{"as_of":"2026-08-08T02:28:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:c52bcff765980804fb21ad56ea05a99e1076550c82ecc527630a25beaff90601","coverage":[{"denominator":59,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":59,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-07T12:42:30.380043Z","state":"measured"},{"denominator":59,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":59,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-07T06:34:17.273281+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2505.24065/citation-record","integrity":"/paper/2505.24065/integrity","json":"/paper/2505.24065/citation-record.json","paper":"/paper/2505.24065"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:38.033089Z","title":"Synthesis and characterization of vertically standing MoS2 nanosheets","venue":null,"work_id":"ce59e9e1-7957-48f7-b262-5ce1429eb276","year":2016},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":1,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:26.750524Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:272bc0b616e7e87e5027f34d9b78b29d98d386a5b56172b88c69fabe972d0765","observation_id":"89885e25-4e64-44a0-8c34-b2251aa7fd70","resolution":{"observed_at":"2026-08-07T12:42:38.064542Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.939997Z","title":"P.; Keating, C","venue":null,"work_id":"b0cf9a76-9625-406e-afe4-43f57e9bc3a9","year":2000},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":2,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:26.792620Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:1e6e852c478d0c584fadc8a96a5b43fd95bc86943072b51dab5409a13ab3d6b2","observation_id":"311eeb76-90ac-4150-8bcb-273c478a624f","resolution":{"observed_at":"2026-08-07T12:42:37.978823Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.800992Z","title":"A comprehensive review on Raman spectroscopy applications","venue":null,"work_id":"bbb71674-eed4-4e17-8cc7-a24ec2020d82","year":2021},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":3,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:26.879339Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:7627c53cc04f616646fee35dff657b7ec5e3d27ef6113987eb3ccc3e6ca5ccf2","observation_id":"01de71e8-552c-4aed-ac7a-5f0324c8f5cc","resolution":{"observed_at":"2026-08-07T12:42:37.883399Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.675459Z","title":"Atomic force microscopy","venue":null,"work_id":"2c55e8cc-b0c8-4bfe-9370-129531e7245a","year":1990},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":4,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:26.976932Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:c65ed93b99015cd7246ae9d72f2a7322ad25e8efb4d698b532c226edcc21532d","observation_id":"5eb73abf-3b2c-49d9-a9e0-264fc13a3c7d","resolution":{"observed_at":"2026-08-07T12:42:37.700019Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.607322Z","title":null,"venue":null,"work_id":"a1b00d03-ce49-4f29-8f1b-34c807e507ed","year":2003},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":5,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.055458Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:ec6c4985f1ffe4b3615bea0920f9f98bc0497b62321733143d141e92964a36ae","observation_id":"f3a16d7b-9c6d-4a8a-846a-dc5738c1121d","resolution":{"observed_at":"2026-08-07T12:42:37.634686Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.497905Z","title":"Atomic force microscopy for two-dimensional materials: A tutorial review","venue":null,"work_id":"10f960ac-9869-431f-94f3-8066bdf87e75","year":2018},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":6,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.089555Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:42f2f85404ee3358da176d07523058433a69d5c1553dbb418bcbe003503b3fb8","observation_id":"0a120033-35d6-4d51-946e-5a6d2f0fb932","resolution":{"observed_at":"2026-08-07T12:42:37.551301Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.434205Z","title":"W.; Yang, S","venue":null,"work_id":"737528ee-c79e-46c9-8f9e-fd0ab1f6667e","year":2021},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":7,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.131975Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:41fd01691339a296bf30f55e84e2d22f91b43efc3fd0e6e8f20fa1200b7d4aad","observation_id":"b60b6166-dcf6-4979-8a88-305550642c88","resolution":{"observed_at":"2026-08-07T12:42:37.472326Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.325634Z","title":"Chemical Reviews 2024, 124, 10112--10191","venue":null,"work_id":"3ae36f1a-3ac7-4743-9255-9a51cd6bffde","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":8,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.162239Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:0133a776f02a4880976c012bb1b97cbc37ffded17c511a9dd3bf6204a417589f","observation_id":"3e9a2158-e2de-449e-966f-ba8382b09bd5","resolution":{"observed_at":"2026-08-07T12:42:37.368002Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.203517Z","title":"Advancements in 2D transition metal dichalcogenides (TMDs) inks for printed optoelectronics: A comprehensive review","venue":null,"work_id":"377363e5-ffdf-4c04-8a01-b64f62783254","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":9,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.238881Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:c2064cae3f12228997be331387bf006a0cd58470d8de0b8c05e6cb4ac85b95bd","observation_id":"b0d2ccda-f8cb-4717-a7c2-898769715695","resolution":{"observed_at":"2026-08-07T12:42:37.274442Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:37.024003Z","title":"Z.; Dahshan, A.; Aftab, S.; Hegazy, H","venue":null,"work_id":"35027fee-d07c-4dc0-b583-daf5c2cbd5dc","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":10,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.303947Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:6faa487551d169d62b3fba6043d33ba41920bdb2297b74bd0e2c2af688b3b0b2","observation_id":"21c604ab-fe00-426d-8991-8201d78135b2","resolution":{"observed_at":"2026-08-07T12:42:37.120021Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:36.867798Z","title":"Advances in MoS2-Based Biosensors: From Material Fabrication and Characterization to Biomedical, Environmental, and Industrial Applications","venue":null,"work_id":"289daa80-fc8b-4100-80cf-578c0adee0d0","year":2025},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":11,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.336386Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:dbfaf6233d8357e6102dd7d0ac90bba1b16b1d913344cf699f628b8eb789e642","observation_id":"d07cd0f9-9b7d-4855-b603-601c5de2fd13","resolution":{"observed_at":"2026-08-07T12:42:36.955552Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:36.697785Z","title":"Science China Information Sciences 2025, 68, 112401","venue":null,"work_id":"a98a3ffb-9439-4efb-8da1-aa6a7f1870e2","year":2025},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":12,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.417184Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:0f0d3f3994e65f08627bd251f29152bff33bce3dcedf85a1b70e57d52a6c917f","observation_id":"0cae5381-7251-450a-b5ff-b4be39a59591","resolution":{"observed_at":"2026-08-07T12:42:36.783794Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:36.543931Z","title":"MoS2-based quantum dot artificial synapses for neuromorphic computing","venue":null,"work_id":"0bd6465e-654a-41ff-a309-83342fd6584c","year":2025},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":13,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.487481Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:963433b857d5bf2a4a6ca750f27af661287f43d3dd8988ad48c95361051450d0","observation_id":"b6bedb9e-8967-425f-b767-641602ff40bc","resolution":{"observed_at":"2026-08-07T12:42:36.619423Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:36.375444Z","title":null,"venue":null,"work_id":"b9753200-e284-479a-824c-b2ec001c1776","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":14,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.574837Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:14202d048d02085c5c8b97d47f86961566570a3635081fe3a88c8ed3df204d5f","observation_id":"404bc4ce-bac3-48d9-8e42-0354874a8d7e","resolution":{"observed_at":"2026-08-07T12:42:36.459856Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:36.203455Z","title":null,"venue":null,"work_id":"fb9e61a7-af29-445f-9cf8-30b7094dcf99","year":2012},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":15,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.648816Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:d786cba2ea894b4bddead7fed619a5c2a4f4913fc608f5513050ef119b9fe161","observation_id":"84185c4d-d138-477d-a1d7-2330f8a3ab83","resolution":{"observed_at":"2026-08-07T12:42:36.281300Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:36.068455Z","title":"Raman spectroscopy characterization of two-dimensional materials","venue":null,"work_id":"67eb2e16-9c32-4f9b-b064-5ac31a7932d0","year":2018},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":16,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.730347Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:6ea9245184f7772b27ab696d2db8f1f53fab686c832296f4832780be68bdf2a6","observation_id":"9a0591e6-7fbe-4155-a6de-46ff5b8a6dc7","resolution":{"observed_at":"2026-08-07T12:42:36.118122Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.942023Z","title":"R.; Bertolazzi, S.; Brivio, J.; Watson, M.; Wu, X.; Kis, A.; Luo, T.; Hight Walker, A","venue":null,"work_id":"382a9616-1e87-4fd9-b95b-d76b41a5c8a8","year":2014},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":17,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.806850Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:0a4351d8faf2b6c22c75c51f4460684ad0b652881b15b4ea9c6d88347abf4f1b","observation_id":"f5f77717-8907-485a-9a54-de01e52a8556","resolution":{"observed_at":"2026-08-07T12:42:35.992881Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.857471Z","title":"E.; Heinz, T","venue":null,"work_id":"fe1effbc-ee3a-485b-a377-ffa2cb8927d7","year":2010},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":18,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.878829Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:de3829b114b429be1f81434cdad64234f52710d43fd113e6711a6c5560f025bf","observation_id":"433af432-cb5f-431f-b393-a14458f39162","resolution":{"observed_at":"2026-08-07T12:42:35.881545Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.798785Z","title":null,"venue":null,"work_id":"6c68dba5-c596-44f7-92f5-575fd89de010","year":2019},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":19,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:27.961423Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:aef0b15f058f4e1451a37805de923e5887025857587fbd2a0a734ca841eb1d7a","observation_id":"a379bd2c-d891-43a7-9636-f1b50880d162","resolution":{"observed_at":"2026-08-07T12:42:35.835236Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.710659Z","title":"I.; Golovynska, I.; Li, B.; Lin, D.; Qu, J","venue":null,"work_id":"da44e9b3-8b36-442f-8542-893ac01d892f","year":2020},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":20,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.038943Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:99746124f3b4c0c131e6c9a7d6b5fd6dc9a4c746823e2dc250bd54e5aa676b28","observation_id":"8f5c252b-12a1-4e78-9853-92fc1b777ea7","resolution":{"observed_at":"2026-08-07T12:42:35.755033Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.608619Z","title":"Shape-uniform, high-quality monolayered MoS2 crystals for gate-tunable photoluminescence","venue":null,"work_id":"b48d10d3-313e-4929-879a-347701ad0514","year":2017},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":21,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.135954Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:03fdd8744441d27cbba3aafb431128740bff0cdb3a85ebf480c2d072a6ff06b8","observation_id":"c1a1dd72-03ed-4674-a868-5d7c43afb6ec","resolution":{"observed_at":"2026-08-07T12:42:35.652893Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.496505Z","title":"M.; Hossain, L.; Lin, Y.-C.; Piasecki, A","venue":null,"work_id":"9c91ca31-c719-4d69-9ef5-a8a132b2ae94","year":2015},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":22,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.210813Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:8570715a4a68473f329af8115d8f927f5680ece446b749752bc89ce22dd27dcf","observation_id":"09e13aa1-8640-42c4-9288-acd7966788df","resolution":{"observed_at":"2026-08-07T12:42:35.547088Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.441765Z","title":"Chemical Vapor Deposition of a Single-Crystalline MoS2 Monolayer through Anisotropic 2D Crystal Growth on Stepped Sapphire Surface","venue":null,"work_id":"f505435e-317c-442f-a8a5-9749bf3e8792","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":23,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.298691Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:5570a22005e5a4d338750a9907a3ef336028ff9c4081bc887a95a52e7e21c310","observation_id":"fc081959-f2bb-4114-8751-4678ab6d7898","resolution":{"observed_at":"2026-08-07T12:42:35.467879Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.306048Z","title":"A.; Wu, C.; Reinhart, W","venue":null,"work_id":"3b18cd28-e0da-48aa-9325-ec2397ef0924","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":24,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.372244Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:8e46e1a84d70ff59ba2b5205ccd9fd73cee279aea286cac790b485c387f423d7","observation_id":"87bef9f5-f6b7-405f-84c8-3f36fd535a64","resolution":{"observed_at":"2026-08-07T12:42:35.378477Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.194850Z","title":"M.; Yesudoss, D.; Johnson, D.; Djire, A","venue":null,"work_id":"1a8584e9-5703-4169-9b0c-5b62b66561a3","year":2023},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":25,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.457662Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:adee4fc4479b4b77239592b79ef5cbf7bedac1ed22c9597f897f119087377c5a","observation_id":"45caf25f-56c4-40bc-a2be-597543b65214","resolution":{"observed_at":"2026-08-07T12:42:35.235663Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:35.045551Z","title":"High-temperature in situ investigation of chemical vapor deposition to reveal growth mechanisms of monolayer molybdenum disulfide","venue":null,"work_id":"f2b2997e-9fba-4aa0-ba7f-c76b6092ca57","year":2020},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":26,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.531316Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:e524dbc093a7249046925a6e1746ac8da96d450033a4cd5678f9f8f190fd28f4","observation_id":"60963ea1-4280-4868-8b79-bfcef2e75fb7","resolution":{"observed_at":"2026-08-07T12:42:35.128910Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.870781Z","title":"A deep learning approaches in text-to-speech system: a systematic review and recent research perspective","venue":null,"work_id":"edeeaa9a-2016-445a-a0dd-c96b1baaced0","year":2023},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":27,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.574483Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:b10a3b3230374806cfdee1ee3db517b4e856e76567965f348f68fe7de09e4260","observation_id":"98c1b923-e718-4182-a905-21c664522ce3","resolution":{"observed_at":"2026-08-07T12:42:34.918262Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.712598Z","title":"S.; Rotskoff, G","venue":null,"work_id":"37f0ec70-3010-45a5-82ef-4b4e38ed9eff","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":28,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.632553Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:fcda1ad1192e73a818a60a3248489fb2f7888bca9baf6d2a94cfd5f2a33ecec5","observation_id":"c800b280-3313-4d60-9463-998994644f1e","resolution":{"observed_at":"2026-08-07T12:42:34.816200Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.579461Z","title":"Transformer-Based Models for Predicting Molecular Structures from Infrared Spectra Using Patch-Based Self-Attention","venue":null,"work_id":"13d380bb-004b-407b-99a7-eb656650a4bd","year":2025},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":29,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.739966Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:cee0ff1ac719b15398717bc9b351e98040de7f6b04b6af06496a7e8a9a110770","observation_id":"6eb1e6aa-02cf-4d59-b559-758b78a04072","resolution":{"observed_at":"2026-08-07T12:42:34.628833Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.491032Z","title":null,"venue":null,"work_id":"d42a05af-5fe1-408b-9a44-7a0c514c0029","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":30,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.770119Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:f9ae2fdbd2c744ca601552c4ec491fc18eea271eb9761ab2f8ee207821ccb040","observation_id":"42896286-eca4-494c-98c4-345a6884109c","resolution":{"observed_at":"2026-08-07T12:42:34.540586Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.337290Z","title":"E.; Chenthamarakshan, V.; Das, P.; Kavraki, L","venue":null,"work_id":"a85373e6-19e0-4fe9-a22c-4adbdb936331","year":2023},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":31,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.799161Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:41f76e179d0bd9c279ad003c196ad13fb3aa7a806fd71282d36ff545542c313b","observation_id":"347aad7e-39af-4213-92fc-af5793197201","resolution":{"observed_at":"2026-08-07T12:42:34.411023Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.262488Z","title":"u hrkop, K.; B \\","venue":null,"work_id":"73946c11-f060-4d41-b4ca-a764f629fa42","year":2022},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":32,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.851778Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:0e37979799f6c8d7e14c253aceba198dc54f7503c46e89ec34a9fcbc7f76863f","observation_id":"e9028791-0e78-4915-adc4-5f5e6c317cae","resolution":{"observed_at":"2026-08-07T12:42:34.312295Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.208842Z","title":"Cross-Modal Prediction of Spectral and Structural Descriptors via a Pretrained Model Enhanced with Chemical Insights","venue":null,"work_id":"33ab8c42-27e8-4bb5-88d9-7441690705c8","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":33,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.890724Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:52560dd2e94fc064c69330ebe8f7e0ca49ad175ff980e0e3d704f55b4d1987ef","observation_id":"f25fbd6f-a41e-4ac5-991a-f78d85d2a4a2","resolution":{"observed_at":"2026-08-07T12:42:34.232122Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.150128Z","title":"J.; Lee, J","venue":null,"work_id":"212dd8ba-03b3-4904-936c-530f1c7d770a","year":2023},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":34,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.923138Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:954be20466b34f951b8371ce6351398607d7b825eec89498578d45752c901ebd","observation_id":"32571c4e-b900-4207-91ca-fa67f8d4fe88","resolution":{"observed_at":"2026-08-07T12:42:34.179106Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:34.093737Z","title":"Pair-variational autoencoders for linking and cross-reconstruction of characterization data from complementary structural characterization techniques","venue":null,"work_id":"931c1b14-fe6e-4444-8775-3bedea8054e4","year":2023},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":35,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:28.976165Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:f050da938e7b15544f146291299e9b70f9fe32fb87299f752138c00e79253258","observation_id":"ccde7e3d-d3a1-4dcc-a54c-3a229f174331","resolution":{"observed_at":"2026-08-07T12:42:34.117950Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:33.994408Z","title":"H.; Chubarov, M.; Xiang, Y.; Jariwala, B.; Zhang, F.; Alem, N.; Wang, G.-C.; Robinson, J","venue":null,"work_id":"991d0a76-e9a0-4492-81af-dbee64b93665","year":2018},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":36,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.002427Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:23a5cab159dd1f73731b2a8c44605f64a5809b3243b928ce29a73b8b5ca17dcb","observation_id":"97836bf0-c460-45b7-8fb4-930312c8976f","resolution":{"observed_at":"2026-08-07T12:42:34.040395Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.26207/pbbx-w030","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:30.641461Z","title":"A.; Redwing, J.; Curtis, M.; Kim, M.; Trainor, N.; Kumar, S","venue":null,"work_id":"0efb9d92-0f78-4031-afc5-c6826f31bcf1","year":null},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":37,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.030080Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:095f2e81fa7419e91637562b717ef259802720f002101825f005e663871bd206","observation_id":"2b29df5d-ae2d-42de-8d41-32f230f7b1e7","resolution":{"observed_at":"2026-08-07T12:42:30.723407Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.5281/zenodo.15533400","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:30.482808Z","title":"A.; Reinhart, W","venue":null,"work_id":"e9d0d72b-a8fd-432f-b48e-8f3e486284ff","year":2025},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":38,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.059971Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:c862c36502ede616e2c43c9a1c10bc027f3d28ca3d9cddfbd7660a127a19df4a","observation_id":"4ea678b0-c2b0-460b-90f4-01576c53160e","resolution":{"observed_at":"2026-08-07T12:42:30.555076Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:33.876115Z","title":"Deep Residual Learning for Image Recognition","venue":null,"work_id":"bdd38662-24ac-4648-a65c-e0e1c66b3b91","year":2015},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":39,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.087407Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:b8ad77485d45bb1fb5d5275d2d2bff7543bc9f9771e52996dc510c1bf0dc40ed","observation_id":"de3e8748-30db-4171-8381-a5b7c4568083","resolution":{"observed_at":"2026-08-07T12:42:33.920339Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:33.777966Z","title":"ImageNet: A large-scale hierarchical image database","venue":null,"work_id":"11e824fd-71a3-41b1-a3e8-64aa127603f8","year":2009},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":40,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.122799Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:003e7861f7780b3d4b379dcd35f0f73cf3e3b6597ea4680d33e334c3344f1464","observation_id":"6cd28767-5395-47cb-994d-3291b61648ad","resolution":{"observed_at":"2026-08-07T12:42:33.818061Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1802.03426","last_updated":"2020-09-18T01:56:41Z","snapshot_observed_at":"2026-08-02T15:32:07.466568Z","submitted_at":"2018-02-09T19:39:33Z","title":"UMAP: Uniform Manifold Approximation and Projection for Dimension Reduction","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1802.03426","snapshot_observed_at":"2026-08-07T12:42:29.152118Z","title":"Umap: Uniform manifold approximation and projection for dimension reduction","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":41,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.152118Z"},"links":{"cited_paper":"/paper/1802.03426","citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:f580523949b2365ca77fcc3b520076c5175e0e6ef91466b2365e5ec089494876","observation_id":"65ca72ff-d318-4989-bdef-23cdde2b3d91","resolution":{"observed_at":"2026-08-07T12:42:29.152118Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:33.621490Z","title":"A.; Reinhart, W","venue":null,"work_id":"17c0832d-13c5-4313-8641-ef604bbaf658","year":2025},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":42,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.206791Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:086c848a9f0cc7a536ab9fa6dee63e65d95f90763551f917f3ea07c58d020d74","observation_id":"f6048624-d3c1-4f35-8db4-eec250858916","resolution":{"observed_at":"2026-08-07T12:42:33.719013Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:33.390934Z","title":"W.; Ng, L","venue":null,"work_id":"d967baee-8e15-4e3e-8f2b-4b0d3484066f","year":2019},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":43,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.255065Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:d2619e766a08d802caa4c2aabe489d5e8efa95865b118937ba0bcf456a6c4c89","observation_id":"931d3031-2f2c-4b3c-86b8-6e2fc01571ba","resolution":{"observed_at":"2026-08-07T12:42:33.499205Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:33.212167Z","title":null,"venue":null,"work_id":"f094b90f-977d-4e21-a9ff-c0b61a77ae29","year":1901},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":44,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.324304Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:79ef3b6d689457d1e62ff3e4518a02b09bccf77ab8b1ef8ccb481f2adc5b3cf6","observation_id":"ede050ca-f382-4bc2-9a40-aa42827feaad","resolution":{"observed_at":"2026-08-07T12:42:33.285425Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:33.006199Z","title":"T.; Cadima, J","venue":null,"work_id":"71cb091f-7abb-4425-998f-125afb7a0e60","year":2016},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":45,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.408720Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:a4ea307bdaacc7fd87e87740ff018839a5481d6541ffb4607a474917e8275c4b","observation_id":"88860307-34d0-43f0-bac1-b715649d1e4a","resolution":{"observed_at":"2026-08-07T12:42:33.102646Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:32.819798Z","title":null,"venue":null,"work_id":"cbeba8e0-03d0-4a12-9413-a620f9b4c385","year":2004},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":46,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.468456Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:3072c61bb8cfc241e1c954da958b23199226fde4e69c26e3718d302ba64469fe","observation_id":"1ec4f31b-710a-47c2-9a34-0b429cb9a146","resolution":{"observed_at":"2026-08-07T12:42:32.913131Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:32.699786Z","title":"M.; Shanmugam, K.; Dinstein, I","venue":null,"work_id":"b8c5d96c-1253-4f52-8d84-91044b4deb05","year":1973},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":47,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.560421Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:29bff502d8f98ea4b3afcc273225abd1fa1fc58b98da4984febf2893b28c6f0a","observation_id":"a9e3f24b-5c03-433d-86e8-9f718c8022e5","resolution":{"observed_at":"2026-08-07T12:42:32.737753Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:32.625268Z","title":"A Threshold Selection Method from Gray-Level Histograms","venue":null,"work_id":"2d6a3d53-4b99-4852-9294-923ed4d8b844","year":1979},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":48,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.640078Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:a945c8c966812226a6f044bfd7752024f773305fbef54169360e4c9ab840fe9c","observation_id":"d85702b9-0832-4ca6-aeac-bb8a5b2d2ef7","resolution":{"observed_at":"2026-08-07T12:42:32.654050Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:32.538862Z","title":"A Computational Approach to Edge Detection","venue":null,"work_id":"0d6a5d03-2d34-43b1-a44f-311fc5c94963","year":1986},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":49,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.737904Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:fee0dfd3f2beed6ba5ce86bebb33a1d790e134814ce0f48a97ba432a20e7733f","observation_id":"819df394-5811-4cef-9463-4b40e4b9be94","resolution":{"observed_at":"2026-08-07T12:42:32.574480Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:32.386524Z","title":"A.; Reinhart, W","venue":null,"work_id":"6642695e-4c55-4da8-a546-e4d1575d2f46","year":2025},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":50,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.793478Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:7a7e9e3a938a5f0a4299af64765772ab7b8f6ab4231461f8b8373c77c3e98bd6","observation_id":"177e6f72-eb8d-4cf0-80bf-22b6cf39e8f3","resolution":{"observed_at":"2026-08-07T12:42:32.459020Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:32.246710Z","title":"Advances in neural information processing systems 2019, 32","venue":null,"work_id":"365a2a2a-5557-4719-9d77-8bd174f151f2","year":2019},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":51,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.877200Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:f48e2cbf84a9b886653be7e2ebb93cf58d15024a04d70846e24873fac34f5b33","observation_id":"83fedc5a-e776-478a-9def-2300373699c7","resolution":{"observed_at":"2026-08-07T12:42:32.319341Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:32.100160Z","title":"the Journal of machine Learning research 2011, 12, 2825--2830","venue":null,"work_id":"0ec1e9e8-9f41-454b-ae01-0eb99385a1a4","year":2011},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":52,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:29.954110Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:d21507a42c8dd9e4e9b4f875d2ff762fdf61044331b198df1c07c01c59ee7a52","observation_id":"86f857ab-895e-48e8-8554-8a2aa58e5c7c","resolution":{"observed_at":"2026-08-07T12:42:32.164605Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:30.043045Z","title":"Optuna: A Next-generation Hyperparameter Optimization Framework","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":53,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:30.043045Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:2269e118f5a8fd25baef5dc94a938383ca455be0e631c1b2259773e6928c661c","observation_id":"d6b0f141-8fbb-4f9a-9259-b1b79939fde3","resolution":{"observed_at":"2026-08-07T12:42:30.043045Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:31.831792Z","title":"L.; Kung, Y.-C.; Krasnozhon, D.; Chen, M.-W.; others Large-area epitaxial monolayer MoS2","venue":null,"work_id":"de21cf7b-cd5e-4bb8-b1c1-d24aba08b08b","year":2015},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":54,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:30.100290Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:ddea4232f58bb4a2feb03d5079d6d620b9baf394a25d9fd02daeed118fe098e6","observation_id":"8efd3d80-c34b-412a-b0ca-badbce10bb32","resolution":{"observed_at":"2026-08-07T12:42:31.972104Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:31.599604Z","title":"Atomically thin MoS2: a versatile nongraphene 2D material","venue":null,"work_id":"7a49a255-cc2d-4c55-910c-61af25ea4187","year":2016},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":55,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:30.128445Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:62d62a623ddef0a294f6690daeeab1d73bd370dfd88d95064d135b3d7a92c6c0","observation_id":"e1ee42be-a19c-4f31-9797-332cf31185cf","resolution":{"observed_at":"2026-08-07T12:42:31.715256Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:31.455983Z","title":"W.; N rskov, J","venue":null,"work_id":"9bb995b0-77f5-4eda-8f97-71f961f3e072","year":2004},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":56,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:30.192128Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:fdd3222c4a617c640b390829d890bbeb6c989ce9c460457e8ce248c36a6ca1e6","observation_id":"6767ad2a-04ba-4308-a44a-c4b90b222204","resolution":{"observed_at":"2026-08-07T12:42:31.539275Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:31.305530Z","title":"Analyzing Fundamental Properties of Two-Dimensional Materials by Raman Spectroscopy from Microscale to Nanoscale","venue":null,"work_id":"31cb42dc-f233-4d7e-b10f-f7f1ee784abe","year":2023},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":57,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:30.239094Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:c8639a6fb4fd752dabf7beaf62b9607ed351889deb343cfe8c06ba74197c00da","observation_id":"572521f6-6d61-48a7-91bb-c9bbe28ee41b","resolution":{"observed_at":"2026-08-07T12:42:31.372741Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:31.180664Z","title":"Analysis of photoluminescence behavior of high-quality single-layer MoS 2","venue":null,"work_id":"5c1cf17f-d7b9-42a2-ab1e-451bd8210bf0","year":2019},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":58,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:30.301796Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:54fce340f2d7ecd0db5165546979f2959a11ea9bbcddfb38e13981cc5a3a5143","observation_id":"2449bbd3-0b2b-4e2f-bcf1-d47958f5236e","resolution":{"observed_at":"2026-08-07T12:42:31.248534Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2024.10048","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:42:30.951603Z","title":"u hrkop, Kai and B \\","venue":null,"work_id":"c5d8d6a7-2847-4a7c-9f09-39b0078b1e6a","year":2024},"citing_paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models","version":2},"reference_index":59,"source":"arxiv_source","source_observed_at":"2026-08-07T12:42:30.380043Z"},"links":{"citing_paper":"/paper/2505.24065"},"observation_digest":"sha256:24d1ad831dc457aaad883896c8cf54aba5bb502f02230481b96319afedd99c12","observation_id":"37ff2dd6-b339-474a-83a5-f5aa6e4ef594","resolution":{"observed_at":"2026-08-07T12:42:31.043784Z","resolver_source":"raw_fallback","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2505.24065","last_updated":"2025-08-18T19:47:07Z","latest_version":2,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-07T12:34:02.458050Z","submitted_at":"2025-05-29T23:18:26Z","title":"Cross-Modal Characterization of Thin Film MoS$_2$ Using Generative Models"},"reference_resolution":{"displayed":59,"state_counts":{"malformed_identifier":0,"metadata_mismatch":1,"parse_uncertain":0,"unresolved":9,"verified_exact":2,"verified_fuzzy":47},"total_outbound_references":59},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"thesis":"As of 8 August 2026, this Paper Citation Record lists 59 of 59 outbound references and 0 inbound Pith citation observations for arXiv:2505.24065."}