{"as_of":"2026-08-17T20:14:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:c8527291cbb74f5704e26fe2255f1ba394a033efee2fa2ed20c5ab69e190e673","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":3,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":3,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-17T06:30:58.91139+00:00","state":"measured"},{"denominator":3,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":3,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-16T11:13:43.830850Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-07-02T19:37:19.150010Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2504.06993","last_updated":"2025-04-10T06:08:19Z","snapshot_observed_at":"2026-08-17T19:57:26.940023Z","submitted_at":"2025-04-09T16:00:47Z","title":"Screening of material defects using universal machine-learning interatomic potentials","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2504.06993","snapshot_observed_at":"2026-08-16T11:13:43.830850Z","title":"Berger, M","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2504.16068","last_updated":"2025-04-22T17:47:01Z","snapshot_observed_at":"2026-08-17T18:56:22.341694Z","submitted_at":"2025-04-22T17:47:01Z","title":"High-performance training and inference for deep equivariant interatomic potentials","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-16T11:13:43.830850Z"},"links":{"cited_paper":"/paper/2504.06993","citing_paper":"/paper/2504.16068"},"observation_digest":"sha256:053c4daf41f318aab0e88d672c63b8ca188d3535cb23e3da7957ec1a1c34511b","observation_id":"00f9cf5b-d2b4-4b9f-8297-57492c9c5ddb","resolution":{"observed_at":"2026-08-16T11:13:43.830850Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2504.06993","last_updated":"2025-04-10T06:08:19Z","snapshot_observed_at":"2026-08-17T19:57:26.940023Z","submitted_at":"2025-04-09T16:00:47Z","title":"Screening of material defects using universal machine-learning interatomic potentials","version":2},"cited_work":{"arxiv_id":"2504.06993","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2504.06993","snapshot_observed_at":"2026-07-02T19:37:19.150010Z","title":"Screening of material defects using universal machine-learning interatomic potentials","venue":null,"work_id":"5cb45ad6-762f-4f3c-8ad2-9ac77258e493","year":2025},"citing_paper":{"arxiv_id":"2604.21069","last_updated":"2026-04-22T20:29:41Z","snapshot_observed_at":"2026-08-11T03:23:08.934757Z","submitted_at":"2026-04-22T20:29:41Z","title":"Accelerating point defect simulations using data-driven and machine learning approaches","version":1},"reference_index":103,"source":"pdf_text","source_observed_at":"2026-05-09T23:29:55.933661Z"},"links":{"cited_paper":"/paper/2504.06993","citing_paper":"/paper/2604.21069"},"observation_digest":"sha256:f3b24a8ba5f44e7a4acc0de482c8fab3a5ddd9a408985b83211adebc9b0ec7b7","observation_id":"47a399e2-b468-4005-b809-a7112365ae52","resolution":{"observed_at":"2026-05-11T14:06:05.132151Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-17T06:30:58.91139+00:00","source":"crossref"},{"observed_at":"2026-08-17T06:30:54.323127+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2504.06993","last_updated":"2025-04-10T06:08:19Z","snapshot_observed_at":"2026-08-17T19:57:26.940023Z","submitted_at":"2025-04-09T16:00:47Z","title":"Screening of material defects using universal machine-learning interatomic potentials","version":2},"cited_work":{"arxiv_id":"2504.06993","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2504.06993","snapshot_observed_at":"2026-07-02T19:37:19.150010Z","title":"Screening of material defects using universal machine-learning interatomic potentials","venue":null,"work_id":"5cb45ad6-762f-4f3c-8ad2-9ac77258e493","year":2025},"citing_paper":{"arxiv_id":"2606.07327","last_updated":"2026-06-10T08:53:54Z","snapshot_observed_at":"2026-08-14T11:15:38.040405Z","submitted_at":"2026-06-05T14:45:06Z","title":"Six Open Questions in Machine-Learned Interatomic Potential Foundation Models","version":2},"reference_index":173,"source":"pdf_text","source_observed_at":"2026-06-27T21:27:50.941166Z"},"links":{"cited_paper":"/paper/2504.06993","citing_paper":"/paper/2606.07327"},"observation_digest":"sha256:d058bf99fa9478bbba1661c7ad4fd3f7097cc26781e8cdf379fccffadaa61dc3","observation_id":"66f5d0b9-3c85-4d10-8bb4-3413e2be0b3c","resolution":{"observed_at":"2026-07-02T19:37:19.151787Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-17T06:30:58.91139+00:00","source":"crossref"},{"observed_at":"2026-08-17T06:30:54.323127+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2504.06993/citation-record","integrity":"/paper/2504.06993/integrity","json":"/paper/2504.06993/citation-record.json","paper":"/paper/2504.06993"},"outbound":[],"paper":{"arxiv_id":"2504.06993","last_updated":"2025-04-10T06:08:19Z","latest_version":2,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-17T19:57:26.940023Z","submitted_at":"2025-04-09T16:00:47Z","title":"Screening of material defects using universal machine-learning interatomic potentials"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-17T06:30:58.91139+00:00","source":"crossref"},{"observed_at":"2026-08-17T06:30:54.323127+00:00","source":"retraction_watch"}],"thesis":"As of 17 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 3 inbound Pith citation observations for arXiv:2504.06993."}