{"as_of":"2026-08-11T04:42:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:2c897f0eefa20e2613f013ea9dc5b4475f22a55e66d270a7ebebc196fa40a6b6","coverage":[{"denominator":3,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":3,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-04T21:37:34.376841Z","state":"measured"},{"denominator":3,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":3,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-10T06:31:04.303077+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2509.07886/citation-record","integrity":"/paper/2509.07886/integrity","json":"/paper/2509.07886/citation-record.json","paper":"/paper/2509.07886"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-04T21:37:35.064802Z","title":"Colinge,IEEE Trans","venue":null,"work_id":"5add838b-759a-41df-abcf-5f392e54cc09","year":1990},"citing_paper":{"arxiv_id":"2509.07886","last_updated":"2025-09-09T16:08:03Z","snapshot_observed_at":"2026-08-10T19:37:42.072910Z","submitted_at":"2025-09-09T16:08:03Z","title":"Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-04T21:37:34.200026Z"},"links":{"citing_paper":"/paper/2509.07886"},"observation_digest":"sha256:8e2349955202cbf51f1075206ccc7a6ea95d1ed4d4cdd903e0050db06fb546f9","observation_id":"d959870b-4cb6-43aa-8a8f-91066cf8ea46","resolution":{"observed_at":"2026-08-04T21:37:35.183399Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-04T21:37:34.856563Z","title":"[4]W.Fichtner,IEEE Solid State Circuits and Technology Workshop on Scaling and Microlithography,New York, 1980","venue":null,"work_id":"8cd55a2f-65cd-4606-a3ae-2c3e71904483","year":2009},"citing_paper":{"arxiv_id":"2509.07886","last_updated":"2025-09-09T16:08:03Z","snapshot_observed_at":"2026-08-10T19:37:42.072910Z","submitted_at":"2025-09-09T16:08:03Z","title":"Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-04T21:37:34.279506Z"},"links":{"citing_paper":"/paper/2509.07886"},"observation_digest":"sha256:0ab243f9f1fd4c4f8d841042a9f483f43337aa115a100e2ee9965804bc8e7421","observation_id":"7074e5d2-8bf0-4961-bea5-10ef4a8decd8","resolution":{"observed_at":"2026-08-04T21:37:34.949241Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-04T21:37:34.580263Z","title":"Rha, “, IEEE Trans","venue":null,"work_id":"357526d2-c635-46c7-b2ff-567addeedb51","year":2012},"citing_paper":{"arxiv_id":"2509.07886","last_updated":"2025-09-09T16:08:03Z","snapshot_observed_at":"2026-08-10T19:37:42.072910Z","submitted_at":"2025-09-09T16:08:03Z","title":"Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-04T21:37:34.376841Z"},"links":{"citing_paper":"/paper/2509.07886"},"observation_digest":"sha256:d4d963fc61a47f2644a573affef62219f9c35a4ea64f815b7eddaecb4010720c","observation_id":"d2628816-bae6-4d49-8535-1ad7ea51d8ae","resolution":{"observed_at":"2026-08-04T21:37:34.714931Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2509.07886","last_updated":"2025-09-09T16:08:03Z","latest_version":1,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-10T19:37:42.072910Z","submitted_at":"2025-09-09T16:08:03Z","title":"Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties"},"reference_resolution":{"displayed":3,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":3},"total_outbound_references":3},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"thesis":"As of 11 August 2026, this Paper Citation Record lists 3 of 3 outbound references and 0 inbound Pith citation observations for arXiv:2509.07886."}