Large Language Models in Fault Localisation","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2308.15276","snapshot_observed_at":"2026-08-10T04:30:42.506950Z","title":"Large Language Models in Fault Localisation,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.506950Z"},"links":{"cited_paper":"/paper/2308.15276","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:a26a42a5f7feecd46693d1cd666a73e2526814bf4ca60df72ae45736af818045","observation_id":"01dc90bb-d0dc-433c-9e99-4a73ae3d4ff3","resolution":{"observed_at":"2026-08-10T04:30:42.506950Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2303.18223","last_updated":"2026-03-18T05:34:39Z","snapshot_observed_at":"2026-08-06T23:27:24.356320Z","submitted_at":"2023-03-31T17:28:46Z","title":"A Survey of Large Language Models","version":19},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2303.18223","snapshot_observed_at":"2026-08-10T04:30:42.512471Z","title":"A survey of Large Language Models,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.512471Z"},"links":{"cited_paper":"/paper/2303.18223","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:47fdaad37e9f634222adb20032e929faf67fc74ef3fb106c3b418d3f0bcbe686","observation_id":"987baddb-18d3-40c7-9b9d-b572b72fcbe0","resolution":{"observed_at":"2026-08-10T04:30:42.512471Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"1607.04347","last_updated":"2017-11-26T17:43:49Z","snapshot_observed_at":"2026-08-04T13:22:12.163647Z","submitted_at":"2016-07-15T00:20:37Z","title":"Spectrum-based Software Fault Localization: A Survey of Techniques, Advances, and Challenges","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1607.04347","snapshot_observed_at":"2026-08-10T04:30:42.517305Z","title":"Spectrum-based software fault localization: A survey of techniques, advances, and challenges,","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.517305Z"},"links":{"cited_paper":"/paper/1607.04347","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:b33d86488cd5ea140b024ebf6f25231bc4e238bc5f47486a11620511241d490f","observation_id":"8082db1b-08a4-4bd9-8c38-430e89301113","resolution":{"observed_at":"2026-08-10T04:30:42.517305Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.409772Z","title":"Ask the mutants: Mutating faulty programs for fault localization,","venue":null,"work_id":"061250b7-feba-47b3-8281-c5daf45c9b2b","year":2014},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.522370Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:afa5af977d9c841aac2f5adcec06889beebf6a7c54508fa58cba6c2223503cc5","observation_id":"bdc602c2-7c54-4431-8b71-faf6bdf797b3","resolution":{"observed_at":"2026-08-10T04:30:43.414464Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.395207Z","title":"Metallaxis-FL: mutation-based fault localization,","venue":null,"work_id":"f10f8d1e-7b02-4840-9d2d-775a35412b5e","year":2015},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.527356Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:55af2deb08ac5cf74a653604588359a3767d824dc4ebae4909bced5a8b912547","observation_id":"df4fec42-45af-4447-bc61-b57e8c081c1a","resolution":{"observed_at":"2026-08-10T04:30:43.399897Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.380354Z","title":"A survey of challenges in spectrum-based software fault localization,","venue":null,"work_id":"40654639-0e53-41aa-a55c-0c34cbc413a5","year":null},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.532064Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:b5cf79e544d01662a99f09ff35476ab5b013da8dd15839942f127a92e652a355","observation_id":"63d95e42-3c4d-4dfe-bac3-2010dbe93b67","resolution":{"observed_at":"2026-08-10T04:30:43.384973Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.366330Z","title":"Learning to combine multiple ranking metrics for fault localization,","venue":null,"work_id":"1846746a-1631-448c-a173-dbbfc0773fc3","year":2014},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.536881Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:00f245a6012c2dec23fa910d6f4608f47c97483491048a7a2e275b5faabb6582","observation_id":"b872bcf7-9a16-4e5e-896c-1cc15212727b","resolution":{"observed_at":"2026-08-10T04:30:43.370651Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.349954Z","title":"Transforming programs and tests in tandem for fault localization,","venue":null,"work_id":"599afc86-b08b-44d9-b161-66643c47fd67","year":2017},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.541785Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:ec7809bb5e4a2c246a0d28d6d3de83cde42cc4d12acb65f3a0ed12228e828cfa","observation_id":"f2088c25-caac-47ef-bcde-f582f8fc7092","resolution":{"observed_at":"2026-08-10T04:30:43.354797Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.335401Z","title":"DeepFL: Integrating multiple fault diagnosis dimensions for deep fault localization,","venue":null,"work_id":"4c77d2ca-9094-4bfe-bf16-218e697cc12f","year":2019},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.546396Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:0e71872e501042e7fa21145c233629d01398993aaf93ce7ec2ec9dbcd58719eb","observation_id":"bbdee638-e8ed-4efe-8ea3-01c6294a24fc","resolution":{"observed_at":"2026-08-10T04:30:43.340309Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.320241Z","title":"Boosting coverage-based fault localization via graph-based representation learning,","venue":null,"work_id":"1d40188c-e043-4ab7-a8ba-7aa29a2abf98","year":2021},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.551182Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:a86754d05a0d4e27945f077b14f8b07ad840a8b918b94e7aaa0b82b0a3ccca43","observation_id":"36af7200-8254-40ad-b20f-72cfe29dd552","resolution":{"observed_at":"2026-08-10T04:30:43.325049Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.303914Z","title":"Fault localization to detect co- change fixing locations,","venue":null,"work_id":"b68d46fc-2c45-461e-a918-9a489dd00131","year":2022},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.556459Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:84ed3f160a2d85969eab409651072f697ed0a27f270c79366d13d9e1409f4a35","observation_id":"02a25fea-9460-403d-85b3-f730bef8b81a","resolution":{"observed_at":"2026-08-10T04:30:43.309541Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.289503Z","title":"Fault localization with code coverage representation learning,","venue":null,"work_id":"1380a363-0cf1-4245-8d11-f7ae17f84c8f","year":2021},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.562211Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:922b647b96a8370ffbc661fd379acce2ecb60a9467eb745cf1ac4922ef95f3f2","observation_id":"46505826-49ef-42cd-ba0e-51a23b106203","resolution":{"observed_at":"2026-08-10T04:30:43.294162Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.274792Z","title":"Improving fault localization and program repair with deep semantic features and transferred knowledge,","venue":null,"work_id":"11dbc9c9-083a-4aab-9ca2-aa497907126d","year":2022},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.567229Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:659fbcc31599f8d637576d1a4f6d1af57493f9ced4639b45855f27276c6d0339","observation_id":"b280b19c-34aa-4b26-87a2-10c90dea1090","resolution":{"observed_at":"2026-08-10T04:30:43.279617Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.259200Z","title":"Large Language Models for Software Engineering: A Systematic Literature Review,","venue":null,"work_id":"6cb7337d-ba30-448a-a3fa-2066c3ac59a8","year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.571957Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:2c630454ff6c636b2b902f056b19d7530e45ed23140ca7635a11b8b65b646865","observation_id":"9663562a-6bef-4a11-ae3b-6ea59aafc9a0","resolution":{"observed_at":"2026-08-10T04:30:43.263944Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2310.03533","last_updated":"2023-11-11T21:15:19Z","snapshot_observed_at":"2026-08-03T19:08:11.820438Z","submitted_at":"2023-10-05T13:33:26Z","title":"Large Language Models for Software Engineering: Survey and Open Problems","version":4},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2310.03533","snapshot_observed_at":"2026-08-10T04:30:42.577028Z","title":"Large Language Models for Software Engineering: Survey and Open Problems,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.577028Z"},"links":{"cited_paper":"/paper/2310.03533","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:19f6fb2477e717482f04f91681c833eea5b51e814ebafe0b78bd11e49d3288bb","observation_id":"c023f635-d32e-4499-bd20-0d06e617a7d7","resolution":{"observed_at":"2026-08-10T04:30:42.577028Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2303.08774","last_updated":"2024-03-04T06:01:33Z","snapshot_observed_at":"2026-08-07T07:30:12.213965Z","submitted_at":"2023-03-15T17:15:04Z","title":"GPT-4 Technical Report","version":6},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2303.08774","snapshot_observed_at":"2026-08-10T04:30:42.582539Z","title":"GPT-4 technical report,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.582539Z"},"links":{"cited_paper":"/paper/2303.08774","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:b85bc384aab232883bc4dc8810bf38ac917ab7ec7a3e1b5bf4e32acd2184a620","observation_id":"d77b8710-7633-44a9-9cd0-5814d47abb09","resolution":{"observed_at":"2026-08-10T04:30:42.582539Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2303.07263","last_updated":"2023-03-13T16:42:47Z","snapshot_observed_at":"2026-07-06T15:02:40.704180Z","submitted_at":"2023-03-13T16:42:47Z","title":"InferFix: End-to-End Program Repair with LLMs","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2303.07263","snapshot_observed_at":"2026-08-10T04:30:42.587723Z","title":"InferFix: End-to-end program repair with LLMs,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.587723Z"},"links":{"cited_paper":"/paper/2303.07263","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:bd10c1a07b16568b69418023c7031a4515aca142f02aa19f5c4e2c6c2c2f1f48","observation_id":"54050373-c8f7-4a39-9dfc-636306faaea0","resolution":{"observed_at":"2026-08-10T04:30:42.587723Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2303.12712","last_updated":"2023-04-13T20:41:31Z","snapshot_observed_at":"2026-08-03T04:49:15.195814Z","submitted_at":"2023-03-22T16:51:28Z","title":"Sparks of Artificial General Intelligence: Early experiments with GPT-4","version":5},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2303.12712","snapshot_observed_at":"2026-08-10T04:30:42.592372Z","title":"Sparks of artificial general intelligence: Early experiments with GPT-4,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.592372Z"},"links":{"cited_paper":"/paper/2303.12712","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:df701e6bb7b7cd39e796f11fae8851e7cbb59738e6bae71fd6671eabf54b2dd9","observation_id":"978037b1-430c-4b3d-8361-27e7d3df74f1","resolution":{"observed_at":"2026-08-10T04:30:42.592372Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2107.03374","last_updated":"2021-07-14T17:16:02Z","snapshot_observed_at":"2026-08-08T11:58:24.516369Z","submitted_at":"2021-07-07T17:41:24Z","title":"Evaluating Large Language Models Trained on Code","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2107.03374","snapshot_observed_at":"2026-08-10T04:30:42.597153Z","title":"Evaluating large language models trained on code,","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.597153Z"},"links":{"cited_paper":"/paper/2107.03374","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:2b9f032c2f0dbd44e151d3f30a72c5dc318f037499f3236c8e9b258664662379","observation_id":"73983558-60db-4584-95e0-604bb23b516e","resolution":{"observed_at":"2026-08-10T04:30:42.597153Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2307.11761","last_updated":"2023-07-14T09:20:16Z","snapshot_observed_at":"2026-08-04T21:23:06.581295Z","submitted_at":"2023-07-14T09:20:16Z","title":"Fairness of ChatGPT and the Role Of Explainable-Guided Prompts","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2307.11761","snapshot_observed_at":"2026-08-10T04:30:42.607503Z","title":"Fairness of ChatGPT and the role of explainable-guided prompts,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.607503Z"},"links":{"cited_paper":"/paper/2307.11761","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:b6b72ab92e00f03859d72a4ade1ec0c9f3b779d2ede2a09df0a787014eb563d0","observation_id":"e7b236ee-fc92-41eb-8972-fc63caa79494","resolution":{"observed_at":"2026-08-10T04:30:42.607503Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.229373Z","title":"Are mutants a valid substitute for real faults in software testing?","venue":null,"work_id":"762c802b-ad22-4d96-9d80-75622e103517","year":2014},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.612475Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:53ba590b8bcd79ba12b0cd0c55f1b9fb01c853e086b58dd70557cda7c1dab982","observation_id":"de8e8783-b0fc-40c6-9164-2b26e8a2e90b","resolution":{"observed_at":"2026-08-10T04:30:43.234563Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.214687Z","title":"How Closely are Common Mutation Operators Coupled to Real Faults?","venue":null,"work_id":"bd1fd566-ea94-406c-8e0d-38c79a8be10d","year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.618165Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:4fab13d044b33c531f73cebe3faefb171e1e8bd57c1a9a9c61242e55c4d2dabe","observation_id":"d35844a8-1fe5-4a20-9c4b-bfbce72e5d63","resolution":{"observed_at":"2026-08-10T04:30:43.219501Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.198276Z","title":"BugsInPy: a database of existing bugs in Python programs to enable controlled testing and debugging studies,","venue":null,"work_id":"020d8e51-586d-4f88-b0a9-3ac6a7d1293e","year":2020},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.623620Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:aa3b65e518b7a137b5e3dec463c5d1bcc67e0048aafec396521381b856c0c359","observation_id":"cab3ec42-ca8c-4de9-b1ee-044d96acb11b","resolution":{"observed_at":"2026-08-10T04:30:43.203741Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"4805.35480","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:42.923241Z","title":"SQLite - A Small, Fast, Self-Contained, High- Reliability, Full-Featured, SQL Database Engine,","venue":null,"work_id":"0ab338fc-52be-40c4-bb57-58ea4a0b1aa1","year":2000},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.628444Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:c81e47a62b6365e0d4ca5a1e89f77331684e1602aa9a3f7e6834bfb22acef374","observation_id":"6dc02de0-7dd8-4deb-a0d8-ee597145e113","resolution":{"observed_at":"2026-08-10T04:30:42.934079Z","resolver_source":"raw_fallback","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.180024Z","title":"Duckdb: An embeddable analytical database,","venue":null,"work_id":"0e9f19a4-f98e-46a9-b395-4c2ae987c934","year":2019},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.633087Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:3936e3cd60cb701ce5cb0808c79ee48e42d53141946902259d56718f424106f3","observation_id":"ce798b14-fa0f-4e6d-a45e-589ac577456e","resolution":{"observed_at":"2026-08-10T04:30:43.185281Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2401.04088","last_updated":"2024-01-08T18:47:34Z","snapshot_observed_at":"2026-08-08T06:16:25.839566Z","submitted_at":"2024-01-08T18:47:34Z","title":"Mixtral of Experts","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2401.04088","snapshot_observed_at":"2026-08-10T04:30:42.638077Z","title":"Mixtral of experts,","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.638077Z"},"links":{"cited_paper":"/paper/2401.04088","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:68d39f2de79010f733b2a98132f3193bce194c55e9a6389aa57b2841cdd6a7be","observation_id":"936483a0-9f12-4ce7-8d2d-afaebe90975f","resolution":{"observed_at":"2026-08-10T04:30:42.638077Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2307.09288","last_updated":"2023-07-19T17:08:59Z","snapshot_observed_at":"2026-08-07T12:56:43.323460Z","submitted_at":"2023-07-18T14:31:57Z","title":"Llama 2: Open Foundation and Fine-Tuned Chat Models","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2307.09288","snapshot_observed_at":"2026-08-10T04:30:42.643666Z","title":"Llama 2: Open foundation and fine-tuned chat models,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.643666Z"},"links":{"cited_paper":"/paper/2307.09288","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:3ff8f802cacaf77125d2d1e0cd1640c83aeb81f3bb7aa4a1647a56c323c50ea5","observation_id":"574fc330-fc7f-4fdb-b6fc-218e922ce89c","resolution":{"observed_at":"2026-08-10T04:30:42.643666Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2310.06825","last_updated":"2023-10-10T17:54:58Z","snapshot_observed_at":"2026-07-06T02:11:23.670680Z","submitted_at":"2023-10-10T17:54:58Z","title":"Mistral 7B","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2310.06825","snapshot_observed_at":"2026-08-10T04:30:42.648327Z","title":"Mistral 7b,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.648327Z"},"links":{"cited_paper":"/paper/2310.06825","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:9c485c8c4b756f638f6d67c07dbed66f6ba18313d12612c3d9160c758dafa9f2","observation_id":"dfa1bd45-7b6b-4b37-b5c5-8c05a711e555","resolution":{"observed_at":"2026-08-10T04:30:42.648327Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2301.03988","last_updated":"2023-02-24T09:53:40Z","snapshot_observed_at":"2026-08-06T09:28:54.008213Z","submitted_at":"2023-01-09T10:52:35Z","title":"SantaCoder: don't reach for the stars!","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2301.03988","snapshot_observed_at":"2026-08-10T04:30:42.653430Z","title":"Santacoder: don’t reach for the stars!","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.653430Z"},"links":{"cited_paper":"/paper/2301.03988","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:1eca86ea07b1d28c63493aaa58233da829676bfdb8b6bd56f9aa796ec6b9159d","observation_id":"95c6dc97-6b53-4641-abaa-3a12c1082a5a","resolution":{"observed_at":"2026-08-10T04:30:42.653430Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2308.12950","last_updated":"2024-01-31T19:47:26Z","snapshot_observed_at":"2026-07-06T16:10:07.931347Z","submitted_at":"2023-08-24T17:39:13Z","title":"Code Llama: Open Foundation Models for Code","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2308.12950","snapshot_observed_at":"2026-08-10T04:30:42.658605Z","title":"Code llama: Open foundation models for code,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.658605Z"},"links":{"cited_paper":"/paper/2308.12950","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:7a0b1c51310c0f7c3e3aa3f81521e39df8ac6a34de6493fa1bf520bad08a1e73","observation_id":"5b886ed7-a940-4674-a106-5d4c2921b74e","resolution":{"observed_at":"2026-08-10T04:30:42.658605Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2106.09685","last_updated":"2021-10-16T18:40:34Z","snapshot_observed_at":"2026-08-07T07:43:16.294957Z","submitted_at":"2021-06-17T17:37:18Z","title":"LoRA: Low-Rank Adaptation of Large Language Models","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2106.09685","snapshot_observed_at":"2026-08-10T04:30:42.663929Z","title":"Lora: Low-rank adaptation of large language models,","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.663929Z"},"links":{"cited_paper":"/paper/2106.09685","citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:dd75506d8bdf0451a3f4882e5c2943dd3af1d3192cb779519e4fde63c7d1bee0","observation_id":"64a6de87-3265-40d8-a7f9-9bf6e56723cb","resolution":{"observed_at":"2026-08-10T04:30:42.663929Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.164807Z","title":"Enriching word vectors with subword information,","venue":null,"work_id":"f038650d-0102-4649-b986-0c79db924cd5","year":2017},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.668799Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:79e345441b84b6c8e62be564d55f83c3c93d9ee2c0ba73c4c951f55b8d40f1a5","observation_id":"7c7926ac-ef5c-4c28-96ea-4e9ef971cd63","resolution":{"observed_at":"2026-08-10T04:30:43.169310Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.149234Z","title":"BLEU: a method for automatic evaluation of machine translation,","venue":null,"work_id":"1996b482-c94b-49bf-a4f9-ade26fcedafc","year":2002},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.673287Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:f23184854e526424bc2d8b41c6972aca8a9ed92a0d05a738999c2d860a272f8b","observation_id":"e659987e-d605-47e0-b710-1b2500dca25d","resolution":{"observed_at":"2026-08-10T04:30:43.154311Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.134091Z","title":"Attention is all you need,","venue":null,"work_id":"9d4f91d0-77af-48c9-8f38-4f711bb5864b","year":2017},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.677848Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:e25d0a8db17cbb18a0eaf26229af5af6d673ab226243820a8b176c62d03fb1dc","observation_id":"5e8337b0-f91c-4af3-bf3d-83f464ac462f","resolution":{"observed_at":"2026-08-10T04:30:43.138574Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.118553Z","title":"Secure hash standard (shs),","venue":null,"work_id":"ed136e3b-fee0-4a79-896c-f39742b24468","year":2012},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.682261Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:2d8cdfa1edcb1c2fa100a4f7aeebc1e796b76ee6877ea88d34a29422e7b70a50","observation_id":"1864aba6-b0e3-428c-853a-d7aa963ca31c","resolution":{"observed_at":"2026-08-10T04:30:43.123577Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T04:30:43.244779Z","title":null,"venue":null,"work_id":"f465cf7d-0dfb-4367-872c-898eee779406","year":null},"citing_paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces","version":3},"reference_index":2021,"source":"pdf_text","source_observed_at":"2026-08-10T04:30:42.602364Z"},"links":{"citing_paper":"/paper/2501.18005"},"observation_digest":"sha256:2ba66fd031fd9aaad8c73bd2275de16bda1fdebd5b7c33992ab81e092cae4630","observation_id":"ec3b2ba1-725f-4dea-8a4f-23a109e975bb","resolution":{"observed_at":"2026-08-10T04:30:43.249400Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2501.18005","last_updated":"2025-02-11T13:58:39Z","latest_version":3,"primary_category":"cs.SE","snapshot_observed_at":"2026-08-10T09:37:11.450039Z","submitted_at":"2025-01-29T21:40:32Z","title":"Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces"},"reference_resolution":{"displayed":55,"state_counts":{"malformed_identifier":0,"metadata_mismatch":1,"parse_uncertain":0,"unresolved":17,"verified_exact":0,"verified_fuzzy":37},"total_outbound_references":55},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"thesis":"As of 10 August 2026, this Paper Citation Record lists 55 of 55 outbound references and 1 inbound Pith citation observation for arXiv:2501.18005."}