{"as_of":"2026-08-07T05:40:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:b664312d3d9c1f1a9111e34c356dbd3d4ec2c80a8b05aa0eae4717597eaa3206","coverage":[{"denominator":36,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":36,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-05T16:47:27.847634Z","state":"measured"},{"denominator":36,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":36,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-06T06:34:29.942622+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2508.17873/citation-record","integrity":"/paper/2508.17873/integrity","json":"/paper/2508.17873/citation-record.json","paper":"/paper/2508.17873"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.176959Z","title":"Associations between long-term ozone exposure and small airways function in Chinese young adults: a longitudinal cohort study [J]","venue":null,"work_id":"5f9318f8-2c61-4721-acd5-4d8dc8e0e7f7","year":2024},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.769818Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:f557bf4c8a5f60b1cec11f9c180a968d31b8034a0811ea77bfb6ee0410db415f","observation_id":"7dcb1b59-47a0-4496-ad09-1c1e400e56a9","resolution":{"observed_at":"2026-08-05T16:47:28.179231Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.170250Z","title":"Avoidable mortality due to long-term exposure to PM2","venue":null,"work_id":"5a88f346-804b-418d-9907-067cef992594","year":2014},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.772837Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:c2382c6646303d0d50eb465bac190b9c53ec811ceacb73d244bb1d41ebb81937","observation_id":"32646629-f036-42f1-a70e-2a4d09817265","resolution":{"observed_at":"2026-08-05T16:47:28.173019Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.164415Z","title":null,"venue":null,"work_id":"6c5cc0cb-d92f-4c5a-9d11-76a903013e3c","year":2012},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.775116Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:eb16f02f248599abcdc0ae2ddc9e59dc2646e6c3fee8e901ff02a1366f104889","observation_id":"afc4433e-d1d6-488e-91ad-03c607b0f897","resolution":{"observed_at":"2026-08-05T16:47:28.166481Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.158632Z","title":null,"venue":null,"work_id":"82b926d9-0106-4513-bb71-0bfa34ef7828","year":2013},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.777572Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:d53f55940dc346cd79f9345effab40ae55c78d0b8da1960a24bd5510c038170f","observation_id":"1f7ffb72-4548-4b41-89eb-f38390e8eb6d","resolution":{"observed_at":"2026-08-05T16:47:28.160638Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.152565Z","title":null,"venue":null,"work_id":"2e8adaa9-1401-4163-a09e-3410e4ff3743","year":2015},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.780082Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:d648a86d1f7f653bf0b8579cf680b05e0ea6ecdaa2ddeb6928e5bca9698756a5","observation_id":"213f18f3-7a9c-4b66-b6ea-6bc80be08837","resolution":{"observed_at":"2026-08-05T16:47:28.154613Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1707.01926","last_updated":"2018-02-22T19:52:51Z","snapshot_observed_at":"2026-08-01T21:20:06.448984Z","submitted_at":"2017-07-06T18:20:59Z","title":"Diffusion Convolutional Recurrent Neural Network: Data-Driven Traffic Forecasting","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1707.01926","snapshot_observed_at":"2026-08-05T16:47:27.782426Z","title":"arXiv preprint arXiv:1707.01926 (2017)","venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.782426Z"},"links":{"cited_paper":"/paper/1707.01926","citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:19dca58a98494e7b22a0ed0d93aa8d8c8a38cd26a9f13ecafce0c95c36c2bc48","observation_id":"a83f0d93-7daa-4e8d-a9bb-ad079dc6790f","resolution":{"observed_at":"2026-08-05T16:47:27.782426Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.146530Z","title":null,"venue":null,"work_id":"d23370ae-786f-4460-96cb-c631c26c058e","year":2018},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.785067Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:a5b6474dc0bdfd4617858c2421964258086747947623275cff50f9f922493a45","observation_id":"534fe618-5255-431f-96f1-55639a75570c","resolution":{"observed_at":"2026-08-05T16:47:28.148652Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2001.02908","last_updated":"2021-03-29T09:59:36Z","snapshot_observed_at":"2026-08-05T20:31:02.244623Z","submitted_at":"2020-01-09T10:21:04Z","title":"Spatial-Temporal Transformer Networks for Traffic Flow Forecasting","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2001.02908","snapshot_observed_at":"2026-08-05T16:47:27.789866Z","title":"arXiv preprint arXiv:2001.02908 (2020)","venue":null,"work_id":null,"year":2001},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.789866Z"},"links":{"cited_paper":"/paper/2001.02908","citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:8f22fafd892a771d17e2d3a7f30b1d802b0ac6f5417d1e4b14543d399e576607","observation_id":"674218f7-ef41-457c-b1d8-6e045fc7dc1b","resolution":{"observed_at":"2026-08-05T16:47:27.789866Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.140334Z","title":"In: The Eleventh International Con- ference on Learning Representations, 2023","venue":null,"work_id":"e1d6a66a-3bfb-451a-bc5a-37269a33bcd1","year":2023},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.792256Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:3e5bd75ae539f905e8633e2b4a521042acb2b4a174bc5040477d09598b79c18b","observation_id":"862bb16a-9632-4af2-8e3e-fad7ca95ffae","resolution":{"observed_at":"2026-08-05T16:47:28.142565Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.133292Z","title":"In: Proceedings of the AAAI Conference on Artificial Intelligence, 2021, 35(12): 11106–11115","venue":null,"work_id":"a3efe388-13ec-461f-9112-959d8d0d6dff","year":2021},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.794313Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:552b2af053693127cd5d4fcf6fdb8489b1445b9c7dc4f0e6383e1eb40aa1a776","observation_id":"7f85a59a-7f5e-4aa8-a3aa-3bef337e5c62","resolution":{"observed_at":"2026-08-05T16:47:28.135624Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.127097Z","title":null,"venue":null,"work_id":"71bf527c-4cba-4f5b-b042-9af509b53370","year":2021},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.796393Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:2d37eec562718d515790467280bce366dcc19dd67df172802a44f4a0023924d4","observation_id":"f54f9bbb-1fda-4eeb-a901-7a888d33b8f8","resolution":{"observed_at":"2026-08-05T16:47:28.129181Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.120835Z","title":null,"venue":null,"work_id":"588cef97-974d-4648-b675-49cb6493b5e0","year":2012},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.798900Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:6b30ef9b5e9445102e69b1b8ab087db531e51e74c5ec85fbb9f981383310e7a1","observation_id":"e15bf0d2-1fa6-4c46-bf00-4a1a273dff00","resolution":{"observed_at":"2026-08-05T16:47:28.123141Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.114640Z","title":"Expert Syst","venue":null,"work_id":"14c42ed4-4102-423e-9d5d-49b3cffef685","year":2022},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.800825Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:92fdc36bf37d517413821825b9756afd88e92ac536c506cb088e07df47cb2644","observation_id":"a735b372-b0ea-4a91-b722-d6b489007ba3","resolution":{"observed_at":"2026-08-05T16:47:28.116658Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2101.04264","doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:27.974653Z","title":"arXiv preprint arXiv:2101.04264 (2021)","venue":null,"work_id":"caeadb25-9acf-4687-ac24-ad1b3ccd2b7c","year":2021},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.802796Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:4e98a89e5255abf87dccdad91260f34835a5a0c216f5c53d4d463ec76ee46681","observation_id":"d04fd9c6-c7e3-41b0-8f66-2e99db9ea619","resolution":{"observed_at":"2026-08-05T16:47:27.979002Z","resolver_source":"raw_fallback","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.108297Z","title":"In: Proceedings of the AAAI Conference on Artificial Intelligence, 2023, 37(12): 14329 - 14337","venue":null,"work_id":"2fa6124b-dd55-4e85-af52-f345131fc64a","year":2023},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.804764Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:67cdb988daaeae9890fa8aaf2c125413754485776330ddd885d9e6b1605c2294","observation_id":"a3ff7125-5c8a-4db0-a2be-e29facfc3b4b","resolution":{"observed_at":"2026-08-05T16:47:28.110627Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.101807Z","title":"ACM Trans","venue":null,"work_id":"87d50fad-902c-49ad-abff-d6c4d3ee0412","year":2023},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.806788Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:ee6c4c4a0234802df7caf615fba4b2cf4230c633b35e5c42266bd047b08084b3","observation_id":"e619413e-7dd4-4b4d-9cc2-0d6303ff7be1","resolution":{"observed_at":"2026-08-05T16:47:28.103945Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.095420Z","title":"In: Proceedings of the AAAI conference on artificial intelligence, 2017, 31(1)","venue":null,"work_id":"bc60fb17-4203-4e27-8884-7e78a07576fe","year":2017},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.808756Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:88b00f3d033148f05fc4a49fb8b29da43d32bb3f19478680a92c242695e27fdc","observation_id":"ebb3efba-bcd9-41cd-9ad2-28064dc38b26","resolution":{"observed_at":"2026-08-05T16:47:28.097541Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1810.05749","last_updated":"2020-12-18T18:01:04Z","snapshot_observed_at":"2026-07-06T07:07:47.487337Z","submitted_at":"2018-10-12T22:21:05Z","title":"Graph HyperNetworks for Neural Architecture Search","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1810.05749","snapshot_observed_at":"2026-08-05T16:47:27.810763Z","title":"arXiv preprint arXiv:1810.05749 (2018)","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.810763Z"},"links":{"cited_paper":"/paper/1810.05749","citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:e2026f085deecabd3331c1807f4008f2ac1a7a068131acdee7402daecdc84671","observation_id":"4318da08-dd32-488b-91df-2325e162186d","resolution":{"observed_at":"2026-08-05T16:47:27.810763Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"1906.00121","last_updated":"2019-05-31T23:53:20Z","snapshot_observed_at":"2026-07-06T07:57:10.401964Z","submitted_at":"2019-05-31T23:53:20Z","title":"Graph WaveNet for Deep Spatial-Temporal Graph Modeling","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1906.00121","snapshot_observed_at":"2026-08-05T16:47:27.813056Z","title":"arXiv preprint arXiv:1906.00121 (2019)","venue":null,"work_id":null,"year":1906},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.813056Z"},"links":{"cited_paper":"/paper/1906.00121","citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:4276e48fb91c9b745ce4a1122255d05579f561b4c584ed5c501843b9d8b5721e","observation_id":"c40b5fb7-79bf-44fe-8e5f-11fe442e72a1","resolution":{"observed_at":"2026-08-05T16:47:27.813056Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.089210Z","title":"In: Proceedings of the 26th ACM SIGKDD international conference on knowledge discovery & data mining, 2020, pp","venue":null,"work_id":"dc7b3ad3-508e-464e-bc9a-9bc1bf8f6eb9","year":2020},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.815475Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:687ca16f79c58fdee0ce8f346a0a13d03067701149b329485154429997b1bce0","observation_id":"17626975-5f1d-4da6-a309-9676fbcfd7f7","resolution":{"observed_at":"2026-08-05T16:47:28.091443Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.082868Z","title":"In: Proceedings of the web conference 2020, 2020, pp","venue":null,"work_id":"cf75dce9-baa4-4330-85ee-1cb8bb478d99","year":2020},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.817461Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:cd8b9390ba2544f52f7e48cb0af2ae76fc96a354ce32908624daca012263a0c6","observation_id":"647be74f-930d-4e94-b268-2750ca07a7a6","resolution":{"observed_at":"2026-08-05T16:47:28.085063Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.077038Z","title":null,"venue":null,"work_id":"ca5a5507-231d-47f5-98fc-0e86bbc75238","year":2017},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.819384Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:7591f34e55e2b91e3f0ee1d87907059fba9015d3727257d30f667f5ce6066101","observation_id":"25b87a35-39b0-47fb-85f4-4dad0ccdc18d","resolution":{"observed_at":"2026-08-05T16:47:28.079027Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1312.6203","last_updated":"2014-05-21T16:27:09Z","snapshot_observed_at":"2026-07-06T03:31:33.797310Z","submitted_at":"2013-12-21T04:25:53Z","title":"Spectral Networks and Locally Connected Networks on Graphs","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1312.6203","snapshot_observed_at":"2026-08-05T16:47:27.821298Z","title":"arXiv preprint arXiv:1312.6203 (2013)","venue":null,"work_id":null,"year":2013},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.821298Z"},"links":{"cited_paper":"/paper/1312.6203","citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:2438cc551f6f8df38aa33d8bd905cd0d9582216b93542944cf527af30222ec45","observation_id":"eb19bb11-903a-47fc-b0c4-6b5e30248845","resolution":{"observed_at":"2026-08-05T16:47:27.821298Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"1609.02907","last_updated":"2017-02-22T09:55:36Z","snapshot_observed_at":"2026-07-06T05:10:16.862707Z","submitted_at":"2016-09-09T19:48:41Z","title":"Semi-Supervised Classification with Graph Convolutional Networks","version":4},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1609.02907","snapshot_observed_at":"2026-08-05T16:47:27.823522Z","title":"arXiv preprint arXiv:1609.02907 (2016)","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.823522Z"},"links":{"cited_paper":"/paper/1609.02907","citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:092a9153f9d1f1f0797552158549bc3ed0d1837a9dc234cd4cecdc00a90b865f","observation_id":"5d49f7b2-278b-4fc3-af30-dcf2445ec718","resolution":{"observed_at":"2026-08-05T16:47:27.823522Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.070517Z","title":"In: Proceedings of the 30th Interna- tional Conference on Neural Information Processing Systems (NIPS’16), 2016, pp","venue":null,"work_id":"c3eac616-11e4-4d1b-a528-3a021a39da38","year":2016},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.825853Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:11dd724cc853bd7814349a168eedfb1b2be8a4299cb086dae6d3d27fc33989a8","observation_id":"b751f609-797f-40fa-9fbf-4f8f6c964839","resolution":{"observed_at":"2026-08-05T16:47:28.073066Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.064087Z","title":"Biometrika, 37(1/2), 17 - 23 (1950)","venue":null,"work_id":"83f413e7-0d08-4c14-a206-02cf657051c3","year":1950},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.827844Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:b5ec96100e011d890ccf78ccccb938e044e75954c470eba7252bec982054e3f5","observation_id":"3f3f4d90-1fb0-4d39-b1e2-4f0e809d55db","resolution":{"observed_at":"2026-08-05T16:47:28.066344Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.057616Z","title":"In: Proceedings of the IEEE conference on computer vision and pattern recognition, 2018, pp","venue":null,"work_id":"d2d72710-9513-4499-85a8-c24f5d5da4f9","year":2018},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.829853Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:86282e04727eda39b3af25f9ce5988855417acdb30d8e5e4cfbb07128c3a3cdc","observation_id":"1e1c1dd8-b856-47d2-a668-13d0199f54a4","resolution":{"observed_at":"2026-08-05T16:47:28.060107Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.050923Z","title":"In: Proceedings of the IEEE/CVF International Conference on Computer Vision Workshops, 2019, pp","venue":null,"work_id":"68f707a4-c9be-4249-af5f-689fee152406","year":2019},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.832009Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:532ca8b65d0ee16eb7e4fa7b923c4972ef3c0209639001b06faf6383d1d26202","observation_id":"2a5f0736-8b21-410f-9ec1-cfa14ca1bf7a","resolution":{"observed_at":"2026-08-05T16:47:28.053061Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.044849Z","title":"In: IJCAI, 2018, pp","venue":null,"work_id":"1beca7ee-8c7f-4b48-b27c-5ed11c4f026b","year":2018},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.833918Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:2a26862bcdd34272266643e20c46a01bcc68c5f3d3a8be24dd6d83b5fcdf377b","observation_id":"404ef7fc-6613-420b-a939-4926f55bd7b8","resolution":{"observed_at":"2026-08-05T16:47:28.046915Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.038058Z","title":"In: Supervised sequence labelling with recurrent neural networks, 2012, pp","venue":null,"work_id":"04da0aa1-2dd0-49b6-ac29-84574df28063","year":2012},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.835886Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:14957031d499cdd0dc1e358933ab5ac6a4c5dfd21246974c8c01d1a08ed3780f","observation_id":"fb2f09f1-5837-4f18-a541-795d9e2ee958","resolution":{"observed_at":"2026-08-05T16:47:28.040375Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1709.04875","last_updated":"2018-07-12T07:55:09Z","snapshot_observed_at":"2026-08-07T02:38:28.481487Z","submitted_at":"2017-09-14T16:54:41Z","title":"Spatio-Temporal Graph Convolutional Networks: A Deep Learning Framework for Traffic Forecasting","version":4},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1709.04875","snapshot_observed_at":"2026-08-05T16:47:27.837828Z","title":"arXiv preprint arXiv:1709.04875 (2017)","venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.837828Z"},"links":{"cited_paper":"/paper/1709.04875","citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:861b832d633c32788763ec2fac3d092c8c2124a5bfe512bc5eb97ecdd9e71d1e","observation_id":"79cf9d79-4e9a-44d6-8b14-843120318986","resolution":{"observed_at":"2026-08-05T16:47:27.837828Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.030969Z","title":"In: Proceedings of the 27th ACM SIGKDD conference on knowledge discovery & data mining, 2021, pp","venue":null,"work_id":"decd7a71-4167-4a07-b46a-ccb799d7cea7","year":2021},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.839757Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:432b1ed4f06fe69cdb89cd4d4bccdcecbc28de3f7c22959f1679d73bb0398592","observation_id":"362f76ba-5e4d-414e-8556-c6b9f54e4bb9","resolution":{"observed_at":"2026-08-05T16:47:28.033142Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.024396Z","title":"In: Proceedings of the AAAI Conference on Artificial Intelligence, 2024, 38(14): 15715 - 15724","venue":null,"work_id":"d3825bc2-3b83-4c13-ac5c-0107bef4ddfc","year":2024},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.841740Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:eea8c42bad2a1cf0c91d03196f2bda623434886d04d581f0bdf076fbf3a0b388","observation_id":"43f00a88-1388-44f7-9f85-5cdb81a33d10","resolution":{"observed_at":"2026-08-05T16:47:28.026600Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.017550Z","title":"In: Proceedings of the AAAI conference on artificial intelligence, 2020, 34(01): 1234 - 1241","venue":null,"work_id":"a1a3d1c0-dae5-49c0-ac02-617b6c9a77b7","year":2020},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.843666Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:82b4947c6d342a90b834bb99b17d9ab1e4ac5cb795f6405d866588344322de57","observation_id":"7014c0a6-24a7-44ed-b8b3-ded853cc6835","resolution":{"observed_at":"2026-08-05T16:47:28.020110Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.010451Z","title":"In: Proceedings of the AAAI conference on artificial intelligence, 2019, 33(01): 922 - 929","venue":null,"work_id":"e1bfddb4-8b78-4935-8a4a-7b20655e069c","year":2019},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.845524Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:9f51a471682485410a4cc7c4bac3ab12d9e38aee84d28ee7d740740de0671665","observation_id":"3b07c625-d43d-41ae-ac23-29921fcd84e0","resolution":{"observed_at":"2026-08-05T16:47:28.012970Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T16:47:28.002637Z","title":"Mathematics, 10(9), 1599 (2022)","venue":null,"work_id":"f8fa2862-ac72-4fd3-aa19-876ed246ee7c","year":2022},"citing_paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-05T16:47:27.847634Z"},"links":{"citing_paper":"/paper/2508.17873"},"observation_digest":"sha256:7e8d02334b5c1c94e34801a132396d08a5add1463475cfaf8b8898d4f5a7ab91","observation_id":"9ac448d2-7a04-4820-9dd7-06866e0fa211","resolution":{"observed_at":"2026-08-05T16:47:28.005374Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2508.17873","last_updated":"2025-08-25T10:28:18Z","latest_version":1,"primary_category":"eess.SP","snapshot_observed_at":"2026-08-07T02:39:07.950581Z","submitted_at":"2025-08-25T10:28:18Z","title":"Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data"},"reference_resolution":{"displayed":36,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":14,"verified_exact":1,"verified_fuzzy":21},"total_outbound_references":36},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"thesis":"As of 7 August 2026, this Paper Citation Record lists 36 of 36 outbound references and 0 inbound Pith citation observations for arXiv:2508.17873."}