{"as_of":"2026-08-08T06:41:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:73e33b1e51df869e57400878d73e8afad2f8d2051168bb175e5fd790948d1cb2","coverage":[{"denominator":26,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":26,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-07T05:49:10.240651Z","state":"measured"},{"denominator":26,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":26,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-08T06:32:00.761636+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2506.07187/citation-record","integrity":"/paper/2506.07187/integrity","json":"/paper/2506.07187/citation-record.json","paper":"/paper/2506.07187"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:07.451065Z","title":null,"venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":1,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:07.451065Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:949c834ea45998c108b3abff16abaf5095f1fc1ee6c82e15ff9c4ec099a50441","observation_id":"f546394d-5768-450a-b578-8fff5cd9d502","resolution":{"observed_at":"2026-08-07T05:49:07.451065Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/s0304-3886(02)00189-4","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:14.777644Z","title":"Kumada , author Y","venue":null,"work_id":"78e04979-9702-431d-83fa-9f94c3886f35","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":2,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:07.544008Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:7eaac2a9f7dc5c8de0e4478441b079aa3d5c9fa5acd6c19ca958ad674068fac6","observation_id":"b1d2d835-3ed8-4422-a95f-6eeffefcbc9e","resolution":{"observed_at":"2026-08-07T05:49:14.916861Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acs.langmuir.2c02085","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:14.492535Z","title":"Li , author P","venue":null,"work_id":"26a44e2f-d1c2-4018-83b9-7c52a0c58cae","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":3,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:07.700215Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:f3513c695abc01f8c42721a8fdb84948a2ba197c438d36ce3b9e24814d6d51e0","observation_id":"07fae165-e7ac-4011-b1ee-f7f90905e85e","resolution":{"observed_at":"2026-08-07T05:49:14.653712Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/s41467-024-46200-3","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:14.237038Z","title":"Fang , author C","venue":null,"work_id":"a3fd3366-bc79-446d-bb3e-44a94cbfbe07","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":4,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:07.801870Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:07ecd6fa6cddf86284384ba4e8d74513692539b078710f90f6285711bfa88f39","observation_id":"4d7b6362-b57c-4705-a059-f03a65a6c685","resolution":{"observed_at":"2026-08-07T05:49:14.317120Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:07.931981Z","title":"M e \\' e ndez Harper , author C","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":5,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:07.931981Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:939f803a2d4cdaab2681993e37de73dbb89a2f5dc49916dfa9cec16b82be148c","observation_id":"639d5e30-155a-40ab-a5de-61983367ee0e","resolution":{"observed_at":"2026-08-07T05:49:07.931981Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsnano.2c07121","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:13.933857Z","title":"Hackl , author G","venue":null,"work_id":"6386997e-d07b-426b-b352-8d1617f9659f","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":6,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.020628Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:b6f619ff71452b9ff0f4ee67e77a05e051fa0ea325385f0b36deebd2c56df401","observation_id":"2a629546-16c0-4aca-8fb7-48e122e35ab2","resolution":{"observed_at":"2026-08-07T05:49:14.068357Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2019.10988","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:16.243786Z","title":"Metwally \\ and\\ author U","venue":null,"work_id":"3861c94f-b3f3-4aa2-966f-7d72cf592578","year":2019},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":7,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.183822Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:63d21b0864d0797942f6c4f461fd43cc558962ca5a6e6c4557bb88aa65946070","observation_id":"039c8f54-b34f-4423-a5fc-9f80a5ea87ef","resolution":{"observed_at":"2026-08-07T05:49:16.359490Z","resolver_source":"raw_fallback","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/s41567-022-01714-9","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:13.716191Z","title":null,"venue":null,"work_id":"6aa963ea-7a27-4381-b3a7-8991792f6432","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":8,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.282025Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:261daa73f535b04cfca541b6662c7cad377c96a8c172ba611340825243a65082","observation_id":"0381c330-a43c-4135-a001-5dbaaaef3a8d","resolution":{"observed_at":"2026-08-07T05:49:13.827730Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.1748947","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:13.517859Z","title":null,"venue":null,"work_id":"04eac139-584c-48e2-9b73-9c427fab9633","year":1932},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":9,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.364976Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:2fea96939afcebda76d24716c8ac9aad21730c80a1052eedd6b5a222aaf9d633","observation_id":"a08af6e3-4971-414a-a63b-fea722b79b1e","resolution":{"observed_at":"2026-08-07T05:49:13.624103Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.1684484","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:13.295092Z","title":null,"venue":null,"work_id":"dd8f7bd3-7df7-45f8-bf0c-3206f145a947","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":10,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.469585Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:415841152daf19595b099d579c3ca1dcf05bae63a27a69c980c3510870263bce","observation_id":"45b3b43c-f3f4-40ee-9d0f-e75d34a1e1d7","resolution":{"observed_at":"2026-08-07T05:49:13.387319Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2404.03593","last_updated":"2024-07-25T14:35:51Z","snapshot_observed_at":"2026-07-06T17:55:44.838732Z","submitted_at":"2024-04-04T17:00:37Z","title":"Beyond the blur: using experimentally determined point spread functions to improve scanning Kelvin probe imaging","version":4},"cited_work":{"arxiv_id":"2404.03593","doi":null,"metadata_source":"pith","pith_arxiv_id":"2404.03593","snapshot_observed_at":"2026-08-07T05:49:15.940115Z","title":"Beyond the blur: using experimentally determined point spread functions to improve scanning Kelvin probe imaging","venue":"physics.app-ph","work_id":"782b8f77-96b3-42aa-9fa2-e5934c9588bb","year":2024},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":11,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.630795Z"},"links":{"cited_paper":"/paper/2404.03593","citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:67b23ca324466499b83e3eb748358a957168d2be1e4c016dffe05a8414fb651b","observation_id":"3623248f-8e5c-466a-b5f8-b800a3f581fe","resolution":{"observed_at":"2026-08-07T05:49:16.040903Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.porgcoat.2011.10.009","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:13.054061Z","title":"Nazarov , author M.-G","venue":null,"work_id":"43237277-da2c-496e-a4da-e334368f920b","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":12,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.710888Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:95c08a89b09f21ff584a9030a404d1c63f149a79842c60331ff3617e0a4ebae4","observation_id":"1a97fbc3-9aeb-4c6f-9fad-ffc9498f5bf6","resolution":{"observed_at":"2026-08-07T05:49:13.168580Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2019.00192","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:15.657668Z","title":"Nazarov \\ and\\ author D","venue":null,"work_id":"b1aef364-82b5-484d-93ab-d589892d1ac1","year":2019},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":13,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.813329Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:beda5397e5ba94f4bb83ddecf4a91fac6489978fae519c66fcf889f22017c3b5","observation_id":"f0114ff1-6c3d-499a-8329-a2bcd1f745d8","resolution":{"observed_at":"2026-08-07T05:49:15.824696Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/1521-396x(200004)178:2","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:12.784734Z","title":"Nalbach \\ and\\ author H","venue":null,"work_id":"21beb82b-5bdf-491f-8218-5cc0a4248c27","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":14,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:08.931985Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:8f49ced5ba3cad46463971f777613db5b21ce9a2852839be77523ff8daefff9b","observation_id":"75e00506-f048-4f3b-89e8-b38db1aa1998","resolution":{"observed_at":"2026-08-07T05:49:12.921439Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2008.44834","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:15.422073Z","title":"Martin \\ and\\ author H","venue":null,"work_id":"0ab0bbcb-553c-440d-8452-d5228a5afdd0","year":2008},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":15,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.015470Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:7c4fae1fa659312335fc957be49840f5dd197516dcb000d201691b135cd52586","observation_id":"6331ca40-5038-44f0-a8c7-dc5d9e47e078","resolution":{"observed_at":"2026-08-07T05:49:15.490586Z","resolver_source":"raw_fallback","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevb.88.035436","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:12.523644Z","title":"Sadeghi , author A","venue":null,"work_id":"935f4a14-dad5-41f6-81e4-451dff1478d3","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":16,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.107332Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:0b4dc8cf80f1698d833a6ac272224e8917520fe62910ba1bb9925c34a86b7a6d","observation_id":"5bfbd351-71fe-46b6-a783-65f9930e66b7","resolution":{"observed_at":"2026-08-07T05:49:12.665273Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevb.101.075432","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:12.215177Z","title":null,"venue":null,"work_id":"0c2d4aa9-9740-4ace-9481-068595e46f44","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":17,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.200994Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:adff107fe52218ed0154863f3efcd32bc9d4afae54e16263d796b26900b2ba8b","observation_id":"7f915700-a768-4a04-9781-25297fbd3483","resolution":{"observed_at":"2026-08-07T05:49:12.364242Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevb.108.085420","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:11.905935Z","title":"Heile , author R","venue":null,"work_id":"0ed645fc-ebc0-4925-84f8-4c17b086db0d","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":18,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.328515Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:634e353977cdf179e087f9e42b9346c9bd4f669a7f46ebd3464075845ece1c40","observation_id":"742a5e6e-6574-44df-9a21-20391840b08d","resolution":{"observed_at":"2026-08-07T05:49:12.052426Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/srep27874","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:11.623621Z","title":"Cai \\ and\\ author N","venue":null,"work_id":"187d316a-1e5e-41ba-b2cc-f6e965f0cff4","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":19,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.419047Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:477cef841e5c516e07a1e4cd55204f6f7807d77eed2c56329248e54dcc1f0ae7","observation_id":"69acf671-c40b-4d74-a905-e54107dd315a","resolution":{"observed_at":"2026-08-07T05:49:11.715865Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.elstat.2016.04.002","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:11.386382Z","title":null,"venue":null,"work_id":"4c88d80c-4f6e-40d6-8d28-57d227368981","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":20,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.469237Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:796017fc335010787b51d6ff9dd66128cecf9d0d7e699643e6c8f0b091b3024b","observation_id":"1ba0410c-2891-4571-8e08-6952b420510f","resolution":{"observed_at":"2026-08-07T05:49:11.500816Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1088/0957-4484/21/22/225706","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:11.163074Z","title":"Palleau , author L","venue":null,"work_id":"9c95b177-2e59-46d3-8507-d46c05289fbc","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":21,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.604023Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:a85b1d5dda114c73a0458b35242db7a3440c4c34fd40804507f541c99deea40c","observation_id":"aeff7a57-f0eb-44b1-a57d-6a0eb59b14cc","resolution":{"observed_at":"2026-08-07T05:49:11.268331Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.synthmet.2004.08.009","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:10.944313Z","title":"B u \\\" u rgi , author T","venue":null,"work_id":"c1e4d70a-2cd4-4976-8db7-b7d60e3945b3","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":22,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.733746Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:7d7fdb87006fb8ff7e15e70d65221ced52be6aa27e4b613e28b6c571db2f8cda","observation_id":"f1096930-760a-4897-8086-6324f91fb0cf","resolution":{"observed_at":"2026-08-07T05:49:11.053910Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1126/science.1201512","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:10.648364Z","title":null,"venue":null,"work_id":"2b76264d-29f9-4783-be26-a1bab84a9e2f","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":23,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.844716Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:9d71385cbb9f9e10016bfccf8e5a683b0848239414255ed42270185af48e892b","observation_id":"d7a9fba4-27e0-406f-8957-fdf20636817e","resolution":{"observed_at":"2026-08-07T05:49:10.782643Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/physrevmaterials.6.125605","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:10.413319Z","title":"Pertl , author J","venue":null,"work_id":"03de4038-c001-45a0-a054-73b825fb7730","year":null},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":24,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:09.994006Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:1c624d128dca40bd9b02201c7e040c9a9dcf13093caf12b3609995cbb2ca1352","observation_id":"7bafda3e-5533-4538-9fa6-75fab340b86c","resolution":{"observed_at":"2026-08-07T05:49:10.529617Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:16.506279Z","title":null,"venue":null,"work_id":"0e086f83-d315-4073-8a29-4df8e35afada","year":2021},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":25,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:10.128306Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:cd9c3a236a1afca2b899819d8b8531614f4e5f27be8495336dbad5eacdc59181","observation_id":"3410d5c1-9368-4c89-8ad2-d44f4082e976","resolution":{"observed_at":"2026-08-07T05:49:16.605497Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2022.15543","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T05:49:15.147355Z","title":"Navarro-Rodriguez , author E","venue":null,"work_id":"520bc746-a61f-47e6-bb41-1c108a300f71","year":2022},"citing_paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","version":1},"reference_index":26,"source":"arxiv_source","source_observed_at":"2026-08-07T05:49:10.240651Z"},"links":{"citing_paper":"/paper/2506.07187"},"observation_digest":"sha256:96e57d9f8d2683fa24741cbef6cc94942d5ceff3421299717dd62583664930b2","observation_id":"6cc9555b-a85a-466b-bc19-848f31dab7d2","resolution":{"observed_at":"2026-08-07T05:49:15.215120Z","resolver_source":"raw_fallback","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2506.07187","last_updated":"2025-06-08T15:15:56Z","latest_version":1,"primary_category":"physics.app-ph","snapshot_observed_at":"2026-08-07T05:37:42.636196Z","submitted_at":"2025-06-08T15:15:56Z","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy"},"reference_resolution":{"displayed":26,"state_counts":{"malformed_identifier":0,"metadata_mismatch":3,"parse_uncertain":0,"unresolved":3,"verified_exact":20,"verified_fuzzy":0},"total_outbound_references":26},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"thesis":"As of 8 August 2026, this Paper Citation Record lists 26 of 26 outbound references and 0 inbound Pith citation observations for arXiv:2506.07187."}