{"as_of":"2026-08-05T02:59:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:0da71b3f8c6ec598a60506be35218b3447eb9421b55eb8b8f3019902cecde80a","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":4,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":4,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-04T06:34:03.388597+00:00","state":"measured"},{"denominator":4,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":4,"source":"paper_references, paper_reference_links","source_observed_at":"2026-07-14T04:41:25.415066Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-06-29T23:24:01.413754Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2507.18316","last_updated":"2025-07-24T11:32:31Z","snapshot_observed_at":"2026-07-06T22:02:13.646335Z","submitted_at":"2025-07-24T11:32:31Z","title":"YATE: The Role of Test Repair in LLM-Based Unit Test Generation","version":1},"cited_work":{"arxiv_id":"2507.18316","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2507.18316","snapshot_observed_at":"2026-06-29T23:24:01.413754Z","title":"Yate: The role of test repair in llm-based unit test generation,","venue":null,"work_id":"f7e34779-ffa1-43e8-99b7-d25d781cc792","year":2025},"citing_paper":{"arxiv_id":"2605.25285","last_updated":"2026-05-24T22:38:04Z","snapshot_observed_at":"2026-07-06T23:35:16.647496Z","submitted_at":"2026-05-24T22:38:04Z","title":"PR-Aware Automated Unit Test Generation: Challenges and Opportunities","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-06-29T23:21:01.886072Z"},"links":{"cited_paper":"/paper/2507.18316","citing_paper":"/paper/2605.25285"},"observation_digest":"sha256:fbe3cf76defec45b175fc698721f1a71748488676e31a07d3a17c28ff0f1cb66","observation_id":"abff6044-a888-4e58-ba76-958799a5f205","resolution":{"observed_at":"2026-06-29T23:24:01.415478Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-04T06:34:03.388597+00:00","source":"crossref"},{"observed_at":"2026-08-04T06:33:57.428241+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2507.18316","last_updated":"2025-07-24T11:32:31Z","snapshot_observed_at":"2026-07-06T22:02:13.646335Z","submitted_at":"2025-07-24T11:32:31Z","title":"YATE: The Role of Test Repair in LLM-Based Unit Test Generation","version":1},"cited_work":{"arxiv_id":"2507.18316","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2507.18316","snapshot_observed_at":"2026-06-29T23:24:01.413754Z","title":"Yate: The role of test repair in llm-based unit test generation,","venue":null,"work_id":"f7e34779-ffa1-43e8-99b7-d25d781cc792","year":2025},"citing_paper":{"arxiv_id":"2605.29822","last_updated":"2026-05-28T12:04:51Z","snapshot_observed_at":"2026-07-29T16:18:16.189748Z","submitted_at":"2026-05-28T12:04:51Z","title":"Inferring Code Correctness from Specification","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-06-29T06:33:36.835860Z"},"links":{"cited_paper":"/paper/2507.18316","citing_paper":"/paper/2605.29822"},"observation_digest":"sha256:c507fe4f1ad48c6516552672a15e893d51120b88458dc761593f1cb6a8516367","observation_id":"7ed7ff4a-d2cc-4501-be8d-8604ad7e0a53","resolution":{"observed_at":"2026-06-29T14:33:31.512841Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-04T06:34:03.388597+00:00","source":"crossref"},{"observed_at":"2026-08-04T06:33:57.428241+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2507.18316","last_updated":"2025-07-24T11:32:31Z","snapshot_observed_at":"2026-07-06T22:02:13.646335Z","submitted_at":"2025-07-24T11:32:31Z","title":"YATE: The Role of Test Repair in LLM-Based Unit Test Generation","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2507.18316","snapshot_observed_at":"2026-07-11T08:12:23.512737Z","title":"Yate: The role of test repair in llm-based unit test generation,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.05139","last_updated":"2026-07-06T14:23:30Z","snapshot_observed_at":"2026-08-04T20:23:02.335560Z","submitted_at":"2026-07-06T14:23:30Z","title":"On the risk of coding before testing: An empirical study on LLM-based test generation workflow","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-07-11T08:12:23.512737Z"},"links":{"cited_paper":"/paper/2507.18316","citing_paper":"/paper/2607.05139"},"observation_digest":"sha256:863414565cb93c9a488b2d7c68e7bed886f814cd30cab19cf5045620c31a9e1b","observation_id":"7358d66e-761f-4e62-aa0f-fb23a89a9dd5","resolution":{"observed_at":"2026-07-11T08:12:23.512737Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2507.18316","last_updated":"2025-07-24T11:32:31Z","snapshot_observed_at":"2026-07-06T22:02:13.646335Z","submitted_at":"2025-07-24T11:32:31Z","title":"YATE: The Role of Test Repair in LLM-Based Unit Test Generation","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2507.18316","snapshot_observed_at":"2026-07-14T04:41:25.415066Z","title":"Y ATE: The role of test repair in LLM-based unit test generation,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.11573","last_updated":"2026-07-13T13:53:50Z","snapshot_observed_at":"2026-08-01T04:37:49.617786Z","submitted_at":"2026-07-13T13:53:50Z","title":"Knowledge-Guided Synthetic Bug Feedback for LLM-Based Unit Test Generation","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-07-14T04:41:25.415066Z"},"links":{"cited_paper":"/paper/2507.18316","citing_paper":"/paper/2607.11573"},"observation_digest":"sha256:b79715d669d5fb7efba7521bce0a9ceba0aa2237852aa8af291e64127ce032eb","observation_id":"85f2bd94-9fa7-4a45-81f3-3e7905a7788e","resolution":{"observed_at":"2026-07-14T04:41:25.415066Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"links":{"evidence":"/evidence","html":"/paper/2507.18316/citation-record","integrity":"/paper/2507.18316/integrity","json":"/paper/2507.18316/citation-record.json","paper":"/paper/2507.18316"},"outbound":[],"paper":{"arxiv_id":"2507.18316","last_updated":"2025-07-24T11:32:31Z","latest_version":1,"primary_category":"cs.SE","snapshot_observed_at":"2026-07-06T22:02:13.646335Z","submitted_at":"2025-07-24T11:32:31Z","title":"YATE: The Role of Test Repair in LLM-Based Unit Test Generation"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-04T06:34:03.388597+00:00","source":"crossref"},{"observed_at":"2026-08-04T06:33:57.428241+00:00","source":"retraction_watch"}],"thesis":"As of 5 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 4 inbound Pith citation observations for arXiv:2507.18316."}