{"as_of":"2026-08-05T13:07:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:2a7ff2472155cfbb2a853ae72a61bbc0f634f7c8e10e57cf412a8b661c040db4","coverage":[{"denominator":10,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":10,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-02T21:37:46.366994Z","state":"measured"},{"denominator":10,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":10,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-05T06:32:48.257954+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2602.19635/citation-record","integrity":"/paper/2602.19635/integrity","json":"/paper/2602.19635/citation-record.json","paper":"/paper/2602.19635"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T21:37:46.277811Z","title":null,"venue":null,"work_id":null,"year":2007},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:46.277811Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:e4d65b7b1c2ac09c566f7098b58ba229ae7563fdc47fccff7ee845f1db4cd59d","observation_id":"d466e8ee-3c6f-4905-9936-60a0e37927bd","resolution":{"observed_at":"2026-08-02T21:37:46.277811Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.2478/s11772-011-0033-3","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Terahertz detectors and focal plane arrays,","venue":"Opto-Electronics Review","work_id":"d8e9edc5-f318-41ed-b256-7236050dd88d","year":2011},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:45.633937Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:4ca0439fc744af97044038d795e21f2ff6adf73b8bde32c9769fc6d5cea1822a","observation_id":"e7de039c-43d1-405a-9288-336575c6363a","resolution":{"observed_at":"2026-08-02T21:38:18.947656Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/s10762-015-0184-2","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Microbolometer Terahertz Focal Plane Array and Camera with Improved Sensitivity in the Sub-Terahertz Region,","venue":"Journal of Infrared Millimeter and Terahertz Waves","work_id":"83145a57-6060-439f-9d73-75f332067f96","year":2015},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:45.711921Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:9fa51793f6c3a8770e2327f7110f20b752ed76fa231f2c5aed83af5604c77b78","observation_id":"e47559e4-51f5-4966-b17d-72b2ac30c064","resolution":{"observed_at":"2026-08-02T21:38:18.798417Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/s00138-013-0570-5","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Thermal cameras and applications: a survey,","venue":"Machine Vision and Applications","work_id":"0c266e06-b8da-48db-8d25-c7296b10afaa","year":2014},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:45.805087Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:7e657d4de1c266ecee4997f5eb1a6c8c129a617650db577a472b95a9d184fbf0","observation_id":"58c24329-8516-4df4-b82e-d134b005d00d","resolution":{"observed_at":"2026-08-02T21:38:18.672479Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.optmat.2017.04.057","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Dielectric and structural characterisation of chalcogenide glasses via terahertz time-domain spectroscopy,","venue":"Optical Materials","work_id":"8270c4a1-2da6-4991-9d53-84b766c8840f","year":2017},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:45.970268Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:ccdce240b29ada5afb79ab991f72041089f637fecd99680124aac472c9021359","observation_id":"eb7eb963-3af7-444c-89fc-29ea35979bb6","resolution":{"observed_at":"2026-08-02T21:38:18.431890Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/adfm.200601117","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Large-Size Bulk and Thin-Film Stilbazolium-Salt Single Crystals for Nonlinear Optics and THz Generation,","venue":"Advanced Functional Materials","work_id":"e0f658ad-acb2-41de-9b2d-5650c10fa0a8","year":2018},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:46.046311Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:5cce16483eed768b92bf2135d02354a55c5a7276236983fdcc859071ab3a9591","observation_id":"49a3cda1-96ed-4e49-9ae6-83a27910543e","resolution":{"observed_at":"2026-08-02T21:38:18.132912Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsphotonics.2c01336","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"A New Standard in High-Field Terahertz Generation: the Organic Nonlinear Optical Crystal PNPA,","venue":"ACS Photonics","work_id":"bd6e72b0-946b-49f7-b3a4-80ba5bec1c03","year":2022},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:46.105180Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:a648c3efb684f1fa2e152a0ca5f4a6b5b7980cb477816a958b0546059f9e2363","observation_id":"9eb418ee-cdd6-4c6d-929d-775e2f754522","resolution":{"observed_at":"2026-08-02T21:38:17.838403Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T21:37:46.188415Z","title":"Terahertz real-time imaging uncooled array based on antenna-and cavity-coupled bolometers,","venue":null,"work_id":null,"year":2012},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:46.188415Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:71ee10d5ec742febbcd247e5c75f71367cc4f862778ddbd6f9a986af053f35ec","observation_id":"fab8b2b0-e388-49b6-ad8f-9b88994c3975","resolution":{"observed_at":"2026-08-02T21:37:46.188415Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T21:37:46.366994Z","title":"Free-space electro-optic sampling of terahertz beams","venue":null,"work_id":null,"year":1995},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":347,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:46.366994Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:f812c0b721cbf4f6b24a3293e487e0b58d2491814f9ce27bd03842bdc880c873","observation_id":"4707f643-0a10-4a21-94b6-212c6f910f59","resolution":{"observed_at":"2026-08-02T21:37:46.366994Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T21:37:45.885258Z","title":"Available: https://www.mdpi.com/2076-3417/9/12/2531","venue":null,"work_id":null,"year":2076},"citing_paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras","version":4},"reference_index":2019,"source":"pdf_text","source_observed_at":"2026-08-02T21:37:45.885258Z"},"links":{"citing_paper":"/paper/2602.19635"},"observation_digest":"sha256:6932de2bf4a5875c181d2c5a28d8d731e09545566c759ac9c403ea1709488413","observation_id":"6a1e71ab-e6fb-47f3-acc9-3c0e73f909a1","resolution":{"observed_at":"2026-08-02T21:37:45.885258Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"paper":{"arxiv_id":"2602.19635","last_updated":"2026-06-30T14:39:38Z","latest_version":4,"primary_category":"physics.optics","snapshot_observed_at":"2026-08-02T21:37:36.908982Z","submitted_at":"2026-02-23T09:25:32Z","title":"Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras"},"reference_resolution":{"displayed":10,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":4,"verified_exact":6,"verified_fuzzy":0},"total_outbound_references":10},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-05T06:32:48.257954+00:00","source":"crossref"},{"observed_at":"2026-08-05T06:32:44.755628+00:00","source":"retraction_watch"}],"thesis":"As of 5 August 2026, this Paper Citation Record lists 10 of 10 outbound references and 0 inbound Pith citation observations for arXiv:2602.19635."}