{"as_of":"2026-07-25T09:21:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:765f065aa5b1e45e97e822304a37f7cbee96b47693413f47e29008260a5888a6","coverage":[{"denominator":24,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":24,"source":"paper_references, paper_reference_links","source_observed_at":"2026-05-10T14:55:33.008785Z","state":"measured"},{"denominator":25,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":25,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-07-25T06:30:59.84592+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-05-07T17:36:17.598196Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"pith","source_observed_at":"2026-05-11T23:16:37.117650Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"cited_work":{"arxiv_id":"2604.11571","doi":null,"metadata_source":"pith","pith_arxiv_id":"2604.11571","snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","venue":"physics.ins-det","work_id":"d1a76245-8ea4-405b-b24f-d269e7417523","year":2026},"citing_paper":{"arxiv_id":"2604.23956","last_updated":"2026-06-21T13:39:32Z","snapshot_observed_at":"2026-07-06T23:10:07.178566Z","submitted_at":"2026-04-27T02:00:42Z","title":"Systematic Investigation of Acceptor Removal in HPK LGADs with Modified Gain Layers","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-05-07T17:36:17.598196Z"},"links":{"cited_paper":"/paper/2604.11571","citing_paper":"/paper/2604.23956"},"observation_digest":"sha256:b7717540106c1c38e2fd20b84c03ce6ee9163496240865e52cd6055bec34e3bc","observation_id":"2f42fbdb-65b9-4399-be7e-66414bd5b7ef","resolution":{"observed_at":"2026-05-11T23:16:37.126357Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2604.11571/citation-record","integrity":"/paper/2604.11571/integrity","json":"/paper/2604.11571/citation-record.json","paper":"/paper/2604.11571"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Pellegrini, P","venue":null,"work_id":"aadf1a71-a012-450a-aee1-23d86debfd41","year":2014},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:3c9a678cca1aee7f4d6a91bcc16776fe7c82ede7d9492ad9cf0de4efe185c36b","observation_id":"ce34cf3a-0fbe-4893-bd1b-92bcf9a3cc2c","resolution":{"observed_at":"2026-05-18T11:02:35.746931Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Cartiglia, R","venue":null,"work_id":"4201741c-083a-4db1-b91c-a55bcf711893","year":2022},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:c2a283bfff4775321f600289f8869369c889a2826090747cea7b03bd907c796d","observation_id":"ed1583b2-dc47-4969-ab5c-40ade91f090a","resolution":{"observed_at":"2026-05-18T11:02:35.768264Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Technical report, CERN, Geneva","venue":null,"work_id":"0d23fd00-1e6e-47a1-b9bb-2ec02207986c","year":2020},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:8bfae2532b1193e7b964882afdfb104e30309e485849ef6bc2794358a9024c90","observation_id":"b7c712cb-d852-4b8d-9d84-6702eb912bc2","resolution":{"observed_at":"2026-05-18T11:02:35.772475Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"A MIP Timing Detector for the CMS Phase-2 Upgrade","venue":null,"work_id":"4921ac19-152c-4093-8cc7-ab32134411f4","year":2019},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:032085e56f7a61d57a5e9736ee06c333ab074314f3df0db02b82c6f0c7b84511","observation_id":"ca2a985c-222c-4d5c-b342-260b72be4aa6","resolution":{"observed_at":"2026-05-18T11:02:35.754932Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"The IDEA detector concept for FCC-ee","venue":null,"work_id":"ca10a535-6f8e-4b48-9223-6c0fee321af4","year":2025},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:915a9095cbaa611dd721978255787eff0563d456ac0f51c8faf9cde4d1963603","observation_id":"f2847c58-945c-45e9-a1ca-ecf62e96896a","resolution":{"observed_at":"2026-05-18T11:02:35.757577Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Holmes, Sergo Jindariani, Kiley E","venue":null,"work_id":"8b729d26-9686-48da-b9d2-b7aa9e6d6255","year":2025},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:446fc8cacf19ead66313043d848db7c2854227fac6feeb7ac935f905d19344d4","observation_id":"b397286c-df7a-416e-a562-9534b2f3f596","resolution":{"observed_at":"2026-05-18T11:02:35.701839Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"291bfd7f-280e-4161-8bbc-0f483f039470","year":2024},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:326e14ad13a6b7d49f064aede8ae06d9786f6b9dc32987c31a8528015a672775","observation_id":"5d463102-bc8f-4755-851e-0a8d5a3ec00f","resolution":{"observed_at":"2026-05-18T11:02:35.665007Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"e07b3b6d-6290-4404-96cb-52e093806df7","year":2024},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:597836bb8ad9d34ca80d1ce1d9e997ee25416fd0ac47d8127fd950968e67fdbb","observation_id":"60dbf5e4-d460-4b4f-8f29-08e151d2e265","resolution":{"observed_at":"2026-05-18T11:02:35.736417Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"et al Kramberger","venue":null,"work_id":"aad448cd-be03-47ff-bfa2-3ba894b1d92f","year":2015},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:ef048bee9ac614c3f0998e50a2d64d08bce1221a19b50c8416fee3927b0e65fe","observation_id":"a7fbf5c1-ae3e-4f6f-8198-957988a84be5","resolution":{"observed_at":"2026-05-18T11:02:35.721258Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Beresford et al","venue":null,"work_id":"2fa6905d-d633-4cad-9206-ee63c40bb387","year":2023},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:31c7fc3cbd697031082c2556cd414798becc238833d0f1930c563c3143405e3e","observation_id":"e00bc38a-de71-410f-8ace-5ab9366899a4","resolution":{"observed_at":"2026-05-18T11:02:35.724919Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"First study of single-event burnout in very-thin planar silicon sensors.Frontiers in Physics, V olume 13 - 2025","venue":null,"work_id":"bca95c41-4957-4120-89de-62ceba5c2be0","year":2025},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:a9c63f0db805421b9f76ea3ddd71a2b42a7a9edc24af29c25cbde7f78a411315","observation_id":"68b536cd-3fce-49af-a3ef-969238e6f09f","resolution":{"observed_at":"2026-05-18T11:02:35.728931Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"bd1d6a66-edaa-4d45-a9f8-e0fdc473793c","year":1993},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:c3ca14fa55c72c90720399c9de93dfec64ae9b4edb5c4f3b7add8d2d41310468","observation_id":"5fdc95a6-5a76-41e4-8583-b6e096f878d5","resolution":{"observed_at":"2026-05-18T11:02:35.764264Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"63d51761-8986-44ca-b3ac-b33dcc9b4b6d","year":1925},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:7b1093ff9caae830707d7379f564583e7614f9d0f8e211f29e186f313ec5c536","observation_id":"54aa6ebf-0311-4c53-8284-5a3f7a26c87d","resolution":{"observed_at":"2026-05-18T11:02:35.743441Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Dachs and J","venue":null,"work_id":"98b41a8c-08db-4670-b5fe-192d00b53d3a","year":1996},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:a7b2fff5b6740e1e0c556dde85165d3748bc72004240d6f966d09bece03a417b","observation_id":"065773b4-dddc-4b62-b501-165ffa6fe9b6","resolution":{"observed_at":"2026-05-18T11:02:35.715156Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Waskiewicz and J","venue":null,"work_id":"dd07fd8e-5d4e-4b89-a459-f657f494b362","year":1998},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:4b874e712811e0a6807aa0cf1fc9739e879b58068791759f5a287c40fba33f2a","observation_id":"aba7b8ac-9cce-44fe-8c94-68a55858d3b6","resolution":{"observed_at":"2026-05-18T11:02:35.707173Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"https://www.bnl.gov/tandem/","venue":null,"work_id":"dd38569b-62b2-4f37-ba91-6f84b7345f72","year":2026},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:df7f3872a1a345850c8308172f8d00c86f13e4a948f3d681156e340e5c6d8210","observation_id":"e0a5d5ec-6229-44fd-9357-65ff3925bd6a","resolution":{"observed_at":"2026-05-18T11:02:35.760170Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Thieberger","venue":null,"work_id":"7d70b3ce-e7ed-4e70-a899-0c3761d7aa4e","year":1984},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:b38bb97d5d5ac32545ca1415d756b0bc741a9169e63ca0f0de210d358a40e8dc","observation_id":"87e0cfee-3252-40c7-9ad0-64a1e85dd640","resolution":{"observed_at":"2026-05-18T11:02:35.770161Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"da883a60-949a-4aed-92a1-c423c0dbe6d2","year":1986},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:c5e69fb613397f58177d963a24e20010fbf8ae72ca307e77136f36a3a19bb4ef","observation_id":"3de9ad3d-8fa1-4817-a552-388f3e88377f","resolution":{"observed_at":"2026-05-18T11:02:35.752364Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"94ee6102-dd23-4f26-921b-fe2b0bed163c","year":2021},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:2928b8caf6f7fb15cd3f5c4fd7e1a4f3114069d2f8a531bb2778d8642f1c3a72","observation_id":"fb6f0c2a-1144-4690-83e2-b646cd005303","resolution":{"observed_at":"2026-05-18T11:02:35.712376Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Development of a technology for the fabrication of Low-Gain Avalanche Diodes at BNL.Nuclear Inst","venue":null,"work_id":"5147148c-9e12-47a5-b8a3-43666631ecaa","year":2019},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:0686e6a2739667483d1ab2f6d9e984dc4b9ffd78a9cf70a9ed860f68b1c0eb3a","observation_id":"5ef129af-1c41-4fcb-bfc9-10cfc67d19ca","resolution":{"observed_at":"2026-05-18T11:02:35.679263Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Rhode Island Nuclear Science Center, n.d","venue":null,"work_id":"71ccdfe9-4cca-4ebb-bf3d-51720f670f10","year":2026},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:947e6a16819f5316128a91520a11b339ea5dc38f0f40373d048e1d9cfbc69d53","observation_id":"ad9d5916-08d4-4092-80c2-14c1738a67b6","resolution":{"observed_at":"2026-05-18T11:02:35.740753Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Radiation Damage in Silicon Detector Devices","venue":null,"work_id":"268b7579-da39-4183-8636-69001f868f5d","year":2024},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:034ea38879af60f75d37dccf2fe404845c322dd6875fe08cd2abccfd3d604c2b","observation_id":"78b85ee5-b581-4ede-bae1-c8248bcb9fd2","resolution":{"observed_at":"2026-05-18T11:02:35.693214Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"History of the seu test facilitiy, n.d","venue":null,"work_id":"e482b446-57da-498d-80e8-679d34b88db6","year":2026},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:3279d408b804a79783c28b73080fcdaa75d64915160983372846e6590ec8c472","observation_id":"dc42243d-1c84-49da-8efd-f8633022ed57","resolution":{"observed_at":"2026-05-18T11:02:35.710360Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"LGAD mortality triggered by highly ionizing particles","venue":null,"work_id":"905db7cf-ae1e-4460-a8e0-d3e463e02b3b","year":2026},"citing_paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition","version":2},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-05-10T14:55:33.008785Z"},"links":{"citing_paper":"/paper/2604.11571"},"observation_digest":"sha256:b08181d56bca60b23e06599f97a0a1b6df827d9fb59160021a8bd781da984be4","observation_id":"fbd114b1-fd88-42fc-bcb3-cc00255845b0","resolution":{"observed_at":"2026-05-18T11:02:35.763548Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-07-25T06:30:59.84592+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2604.11571","last_updated":"2026-04-17T18:23:48Z","latest_version":2,"primary_category":"physics.ins-det","snapshot_observed_at":"2026-07-06T22:59:54.573362Z","submitted_at":"2026-04-13T14:51:33Z","title":"Mortality of ultra-thin LGADs and PiN diodes from high energy deposition"},"reference_resolution":{"displayed":24,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":24},"total_outbound_references":24},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-07-25T06:30:59.84592+00:00","source":"crossref"},{"observed_at":"2026-07-25T06:30:55.222588+00:00","source":"retraction_watch"}],"thesis":"As of 25 July 2026, this Paper Citation Record lists 24 of 24 outbound references and 1 inbound Pith citation observation for arXiv:2604.11571."}