{"as_of":"2026-08-08T04:30:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:f574083c048f8c82341df0fd65746f6d63c5d94e46196a33733a6b365fccb25d","coverage":[{"denominator":52,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":52,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-07T12:29:28.789113Z","state":"measured"},{"denominator":52,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":52,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-07T06:34:17.273281+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2505.24471/citation-record","integrity":"/paper/2505.24471/integrity","json":"/paper/2505.24471/citation-record.json","paper":"/paper/2505.24471"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:40.840722Z","title":null,"venue":null,"work_id":"f5a24847-2fed-4189-ac6a-55b4227836bc","year":2010},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:22.960359Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:4c359977c1cf1411edb47b22ab6c1a3197cbb2ea07ec387d18966824f2419666","observation_id":"f3bef62e-4a58-4c91-b70b-67fbe82ebb90","resolution":{"observed_at":"2026-08-07T12:29:40.936174Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:40.650370Z","title":"and Wang, Y ., Materials, 10(7), 814 (2017)","venue":null,"work_id":"ab223623-e5eb-4b53-ba2a-602f5aa406d9","year":2017},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:23.102499Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:cd94ce040b4158537c6efb76e941bbb9fd0ad8e456c5856e3b94eabd38b31805","observation_id":"b1b88a5f-2c3f-4759-86a2-cf1d89b1ff2c","resolution":{"observed_at":"2026-08-07T12:29:40.727065Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:40.401376Z","title":"and Catlow, C.R.A., Adv","venue":null,"work_id":"ab6ea43b-179a-4f4d-8b33-2c724ca47fe8","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:23.272987Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:6e57b8ba595f6ff2216e7a6e3f195dc96a2b4582ae255cb39e999058d979821f","observation_id":"b9493553-0aec-40d4-aca7-baf89c957b7c","resolution":{"observed_at":"2026-08-07T12:29:40.466975Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:40.115474Z","title":null,"venue":null,"work_id":"421e2386-7d49-4f5e-93af-cd5d9c3b3d9c","year":2013},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:23.425061Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:a731f206166840ed9a5daeab867b72d8657d0850803631249ae49052fa0a9b00","observation_id":"c76144f6-5334-46f4-b601-30d29bbbe707","resolution":{"observed_at":"2026-08-07T12:29:40.282298Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:39.936824Z","title":"and Kane, C.L., Rev","venue":null,"work_id":"08c38aa4-df2c-43e5-9d77-a2ebcb082012","year":2010},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:23.574870Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:f715722ed5da6c6e94d1ee0ceae08e0d67dbd80f0a574684a5cb444dc3b6c7d3","observation_id":"d2034b2b-6f6e-4106-8cd0-fb796e9e4b8c","resolution":{"observed_at":"2026-08-07T12:29:40.036090Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:39.747601Z","title":"and Ando, Y ., Phys","venue":null,"work_id":"443c78dd-3b39-411e-93e4-259aad5c95f8","year":2010},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:23.681275Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:9359fd72e70fd6cbcd69f4f8dd9ca8c482b54152c22e8d9c0627654272f10410","observation_id":"7c40cc34-233a-4479-ad91-39efc2d12d45","resolution":{"observed_at":"2026-08-07T12:29:39.826825Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:39.559861Z","title":"and Zhang, S.C., Rev","venue":null,"work_id":"02988bfa-ae44-48f6-ab3d-ef399a2ce257","year":2011},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:23.773466Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:a4a529bf63748d4748b1fc14a456153c9a993ac9a14193d8578b47f4c5cfef01","observation_id":"656b462b-f4fa-4d7c-9882-9476651318e5","resolution":{"observed_at":"2026-08-07T12:29:39.668112Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:39.248670Z","title":"and Hasan, M.Z., Nat","venue":null,"work_id":"996f61af-3cac-4eff-8198-d294ffc8778c","year":2009},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:23.877214Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:dd7b94c4b84c1c0f87c41da681b40ca8671b9f9f70b7616354d4e943f7ee1e35","observation_id":"279455ed-54a6-4c4d-9c0a-4d8a9da08a79","resolution":{"observed_at":"2026-08-07T12:29:39.381392Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:38.945022Z","title":"and Wang, K.L., In Spin (V ol","venue":null,"work_id":"2d6dda48-2aba-4a72-a28f-aa92bdef0409","year":null},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.002941Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:bc435e821a40237f9efa908566452109febbe4e2ce2eb4fbcbeaed21f5f27256","observation_id":"364e6b41-bbac-4513-8a09-dca15c5c4f91","resolution":{"observed_at":"2026-08-07T12:29:39.087672Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:38.649929Z","title":"and He, Q.L., Front","venue":null,"work_id":"1518f199-af18-4b63-864e-022189164e19","year":2019},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.123746Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:e9c21c10df70d54400368da1d4da88fda6559c9709fbab960a62af476ff27abc","observation_id":"18aa7bb1-cf20-4864-b732-55d08940a5a9","resolution":{"observed_at":"2026-08-07T12:29:38.786544Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:38.270693Z","title":"and MacDonald, A.H., Nat","venue":null,"work_id":"01fbf31f-d737-4cf3-9864-e6afd75177c9","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.237744Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:4d94c1177203b44b07296801c97153a5ef161111c1f9a7befb0c86d6a795d21d","observation_id":"3794316b-2554-4a34-81ed-e279a3ee2e60","resolution":{"observed_at":"2026-08-07T12:29:38.435087Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:37.878030Z","title":"and Chen, Y .P., Phys","venue":null,"work_id":"970c076c-77cc-4e2d-a23a-4c2f79b9da37","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.365994Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:3e3913c779d4bdf6d6e36cee9edd8d40761b93cebfa8e6e5f1c5863e1ad6b3ff","observation_id":"dc8997ae-de13-4078-8f1b-f1c7b138b362","resolution":{"observed_at":"2026-08-07T12:29:38.054620Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:37.665089Z","title":"and Mukhopadhyay, S.C., Smart Sensors, Measurement and Instrumentation, 6(1), 1(2013)","venue":null,"work_id":"05d084ba-c3c8-4b1e-941a-85b91fb9d258","year":2013},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.516416Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:5141dbfd0c7a34ae0feeed7ed63050fc6c84537ad51d02bf56a4b905713c15ea","observation_id":"85ee78ed-745f-452f-a01c-260a23db5ac3","resolution":{"observed_at":"2026-08-07T12:29:37.742350Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:37.290178Z","title":"and Zhang, X.X., Sci","venue":null,"work_id":"1c1c7f78-dca3-4089-85d2-8b7ddd056b60","year":2013},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.624753Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:83ca099c64145033d2c5543e78c024224217dbeee0f7a49e9cc8985997d47065","observation_id":"b65bd1d3-734c-4622-ad6e-aaf7836bb6cd","resolution":{"observed_at":"2026-08-07T12:29:37.452308Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:37.027383Z","title":"and Ong, N.P., Phys","venue":null,"work_id":"02e1f52e-742e-42e2-bdb8-238bf6b1fd7c","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.754952Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:6ac492ab20ef0daf1cae47c4a3a3e86beb7a492f4f8e38a5f5173053ef948abe","observation_id":"7fdbbc7e-bb63-495a-adbb-649023eb3036","resolution":{"observed_at":"2026-08-07T12:29:37.137121Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:36.832032Z","title":"and Mandrus, D., Sci","venue":null,"work_id":"4143393b-9ea0-4321-ad16-42c74ac25ac2","year":2018},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.864749Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:a20bfaa13c6f44a70b69f49eef11df516a8a8a61c53fb5eb2005039fdb1ddaa7","observation_id":"22f93fcd-ef35-4f71-9300-695d5974baf3","resolution":{"observed_at":"2026-08-07T12:29:36.923878Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:36.627060Z","title":"and Bharathi, A., J Phys.: Cond","venue":null,"work_id":"e3731453-bd88-4633-8e45-3b2e3151fd58","year":2016},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:24.944747Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:20b3022c4eb241bd297bddd06e4772e87ae58e18a51f2edb07dd946103872602","observation_id":"e1bad056-e8a1-4e9a-aac8-b7c55b5d6460","resolution":{"observed_at":"2026-08-07T12:29:36.726454Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:36.371415Z","title":"and Zhang, S.C., Nat","venue":null,"work_id":"7d699fab-0498-46a0-a6bf-63a406646507","year":2009},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:25.096127Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:1a548889b2fb0a235e557d06e0caba78d65fe12befc4e4e1d020d7cbaa082bb6","observation_id":"1bb69ca2-7d2e-4e9e-b432-8560d1d5c4bf","resolution":{"observed_at":"2026-08-07T12:29:36.479555Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:36.207059Z","title":"and Ando, Y ., Nat","venue":null,"work_id":"9e139b67-4bc8-43e6-b7fd-9d17bd2513fb","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:25.189319Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:b1c58c4ee02dc46f1a8165b84c618b62c2665d554b5dc533d1aa0429b06ccfee","observation_id":"5630173f-3990-4fbd-8f29-8f686c9ce0db","resolution":{"observed_at":"2026-08-07T12:29:36.288439Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:36.051499Z","title":"and Tamegai, T., Phys","venue":null,"work_id":"9e568c4a-61ab-4039-9b99-5bfd32475288","year":2014},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:25.301557Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:955a54cc1cc71977645c7eef2520cea2016404c4399d8c6c43c3537d223ad9a9","observation_id":"f6c2c781-d6c1-4aba-9059-5ed13bf2965c","resolution":{"observed_at":"2026-08-07T12:29:36.122380Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:35.867807Z","title":"and Spivak, B.Z., Phys","venue":null,"work_id":"cf4dc163-2dd7-43ef-9c8c-876dd53e939b","year":2013},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:25.466364Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:fae56767e0cca6185c7166f01c3f3aa7a20d08c07c770a159bf903a1254deb4e","observation_id":"8fb5662c-4bd8-4268-8e6a-e51906684693","resolution":{"observed_at":"2026-08-07T12:29:35.934433Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:35.659220Z","title":"Phys.: X, 7(1), 2064230 (2022)","venue":null,"work_id":"b1a1d9db-be95-42dd-ac6a-7d245db76a21","year":2022},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:25.647648Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:440c98d76c67424118c2c125813bcf758a74c557689901dbc6c8f640f118750b","observation_id":"483454b5-0406-401a-a525-02bbd25dce42","resolution":{"observed_at":"2026-08-07T12:29:35.722113Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:35.336178Z","title":"and Dai, X., Phys","venue":null,"work_id":"317f0602-8392-4a63-b1a1-a845446c57f2","year":2011},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:25.845219Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:c799c9da834b12986853666c7423c2fd6ea9d461cf60f8572f0ca958d9b20d85","observation_id":"744f68e0-f0c1-436e-813b-cd3f6f833970","resolution":{"observed_at":"2026-08-07T12:29:35.479732Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:35.016568Z","title":null,"venue":null,"work_id":"ad3887fb-6cfc-4bc4-8686-74757ab5da4e","year":1980},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:25.910004Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:4a56c639a2c3589a8daeb1dd8c06199f0230a8bf065cf53a8108e519e579e63c","observation_id":"16bdbaca-7e5b-4e4b-86c3-057d62e7941c","resolution":{"observed_at":"2026-08-07T12:29:35.168905Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:34.722547Z","title":"and Awana, V .P.S., J Supercon","venue":null,"work_id":"41187f6c-aeb6-434e-ac4b-5e9843053bbb","year":2021},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:26.076160Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:f6bbfe7edeeee44a4bc2baf9e8174558debb765324df6c20c1f45d768bed41b3","observation_id":"1bcd92b9-565b-4a88-b99c-b2b88a6a731b","resolution":{"observed_at":"2026-08-07T12:29:34.906517Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:34.434107Z","title":"and Sau, J., Physica Scripta, 96(5), 055802 (2021)","venue":null,"work_id":"cb64e527-8e1f-4442-84b5-0d0facd4ae41","year":2021},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:26.197336Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:349a796bcd865a0baee00feedc1483a0d3aa0820d07d697f2a055c0b770fd880","observation_id":"3467ec71-4a1f-44d8-9675-93dbbde7b30d","resolution":{"observed_at":"2026-08-07T12:29:34.559756Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:34.125381Z","title":"and Wu, K., Sci","venue":null,"work_id":"a6cb58e4-2a00-41f0-90d0-7bac22bb8292","year":2015},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:26.333226Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:8e9bac59df43cd133ee8d532338e2ebadf88ff7045c6aa88d72c764102fc45f9","observation_id":"5e95ed45-3797-4ca1-9ab8-2c32f39ed18a","resolution":{"observed_at":"2026-08-07T12:29:34.281295Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:33.810226Z","title":"and Chou, M.C., Appl","venue":null,"work_id":"72fcd4ee-501b-49b3-be79-4de2a8351950","year":2018},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:26.448179Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:eb0d57a8f4f8e73e5924669d71c6be3181db71c5292ad2b50c3038e5cdb00887","observation_id":"1aeed031-0b24-4f52-a738-a07733b83dc4","resolution":{"observed_at":"2026-08-07T12:29:33.958304Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:33.601414Z","title":"and Lakhani, A., Mat","venue":null,"work_id":"c018603f-a2b3-4354-a023-0fb4bb99ae55","year":2022},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:26.606629Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:c7e0b84523f80421ba5b75828e0e079b737801a6c0212ca0f80443dd52033a23","observation_id":"d16cfeab-a43f-4526-b37e-fce5a3804d85","resolution":{"observed_at":"2026-08-07T12:29:33.724802Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:33.356303Z","title":"Springer Science & Business Media (2010)","venue":null,"work_id":"a16bd44b-4db5-48ff-a7e3-10b8d2574fdc","year":2010},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:26.787929Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:d9fd4274e4f1f8c0a091a35c7bf945bd2e3189d3ccd0930325e2fcb3116f3b1b","observation_id":"09524c37-dd35-45a7-bf2c-9b3797210ce8","resolution":{"observed_at":"2026-08-07T12:29:33.413383Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:33.140360Z","title":"and Ramamurthi, K., Mat","venue":null,"work_id":"98b350a2-52cf-4ee9-9a9b-a44dbd453a6e","year":2011},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:26.910572Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:761ec6c3104a6264c1a3f89effff9577eead74cc9a836b826aca22be6777c981","observation_id":"23f68c84-1359-41f1-a43f-8ad07d874428","resolution":{"observed_at":"2026-08-07T12:29:33.250303Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:32.885271Z","title":"and Paramasivam, S., Zeitschrift für Physikalische Chemie, 238(11) (2024)","venue":null,"work_id":"4c2a18a2-780d-4f58-8f14-240e73b7c9d9","year":2024},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.032917Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:41d06659c5110b872add2cd14cf5e387e66905e7da0e241b89523dca15438914","observation_id":"cc2de09d-4248-4278-b48b-119eb5ba75ed","resolution":{"observed_at":"2026-08-07T12:29:32.951908Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:32.701204Z","title":"and Kumar, M., Mat","venue":null,"work_id":"0dec3133-64e7-489b-be53-fdacb32d8344","year":2020},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.117527Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:c5c5208a4dc3b2f713c41c6f8fc2e90d03fae6971cb90a04310da4909e10bf9f","observation_id":"74b8aab9-241a-4f39-b0cb-e2c39cfea3d5","resolution":{"observed_at":"2026-08-07T12:29:32.754958Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:32.531213Z","title":"and Blumberg, G., Phys","venue":null,"work_id":"82cf4a2b-976f-41e7-967a-e45dad67f1f1","year":2023},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.180195Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:b71f729293c66192fbd8b02d31bedcddd4629eacd65f643c6edfe990a31e2ab5","observation_id":"c6af6c85-e619-4d25-985c-5bf178f73a3a","resolution":{"observed_at":"2026-08-07T12:29:32.614416Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:32.383746Z","title":null,"venue":null,"work_id":"aeb08945-62fd-4148-a27e-a47e9b74ca74","year":2009},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.289520Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:68096706c2a880dc337a5c61ed18ed1dc4a060fbf8418f9a9c12d67478eccdbb","observation_id":"9dc33dc7-3794-454e-8ec6-5c4f236ea7f5","resolution":{"observed_at":"2026-08-07T12:29:32.444594Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:32.241281Z","title":"and Awana, V .P.S., Physica B: Cond","venue":null,"work_id":"a6cec8ec-342c-4c67-b4a5-b99a31ab3264","year":2021},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.388616Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:cb37a492e31fb3165a7990040987b09dd807e0581f9dc703884db1992f190b3f","observation_id":"c8ff30d4-8fb4-4f7e-af18-ebed867e5ee2","resolution":{"observed_at":"2026-08-07T12:29:32.304551Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:32.052759Z","title":"and Hampel, S., J","venue":null,"work_id":"268dcffc-37cc-4935-8ded-86385360fb90","year":2024},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.440870Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:2904e5e547680a1458fb42f08534925698ae583881391bc9cc5e778611012658","observation_id":"b93ce19d-b8d1-4409-94f7-e68667eb01f7","resolution":{"observed_at":"2026-08-07T12:29:32.148384Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:31.818863Z","title":"and Becker, C.R., Phys","venue":null,"work_id":"89a78f90-1c05-45ef-b8c7-cc4bfa517cc7","year":1977},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.544207Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:a5c75739285b545c2fbb0b44f510f88283401e392cc059b4e7d01ed23e950a60","observation_id":"8d7f2914-804e-4c6c-8160-13f8d9429aba","resolution":{"observed_at":"2026-08-07T12:29:31.875803Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:31.638105Z","title":"and Das, P., Sci","venue":null,"work_id":"e6f50c0d-e0fd-4c1a-a9cd-8ab661b5febe","year":2019},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.645214Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:b3a21cc3ebad31c062c71dd51a78d9c5925f5b522397ff359e054af6556cb7dc","observation_id":"fc9bfcb0-5ea0-4313-abe2-d5bb444c1365","resolution":{"observed_at":"2026-08-07T12:29:31.710424Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:31.491229Z","title":"and Awana, V .P .S., Physica B: Cond","venue":null,"work_id":"d2ca3aa0-6a98-4c4d-bcd1-f5f76fa9e1c9","year":2021},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.797809Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:df9cc4740baa17b165b500cb92ed2cdd7fae41671558e48aaeff74906dee3f53","observation_id":"85504146-0f77-4ca2-a06d-6e47a9fe93b8","resolution":{"observed_at":"2026-08-07T12:29:31.555650Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:31.334947Z","title":"and Awana, V .P .S., J of Supercon","venue":null,"work_id":"a5c2c7cb-b053-46f7-b5f8-b14e2377da42","year":2022},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:27.916776Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:dc060518bf02b54419d938b57c62eda8865329532e00eb09c3b75fcfc5df6219","observation_id":"1cf5331a-4699-42a6-b5fc-1151dbd128b4","resolution":{"observed_at":"2026-08-07T12:29:31.430534Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:31.132099Z","title":"and Kumar, S., New J","venue":null,"work_id":"c917081a-25b8-4075-b61a-0442646ac09c","year":2024},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.005060Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:e4365ee01a1505243b65df04885596df12ad3409acef2f5760b11fed8b708b5b","observation_id":"e44fea98-be06-4faf-9b0a-82162c38b415","resolution":{"observed_at":"2026-08-07T12:29:31.242021Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:30.949248Z","title":"and Ganesan, V ., Appl","venue":null,"work_id":"e139e6a0-61bb-4513-9261-9f416315faae","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.114809Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:3a2a5e83f630e471291ee5d8e255b693f81ce488ab3511c2c80beae52cf37f70","observation_id":"ba6a41fe-3b8c-4074-b909-9bf1b9873e18","resolution":{"observed_at":"2026-08-07T12:29:31.063404Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:30.835359Z","title":"and Chattopadhyay, K.K., J","venue":null,"work_id":"75d7d9ea-7100-4497-b2ee-97f86df97625","year":2022},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.179813Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:78305840ff35a2966ceca6527168a16e93253ff6ded325107c8e89ce6334bcfd","observation_id":"73d2a4a0-cad7-47df-a3e7-568592dd1d38","resolution":{"observed_at":"2026-08-07T12:29:30.887935Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:30.690630Z","title":"and Heiman, D., Appl","venue":null,"work_id":"184e7bc6-8121-4d69-93a4-de5254d4e332","year":2013},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.259301Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:7edbac102a5d2bcb2f93f47e7bec00571873b03edfc118c7732b1128d5fd7a5d","observation_id":"2f6e4727-6c0f-470d-b3de-1efbead00e57","resolution":{"observed_at":"2026-08-07T12:29:30.772006Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:30.375756Z","title":null,"venue":null,"work_id":"c059304f-3cf0-4e23-9497-92629444586f","year":2014},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.319073Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:cdf708fbbe74a6c2dcb2a3316c524ee72bcceb0e185c0bd3bd96b09979dad1bc","observation_id":"27bcb21c-6395-4cfb-8c1e-0e63fa6f70d3","resolution":{"observed_at":"2026-08-07T12:29:30.520852Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:30.126434Z","title":"and Fuhrer, M.S., Nat","venue":null,"work_id":"1682094c-3ea6-46e7-a548-0ec61d8e7252","year":2013},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.376738Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:7d4315fb5bd6131daa752dd9f72efa1f836009269082f1191c50e82bd233b5b4","observation_id":"94f8c8b6-940c-4817-a966-44f19d501218","resolution":{"observed_at":"2026-08-07T12:29:30.227197Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:29.938507Z","title":"and Li, Y .Q., Phys","venue":null,"work_id":"b44c27b2-fa45-46b2-901e-2cfc8bd52342","year":2011},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.440896Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:421d1bf09083b389a3bdcd82316709da6732a07aa3f87d579d7236fa0ad0045c","observation_id":"c05975f9-8c3b-4418-972d-6f37b70c0e1a","resolution":{"observed_at":"2026-08-07T12:29:30.037349Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:29.662456Z","title":"and Awana, V .P.S., SN Appl","venue":null,"work_id":"e84db0cf-be50-49c6-ae56-30e9b9d3bdda","year":2021},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.566433Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:60d6c78cf171d3582236d0a18a7cb74f2fc2c71302e619de1021b977d20f8fea","observation_id":"d9058fd7-da5a-4294-93fc-7f36dc0bf05e","resolution":{"observed_at":"2026-08-07T12:29:29.792090Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:29.378951Z","title":"and Glazman, L., Phys","venue":null,"work_id":"9844df4b-bf08-42c5-a88d-7a650a9cf00c","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.651754Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:15d14abd6d1623a336e853bb47d2deffced6be09880ea1acecb77a822b06d34e","observation_id":"7423a17a-690c-446f-8990-df5bf957ee73","resolution":{"observed_at":"2026-08-07T12:29:29.450338Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:29.189185Z","title":"and Ma, X.C., Phys","venue":null,"work_id":"aa46dda0-334f-4e25-99bd-1637d2d14d65","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.712583Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:283f224de534793e9caa6e94a88a7d3792ab2f09e8ea9191d7dd81fba22e1710","observation_id":"ead311ee-b16d-430e-9e32-bff19eb1dbb7","resolution":{"observed_at":"2026-08-07T12:29:29.285539Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T12:29:28.930668Z","title":null,"venue":null,"work_id":"620cf1d2-9585-43f4-94bf-44b2d6c2207f","year":2012},"citing_paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$","version":1},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-07T12:29:28.789113Z"},"links":{"citing_paper":"/paper/2505.24471"},"observation_digest":"sha256:ce9fd870842c4ba822d83a4d83231533e388c9c7035d914c21274b946f0ef054","observation_id":"6f590850-9d1d-4bfd-be13-aed9f69db7c5","resolution":{"observed_at":"2026-08-07T12:29:29.035504Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2505.24471","last_updated":"2025-05-30T11:16:07Z","latest_version":1,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-07T12:19:06.275339Z","submitted_at":"2025-05-30T11:16:07Z","title":"Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$"},"reference_resolution":{"displayed":52,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":6,"verified_exact":0,"verified_fuzzy":46},"total_outbound_references":52},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"thesis":"As of 8 August 2026, this Paper Citation Record lists 52 of 52 outbound references and 0 inbound Pith citation observations for arXiv:2505.24471."}