{"as_of":"2026-08-16T21:11:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:5bcbd8557430d81165eb4a31f4702dd67aaee521a4b37dfce54cbf48a2f3d2da","coverage":[{"denominator":76,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":76,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-15T21:54:13.967820Z","state":"measured"},{"denominator":76,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":76,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-16T06:30:59.297886+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2505.08569/citation-record","integrity":"/paper/2505.08569/integrity","json":"/paper/2505.08569/citation-record.json","paper":"/paper/2505.08569"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1364/ao.37.001873","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.978825Z","title":"Mertins, F","venue":null,"work_id":"330fd9fa-3f43-4872-b8a8-eea54b541ed0","year":1998},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.611049Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:c70439137d0aaf47fa3f72b00b8465c54b93e644a0ee596103c2d408672c4579","observation_id":"53fb003d-033a-41c1-93d5-23fa15885d4f","resolution":{"observed_at":"2026-08-15T21:54:14.983420Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1364/ao.25.001730","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.964511Z","title":"Underwood, T.W","venue":null,"work_id":"883bacea-31fd-4c97-9396-f498a969dfc5","year":1986},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.616987Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:090a76036bfd111692eaf9d5e5dad7d5828b1c883f29e3494e74bc4d73e9a0a9","observation_id":"cd94bd79-b44d-472e-9610-0fbc30aa5bc1","resolution":{"observed_at":"2026-08-15T21:54:14.969181Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/s41598-017-13222-5","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.949715Z","title":"Huang, Q","venue":null,"work_id":"7693b26b-f63a-4a11-bad3-aa0a1d1a851c","year":2017},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.622318Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:41e30752ad6d3f9635245358fdf3ebab9919b60a36577555c2d030f84c99a12e","observation_id":"7c101919-5f95-413a-879c-1a83d1c1c94e","resolution":{"observed_at":"2026-08-15T21:54:14.954492Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.627463Z","title":"Kördel, A","venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.627463Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f206956955c6187d973387d654117d9fb8a4f453c484ebec17bd5506b73284d4","observation_id":"9ea337f6-a534-429b-b307-74465a1d6ea1","resolution":{"observed_at":"2026-08-15T21:54:13.627463Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.1145894","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.922815Z","title":"Di Fonzo, B.R","venue":null,"work_id":"de6d046e-1bda-40b4-893c-8e5497fa8f38","year":1995},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.632185Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:88927e3455ddb1bee7f7230f26dd1f8f878a811f7c941f926ce9fec2721fa7d9","observation_id":"ce8004ad-f9cb-41ed-b92e-5b40c53672e8","resolution":{"observed_at":"2026-08-15T21:54:14.927432Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.581416Z","title":"Zhong, W","venue":null,"work_id":"6b952249-7afa-4b31-8c15-655e5d583f8f","year":2006},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.637697Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:a5969e919b031dedc59e6a14156d15b679af3c996605af38c813fa138cab024d","observation_id":"640a0218-e093-4eee-83bf-3c45d6ade841","resolution":{"observed_at":"2026-08-15T21:54:15.586097Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.564093Z","title":"Maruyama, D","venue":null,"work_id":"68e9f191-f019-4651-a35a-9f852cd0a1ae","year":2006},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.647910Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:4e451ee445942c65dcd9ddc698927218cd4e8bd3f347987692e2adf1d575357b","observation_id":"fc738a43-a340-4e04-b00d-1ab73fcaa376","resolution":{"observed_at":"2026-08-15T21:54:15.570651Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.657849Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.657849Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:db84c824e41371ac7cac53bcc6fa213097d5771f86efcf59663de7eebdb5cf69","observation_id":"965e06f7-cbba-4d36-896d-87d83ba6bb26","resolution":{"observed_at":"2026-08-15T21:54:13.657849Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2023.12994","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.374421Z","title":null,"venue":null,"work_id":"290d89ba-143f-47c5-a26e-e26905c5907a","year":2023},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.662286Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:a0a94ba0e3d191364351b8c07d134bb1ec873838a8ec3aa5c8bba2172b958f73","observation_id":"fdf26831-185a-40f2-868e-5c8774f6a508","resolution":{"observed_at":"2026-08-15T21:54:15.381788Z","resolver_source":"raw_fallback","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1364/ome.476713","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.872653Z","title":"Eriksson, N","venue":null,"work_id":"5c6cf453-5b84-4b43-9ca8-0805938e0850","year":2023},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.667556Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:0ecd748a1f1b1327d4092b05996b25a08bc7712fb4159a646d44c34b9ef08c80","observation_id":"dc3da258-be51-42b9-b29f-ed8c9949970c","resolution":{"observed_at":"2026-08-15T21:54:14.877039Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1117/12.2317742","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.858037Z","title":"Eriksson, N","venue":null,"work_id":"00f4a70e-6cf0-46ca-85a7-312c59f7d579","year":2018},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.673189Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:af78e4ec64127be2e46963902b5000185106a53e248b82e3ca3a2d4fa4227dc6","observation_id":"efa34001-9cf4-4277-add1-ac65b13b07c8","resolution":{"observed_at":"2026-08-15T21:54:14.862852Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.677758Z","title":"Maruyama, D","venue":null,"work_id":null,"year":2007},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.677758Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:1f9b43850c15a4d1e9bc31d78c592a9bf6748c3ee8590092fbef32e7d22853bd","observation_id":"8111c672-8d47-4b52-ad3c-fa5cd470fc4e","resolution":{"observed_at":"2026-08-15T21:54:13.677758Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.549058Z","title":"Elsenhans, P","venue":null,"work_id":"098f5ac2-5a30-49a7-abf2-57ccf0150d9d","year":1994},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.683419Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:0a38af58ab26884c2e48635d38c4a7163d373910e917b1dec8cee3be2086f400","observation_id":"9c6b2905-a3c6-4696-987b-facbf471ab4a","resolution":{"observed_at":"2026-08-15T21:54:15.553820Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.692574Z","title":"Broekhuijsen, N","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.692574Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:ffa898b4723e646486b950685d718c670e7788457e5fb534f9e9ca2f6ee4ca33","observation_id":"f9e8bb64-400a-4457-9241-52b918e44924","resolution":{"observed_at":"2026-08-15T21:54:13.692574Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.697029Z","title":"Stendahl, N","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.697029Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:b28659301f7e1adeed1afbe7b02c06b8d2a9bc866e3ee9552f1cdcbbdc85d5e6","observation_id":"905dd391-413c-4541-8868-3fa9314ae9d6","resolution":{"observed_at":"2026-08-15T21:54:13.697029Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1107/s1600576724007702","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.808601Z","title":"Smertin, E","venue":null,"work_id":"43d61603-5ba1-4f47-9c32-76c529f773cd","year":2024},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.701653Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f642e536f934fcd35a6e106536ee573f9942eaef6dccc6771a0d6ef5c1819e82","observation_id":"e5471bdd-6ced-49da-a20c-0f06640234ca","resolution":{"observed_at":"2026-08-15T21:54:14.813114Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.706296Z","title":"Duerig, A","venue":null,"work_id":null,"year":1999},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.706296Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:e273d4839ddba2dfd4e62217ad15b97182377c1fdf1a3f03c2e9f5c4d7c67058","observation_id":"424a7813-d747-4c25-af70-ba93d65f05b9","resolution":{"observed_at":"2026-08-15T21:54:13.706296Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/jbm.a.10549","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T11:08:47.750906Z","title":"Armitage, T.L","venue":"Journal of Biomedical Materials Research Part A","work_id":"72219cfa-a327-4965-a085-c45703a7302c","year":2003},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.710828Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f444b0bff54cda8fe04e6f3bd271dfaf8f3254ea3f0fad15816639f3fb916e52","observation_id":"8ce1d1c8-f17a-4c80-b3ed-f83d58191a4a","resolution":{"observed_at":"2026-08-15T21:54:14.788117Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.3367/ufne.2019.05.038623","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.769107Z","title":"Polkovnikov, N.N","venue":null,"work_id":"f6d81d92-21fe-4cab-9f14-e4fda68649c2","year":2020},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.715108Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:330fadc02242edf1690adb2e91bf9f2212133d6f0f522043c27a485076be5f63","observation_id":"86c29fcd-b260-4d06-8e2f-e1ee2bf8fafb","resolution":{"observed_at":"2026-08-15T21:54:14.773780Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2019.16474","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.192715Z","title":"Chkhalo, A","venue":null,"work_id":"a6497803-cbf7-4595-aa99-406ef98bfcbd","year":2019},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.719535Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:899d0d97e800f4cc2b0c542198f327f936201c17673136adc9d23972061ded82","observation_id":"2077b855-1870-40ca-a993-a905c709abcf","resolution":{"observed_at":"2026-08-15T21:54:15.200706Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/sia.740180719","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T11:08:47.750906Z","title":"Repoux, Comparison of background removal methods for XPS, Surface and Interface Analysis 18 (1992) 567–570","venue":"Surface and Interface Analysis","work_id":"7a9dd949-12bd-4816-b050-eaf85a13865a","year":1992},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.723844Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:d8d7a66048b260fd3441035a41b3e1abd808088d399063f482577db264be5f43","observation_id":"20e8c83e-c6a0-4ad6-b3b7-612282fb11d5","resolution":{"observed_at":"2026-08-15T21:54:14.759266Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/(sici)1096-9918(199703)25:3","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.740129Z","title":"Tougaard, Universality classes of inelastic electron scattering cross-sections, Surface and Interface Analysis 25 (1997) 137–154","venue":null,"work_id":"9a03cf3b-fcdc-47d3-807d-e5ef4ab3a04f","year":1997},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.728181Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:5b7501403853b58e6fd2a79315d39176f92463f47f93f27713032da804f6e504","observation_id":"98089bfc-7e0c-454d-b284-5da5f95f6588","resolution":{"observed_at":"2026-08-15T21:54:14.744856Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1107/s160057671901584x","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.724802Z","title":"Svechnikov, Multifitting: software for the reflectometric reconstruction of multilayer nanofilms, J Appl Crystallogr 53 (2020) 244–252","venue":null,"work_id":"5df1a34c-545c-4afb-822d-4385e75cb7b1","year":2020},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.732720Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:8a952b3cdf9df5c52327c5c9ac7345cc494a6de5985c22955c6e16dca4aefeee","observation_id":"f66843cc-6d35-44d7-bdc0-4f8d0d71414b","resolution":{"observed_at":"2026-08-15T21:54:14.729778Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1107/s1600576724002231","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.709606Z","title":null,"venue":null,"work_id":"4359eee7-a3ce-4bff-bf9e-c22f52bad5c1","year":2024},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.737309Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:c2bd5ef37f0b322e73271218ae1555f03a84b373ffb2b138c9b019850b6a8a99","observation_id":"b6392b0c-532c-4b62-9980-76e9588fab35","resolution":{"observed_at":"2026-08-15T21:54:14.714259Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.4812323/119685","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.694441Z","title":"Jain, S.P","venue":null,"work_id":"6cf1f906-79f8-4cd1-a276-eed28641c5c2","year":2013},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.742658Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:ae4692b4b4a837db1fc6a594fdc3aa5404164d421f3a2117e0d018f7cc6f2381","observation_id":"dca514d0-39a4-4279-9838-e1457d83da9e","resolution":{"observed_at":"2026-08-15T21:54:14.699227Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.matdes.2017.05.055","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.679828Z","title":null,"venue":null,"work_id":"911b1688-2477-4e83-ba75-6321c78795bd","year":2017},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.747210Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:51ab1ebc8730727e58a1a20bb4f062dde601e9658e52cc7ed48e271220f54a06","observation_id":"fb1f2680-031d-458d-9d10-c37d462b5d9c","resolution":{"observed_at":"2026-08-15T21:54:14.684412Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[{"edge_observation":{"observed_at":"2026-08-16T06:31:06.458307+00:00","source":"paper_reference_links","state":"open"},"event_date":"2018-02-13","event_type":"correction","notice_doi":"10.1016/j.matdes.2018.02.014","provenance":{"observed_at":"2026-07-11T03:17:19.891751+00:00","source":"crossref","source_record_id":"10.1016/j.matdes.2018.02.014->10.1016/j.matdes.2017.05.055:correction"}}],"reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.jmrt.2022.09.017","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.663771Z","title":"Babaei-Dehkordi, M","venue":null,"work_id":"416d1b34-2ec2-4e17-9345-a90d950b9399","year":2022},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.751727Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:ef9c877d3075d6c30157e731e5b48ff69852d1145939ca66125dc8493b1448f4","observation_id":"85e17aea-11f4-4f0a-b077-cb74610bd853","resolution":{"observed_at":"2026-08-15T21:54:14.669051Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.533918Z","title":"Senkovskiy, D.Yu","venue":null,"work_id":"c0100e1d-4e7d-4002-8c61-3c4852171a87","year":2012},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.756691Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:1c82a6e9eb2fe10446eb11d7cbf6adebbc6abe621633e04c439ad61370e8e5d6","observation_id":"4ac8534e-d41e-445d-ade3-f111b079c56f","resolution":{"observed_at":"2026-08-15T21:54:15.538553Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.intermet.2012.02.007","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.631755Z","title":"Petrović, D","venue":null,"work_id":"80bf7065-995b-4eba-92ac-6c473ddbd99c","year":2012},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.766080Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:b7c2883666946312f9bcfb167380acbf225411571e8f50c6cc75edd87f03c2ab","observation_id":"62490964-24ae-4028-b530-0a999418b532","resolution":{"observed_at":"2026-08-15T21:54:14.636964Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevb.27.2179","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.616548Z","title":"Hillebrecht, J.C","venue":null,"work_id":"b48fb945-5c8c-4822-bf90-0af887e49fc2","year":1983},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.770810Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:28cc4e3ca64e7ba7cf21119970d30677923c4e7c1b036d804a86596570552b70","observation_id":"2c52a43a-f9ee-4184-995b-cc84e0be4be6","resolution":{"observed_at":"2026-08-15T21:54:14.621234Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/0375-9601(75)90457-0","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.601627Z","title":"Hüfner, G.K","venue":null,"work_id":"f16227a5-33c0-4fef-976f-dfed4d51ecdf","year":1975},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.775334Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:2fe41733aef19f5f5b347158e9bf6d3d244b3d77a828a567b6f5b1d143d569c4","observation_id":"9d981cd3-8418-4675-8227-98230a8ec49f","resolution":{"observed_at":"2026-08-15T21:54:14.606438Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.apsusc.2007.04.018","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.586979Z","title":"Wang, C.L","venue":null,"work_id":"abb6476f-3c01-4fca-ba0a-b20c771edc59","year":2007},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.779958Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:1f323db50a31f0c1b381644fc850df2ed13d440096bcc353972178c70e72ba40","observation_id":"1417d2a3-2e9d-4929-bd67-f5811ea638c5","resolution":{"observed_at":"2026-08-15T21:54:14.591384Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.784356Z","title":"Richardson, L.A","venue":null,"work_id":null,"year":1976},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.784356Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:85b3a59cf597941f9150757c9bd562e929fa84d5bc92aeba5054b0ae78aff6fd","observation_id":"cadb6d0c-6bc9-404d-977e-b354b5fe315d","resolution":{"observed_at":"2026-08-15T21:54:13.784356Z","resolver_source":null,"status":"malformed_identifier"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.517328Z","title":"Kittel, Introduction to Solid State Physics","venue":null,"work_id":"5556ff1a-e197-4f13-ac01-fc9b6263ed26","year":2005},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.788840Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:0980a95abf00e7a1aeb7569ffa16f724b477400066983b38d88e05d7517c2836","observation_id":"8db0bee2-722b-477d-b330-5e7de4eaa8fb","resolution":{"observed_at":"2026-08-15T21:54:15.522298Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/1.1247794","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.562089Z","title":"Diebold, T.E","venue":null,"work_id":"d8cc8a84-fe54-4350-83cf-53ba028df64c","year":1996},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.793183Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f3c1e275fb552af13802ab8293d07cbe659501a630d5828b85644a03d6f870d6","observation_id":"99f3e233-7d2e-4173-bc7a-e4b8e8fc8cf5","resolution":{"observed_at":"2026-08-15T21:54:14.566825Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/11.20070902","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.547036Z","title":"Barreca, A","venue":null,"work_id":"9ef86a92-54ed-47ba-b283-eb6c7e3a4d40","year":2007},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.798121Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:4b139d022620da51633ea31313555dabe06ab72b40888b46ad7c7d2db311e506","observation_id":"ac9a75ae-c148-4ecd-a2a5-7e30eb59ab1b","resolution":{"observed_at":"2026-08-15T21:54:14.551703Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.802721Z","title":"Biesinger, L.W.M","venue":null,"work_id":null,"year":2010},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.802721Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:9bbb0a1d69470fd53ca8b62abe06a6b5fa1a40917ec089c459d132184d60441f","observation_id":"2cb4efce-9c60-4487-88f6-ccb170353394","resolution":{"observed_at":"2026-08-15T21:54:13.802721Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/sia.1296","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T11:08:47.750906Z","title":"Hashimoto, A","venue":"Surface and Interface Analysis","work_id":"2434bb57-4604-4ad2-be09-86831a697a2f","year":2002},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.807229Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:c8ba09d5fcb1282d5e217f35bab4a4686a9a7e9fc4890bfeeaab4d8ed940526e","observation_id":"2a6ff335-e830-4130-bf11-afdb9b9384e8","resolution":{"observed_at":"2026-08-15T21:54:14.526493Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1088/1742-6596/100/1/012025","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.506161Z","title":"Biesinger, B.P","venue":null,"work_id":"b5d35549-a246-41fc-9a0c-841ac9cad9d4","year":2008},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.812589Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:cf1115f03cd49e071d6b13a7d048d457ecb971b0f9c87b724f47583f6cc32b27","observation_id":"e1136356-364f-4d46-9ec3-890413f9d0a6","resolution":{"observed_at":"2026-08-15T21:54:14.511272Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/0368-2048(92)80001-o","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.384969Z","title":null,"venue":null,"work_id":"14b62542-b925-42cd-879a-f533b3252b28","year":1992},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.817359Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:9cf93778a06d94088e60d17d12d009ad7664200d11a5495056017eb48d8f2e46","observation_id":"21cf5abe-2d8c-42fb-82d0-842a3943d089","resolution":{"observed_at":"2026-08-15T21:54:14.494816Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/1.5143897","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.369412Z","title":"Brundle, B.V","venue":null,"work_id":"f77ed5cb-2959-4c4a-ab37-af7fc1f85f46","year":2020},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.821944Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:5356810b639074008a9e3205005b25d7eca76f00a21e6b798f3ebe6eb6adc308","observation_id":"bda1f952-e9b5-485a-9c08-c4a4540e7652","resolution":{"observed_at":"2026-08-15T21:54:14.373989Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2000.0849","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.124433Z","title":"TRZHASKOVSKAYA, V .I","venue":null,"work_id":"4afc2183-75fa-42cc-b542-b2b489f43b8c","year":2001},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.826536Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:0c79ced93a1291784ff5dfda941b48ba253ea7121f6a212462f1d68c0732693a","observation_id":"f993b7c6-078f-4410-925d-951590775f63","resolution":{"observed_at":"2026-08-15T21:54:15.132909Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.501723Z","title":"Tanuma, C.J","venue":null,"work_id":"c71431a8-2266-4b7d-beff-104c7082132d","year":2003},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.831141Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f62c360c8c3d89f1195ef66d1e67f9641a89b5ce26e87fea555de3bcf58ddbe0","observation_id":"2f77295d-8b31-4348-85f0-63617758c818","resolution":{"observed_at":"2026-08-15T21:54:15.506594Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/sia.740200302","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T11:08:47.750906Z","title":null,"venue":"Surface and Interface Analysis","work_id":"1337d98d-5e10-42f3-b626-f77e1e2ba927","year":1993},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.841257Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:035487590848ed6e0338250bb5cf753e29abbc7bd2c687eb5064e89b143512ef","observation_id":"c7625678-af8a-4de6-95b1-d21ccb17bae5","resolution":{"observed_at":"2026-08-15T21:54:14.343874Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/1.1247751","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.324116Z","title":"Mansour, Characterization of NiO by XPS, Surface Science Spectra 3 (1994) 231–238","venue":null,"work_id":"aa044576-8563-414a-b506-5cd606a1abf4","year":1994},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.846213Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f99f4716934276c17fdac15865a21f1578fc2503f373459289c9511c0c38281b","observation_id":"e828ce17-c479-45af-b681-a9e8b3aa78b2","resolution":{"observed_at":"2026-08-15T21:54:14.328848Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/6.0003008","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.308960Z","title":"Pagot, M","venue":null,"work_id":"5eae036b-9395-4f40-aa85-e5340e6c5445","year":2023},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.850669Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:463320fc20fa4cca8572e1ed7f1908fefae71d02094d1ec8d4ebdfc2fd982801","observation_id":"e2c8b5f4-5d87-458d-aa90-d428c5a3ca00","resolution":{"observed_at":"2026-08-15T21:54:14.313683Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.855578Z","title":null,"venue":null,"work_id":null,"year":1984},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.855578Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f3ff8a1da60c819a70aa544fd214dc571adfbdeb67b2458bb24d70f5d262843f","observation_id":"cd16d12b-7414-41bb-b775-f4bc636f0c45","resolution":{"observed_at":"2026-08-15T21:54:13.855578Z","resolver_source":null,"status":"malformed_identifier"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.susc.2011.10.015","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.284055Z","title":null,"venue":null,"work_id":"de83c644-2562-4c1c-a8fc-6a1eb270f5f5","year":2012},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.861217Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:c2e4a27aec4fe02fe9690d9ac7a7be1a0e708dd4d055ba9d76f601be6cc3263b","observation_id":"c28342ea-ecaa-4d3a-b659-a05fd061a988","resolution":{"observed_at":"2026-08-15T21:54:14.288812Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/sia.3050","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T11:08:47.750906Z","title":null,"venue":"Surface and Interface Analysis","work_id":"20db04d2-6e06-4ff6-b54d-dc9b11e65606","year":2009},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.865657Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:cbb6b47459a11292ded7276e7436f9a931fb9d2d12ea3c66d51e53daf3afd641","observation_id":"4aba33b9-5604-44e5-b41d-8fbce4ea5c0d","resolution":{"observed_at":"2026-08-15T21:54:14.274175Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/11.20121101","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.255308Z","title":"Jensen, S.S","venue":null,"work_id":"64b9b5ed-0881-42ca-86dc-c7afe63ace47","year":2013},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.870140Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:c74234dc687bdd056f705c34db72e1022a4ef6776fe7fbf06dccdcb6d2e8cef5","observation_id":"648ecda5-3cf3-4cea-ac6d-32c058421bd3","resolution":{"observed_at":"2026-08-15T21:54:14.259620Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/1.1467357","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.241354Z","title":"Desbiens, R","venue":null,"work_id":"b168a217-34ef-4b01-a97b-c9ff79b26ccd","year":2002},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.874617Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f5456fc8061c8f86f4ba5c11080272ec9400558f04b31bcc45dd88389f0108c6","observation_id":"b7b6a456-e03a-4283-9695-822ea4affe47","resolution":{"observed_at":"2026-08-15T21:54:14.245666Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/0378-5963(83)90003-x","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.226326Z","title":"Barr, An XPS study of Si as it occurs in adsorbents, catalysts, and thin films, Applications of Surface Science 15 (1983) 1–35","venue":null,"work_id":"5f8b478d-621b-45af-99a3-0cf7ba164224","year":1983},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.879057Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:fd9c97e33283310db236374c157159df7c09682266c6c6f2120f793a1393af93","observation_id":"867a4573-e6f1-47d6-b2d2-115527a89479","resolution":{"observed_at":"2026-08-15T21:54:14.231264Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1116/1.1247726","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.211825Z","title":"Nakajima, S.P","venue":null,"work_id":"95f26b54-58c8-4cf6-93af-257f76a02ca1","year":1993},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.883447Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:7c0954e9b42f70e4c9a5dfb0a0ab6d58622657c9d84374443033f93501196349","observation_id":"2b925008-00cf-4717-924f-d449873825d9","resolution":{"observed_at":"2026-08-15T21:54:14.216412Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/s0039-","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.197349Z","title":"Lee, E.T","venue":null,"work_id":"f6de65da-be7f-41e9-a461-c969f1df7c57","year":2000},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.887710Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:167f4774c6f36b9f15ae929e682e4ada64d69dee3408e3a050eae058ef9f5263","observation_id":"ee479b69-b5b0-4bce-9edd-334095e1e32e","resolution":{"observed_at":"2026-08-15T21:54:14.201980Z","resolver_source":"doi_truncated","status":"malformed_identifier"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.apsusc.2006.06.018","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.182095Z","title":"Osiceanu, An XPS study on ion beam induced oxidation of titanium silicide, Appl Surf Sci 253 (2006) 381–384","venue":null,"work_id":"5f467306-b203-413a-ab67-37ae9caa7d44","year":2006},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":55,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.893026Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:3063cd3e16ca1407aa37d1fa307eca3235ed6c2737a690d76313d4883255e818","observation_id":"65290b97-ed5f-40ab-bfff-c801a9010844","resolution":{"observed_at":"2026-08-15T21:54:14.186942Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.486263Z","title":null,"venue":null,"work_id":"08f07737-5e06-451c-854d-a4ca5ab41d90","year":2005},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.897580Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:8a232603486850abb5a2a297fbfa97139cf4bc36da60277ab04e9d877b3b9752","observation_id":"719a2f62-4ac4-4fa8-b018-27f5ecb0ac37","resolution":{"observed_at":"2026-08-15T21:54:15.491137Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.matlet.2018.10.085","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.153054Z","title":"Aboulfadl, F","venue":null,"work_id":"648d1fa2-c97d-481d-9559-1fbf3fb87f55","year":2019},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":57,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.907262Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f10b7eb9354592db0923c7b398904558b00e2371787bab748b8300970540961a","observation_id":"ad7e5e73-f515-4e75-a8d9-01b7ad898a59","resolution":{"observed_at":"2026-08-15T21:54:14.157996Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevb.42.5481","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.138439Z","title":"Hollanders, B.J","venue":null,"work_id":"19dbcd9a-0566-4e76-9f5f-8e926d5ab11b","year":1990},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.911694Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:b06b6e87c9496f694431c29de1ef00bb9133cf89ee431b05914273395335f70c","observation_id":"4c1725eb-2ec0-424f-ab4e-45648771d328","resolution":{"observed_at":"2026-08-15T21:54:14.143061Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.sna.2006.11.012","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.122449Z","title":null,"venue":null,"work_id":"76f7230d-d725-425c-9bcb-4f4811568aac","year":2007},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":59,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.916540Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:a34b81d40888be13eec372ca82adab0bf31c42d368311caf0200c3fa7bd6a697","observation_id":"97880928-c728-4119-9841-af355b72fcd4","resolution":{"observed_at":"2026-08-15T21:54:14.127829Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.jallcom.2019.06.092","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.105469Z","title":"Zhang, Z","venue":null,"work_id":"58e3b01b-3019-4b7c-a948-82eef22b2f09","year":2019},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":60,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.921206Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:fdfbb6f66aebbdc3e5ad6abab07d51290cf0f7e65ff58a68e9fd9f17928cec51","observation_id":"ce9c9b23-70ae-44bd-adc2-29cacbf624ec","resolution":{"observed_at":"2026-08-15T21:54:14.110522Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"1994.0031","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.043889Z","title":"Jankowski, M.A","venue":null,"work_id":"10622dc4-843d-4847-91f7-e0de474ec736","year":1994},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":61,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.925843Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:910fe314b52c91f067afaefce1b8154e033181749670f1b57c06c52477c053e3","observation_id":"65fc4bd9-4712-4379-ab2d-c42e01dc2ac8","resolution":{"observed_at":"2026-08-15T21:54:15.052634Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevb.79.195435","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.089236Z","title":"Singh, S","venue":null,"work_id":"afd9b3ec-93fd-4912-9dfb-ef3c38bd5cf1","year":2009},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":62,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.931025Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:66d18e7afe0a4759e63babb264876c73d738b1dcdcd28bd207a5a74c1bf0194c","observation_id":"2a9b3f62-448b-4051-82ab-01fb9643f34f","resolution":{"observed_at":"2026-08-15T21:54:14.093802Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.jallcom.2017.08.158","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.073796Z","title":"Shi, Z.H","venue":null,"work_id":"5041d8d9-3eb7-425d-9bd8-af7508b88d37","year":2017},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":63,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.935683Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:8f96af10d1d6318ddc31689a651da6337724192a5ca8f6651a8aa82322b0aff2","observation_id":"7872c8fd-bda4-4d42-9c51-47b02533d11b","resolution":{"observed_at":"2026-08-15T21:54:14.078928Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.apsusc.2006.05.036","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.058830Z","title":"Bhatt, V","venue":null,"work_id":"1fcab0e3-ece2-419a-8fb1-c8b99752cbe5","year":2006},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":64,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.940146Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:e923bbf22542c2a650631f2c91dc11602328ff7e5882959a2a9a82c724fb5a24","observation_id":"d981215c-1976-4ca8-911c-8cab3c915d37","resolution":{"observed_at":"2026-08-15T21:54:14.063427Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1039/c8ra08200f","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.042718Z","title":"El-Eskandarany, Metallic glassy Ti 2 Ni grain-growth inhibitor powder for enhancing the hydrogenation/dehydrogenation kinetics of MgH 2, RSC Adv 9 (2019) 1036–1046","venue":null,"work_id":"f05b3da4-ba4c-4cb5-be73-87a0f4b4a475","year":2019},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":65,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.944648Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:62918e6a2cdbb9195940069d539116969d54bb3084991af5ec9c3e7dc18476a4","observation_id":"b5cc87d4-62e0-467f-a5ba-d305a5d43acf","resolution":{"observed_at":"2026-08-15T21:54:14.048527Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.949231Z","title":"Patterson, The Scherrer Formula for X-Ray Particle Size Determination, Physical Review 56 (1939) 978","venue":null,"work_id":null,"year":1939},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":66,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.949231Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:2c27326ec005df89e9b8cda5aa7f728d6e5b47b0d0867ef1a6a7e4854faab261","observation_id":"232a88a9-7c78-43b8-bdcd-8364a11fdceb","resolution":{"observed_at":"2026-08-15T21:54:13.949231Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1088/0953-8984/19/37/376210","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.015990Z","title":"Bhatt, S.M","venue":null,"work_id":"2ec39d26-2241-45dc-806f-a2398cd8168d","year":2007},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":67,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.953897Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:8508e8b36982f135909669947dd95efc26bf39fe592d8d1c25d6377d5617567b","observation_id":"fa1eb5d2-532d-4c2e-8e66-fe66ef6f7739","resolution":{"observed_at":"2026-08-15T21:54:14.020926Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/0304-8853(94)01563-5","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:13.999043Z","title":"Kraegermann, K","venue":null,"work_id":"29fbfe77-3bca-4fae-a662-d5d4622d8200","year":1995},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":68,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.958531Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:3e1517d8dc8d2319c0e0dff9140d2d85f6818306f2adb3d4a5fdcb6256e03bf4","observation_id":"576e3917-328c-48ee-a693-22e3b564cf1f","resolution":{"observed_at":"2026-08-15T21:54:14.004998Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.471237Z","title":"Arblaster, Selected Values of the Crystallographic Properties of Elements, ASM International,","venue":null,"work_id":"47230350-c7fc-47da-a73a-045adb1e8c25","year":null},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":69,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.963083Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:75140ade09652b94668207369df86a2002e09cb30916ac61f0d575cbdf96b073","observation_id":"0666dd0f-fb01-4168-815e-b15f687bb4f5","resolution":{"observed_at":"2026-08-15T21:54:15.476247Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/0040-6090(94)90739-0","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.833360Z","title":null,"venue":null,"work_id":"3bbe1bb9-ca75-45e6-85f7-a2cd08a450e1","year":null},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":119,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.687832Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:a6418db4448145fefa78ef5e958f0e57db5994c922463b991a2649349839af03","observation_id":"412d8f35-2183-4d29-98a2-372a2a10598f","resolution":{"observed_at":"2026-08-15T21:54:14.838608Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.jallcom.2012.05.059","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.647627Z","title":null,"venue":null,"work_id":"a1a79fc3-19f9-421f-bb89-cbad734e1793","year":2012},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":196,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.761035Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:ed724b03b1cd61e7dae658d3579328e5c3b6e14d8201830b54f14c55b88784de","observation_id":"3b72f2a8-52d1-4add-8979-4568b455f5a3","resolution":{"observed_at":"2026-08-15T21:54:14.652307Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.apsusc.2005.01.013","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.167786Z","title":null,"venue":null,"work_id":"4c5339ee-8a8a-4e8f-b358-1c9750711bc9","year":2005},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":267,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.902761Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:a346481ab8d73df22035c8727e40831357f7e204fc068677d3296d8d4d9ed266","observation_id":"f5dbe4be-7fbb-47cd-916b-189a74735cd4","resolution":{"observed_at":"2026-08-15T21:54:14.172286Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/sia.1526","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-16T11:08:47.750906Z","title":null,"venue":"Surface and Interface Analysis","work_id":"f6826254-72b0-4b94-865b-abe1a2d4c6b2","year":null},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":275,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.835804Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:227295af221987e0d13e1a645f805e6e0c6090367a7043dc06a018c72fed32db","observation_id":"6c765770-7478-45ac-a89b-aeaac3f33629","resolution":{"observed_at":"2026-08-15T21:54:14.359441Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.physb.2006.06.024","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.887096Z","title":null,"venue":null,"work_id":"50474b12-ed6a-487a-8102-3e95adfe4a75","year":2006},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":1258,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.653134Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:f33f04b29a9babba5b956e91fd6124d256f4b2f2db4cc9a513f3daa9063e8251","observation_id":"1fd17eeb-ca2d-4e04-af97-e49317d1abb8","resolution":{"observed_at":"2026-08-15T21:54:14.891739Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:15.456770Z","title":null,"venue":null,"work_id":"3c94a624-a5a2-413d-b92c-259000b4ed9b","year":null},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":2018,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.967820Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:0f136232effe544f14593a390c480135b11f2079cbe29be8259ce0d37739d99d","observation_id":"5e6b0db5-ad41-4744-b026-f101b6f30839","resolution":{"observed_at":"2026-08-15T21:54:15.461401Z","resolver_source":"raw_fallback","status":"parse_uncertain"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1088/0256-307x/23/10/015","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-15T21:54:14.907873Z","title":null,"venue":null,"work_id":"87055c6d-1fde-4a39-8862-0629fefea0b1","year":null},"citing_paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses","version":1},"reference_index":2680,"source":"pdf_text","source_observed_at":"2026-08-15T21:54:13.643050Z"},"links":{"citing_paper":"/paper/2505.08569"},"observation_digest":"sha256:efec70c0a6e2402fab4238145ad42cb999089fe70e5e9adb67e916a8856b2f50","observation_id":"5c3f33cf-b470-46a5-aa9d-a3d11d2038fd","resolution":{"observed_at":"2026-08-15T21:54:14.912702Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2505.08569","last_updated":"2025-05-13T13:45:11Z","latest_version":1,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-16T06:42:16.114904Z","submitted_at":"2025-05-13T13:45:11Z","title":"Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses"},"reference_resolution":{"displayed":76,"state_counts":{"malformed_identifier":3,"metadata_mismatch":1,"parse_uncertain":1,"unresolved":9,"verified_exact":55,"verified_fuzzy":7},"total_outbound_references":76},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"thesis":"As of 16 August 2026, this Paper Citation Record lists 76 of 76 outbound references and 0 inbound Pith citation observations for arXiv:2505.08569."}