{"as_of":"2026-08-16T11:14:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:7783524e1da7f4dc2b7a84f336d16bf1faa70c9652e3828faf509cf22e8055c2","coverage":[{"denominator":24,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":24,"source":"paper_references, paper_reference_links","source_observed_at":"2026-07-09T15:40:44.176178Z","state":"measured"},{"denominator":24,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":24,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-16T06:30:59.297886+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2607.07273/citation-record","integrity":"/paper/2607.07273/integrity","json":"/paper/2607.07273/citation-record.json","paper":"/paper/2607.07273"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/pssb.200983650","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Zhang, S.-W","venue":"physica status solidi (b)","work_id":"aa2cc297-5b89-40ac-bf84-45213619272a","year":2010},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:b9a861a1f788a5a207542b84e1a24b4009a1d9ab7a49922cf972d4c64f506456","observation_id":"8e7cf97e-82d4-4582-8732-90148423a5f5","resolution":{"observed_at":"2026-07-09T15:46:19.166108Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2020.10085","doi":"10.1016/j.apmt.2020.10085","metadata_source":"arxiv_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-07-11T11:50:26.030339Z","title":"Calahorra, B","venue":null,"work_id":"7aeb53db-c90e-42c6-b5ec-6705dd3bff05","year":2020},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:e7298a063125204c0acbd50e7d4bd09bb5edadf2f6c2b841ab5e8d0bfafe556c","observation_id":"732981a0-1367-4c6e-8cd7-0aada4b45219","resolution":{"observed_at":"2026-07-09T15:46:19.137341Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-07-09T15:46:19.244774Z","title":"Zhang, S","venue":null,"work_id":"62d5c187-e11c-4fbc-9071-535f34f3ba41","year":2015},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:e6ef3c88ccda029b6b09a07bbbd3cc51820ef8c19ee229b8422b3415d5fab2c7","observation_id":"0e21c216-5447-48c8-b297-aea0859abfc5","resolution":{"observed_at":"2026-07-09T15:46:19.245846Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsami.5c18520","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"ACS Applied Materials & Interfaces","work_id":"667b6040-3cb8-405b-9252-cbdab2930427","year":2025},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:2743ab72f229029ac26edcf9d52e3b7d217e2188d8bb7d7c1b99293d498b00a1","observation_id":"78e375bb-a8f1-4d48-a2cb-95a5fe6f1217","resolution":{"observed_at":"2026-07-09T15:46:19.164500Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsami.3c06257","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Huang, L.-X","venue":"ACS Applied Materials & Interfaces","work_id":"63a15dc0-14ea-41b5-9dce-c4757495a181","year":2023},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:059bb55fa78f1043ce6f540b74302b3aa0284ea5edcd52a422c2b2fdd046ebb7","observation_id":"4d659032-848d-417d-be19-e7de66789c8e","resolution":{"observed_at":"2026-07-09T15:46:19.141422Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/s1452-","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-07-09T15:46:19.149571Z","title":null,"venue":null,"work_id":"e087697c-be49-438d-b4dd-0453c72c0c7a","year":2012},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:c04f7a21916929101ad55e7174e4545c32961ed4751761e735c03e9e90cf0bfb","observation_id":"2f23ca12-b5c4-4d92-8778-3edc8345c2d3","resolution":{"observed_at":"2026-07-09T15:46:19.150872Z","resolver_source":"doi_truncated","status":"malformed_identifier"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.4752259","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"Journal of Applied Physics","work_id":"fb5deab6-efa9-484b-a9cd-abcc6b079f78","year":2012},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:5193be7bb37a4af481d6ab88395528ceef07919e83a52662158e9f9fb0752dab","observation_id":"0bc08177-2994-45c7-ae89-a451344b2d73","resolution":{"observed_at":"2026-07-09T15:46:19.143433Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.snb.2011.01.034","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Ramizy, Z","venue":"Sensors and Actuators B Chemical","work_id":"6105a608-0466-405e-bbfe-b1861afec059","year":2011},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:22b24d4012f5be89005ac7a01c869b64db077297c03c29c04f58aff72658a7e9","observation_id":"ce1f3649-8b9b-4bee-ae28-8e5bd7deeaec","resolution":{"observed_at":"2026-07-09T15:46:19.171158Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/1.4903246","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Benton, J","venue":"Applied Physics Letters","work_id":"460ca1c5-e65e-4d03-a4cd-d127bbf23bd7","year":2014},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:6be518b8041ea4159d3d68eccbfd46729ad1c484a03470803f95b2fedea95638","observation_id":"5aa681e1-5ad6-40b6-90bd-0c855c84bdc0","resolution":{"observed_at":"2026-07-09T15:46:19.141773Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/adom.202400221","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"Advanced Optical Materials","work_id":"9b9ad1d1-bfda-4064-ba2d-14298d998f8f","year":2024},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:2d94c031e56e7804290009b86d3193d4417cc2323f2340b8dc0537006e899b45","observation_id":"7792e2c2-a750-4983-aaad-781f9395298a","resolution":{"observed_at":"2026-07-09T15:46:19.148938Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1002/pssr.202100234","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Keller, S","venue":"physica status solidi (RRL) - Rapid Research Letters","work_id":"ea166fcb-15b6-462b-b394-25f69615cd0b","year":2021},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:c164024bc06eb63e6843f1e685cdfa65bcabfdd8869762447dcf0f7ddf040ac3","observation_id":"71985c8e-2324-4824-b7f6-7b30f0427fe6","resolution":{"observed_at":"2026-07-09T15:46:19.160411Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acsphotonics.5b00216","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Zhang, S","venue":"ACS Photonics","work_id":"c05ff9de-4508-4be3-b722-944af82597e6","year":2015},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:a0eb470b28769b1a1e31d8f3e983aae18baf3034ba14e7a391230c8ddc699071","observation_id":"fe08b40f-39b2-4a1f-a5e1-724e6dce59ce","resolution":{"observed_at":"2026-07-09T15:46:19.147128Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/5.0325215","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Zhang, B","venue":"Journal of Applied Physics","work_id":"139b45f6-12bb-432d-8450-76f99f2f17e7","year":2026},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:c95cc0eefda3b8e6237d3222199b15222c5236163f175715f06cff5df2a11713","observation_id":"bd8f77c6-6d65-401d-9e0d-fa324c8fc8ed","resolution":{"observed_at":"2026-07-09T15:46:19.139687Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/srep45344","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"Scientific Reports","work_id":"4f509b4e-f3f4-4f03-96ab-5f6ba4c7484f","year":2017},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:e4f343012e89ac1e7070c97811a3af8b148c5286a7a813f72ed9ea371b5dab92","observation_id":"3c36711e-2307-402b-974b-c624690f426c","resolution":{"observed_at":"2026-07-09T15:46:19.169589Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1088/1742-6596/1368/3/032015","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"Journal of Physics Conference Series","work_id":"2ef6df0c-6db9-4188-b832-3297132f48e8","year":2019},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:777a388bcfcce0c08b13f565345f3c3b92bc869bb4bbdefec2deb58db0bc84ca","observation_id":"c6d74676-e0ac-436f-9071-dc7bff7c8320","resolution":{"observed_at":"2026-07-09T15:46:19.153136Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.matchar.2014.05.014","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Salzer, S","venue":"Materials Characterization","work_id":"da544e50-b3a3-4e18-9623-1282210d1748","year":2014},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:3ae1a3e76ccb80a1a076461f6c90a49953512e0340ddc2aeff524fd6f46f255e","observation_id":"fb7262d0-091a-4072-b09d-80cafbea7c0b","resolution":{"observed_at":"2026-07-09T15:46:19.145140Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1016/j.ultramic.2009.11.013","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Jørgensen, K","venue":"Ultramicroscopy","work_id":"54f56ae3-b803-4370-a993-f424f8601741","year":2010},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:94467c1d5292206b2895d2b8baae7749715ce634a36b40c829e34d8e98ba9ec1","observation_id":"5f1085ef-e1a8-4373-ae5c-ddef32917353","resolution":{"observed_at":"2026-07-09T15:46:19.158400Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2023.141680","doi":"10.1016/j.cej.2023.141680","metadata_source":"arxiv_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Sciazko, Y","venue":"Chemical Engineering Journal","work_id":"c3b54b7f-5baf-4ee5-8ba2-a0108628b921","year":2023},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:9139db2d9f6b8936a234c7ea1ee2f459776477f7c327eae4db8187bf1e4a7bb3","observation_id":"05aa32c4-4731-4ea6-a3df-c0041bdd1ea8","resolution":{"observed_at":"2026-07-09T15:46:19.155833Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.2478/s11534-011-0096-2","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Nečas, P","venue":"Open Physics","work_id":"54eebfc8-b5b3-49c8-8b1e-fff06f971014","year":2012},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:558221769b4d6cd4663ae4d15174aea887aebd975f07a6c6ed6122f0e5b0ce26","observation_id":"52a9c9c0-36b5-4b67-a86b-ef804d92cb36","resolution":{"observed_at":"2026-07-09T15:46:19.157842Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-05-22T06:52:55.527022+00:00","source":"crossref_status_cache"},{"observed_at":"2026-05-22T06:52:55.527022+00:00","source":"openalex_status_cache"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":"2026.121957","doi":"10.1016/j.actamat.2026.121957","metadata_source":"arxiv_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Thornley, M","venue":"Acta Materialia","work_id":"f8cf5242-dfd5-4b1e-bc6f-2fc88a0d1c04","year":2026},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:45aa658493b32c84524ebee1bf722b195b116efc8749b32b72c7166aed78a1e2","observation_id":"c44d718a-4b03-4078-a73b-d2a953042199","resolution":{"observed_at":"2026-07-09T15:46:19.162832Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/acs.jpcc.3c05297","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Medjahed, C","venue":"The Journal of Physical Chemistry C","work_id":"3f18129e-d5fd-4e47-b6d1-8c6c04ea93bb","year":2024},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:7ba4fc94dd92fc88b352130db89cbc723cba5d33777d261389b7e0653b56d8cf","observation_id":"10b06aca-4a05-4d44-b822-31a34625adc1","resolution":{"observed_at":"2026-07-09T15:46:19.162290Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1021/nn700389j","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Chen, J.-S","venue":"ACS Nano","work_id":"c902f8fc-3943-419b-b63a-fa45442de2a3","year":2008},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:8b5e148e0fa37c147da368b785ac4f6168d5419d48cf2849da9fa3bbae66030e","observation_id":"6dd38b1e-c2b7-4036-9561-2ac6cb75ceff","resolution":{"observed_at":"2026-07-09T15:46:19.172807Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1155/2022/1482877","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Kuntyi, G","venue":"Advances in Materials Science and Engineering","work_id":"5390d6bb-aa36-4f0c-8fb3-ddbd0a13f43c","year":2022},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:2aa75c27590bd520e9efb7c54f3c6ff63dcef7e53da6b24b1d10c7813cb8d0f3","observation_id":"4f4e8bf4-0cf8-4db4-a3aa-b30d063fa557","resolution":{"observed_at":"2026-07-09T15:46:19.167696Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/5.0325374","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"Journal of Applied Physics","work_id":"2246e5bf-55cb-4590-b89e-79df33f0d6c4","year":2026},"citing_paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-07-09T15:40:44.176178Z"},"links":{"citing_paper":"/paper/2607.07273"},"observation_digest":"sha256:d993e3d6b9ea7e760b950d4afadb895921909221217c21319388b6f2ade4643f","observation_id":"3038f594-74bd-4c9f-8e30-6dcb0d0b06a5","resolution":{"observed_at":"2026-07-09T15:46:19.159898Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2607.07273","last_updated":"2026-07-08T11:01:32Z","latest_version":1,"primary_category":"cond-mat.mtrl-sci","snapshot_observed_at":"2026-08-07T20:17:01.101464Z","submitted_at":"2026-07-08T11:01:32Z","title":"Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films"},"reference_resolution":{"displayed":24,"state_counts":{"malformed_identifier":1,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":22,"verified_fuzzy":1},"total_outbound_references":24},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-16T06:30:59.297886+00:00","source":"crossref"},{"observed_at":"2026-08-16T06:30:54.164669+00:00","source":"retraction_watch"}],"thesis":"As of 16 August 2026, this Paper Citation Record lists 24 of 24 outbound references and 0 inbound Pith citation observations for arXiv:2607.07273."}