{"as_of":"2026-08-11T10:41:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:119d0d20cb2b21ab061f35a1c1a1194040ea1b2c75af1d4c1a3e9398c68d2efa","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":2,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":2,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-11T06:34:44.6726+00:00","state":"measured"},{"denominator":2,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":2,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-03T23:17:29.629390Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"arxiv_reference","source_observed_at":"2026-06-30T12:54:40.308769Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2508.12931","last_updated":"2025-08-18T13:54:29Z","snapshot_observed_at":"2026-08-05T19:08:07.546119Z","submitted_at":"2025-08-18T13:54:29Z","title":"Towards High-Resolution Industrial Image Anomaly Detection","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2508.12931","snapshot_observed_at":"2026-08-03T23:17:29.629390Z","title":"Towards high-resolution industrial image anomaly detection,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2511.06644","last_updated":"2026-06-08T06:25:46Z","snapshot_observed_at":"2026-08-06T03:52:19.054451Z","submitted_at":"2025-11-10T02:42:08Z","title":"UniADC: A Unified Framework for Anomaly Detection and Classification","version":3},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-03T23:17:29.629390Z"},"links":{"cited_paper":"/paper/2508.12931","citing_paper":"/paper/2511.06644"},"observation_digest":"sha256:12d9c4019246681ce348750416f733aa272e98d6fec703040b854324aad8baf3","observation_id":"570c79bd-b718-4cf1-8867-38c29f957c70","resolution":{"observed_at":"2026-08-03T23:17:29.629390Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2508.12931","last_updated":"2025-08-18T13:54:29Z","snapshot_observed_at":"2026-08-05T19:08:07.546119Z","submitted_at":"2025-08-18T13:54:29Z","title":"Towards High-Resolution Industrial Image Anomaly Detection","version":1},"cited_work":{"arxiv_id":"2508.12931","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2508.12931","snapshot_observed_at":"2026-06-30T12:54:40.308769Z","title":"arXiv preprint arXiv:2508.12931 (2025)","venue":null,"work_id":"c5d41919-4531-4478-84dd-155ea87fe087","year":2025},"citing_paper":{"arxiv_id":"2606.28688","last_updated":"2026-06-27T01:59:07Z","snapshot_observed_at":"2026-08-02T12:30:03.656084Z","submitted_at":"2026-06-27T01:59:07Z","title":"LogiCo: A Unified Framework for Logical and Structural Anomaly Detection","version":1},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-06-30T10:05:09.329599Z"},"links":{"cited_paper":"/paper/2508.12931","citing_paper":"/paper/2606.28688"},"observation_digest":"sha256:f841768899bdee247cb61f3394cdcaba6543a9e79e09469dd1c6ae262e9db2a2","observation_id":"906ddda9-cd96-43cb-9547-c7c5679ac8bc","resolution":{"observed_at":"2026-06-30T12:54:40.310003Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-11T06:34:44.6726+00:00","source":"crossref"},{"observed_at":"2026-08-11T06:34:36.301508+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2508.12931/citation-record","integrity":"/paper/2508.12931/integrity","json":"/paper/2508.12931/citation-record.json","paper":"/paper/2508.12931"},"outbound":[],"paper":{"arxiv_id":"2508.12931","last_updated":"2025-08-18T13:54:29Z","latest_version":1,"primary_category":"cs.CV","snapshot_observed_at":"2026-08-05T19:08:07.546119Z","submitted_at":"2025-08-18T13:54:29Z","title":"Towards High-Resolution Industrial Image Anomaly Detection"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-11T06:34:44.6726+00:00","source":"crossref"},{"observed_at":"2026-08-11T06:34:36.301508+00:00","source":"retraction_watch"}],"thesis":"As of 11 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:2508.12931."}