{"as_of":"2026-08-06T13:18:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:8e54f058bfaa2649374e95749157206c0f5e6db89041e882137b5a7c7cf5cab4","coverage":[{"denominator":11,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":11,"source":"paper_references, paper_reference_links","source_observed_at":"2026-05-10T11:39:20.378551Z","state":"measured"},{"denominator":11,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":11,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-06T06:34:29.942622+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2604.14680/citation-record","integrity":"/paper/2604.14680/integrity","json":"/paper/2604.14680/citation-record.json","paper":"/paper/2604.14680"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"When subjected to electrical stress, MOM devices typically exhibit non-volatile, volatile, or combined resistive switching responses","venue":null,"work_id":"b244e012-e43c-467b-980c-5c6edf6f4539","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:84685460b960823af3ae265a469a8e66b1e766fb3129589e14f1989f21f69169","observation_id":"bbfd7a3f-98ca-41b8-826d-af2cbbe10775","resolution":{"observed_at":"2026-05-19T13:43:06.016597Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"d9ced58f-5d36-4a4c-b137-898e9eefb3cc","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:bcc322716bb98fb42d39c7da2ef4e740c5c67ae05e4eb41d808bb872e41f88d7","observation_id":"a10a75ab-68a7-4500-8e6d-5166e3fd5103","resolution":{"observed_at":"2026-05-19T13:43:06.012292Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1912.08373","last_updated":"2019-12-18T04:11:25Z","snapshot_observed_at":"2026-07-06T08:45:17.636210Z","submitted_at":"2019-12-18T04:11:25Z","title":"Metal-oxide interface reactions and their effect on integrated resistive/threshold switching in NbOx","version":1},"cited_work":{"arxiv_id":"1912.08373","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"1912.08373","snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"1a shows a TEM image and EDX maps of a representative device cross -section, confirming the thickness and composition of the layered structure","venue":null,"work_id":"117bd846-7a41-4e76-8650-9ebd16572825","year":2020},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"cited_paper":"/paper/1912.08373","citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:b88212533b655ef1036c5c644a0402ac04384a78b6128a78dcc9e418332e83b7","observation_id":"026115d5-45b9-487c-b7e3-37d665a4ee64","resolution":{"observed_at":"2026-05-10T11:40:18.905695Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"9eb7914e-3a34-4036-bc2a-f0db4a2a8966","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:7d7f761a0572bf4acd501ce1be20646a69cb766977c4a3187159c07295e3607e","observation_id":"0220e956-e259-4cd6-9c3c-8a6318950aa0","resolution":{"observed_at":"2026-05-19T13:43:06.018193Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Figure S3: (a) Electroforming step of a 20 μm device with Pt/Nb/Nb₂O₅/Pt structure under current-controlled testing with a bidirectional current sweep from 0 to 800μA","venue":null,"work_id":"3ddd0be0-5313-4bf9-92e4-658c951ce2c1","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:9bc5a235d1d3d14cdfee65e14212de0f6d40d4c2bb8f18a488ca3aa58139c30b","observation_id":"ed4b3f84-0abc-48c3-a1e4-cbb3d0dd8ee0","resolution":{"observed_at":"2026-05-19T13:43:06.008300Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Figure S4: (a) ToF-SIMS images showing oxygen (O-) distribution in a Pt/Nb/Nb₂O₅/Pt device (maximum current applied through the device = 800 μA)","venue":null,"work_id":"c867dc76-c6c7-4199-aaf5-797c7383a948","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:22c008337f10bf1f9e4e7f2e65301e9b1a8d386d740956be4c5db4c78dd0754b","observation_id":"9135bb41-632c-4f3a-af64-491a02739c0e","resolution":{"observed_at":"2026-05-19T13:43:06.006503Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"The finite element simulations employed the electric currents and heat transfer modules in COMSOL to simultaneously solve the coupled electrical and thermal transport equations","venue":null,"work_id":"a31e0fee-938e-4bfe-bdcf-6ed8b212fe1b","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:7a1a3e24838ca75abe1830e796efacf54444829fb34f62941ed6c6822f83e82a","observation_id":"02e60045-f191-47a1-9be8-1ce1417dea2e","resolution":{"observed_at":"2026-05-19T13:43:06.010436Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"0b8f1d04-ff18-4a7f-bb71-0b9c09a10b3e","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:63de7fb8869d3c8fb75b1e45e40e9b80869f05b4a7f3b23c36c27119b07ad69f","observation_id":"295d188a-d7c8-4045-bbb5-857f56ad16a0","resolution":{"observed_at":"2026-05-19T13:43:06.002302Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":null,"venue":null,"work_id":"3a4f1ef8-4572-495f-aa6b-3cfb5387e129","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:e1b2133d5f692796dc12d736b3105b50d3cbb9d46557b960fbe12be536705cb5","observation_id":"b0b75129-c67e-4002-a9d4-082137259fdc","resolution":{"observed_at":"2026-05-19T13:43:06.004372Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-06-05T21:23:00.469572Z","title":"Figure S7: Electroforming and TEM imaging of the filamentary area in devices with (a) 10 μm Pt/Nb(5 nm)/NbOx/Pt and (b) 10 μm Pt/Nb(10 nm)/NbOx/Pt structures","venue":null,"work_id":"a564b7b2-5938-499f-a4e7-f7cace6a431f","year":null},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:5c20620592d0b2215a15b5a1fe3751a67f4330e7743bb3db5df79bb163b03b91","observation_id":"794bd23b-0634-43c6-88f9-53a41250b2d7","resolution":{"observed_at":"2026-05-19T13:43:06.014494Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/aelm.201800954","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"(c) Cycle- to-cycle variability of threshold and hold voltages in a Pt/Nb/Nb2O5/Pt device with a 30 nm Nb electrode","venue":"Advanced Electronic Materials","work_id":"b1197930-d528-4834-911f-246c985ffb75","year":2020},"citing_paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-05-10T11:39:20.378551Z"},"links":{"citing_paper":"/paper/2604.14680"},"observation_digest":"sha256:fbdccb498e733a06fe6c3227774683a130f383de2b2b4a1a3d459476df668f3f","observation_id":"b131c08f-e5a4-420b-9b9a-5285088aeeb0","resolution":{"observed_at":"2026-05-10T11:40:18.626404Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2604.14680","last_updated":"2026-04-16T06:37:08Z","latest_version":1,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-07-31T06:59:53.862003Z","submitted_at":"2026-04-16T06:37:08Z","title":"Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors"},"reference_resolution":{"displayed":11,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":4,"verified_exact":2,"verified_fuzzy":5},"total_outbound_references":11},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-06T06:34:29.942622+00:00","source":"crossref"},{"observed_at":"2026-08-06T06:34:23.284952+00:00","source":"retraction_watch"}],"thesis":"As of 6 August 2026, this Paper Citation Record lists 11 of 11 outbound references and 0 inbound Pith citation observations for arXiv:2604.14680."}