{"as_of":"2026-08-08T01:06:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:93f0da1cd087086d5a83597260742c8b02f943fe36ce9e7d7519fff521e81b90","coverage":[{"denominator":33,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":33,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-07T06:06:57.890571Z","state":"measured"},{"denominator":33,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":33,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-07T06:34:17.273281+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2506.06222/citation-record","integrity":"/paper/2506.06222/integrity","json":"/paper/2506.06222/citation-record.json","paper":"/paper/2506.06222"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.801341Z","title":"Ferroelectricity in hafnium oxide thin films,","venue":null,"work_id":null,"year":2011},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.801341Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:5f24e163322152861bd06256445f1d7cc3f30a98cb0b02ab32783e699c6d88ac","observation_id":"87b65c27-d046-403d-9e21-b9cd195d9b9c","resolution":{"observed_at":"2026-08-07T06:06:57.801341Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.362044Z","title":"The fundamentals and applications of ferroelectric HfO2,","venue":null,"work_id":"1248fc70-8bcc-42ac-9866-c1046d4c7269","year":2022},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.805298Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:b018bed1f0b8b211dec011df953e240fcc15f33cd6ed958c045a7008cc066d4d","observation_id":"6c0f826a-7d89-4865-9e99-805d2373c626","resolution":{"observed_at":"2026-08-07T06:06:58.365265Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.353471Z","title":"Ferroelectricity in Simple Binary ZrO 2 and HfO 2,","venue":null,"work_id":"bb872136-fece-4aed-aef8-82f42721eef5","year":null},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.808065Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:aef74962429da1ad10e732f9da12e3bfce56b70f63e56275a6d46a33587e8de4","observation_id":"52937e58-1cfb-48ee-94bd-f19a49d8fb2a","resolution":{"observed_at":"2026-08-07T06:06:58.356637Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.344628Z","title":"The origin of ferroelectricity in Hf1 −xZrxO2: A computational investigation and a surface energy model,","venue":null,"work_id":"0c2052c0-4c04-4ccd-8c1f-e56c3c1cd373","year":2015},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.814228Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:532d1cfbbfae6139b969959120877d3a54bb13c78b666770774e979bc4bcb2df","observation_id":"b4f41e49-baaf-4070-8932-eaf39d1c8b3a","resolution":{"observed_at":"2026-08-07T06:06:58.347891Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1126/science.aba0067","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.075917Z","title":"Scale-free ferroelectricity induced by flat phonon bands in HfO 2,","venue":null,"work_id":"747818f6-a1f7-4858-bbc0-8762f239ff2b","year":2020},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.816998Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:d78a8c5e44880e39f03a9d02e4c1ce05f7d36cdcdda9193781639b7d655912b6","observation_id":"01e1ec86-40ac-423f-96b4-a17aaa33520a","resolution":{"observed_at":"2026-08-07T06:06:58.078823Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"document/6724605","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.296695Z","title":"Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories,","venue":null,"work_id":"2cbb8f0c-af20-45d5-b6f1-c5ead557615a","year":2013},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.819946Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:f491b0bf95938fca612789d9af8d6d562d9bc742a5df7949ba50609cf6c34e83","observation_id":"63dd0f13-589e-4813-8be9-65d9aa88eac5","resolution":{"observed_at":"2026-08-07T06:06:58.301718Z","resolver_source":"raw_fallback","status":"malformed_identifier"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"document/8403848","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.227638Z","title":"Hafnium oxide based ferroelectric devices for memories and beyond,","venue":null,"work_id":"ce84063d-5d6e-4871-a58e-1533bf892ec8","year":2018},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.822668Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:feed750832a1c2fc6b24ec0a34354fda3a4b59e6d5dac663c200bcc75478dff3","observation_id":"13421a23-ad1a-4196-bb8b-0c8bd6618beb","resolution":{"observed_at":"2026-08-07T06:06:58.232024Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.335364Z","title":"The Past, the Present, and the Future of Ferroelectric Memories,","venue":null,"work_id":"e586dc50-eff5-43dc-8aae-cb62bf168e8a","year":2020},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.825594Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:6469f32fd893b26968bc446968fc13fc8b38ba426162503f0e9bfb2a1afa2171","observation_id":"b0e52354-3538-4ddb-9fdd-7ff4bc041485","resolution":{"observed_at":"2026-08-07T06:06:58.338588Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.828302Z","title":"A perspective on the physical scaling down of hafnia-based ferroelectrics,","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.828302Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:25f7c33ce2b103eebf4f55d21a5c1f8604a252eec79409dffc48a3c69eb1ab1e","observation_id":"161efd29-32a4-4467-9fb0-558ab6b1d2c3","resolution":{"observed_at":"2026-08-07T06:06:57.828302Z","resolver_source":null,"status":"malformed_identifier"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/5.0035100","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.062272Z","title":"Polarization switching in thin doped HfO2 ferroelectric layers,","venue":null,"work_id":"20ea969f-12f7-4adb-a5ea-78162e888bc8","year":2020},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.831003Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:47c55a07e185490d94549aad058fc63734c9997941673cdefceb547264bc4d31","observation_id":"293408cc-f89d-4a5b-8d29-6ace92d2677c","resolution":{"observed_at":"2026-08-07T06:06:58.065072Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.5040018","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.053962Z","title":"Thickness-dependent crystal structure and electric properties of epitaxial ferroelectric Y2O3-HfO2 films,","venue":null,"work_id":"4704d08d-0f9a-4c60-8f06-49d684920890","year":2018},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.833760Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:6bec8904839c784dfa0f95b969b8fc8918e76614bfdb7ff4727eab45cd3e0d8e","observation_id":"bad23230-d5fa-484a-8b76-a7a127f2ad50","resolution":{"observed_at":"2026-08-07T06:06:58.057072Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.327170Z","title":"Study on the size effect in Hf0.5Zr0.5O2 films thinner than 8 nm before and after wake-up field cycling,","venue":null,"work_id":"f3a7b9f0-c717-4413-9474-1c9dafe5b0f0","year":null},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.836900Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:ac430a98038c749f8d2f3832fdf524240afc7ae4a81fe0dcbcfa9e766009d9a6","observation_id":"76fa36b4-0a81-40bd-ae03-eaa0ab386d46","resolution":{"observed_at":"2026-08-07T06:06:58.330133Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"document/8993464","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.165648Z","title":"Material perspectives of HfO2-based ferroelectric films for device applications,","venue":null,"work_id":"9d226fc0-38ed-4a3d-8272-3945eb7e8b5f","year":2019},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.842612Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:08ae3954aa4ee95b6c22482503a992a2e23942988eb76453b44f1812fec22eb4","observation_id":"a319a7d9-92df-492c-b1fb-f263033de161","resolution":{"observed_at":"2026-08-07T06:06:58.170087Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.7567/jjap.57.04fb01/meta","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.036821Z","title":"Polarization switching behavior of Hf–Zr–O ferroelectric ultrathin films studied through coercive field characteristics,","venue":null,"work_id":"746eb115-6e7d-4bc5-9559-088945a6cb02","year":2018},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.845120Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:f3ec4756b4111fc129f842b7ab39e68ec2285714438544a5545b25dbe8bddc30","observation_id":"b38fb8ce-dc34-44c3-8c4f-e7ee1e12fa19","resolution":{"observed_at":"2026-08-07T06:06:58.039937Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.113144","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.028369Z","title":"Thickness dependence of the coercive electric field of laser ablated niobium-doped lead-zirconium-titanate films,","venue":null,"work_id":"4f5d944e-4ffd-4763-8731-d9c399c8bee9","year":1995},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.847926Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:b983579baa06c5be53428289c7d0618e18b0df92106b9ab91eea22dc4ad7f2ac","observation_id":"55200426-f0a4-4f2c-a977-24539c2dcb56","resolution":{"observed_at":"2026-08-07T06:06:58.031275Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.1621731","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.019730Z","title":"Coercive field of ultrathin Pb(Zr0.52Ti0.48)O3 epitaxial films,","venue":null,"work_id":"0e5dcfbf-65f4-45d9-8634-83a057c04549","year":2003},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.850661Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:cd17338dc26a3805a9ee6253f73a3036bd084af9197b77d7c6415f01e747986a","observation_id":"266ef3cb-09ec-425d-bf9d-49acbc259940","resolution":{"observed_at":"2026-08-07T06:06:58.022840Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/bf01688741","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.010620Z","title":"On the theory of the coercive field of single-domain crystals of BaTiO3,","venue":null,"work_id":"d61fd4e7-ede8-4d30-9507-5a9c44e3f153","year":1958},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.853943Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:f0b76f2fdc85254bc79aa00e1140e59671e5873f6199b884564279d69e4b0bce","observation_id":"b3053a8f-2496-4365-ad78-796ff0bdca5f","resolution":{"observed_at":"2026-08-07T06:06:58.014240Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1080/14786436208214471","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.001986Z","title":"Thickness dependence of the nucleation field of triglycine sulphate,","venue":null,"work_id":"9ace3701-fd50-411e-8446-6ebdf19130a8","year":2027},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.856571Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:661f17cd8f57a21a12700a288a603dfea01e86de9f642b6bc6ad3e5ebc0a1159","observation_id":"0afbc730-be9c-4a2a-99b9-5cecb271a825","resolution":{"observed_at":"2026-08-07T06:06:58.005007Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1080/00150190490891157","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.992777Z","title":"Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics,","venue":null,"work_id":"ff3269e1-3a38-4c8c-9a57-ec5ee733cd41","year":2004},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.859428Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:bde05099ad77007b55857e2da691eb24b3add38c4502eef4f01d9f9753093d82","observation_id":"1aeff340-85a7-47ce-b275-f417764f68b3","resolution":{"observed_at":"2026-08-07T06:06:57.995648Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.317710Z","title":"Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment,","venue":null,"work_id":"bf44dd27-5b04-4d3d-8344-6581f4662105","year":2017},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.861975Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:441418f16b46702855bba1ffa562cce7de159ca4de9f21ca75e46a5ab5025739","observation_id":"690ab5ba-ddf5-41f6-8b2a-42c7e5ca45bd","resolution":{"observed_at":"2026-08-07T06:06:58.321191Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2208.11029","last_updated":"2023-12-04T20:16:55Z","snapshot_observed_at":"2026-07-06T13:44:41.231513Z","submitted_at":"2022-08-23T15:13:36Z","title":"Direction-Dependent Lateral Domain Walls in Ferroelectric Hafnium Zirconium Oxide and their Gradient Energy Coefficients: A First Principles Study","version":4},"cited_work":{"arxiv_id":"2208.11029","doi":null,"metadata_source":"pith","pith_arxiv_id":"2208.11029","snapshot_observed_at":"2026-08-07T06:06:58.098384Z","title":"Direction-Dependent Lateral Domain Walls in Ferroelectric Hafnium Zirconium Oxide and their Gradient Energy Coefficients: A First Principles Study","venue":"cond-mat.mtrl-sci","work_id":"ef9b665a-f2d1-4b7c-8c46-4713118b24ab","year":2022},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.864497Z"},"links":{"cited_paper":"/paper/2208.11029","citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:c7363c2cf9a46b64e0d941ac0ef501000450883b151d51f976ec2fa645238f18","observation_id":"c69cc182-9e83-4094-9920-ba14ab12ab4f","resolution":{"observed_at":"2026-08-07T06:06:58.101732Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsnano.4c08721","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.984196Z","title":"Atomic-Scale Scanning of Domain Network in the Ferroelectric HfO 2 Thin Film,","venue":null,"work_id":"f22f41f0-aa67-400f-a888-21fd669b55ab","year":2024},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.867279Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:09b83c3e233985baa01a01dd41802c9778fa293184f6bd3c29aabdbfad9df136","observation_id":"c68b28ed-e5cd-4f2d-9f40-f1238e03baf3","resolution":{"observed_at":"2026-08-07T06:06:57.987291Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsaelm.1c00110","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.975653Z","title":"Epitaxial Ferroelectric HfO2 Films: Growth, Properties, and Devices,","venue":null,"work_id":"0d9d2e81-3044-43e3-8494-205efa414d7a","year":2021},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.869977Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:3cc9b9cf12debc93bbf7b072dd7d680a017fffbaa069b3004e8e7901edb35878","observation_id":"89346810-eb16-4117-8168-ed75033f367c","resolution":{"observed_at":"2026-08-07T06:06:57.978662Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsaelm.8b00065","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.967316Z","title":"Growth Window of Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films,","venue":null,"work_id":"dfc41fd1-c277-4f5d-a8f7-ba0fcb45c02c","year":2019},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.872395Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:f713cb80ef8f2941ab0d0e4df3f26ae4e7e3b17cd9c37d5392f0f6ee979b2a60","observation_id":"4291dd0b-a0f8-4be2-984e-67828e56e75b","resolution":{"observed_at":"2026-08-07T06:06:57.970024Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsaelm.0c00560","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.958650Z","title":"Epitaxial Ferroelectric La-Doped Hf0.5Zr0.5O2 Thin Films,","venue":null,"work_id":"3196ea41-8bd4-49a7-a3ed-81c134762027","year":2020},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.874963Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:e7cb714f565315f33add54b9026564d8fea6d08577d419207560f2de017b5197","observation_id":"abcbc74c-6f51-41f3-a246-30fdc0d62aae","resolution":{"observed_at":"2026-08-07T06:06:57.961644Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.307327Z","title":"A rhombohedral ferroelectric phase in epitaxially strained Hf0.5Zr0.5O2 thin films,","venue":null,"work_id":"a4ee4fa0-e277-4725-ad05-d2b940a5b9cd","year":2018},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.877502Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:eda3ad629358a89a059ba67372673238665faed42bbd77ce5faae877950b5441","observation_id":"63d65ba0-ae2a-455c-81a0-d0c932fbb088","resolution":{"observed_at":"2026-08-07T06:06:58.310556Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.880241Z","title":"Distinguishing the Rhombohedral Phase from Orthorhombic Phases in Epitaxial Doped HfO2 Ferroelectric Films,","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.880241Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:2ac3b9b4c0120b01c8d0ffda82121f725b19814bd869da65a87d526fc2eb8a14","observation_id":"5d6fc31e-b997-4e87-98be-9cae274f2989","resolution":{"observed_at":"2026-08-07T06:06:57.880241Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevb.66.214109","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.943898Z","title":"Non-Kolmogorov-Avrami switching kinetics in ferroelectric thin films,","venue":null,"work_id":"dedb688c-f64a-4cae-afb1-5f8b7366c4d5","year":2002},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.882965Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:0d92dcc08165883ff2eb071c9d162167ef582dfe17334cd4065511da0b6a870f","observation_id":"845c9b45-e5bd-4ce9-9f07-61e6fd0a9f84","resolution":{"observed_at":"2026-08-07T06:06:57.946838Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/5.0158997","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.934793Z","title":"Phase-field simulations of polarization variations in polycrystalline Hf0.5Zr0.5O2 based MFIM: V oltage dependence and dynamics,","venue":null,"work_id":"11009ab0-b34e-4ad3-aab6-a1ccc8102ac7","year":2023},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.885525Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:06cfc74c41b2eaec2af5c75986cf38808be66f6c8b3d04a49e45be5aebe1eb91","observation_id":"687feca7-6e9a-435f-9d74-8bc04f0d20b4","resolution":{"observed_at":"2026-08-07T06:06:57.937842Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.1722712","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.925999Z","title":"Electrostatic Considerations in BaTiO3 Domain Formation during Polarization Reversal,","venue":null,"work_id":"8321cf63-3784-4037-9470-ec6d332beb97","year":1957},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.888017Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:58dc1be01c86a2ddb3634806b1539f796bbb57c3c130a92b6b718a1a9cbb30d4","observation_id":"9318d062-cabd-477f-911f-dbef1eab9928","resolution":{"observed_at":"2026-08-07T06:06:57.929168Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1088/0953-8984/15/24/106","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.914590Z","title":"Depolarization corrections to the coercive field in thin-film ferroelectrics,","venue":null,"work_id":"11b3c7aa-4e4c-4694-92a1-23db1a0f24fb","year":2003},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.890571Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:afa25810b4f811023c3b02e9899505714a49f36c5a951be1486fd97808507191","observation_id":"3c2e5b28-c19a-43b9-8570-90365d32aead","resolution":{"observed_at":"2026-08-07T06:06:57.919716Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:57.811088Z","title":"Available: https://pubs.acs.org/doi/10.1021/nl302049k","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":2012,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.811088Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:7dfad0bd589300590dc9763bcb533682e824cf0b77722ba4cb2f685946bff811","observation_id":"b9b142cc-7082-4282-9112-dcfb5312e237","resolution":{"observed_at":"2026-08-07T06:06:57.811088Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.4935588","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T06:06:58.045765Z","title":"Available: https://doi.org/10.1063/1.4935588","venue":null,"work_id":"8d7944dd-f688-4a7d-a245-6dde030874bf","year":null},"citing_paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide","version":1},"reference_index":2015,"source":"pdf_text","source_observed_at":"2026-08-07T06:06:57.839850Z"},"links":{"citing_paper":"/paper/2506.06222"},"observation_digest":"sha256:2b737b02339cbee2340d98fe8679666f07b02716bb20812e436a8eac04b2fbbd","observation_id":"0d24434c-27af-40fa-92ba-b4f3ee727489","resolution":{"observed_at":"2026-08-07T06:06:58.048615Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2506.06222","last_updated":"2025-06-06T16:34:47Z","latest_version":1,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-07T05:56:01.606502Z","submitted_at":"2025-06-06T16:34:47Z","title":"Thickness Dependence of Coercive Field in Ferroelectric Doped-Hafnium Oxide"},"reference_resolution":{"displayed":33,"state_counts":{"malformed_identifier":2,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":3,"verified_exact":21,"verified_fuzzy":7},"total_outbound_references":33},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-07T06:34:17.273281+00:00","source":"crossref"},{"observed_at":"2026-08-07T06:34:11.927384+00:00","source":"retraction_watch"}],"thesis":"As of 8 August 2026, this Paper Citation Record lists 33 of 33 outbound references and 0 inbound Pith citation observations for arXiv:2506.06222."}