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Integrity report for Understanding oxide-thickness-dependent variability in dense Si-MOS quantum dot arrays

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.12143

0Critical
0Advisory
4Detectors run
2026-05-20Last checked

Paper page arXiv integrity.json

Detector runs

doi_title_agreement completed v1.0.0 · findings 0 · 2026-05-20 15:01:25.903581+00:00
doi_compliance completed v1.0.0 · findings 0 · 2026-05-20 10:55:17.834116+00:00
claim_evidence completed v1.0.0 · findings 0 · 2026-05-19 23:01:58.334956+00:00
ai_meta_artifact completed v1.0.0 · findings 0 · 2026-05-19 10:42:20.005529+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/2605.12143/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.