{"as_of":"2026-08-19T18:17:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:dc914d48fa2aa43facbee24437ded3cbc44a8a81795f38f555d95b933d42d350","coverage":[{"denominator":53,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":53,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-16T10:35:20.920361Z","state":"measured"},{"denominator":53,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":53,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-19T06:32:44.657259+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2504.17783/citation-record","integrity":"/paper/2504.17783/integrity","json":"/paper/2504.17783/citation-record.json","paper":"/paper/2504.17783"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.841562Z","title":null,"venue":null,"work_id":"0ba41745-257b-40fd-baab-5bcb00d2d0bf","year":2020},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.570060Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:2ff808271d3a75fd5817c1e7362ddfd14f5ed147450a81bb5d087ce5f3f40f39","observation_id":"d226e6d6-6da2-4f32-8aaa-f27a4b491878","resolution":{"observed_at":"2026-08-16T10:35:21.846048Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.575057Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.575057Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:d4a0d87e26c6b42c3ce1889232bd03c16e8dd55228e504a4933644dc267e10d2","observation_id":"7375c5de-c2b9-4eeb-a514-bada50b833c2","resolution":{"observed_at":"2026-08-16T10:35:20.575057Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.818024Z","title":null,"venue":null,"work_id":"5f1ca2b0-de74-48b5-ac52-642cc45c94da","year":2022},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.579182Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:bd84dda36a6c7ad9588c595063ed9bdea7a39483728b15dd279efb2dd58f1ba3","observation_id":"c26b4133-4336-4c65-b698-0d542d53890f","resolution":{"observed_at":"2026-08-16T10:35:21.822760Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.803692Z","title":null,"venue":null,"work_id":"bf2ef0d0-75ea-4a73-9240-3c24d82335b5","year":2023},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.583707Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:b09970e27a127655b1debb17d2b742033333937ddda3372b0d5b3335d5425b6a","observation_id":"013d679b-2658-4c32-b86a-8376cd667ea8","resolution":{"observed_at":"2026-08-16T10:35:21.808181Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/s41586-025-08725-5","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.022565Z","title":"Holleis, T","venue":null,"work_id":"c62a8d34-4f9b-4d6a-91d8-deac3cd7c42c","year":2025},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.588105Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:834dee19ed766dd8e43f67604f953d9affac56cc1cddcb1d59b045669550c736","observation_id":"a59f7fd6-bf05-4f93-8fba-353d5e68728c","resolution":{"observed_at":"2026-08-16T10:35:21.027120Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.592673Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.592673Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:b52de3db1cd03fd5d26aeae34682e6113f4d6399fdcbf8ea006cb8039337068c","observation_id":"fd1f42f5-83c8-4a66-b394-3ccebb18d1a6","resolution":{"observed_at":"2026-08-16T10:35:20.592673Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.779526Z","title":"Zhang, R","venue":null,"work_id":"5b9fba0e-06a6-4dcb-a2b9-2bf8630c412d","year":2023},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.597726Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:dd6ede8c4277e6ad323c36eb66a843597326d5103de2ce2071124a4a28abb240","observation_id":"ea367293-7683-4fc4-984b-24a2846748e7","resolution":{"observed_at":"2026-08-16T10:35:21.783943Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2303.00742","last_updated":"2024-06-12T17:55:48Z","snapshot_observed_at":"2026-08-16T15:51:37.171999Z","submitted_at":"2023-03-01T18:55:33Z","title":"Nematicity and Orbital Depairing in Superconducting Bernal Bilayer Graphene with Strong Spin Orbit Coupling","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2303.00742","snapshot_observed_at":"2026-08-16T10:35:20.602303Z","title":"Holleis, C","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.602303Z"},"links":{"cited_paper":"/paper/2303.00742","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:c81f964fc0ab05a71b2fa33025de7230a095c4cca128c7f360f9c478ccdd85eb","observation_id":"1274aab9-615e-4e64-8243-c6c7e6b70863","resolution":{"observed_at":"2026-08-16T10:35:20.602303Z","resolver_source":null,"status":"malformed_identifier"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.606908Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.606908Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:0484c8e0da0646f03a1ab3d3008b0a3acc55e97b635cf165a8e926552cce1ed6","observation_id":"c5f08682-9de1-4bff-9601-f1674ea9e8f6","resolution":{"observed_at":"2026-08-16T10:35:20.606908Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2408.10190","last_updated":"2024-08-19T17:50:03Z","snapshot_observed_at":"2026-08-17T20:40:47.256385Z","submitted_at":"2024-08-19T17:50:03Z","title":"Superconductivity and spin canting in spin-orbit proximitized rhombohedral trilayer graphene","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2408.10190","snapshot_observed_at":"2026-08-16T10:35:20.610960Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.610960Z"},"links":{"cited_paper":"/paper/2408.10190","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:a0c1cc42ee141685cba8f3aacc3461fc29c87f1a9cf2346b1c6906cee13ff548","observation_id":"5ac0dde6-5b91-47cb-9ce6-81cbe516bd37","resolution":{"observed_at":"2026-08-16T10:35:20.610960Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2408.12584","last_updated":"2025-04-15T04:55:38Z","snapshot_observed_at":"2026-08-17T20:51:44.635470Z","submitted_at":"2024-08-22T17:50:17Z","title":"Superconductivity and quantized anomalous Hall in rhombohedral graphene","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2408.12584","snapshot_observed_at":"2026-08-16T10:35:20.615525Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.615525Z"},"links":{"cited_paper":"/paper/2408.12584","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:98ecea8ef91ffbc537ee505c40c527989e77be198fe86ebc6758a7039d58245c","observation_id":"af8b0c81-4186-4b3f-b723-19b0820aa1fe","resolution":{"observed_at":"2026-08-16T10:35:20.615525Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2408.09906","last_updated":"2025-02-01T02:05:15Z","snapshot_observed_at":"2026-08-16T13:25:33.975788Z","submitted_at":"2024-08-19T11:26:23Z","title":"Impact of Spin-Orbit Coupling on Superconductivity in Rhombohedral Graphene","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2408.09906","snapshot_observed_at":"2026-08-16T10:35:20.620365Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.620365Z"},"links":{"cited_paper":"/paper/2408.09906","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:9756ff099e941735046f64df17075f89a333858f5277a6b0ce7e7b354a95f17d","observation_id":"59cf7f74-92ed-47f7-b2ee-07c29fd04cc0","resolution":{"observed_at":"2026-08-16T10:35:20.620365Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2408.15233","last_updated":"2025-02-19T19:46:17Z","snapshot_observed_at":"2026-08-17T07:58:17.630877Z","submitted_at":"2024-08-27T17:50:09Z","title":"Signatures of Chiral Superconductivity in Rhombohedral Graphene","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2408.15233","snapshot_observed_at":"2026-08-16T10:35:20.624969Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.624969Z"},"links":{"cited_paper":"/paper/2408.15233","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:86a84ba3d14940c799920c2069b199b40d73bec0b81015f2c40c2a3a78c37f39","observation_id":"3ea8628d-beb7-4f26-b94a-4aa0cf0d5c65","resolution":{"observed_at":"2026-08-16T10:35:20.624969Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.755774Z","title":null,"venue":null,"work_id":"406189bd-10b7-430b-80ba-d0c5fbe01a20","year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.629636Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:0ef4b2e20bd5b266cd61e905323b05c8626f4d1dc5819eaeba92a352554a1e8d","observation_id":"db9ca338-579f-422f-aafd-090c27e1be59","resolution":{"observed_at":"2026-08-16T10:35:21.760448Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2411.11163","last_updated":"2024-11-17T20:00:10Z","snapshot_observed_at":"2026-08-12T18:48:53.981479Z","submitted_at":"2024-11-17T20:00:10Z","title":"Visualizing incommensurate inter-valley coherent states in rhombohedral trilayer graphene","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2411.11163","snapshot_observed_at":"2026-08-16T10:35:20.633960Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.633960Z"},"links":{"cited_paper":"/paper/2411.11163","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:e8e87056b77feaae037301315d1ce8d11ad76ae870e583229ad6e9f77ee3287d","observation_id":"a1c18bf4-ae59-4232-9f02-719315b58910","resolution":{"observed_at":"2026-08-16T10:35:20.633960Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.638615Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.638615Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:8e3f8c18253c34da7b896982abdec26557c53bc87a1020ed390804d10a0f9add","observation_id":"8ce38f70-2b10-43b4-b514-8a31de6c597b","resolution":{"observed_at":"2026-08-16T10:35:20.638615Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.730378Z","title":null,"venue":null,"work_id":"2826cafc-a86b-481f-96f7-fd3c2c773601","year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.642821Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:e895cb1a499709a59ec34c25fab408ae7bc01eec3ad6e40aaf8c3cbef58d03e0","observation_id":"5bb7f20d-447d-4fcf-8c85-93a0491d7bef","resolution":{"observed_at":"2026-08-16T10:35:21.735085Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2408.10203","last_updated":"2024-08-19T17:57:47Z","snapshot_observed_at":"2026-08-16T13:25:25.983122Z","submitted_at":"2024-08-19T17:57:47Z","title":"Extended Quantum Anomalous Hall States in Graphene/hBN Moir\\'e Superlattices","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2408.10203","snapshot_observed_at":"2026-08-16T10:35:20.648039Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.648039Z"},"links":{"cited_paper":"/paper/2408.10203","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:69d2a382568c53dc4c9f5bd9f9de2454d4185ee7d30e2dafb548c283a2f9386b","observation_id":"82931d59-c622-4971-97f6-c8ee3fad917b","resolution":{"observed_at":"2026-08-16T10:35:20.648039Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2405.08074","last_updated":"2024-05-13T18:00:05Z","snapshot_observed_at":"2026-08-16T13:53:03.559021Z","submitted_at":"2024-05-13T18:00:05Z","title":"Optical Imaging of Flavor Order in Flat Band Graphene","version":1},"cited_work":{"arxiv_id":"2405.08074","doi":null,"metadata_source":"pith","pith_arxiv_id":"2405.08074","snapshot_observed_at":"2026-08-16T10:35:21.283938Z","title":"Optical Imaging of Flavor Order in Flat Band Graphene","venue":"cond-mat.mes-hall","work_id":"7c242862-1afa-4d67-8ef5-ec205beaf198","year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.652523Z"},"links":{"cited_paper":"/paper/2405.08074","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:48b3233bad3ac8b797ac5316ef61ba5a7e95cc8c2a6f2cfe944549f278104785","observation_id":"3c095d95-ae78-468b-aed3-49e9641c43f8","resolution":{"observed_at":"2026-08-16T10:35:21.289145Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.657285Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.657285Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:6b95f887573e8b65ed22dc97d12533d7b0e7b3fbf231c2ae31991e0cf3b87b7b","observation_id":"d8beb376-fc78-4799-b50f-abc8daec18c0","resolution":{"observed_at":"2026-08-16T10:35:20.657285Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2310.17483","last_updated":"2024-04-26T15:55:31Z","snapshot_observed_at":"2026-08-16T14:48:34.648267Z","submitted_at":"2023-10-26T15:41:59Z","title":"Large Quantum Anomalous Hall Effect in Spin-Orbit Proximitized Rhombohedral Graphene","version":3},"cited_work":{"arxiv_id":"2310.17483","doi":null,"metadata_source":"pith","pith_arxiv_id":"2310.17483","snapshot_observed_at":"2026-08-16T10:35:21.182119Z","title":"Large Quantum Anomalous Hall Effect in Spin-Orbit Proximitized Rhombohedral Graphene","venue":"cond-mat.mes-hall","work_id":"7a107126-e4c2-4b21-aa53-54fd57f20206","year":2023},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.661969Z"},"links":{"cited_paper":"/paper/2310.17483","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:eb546f47d428ed4d8db9d01d8ac6e0f9798a40ce739895073fdd204e467ed549","observation_id":"b53f4946-3440-4ce2-8ae9-06e0f81da860","resolution":{"observed_at":"2026-08-16T10:35:21.187444Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.715157Z","title":null,"venue":null,"work_id":"2ee0fb68-e085-4adf-9978-bc435970905c","year":2007},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.666791Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:d1004d29dc505ca340c2d3b12e4272dee6dc4437b65f7d375d17ee1506f2726b","observation_id":"4733a613-02da-4d99-b5b4-b495e326866a","resolution":{"observed_at":"2026-08-16T10:35:21.719886Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.699776Z","title":null,"venue":null,"work_id":"ffc8c314-43ed-4470-bef4-b2e72d9e5d97","year":2010},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.670976Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:c6d7f7681cb0fbabb980a978691081f13b27b1a15fb737b69c32899f355fc144","observation_id":"887b62fc-9b86-4337-9c8e-baa74e4de278","resolution":{"observed_at":"2026-08-16T10:35:21.704511Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.683130Z","title":null,"venue":null,"work_id":"91af979a-7d0a-48fe-af64-d42ae5cbf26c","year":2011},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.675360Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:bca42166a2a60c57822c29f804a3fee46fcca64655d69cee2b71a19096fc7a86","observation_id":"48798a48-84cb-44b6-947f-be8326a71d27","resolution":{"observed_at":"2026-08-16T10:35:21.688626Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.679531Z","title":null,"venue":null,"work_id":null,"year":2011},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.679531Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:b40c18f3204684b40ffa0951eafdbfda6314dcb756a2000edd08e8f9479bd993","observation_id":"cf194978-1259-441a-8c84-1b9220c7fb49","resolution":{"observed_at":"2026-08-16T10:35:20.679531Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2408.09814","last_updated":"2024-08-19T09:03:48Z","snapshot_observed_at":"2026-08-16T13:25:36.073142Z","submitted_at":"2024-08-19T09:03:48Z","title":"Rapid infrared imaging for rhombohedral graphene","version":1},"cited_work":{"arxiv_id":"2408.09814","doi":null,"metadata_source":"pith","pith_arxiv_id":"2408.09814","snapshot_observed_at":"2026-08-16T10:35:21.161870Z","title":"Rapid infrared imaging for rhombohedral graphene","venue":"cond-mat.mes-hall","work_id":"3bada9c0-abac-4ff2-8e9f-97408ab6bd04","year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.683856Z"},"links":{"cited_paper":"/paper/2408.09814","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:28be9ca9d3e41a6d629bdc05e891231be31eec569447ea03a26604ca4729eb3e","observation_id":"74f0b91a-4c5d-40f7-a613-47a1177111c8","resolution":{"observed_at":"2026-08-16T10:35:21.166709Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1301.1690","last_updated":"2013-03-15T17:34:16Z","snapshot_observed_at":"2026-08-15T00:33:21.945339Z","submitted_at":"2013-01-08T21:01:10Z","title":"Topological kink states at a tilt boundary in gated multi-layer graphene","version":2},"cited_work":{"arxiv_id":"1301.1690","doi":null,"metadata_source":"pith","pith_arxiv_id":"1301.1690","snapshot_observed_at":"2026-08-16T10:35:21.141277Z","title":"Topological kink states at a tilt boundary in gated multi-layer graphene","venue":"cond-mat.mes-hall","work_id":"6a8b5b29-46ca-44ef-81cd-3eb849a88d0d","year":2013},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.688212Z"},"links":{"cited_paper":"/paper/1301.1690","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:0c56b13fe7f54bb21516c4ba5e7aa7852ac2a822890670802e6e6739e983aff6","observation_id":"c9745644-866b-4b03-9f64-0baf0078c43c","resolution":{"observed_at":"2026-08-16T10:35:21.146594Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.658137Z","title":null,"venue":null,"work_id":"353352d6-1a10-4f57-bc3c-2e77e59a5e8a","year":2014},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.693153Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:a888b30da13a249084ce699af1cdc2b5bd435f6a6dfe2da0d8d12977c5ca0c51","observation_id":"17cde1a9-6e1a-4600-9ba4-41c71465c9da","resolution":{"observed_at":"2026-08-16T10:35:21.662692Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.642496Z","title":null,"venue":null,"work_id":"3cb8818e-7970-4c66-9164-79e1daba1aba","year":2015},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.697197Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:a1c54533a481f65971e8927bd7a2d359c2b2a90f863d478dfa413a97dfb6dd4b","observation_id":"571fd729-6fd1-420a-83f6-16bcc02372ba","resolution":{"observed_at":"2026-08-16T10:35:21.647629Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.627130Z","title":null,"venue":null,"work_id":"312a7405-498f-4bfe-ba98-e2f287e87861","year":2015},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.701591Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:6c5b84a143b3541c2cc8a70817d87ad3a44635a3ed702101f085aa3e966e0965","observation_id":"d8efb3b1-06aa-4097-9cbd-a5a81476fa8b","resolution":{"observed_at":"2026-08-16T10:35:21.631934Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/ncomms11760","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.007233Z","title":null,"venue":null,"work_id":"cf108cc7-4f5e-4ede-8058-21e58a38f49e","year":2016},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.705672Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:5c917814ee6d7ed7f09846f93ed8b52b9cd113cb113fd4bd1199672116d77793","observation_id":"d2e142bd-519c-400f-82a0-178a40d9062e","resolution":{"observed_at":"2026-08-16T10:35:21.011906Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.612317Z","title":"Jiang, S","venue":null,"work_id":"2c82d9ef-fa19-42d7-8156-6adf02d9d667","year":2018},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.709827Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:7f70e93077da375bb7b08be45da95fc4fa9d6fea02d562c2f094d12c05897157","observation_id":"e21b46f5-02db-4cdd-974f-2ad582a20ac7","resolution":{"observed_at":"2026-08-16T10:35:21.617019Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2203.07971","last_updated":"2022-09-15T16:10:07Z","snapshot_observed_at":"2026-08-16T17:14:23.969430Z","submitted_at":"2022-03-15T14:58:34Z","title":"Experimental observation of ABCB stacked tetralayer graphene","version":2},"cited_work":{"arxiv_id":"2203.07971","doi":null,"metadata_source":"pith","pith_arxiv_id":"2203.07971","snapshot_observed_at":"2026-08-16T10:35:21.121105Z","title":"Experimental observation of ABCB stacked tetralayer graphene","venue":"cond-mat.mes-hall","work_id":"005c8edf-db30-4c53-8c22-2939f120e5f1","year":2022},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.714029Z"},"links":{"cited_paper":"/paper/2203.07971","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:9c4d67e1fb6eb1445bd4cf8977b446303ae315c2cf7b0de44b2d379abbd5023c","observation_id":"4334cefb-934b-4193-891d-5aa753776429","resolution":{"observed_at":"2026-08-16T10:35:21.126497Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.596270Z","title":"Beitner, S","venue":null,"work_id":"d8659cc1-90ef-461c-8756-53688c1cefd7","year":2023},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.718500Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:1109906a49d39b306c297fd70d2876b883bea53b0703bbaad3e19bb20aa1674b","observation_id":"6938651f-5dc4-4417-8a2d-719eaf2453b7","resolution":{"observed_at":"2026-08-16T10:35:21.601389Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.581382Z","title":"A Comprehensive Guide to Photothermal AFM-IR Spectroscopy. Bruker Technical Note TN201","venue":null,"work_id":"e237e45b-295d-4d3e-aa62-843179580fcc","year":2023},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.722629Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:365b3428b718f56e71d83c0302522de8f1dd7c10425a7e88484ed2dc12417fcc","observation_id":"ff75a38c-e807-4a18-bd35-641a22cc7e05","resolution":{"observed_at":"2026-08-16T10:35:21.586207Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2102.09085","last_updated":"2021-02-18T00:38:47Z","snapshot_observed_at":"2026-08-16T18:44:48.765627Z","submitted_at":"2021-02-18T00:38:47Z","title":"Imaging graphene moir\\'e superlattices via scanning Kelvin probe microscopy","version":1},"cited_work":{"arxiv_id":"2102.09085","doi":null,"metadata_source":"pith","pith_arxiv_id":"2102.09085","snapshot_observed_at":"2026-08-16T10:35:21.100181Z","title":"Imaging graphene moir\\'e superlattices via scanning Kelvin probe microscopy","venue":"cond-mat.mtrl-sci","work_id":"10b8c8c1-03e7-4b00-982e-897187dd9890","year":2021},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.727683Z"},"links":{"cited_paper":"/paper/2102.09085","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:17a2741a84ace1487e8b9987bc9ad0c82877037b5a440e740b7b81e0f25db7ff","observation_id":"a5c8c6da-a6c4-4ff3-8458-22f4945dc6b9","resolution":{"observed_at":"2026-08-16T10:35:21.105328Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.565626Z","title":"Dazzi, R","venue":null,"work_id":"3d706ca4-aead-4202-89c5-c7b9139efb2f","year":2005},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.731967Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:762e2cd76d4520cda7a35293d96e9bbe114747d8a86746d811c51a0496a12514","observation_id":"d248405c-09d3-4303-a1e7-479347cb2806","resolution":{"observed_at":"2026-08-16T10:35:21.570519Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.550999Z","title":null,"venue":null,"work_id":"f4050204-94fa-4fe0-adcb-3dc26bff499e","year":null},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.736468Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:29561b6a9c0af62d909affd2accd131035c2eebd16c21217025c96faeb26689b","observation_id":"52c1835b-ccd2-436c-b3cf-4cdcbc897640","resolution":{"observed_at":"2026-08-16T10:35:21.555666Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.2949109","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.991770Z","title":null,"venue":null,"work_id":"86504695-a5f7-4626-8936-599ea04a2910","year":2008},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.741074Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:07615fd234771368f24058dd9e85e5fab6831caac6d84ce87fefb0c85bd41c79","observation_id":"05a8ffb6-dceb-4fa3-9c06-57b4b9a92e8e","resolution":{"observed_at":"2026-08-16T10:35:20.996551Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.2990638","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.973377Z","title":null,"venue":null,"work_id":"b82d0fd9-584b-4256-af8e-3e313ae3bd72","year":2008},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.745474Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:fffe46d5e9242ca36b8eaedfc7d7f5951fd0ef8adea0d37a7d92bded6ea58577","observation_id":"d02300d0-f987-4d92-8a4f-2519855bb34c","resolution":{"observed_at":"2026-08-16T10:35:20.980541Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.535992Z","title":null,"venue":null,"work_id":"5f54a5ce-bcea-49f5-a445-f190bfed58a0","year":2009},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.749886Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:68bb6d7b56808220f6ecedbe75d31fe3417d742a7c47d52f5d1eaf2e5f2b747b","observation_id":"bfaabb7a-37dc-4066-be53-f551f32f54bb","resolution":{"observed_at":"2026-08-16T10:35:21.540266Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.520563Z","title":null,"venue":null,"work_id":"d4a77b60-0653-45a1-9176-54683f5104d6","year":2010},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.754107Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:b13818ba9aa1d2ae973db260eb184ffa59ff65b53a900a52a67087b0662b1ad9","observation_id":"139b884c-a42f-4c97-9d69-92b09eec70bd","resolution":{"observed_at":"2026-08-16T10:35:21.525539Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.505304Z","title":"Drevniok, P","venue":null,"work_id":"f57f2d03-0808-451c-b00a-0538b09b1620","year":2016},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.758292Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:915a87f135b62ce01a22b3dc4e4496863e6fd1ee676b8ff000f8033b16c6a032","observation_id":"20e0b98b-bbad-4e86-8725-e0e8a349c468","resolution":{"observed_at":"2026-08-16T10:35:21.510082Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.487661Z","title":null,"venue":null,"work_id":"6d46d608-d2fc-4645-9006-679fca87a422","year":2019},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.876976Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:062ddc37c0090d37e7e2c47bd7103e7d3e27e233b7f91055a1c8062547618af1","observation_id":"569d8bd4-933e-485c-993f-6ae6475badf7","resolution":{"observed_at":"2026-08-16T10:35:21.493426Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2002.07790","last_updated":"2020-02-18T18:34:59Z","snapshot_observed_at":"2026-08-05T07:14:27.657575Z","submitted_at":"2020-02-18T18:34:59Z","title":"Long-range rhombohedral-stacked graphene through shear","version":1},"cited_work":{"arxiv_id":"2002.07790","doi":null,"metadata_source":"pith","pith_arxiv_id":"2002.07790","snapshot_observed_at":"2026-08-16T10:35:21.077752Z","title":"Long-range rhombohedral-stacked graphene through shear","venue":"cond-mat.mes-hall","work_id":"4519308f-c33a-4c23-a98c-03a0f126f175","year":2020},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.881719Z"},"links":{"cited_paper":"/paper/2002.07790","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:1460b4e62fb9abcbac577b12041a6858490f00dde886a7d455f94cc3b2a3c361","observation_id":"b8bdb42d-8a02-4dd8-805d-21237c78c22f","resolution":{"observed_at":"2026-08-16T10:35:21.083816Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.470223Z","title":null,"venue":null,"work_id":"1f31eef9-a550-41bc-a5b8-00b4aad0e60b","year":2024},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.886433Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:06d676aecbb75e01a7c629523144781a728755e61d02430bc88be47dcff240f1","observation_id":"d7417873-891e-40a5-bd1a-d093a89be33a","resolution":{"observed_at":"2026-08-16T10:35:21.475206Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.454766Z","title":null,"venue":null,"work_id":"8118074b-04ef-4b02-a507-627651a970e4","year":2013},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.891041Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:1ec3208b9d2594f21d4ff983322e0983437a16c8f3e2ca672add01b3efbdacbe","observation_id":"f6d11f92-a849-413d-bf07-612261d2074b","resolution":{"observed_at":"2026-08-16T10:35:21.459453Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.438710Z","title":"Jiang, Z","venue":null,"work_id":"2f2b25b1-d32e-4272-96cf-eeee0d9b3810","year":2016},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.895489Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:9f9ba70a3b71f97aa81a69fd1f8548ba9a93a8db3e78d2d70c2d61e8aa09377f","observation_id":"42af2a61-4504-493a-b372-60084e49d76d","resolution":{"observed_at":"2026-08-16T10:35:21.443613Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.424786Z","title":null,"venue":null,"work_id":"d7d97bb4-9a19-4055-9e52-ec9c4264c4b0","year":2020},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.900188Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:d2d3bad636384a91db72fe31bfb7d33422b2496f3719598c97a23a1dcc526fba","observation_id":"2b7522da-b616-4bc2-9691-06e575e87372","resolution":{"observed_at":"2026-08-16T10:35:21.429157Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2504.07935","last_updated":"2025-04-10T17:49:10Z","snapshot_observed_at":"2026-08-16T12:42:16.770333Z","submitted_at":"2025-04-10T17:49:10Z","title":"Stacking-induced ferroelectricity in tetralayer graphene","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2504.07935","snapshot_observed_at":"2026-08-16T10:35:20.904514Z","title":"Singh, S","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.904514Z"},"links":{"cited_paper":"/paper/2504.07935","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:1023ae11408963ab1de5945f5d3132386794e181a7db75d77b5ae6f4749caa79","observation_id":"6e39657c-0879-45ba-b4c7-e6415020a499","resolution":{"observed_at":"2026-08-16T10:35:20.904514Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1126/sciadv.abc5555","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:20.954955Z","title":"Zhang, A","venue":null,"work_id":"b5d2ef97-e6df-4cca-9ee4-cc2b73f3e96c","year":2020},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.910185Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:7892293f24700a29401e20bd037cf95da59fdcccec11743f4004480f08752b77","observation_id":"92029dcb-6ff3-431a-9d93-a14881663442","resolution":{"observed_at":"2026-08-16T10:35:20.961889Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T10:35:21.410510Z","title":"Huang, L","venue":null,"work_id":"552a6495-e88b-4c12-83f0-40d2de54fb60","year":2021},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.915346Z"},"links":{"citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:b5bb2a0d226499df5dbfd23767dbe4bd9fa1d06c8c3733542ac0b27d08064e22","observation_id":"6c5ded11-c777-41aa-a6a6-c073c7ab85aa","resolution":{"observed_at":"2026-08-16T10:35:21.415081Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2304.10586","last_updated":"2023-04-20T18:18:57Z","snapshot_observed_at":"2026-08-16T15:38:53.540678Z","submitted_at":"2023-04-20T18:18:57Z","title":"Imaging inter-valley coherent order in magic-angle twisted trilayer graphene","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2304.10586","snapshot_observed_at":"2026-08-16T10:35:20.920361Z","title":null,"venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene","version":1},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-16T10:35:20.920361Z"},"links":{"cited_paper":"/paper/2304.10586","citing_paper":"/paper/2504.17783"},"observation_digest":"sha256:2c85d21356bfba722a38d8d41cf03b08a28f86ca067c1184db38f3425c38a16f","observation_id":"b62a00e3-a5b7-48d6-b5b9-e17a9a965b34","resolution":{"observed_at":"2026-08-16T10:35:20.920361Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"paper":{"arxiv_id":"2504.17783","last_updated":"2025-04-24T17:58:30Z","latest_version":1,"primary_category":"cond-mat.mes-hall","snapshot_observed_at":"2026-08-19T05:02:12.805605Z","submitted_at":"2025-04-24T17:58:30Z","title":"Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene"},"reference_resolution":{"displayed":53,"state_counts":{"malformed_identifier":1,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":32,"verified_exact":12,"verified_fuzzy":8},"total_outbound_references":53},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-19T06:32:44.657259+00:00","source":"crossref"},{"observed_at":"2026-08-19T06:32:39.956319+00:00","source":"retraction_watch"}],"thesis":"As of 19 August 2026, this Paper Citation Record lists 53 of 53 outbound references and 0 inbound Pith citation observations for arXiv:2504.17783."}