{"as_of":"2026-08-08T15:27:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:298ccd5e2578c0c7961e39f1878f1bdfe423a7d6eec0801ffe6a8d7dd397ab7a","coverage":[{"denominator":49,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":49,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-02T05:30:15.306031Z","state":"measured"},{"denominator":49,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":49,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-08T06:32:00.761636+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2607.13368/citation-record","integrity":"/paper/2607.13368/integrity","json":"/paper/2607.13368/citation-record.json","paper":"/paper/2607.13368"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.200475Z","title":"Applications of machine learning to machine fault diagnosis: A review and roadmap.Mechanical systems and signal processing, 138:106587, 2020","venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.200475Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:ab60d7532d1cdc3ae27cdf28f62d2ba82be9690611561fba6cacd88f3f7cf8fd","observation_id":"9ef303c3-c592-4645-8d46-6e078e18d929","resolution":{"observed_at":"2026-08-02T05:30:12.200475Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.274397Z","title":null,"venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.274397Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:18ab71548dd4e7f717cf0fb2d35beb81a118f60dbbe42deba71dfb774a30cfb0","observation_id":"959c792a-d422-4188-8098-98209654b930","resolution":{"observed_at":"2026-08-02T05:30:12.274397Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.319185Z","title":"A transferable diagnosis method with incipient fault detection for a digital twin of wind turbine.Digital Engineering, 1:100001, 2024","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.319185Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:640238bf13d550570373a92d6f6afc7d84d1fba346f83ab6078d9d6940258622","observation_id":"b123cd93-936c-4290-bed5-5ce80453db5e","resolution":{"observed_at":"2026-08-02T05:30:12.319185Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.377370Z","title":"From theory to industry: A survey of deep learning-enabled bearing fault diagnosis in complex environments.Engineering Applications of Artificial Intelligence, 163:113068, 2026","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.377370Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:d39ff2eb3ddb731ee9a9c90d05a9b8cc38f4b36c6da0eed654fad96d5cbe6fe1","observation_id":"522bac9c-206c-45fe-bfd8-ebcb239c61e1","resolution":{"observed_at":"2026-08-02T05:30:12.377370Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.413177Z","title":"Deep learn- ing and its applications to machine health monitoring.Mechanical systems and signal processing, 115:213–237, 2019","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.413177Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:68412798fd675639f7a540b3c02c24924485a36ece0222df564f89c31da1547a","observation_id":"f6449324-0aea-4c3b-98a6-fd6e6a556509","resolution":{"observed_at":"2026-08-02T05:30:12.413177Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.474904Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.474904Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:c61565b674b108a5480fe5da3a11c2458d34dac4e0d32b77f694f99e4be9f397","observation_id":"4b0c89a4-f952-4bf3-b898-7925e9630fd7","resolution":{"observed_at":"2026-08-02T05:30:12.474904Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.541551Z","title":null,"venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.541551Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:b7ebe27ed95e562cae2a9750da052abd7095f6770df058e9e89df9f6c45ffc6b","observation_id":"c09134ca-6d93-45de-997f-26d1b40bf9c7","resolution":{"observed_at":"2026-08-02T05:30:12.541551Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.596930Z","title":"A lightweight hybrid model-based condition monitoring method for grinding wheels using acoustic emission signals.Measurement Science and Technology, 36(1):016145, 2025","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.596930Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:3c1279b5772bfa8027adde497f3ef51b9fae15d898a3bc9e9ff99a7b7f607a33","observation_id":"83876daf-e289-4865-855b-1d8ebbdea74d","resolution":{"observed_at":"2026-08-02T05:30:12.596930Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.654679Z","title":null,"venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.654679Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:1200ae630085b75cdf95d2705318887df3cbeee441d4abd8dbcf303d2e1922a3","observation_id":"1bbfc61c-9a46-4a13-8001-6b4a5f990869","resolution":{"observed_at":"2026-08-02T05:30:12.654679Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.737368Z","title":"Opensetrecognition methods for fault diagnosis: A review","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.737368Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:68774bbb4c6930dab96e2cad17c4445820befc94200e5de04e78d53fb4a52f7d","observation_id":"a0e59b5c-55f2-48d9-a852-de3e69abc925","resolution":{"observed_at":"2026-08-02T05:30:12.737368Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.791211Z","title":"Center margin loss-based uncertainty-aware fault diagnosis for rotating machines to identify unseen faults.Journal of Computational Design and Engineering, page qwag057, 2026","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.791211Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:c849689f85b365b14c6abe36978d0c626acdbd722a1aab9e3a09b1c1bb094bc8","observation_id":"f7ea94f4-6584-4b57-a822-546a1400b0f2","resolution":{"observed_at":"2026-08-02T05:30:12.791211Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.877318Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.877318Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:fb5b4d54e620908c4d28bf0a0fe6d4a58af07288c38861ef494db7c6423aec60","observation_id":"1e8eedc6-3479-4dda-8ddb-1f09d68c90f8","resolution":{"observed_at":"2026-08-02T05:30:12.877318Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:12.945904Z","title":"From coarse to fine-grained open-set recognition","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:12.945904Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:23fd2b34410ee22d541f4a47b3c2c2308f6d802016d11ac861e48adbb9bc5916","observation_id":"8550aa31-56c0-4ab1-b4ae-bcefc06933a9","resolution":{"observed_at":"2026-08-02T05:30:12.945904Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.008293Z","title":"Rolling element bearing diagnostics using the case western reserve university data: A benchmark study.Mechanical systems and signal processing, 64:100– 131, 2015","venue":null,"work_id":null,"year":2015},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.008293Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:ef82cde2b92981aae0a0d0b1c24ecd91dd1bcc14fd8bcf89eaaa187c6eda973c","observation_id":"838f11ff-c4ff-4537-8781-49811d15a692","resolution":{"observed_at":"2026-08-02T05:30:13.008293Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.090259Z","title":"Towards open set deep networks","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.090259Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:57dbfa159087bf48d0f31465a84e6d2e80e2e9456a2ae2e1e78814b67fb08c1b","observation_id":"2977b059-d0e5-48ce-8cef-38b17b0c85ad","resolution":{"observed_at":"2026-08-02T05:30:13.090259Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.164774Z","title":"An adaptive expansion network for incremental fault diagnosis in open and dynamic industrial systems.Engineering Applications of Artificial Intelligence, 181:115589, 2026","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.164774Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:91b690f9ebdc277b10f469cd260c6dbf7e4fa91e5979b9d4ef31e7db7f28a3af","observation_id":"09b1070e-7537-482a-aab8-ff55f22eda2b","resolution":{"observed_at":"2026-08-02T05:30:13.164774Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.231584Z","title":"Convolutional pro- totype network for open set recognition.IEEE Transactions on Pattern Analysis and Machine Intelligence, 44(5):2358–2370, 2020","venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.231584Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:5e8f6f81893ab55332265ffb072bde2ba12f2e286188a6269de07b5d9b94c299","observation_id":"ba93855d-3d1e-4d5f-a085-5bfc84c9bb04","resolution":{"observed_at":"2026-08-02T05:30:13.231584Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.306525Z","title":"Adversarial reciprocal points learning for open set recognition.IEEE Transactions on Pattern Analysis and Machine Intelli- gence, 44(11):8065–8081, 2021","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.306525Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:161f5096284d4afe0bc7be4a1cf17b792b0eb8752f960781740bed2626efec49","observation_id":"1be0db6e-ede9-42a7-9d78-37e98d0fa60a","resolution":{"observed_at":"2026-08-02T05:30:13.306525Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.365872Z","title":"A comparative study of time–frequency representations for bearing and rotating fault diagnosis using vision transformer.Machines, 13(8):737, 2025","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.365872Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:c8c2f44b05c9236e9fcace5c0df4bc2496ae3f0a0e9b4f431e55cbf9ec1603b7","observation_id":"2c588569-3637-479a-bdaf-f30a73a4a4cc","resolution":{"observed_at":"2026-08-02T05:30:13.365872Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.421741Z","title":"Frequency-enhanced neural networks with a hybrid spall-size estimator for bearing fault diagnosis.Journal of Computational Design and Engineering, 12(5):1–20, 2025","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.421741Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:34f0f725f04e9affc40e149589732c2b0a1a0c287e10bc8663863ee0d83fb019","observation_id":"5764d4fb-443c-4f98-a009-f78674ef2c2c","resolution":{"observed_at":"2026-08-02T05:30:13.421741Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.515205Z","title":null,"venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.515205Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:b390b76ddcf1bcfcb18db01554d741da7d2f0f8c8531a7520838fe75a659505f","observation_id":"5b1f7b3e-b280-40c2-ba5f-673f429568f4","resolution":{"observed_at":"2026-08-02T05:30:13.515205Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.597533Z","title":"An efficient adaptive window size selection method for improving spectrogram visualization.Computational intelligence and neu- roscience, 2016(1):6172453, 2016","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.597533Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:1b2bc1e6ed5153fcf68dccab343bf1a04d04358d8249fb3a8e93fe84641d9759","observation_id":"dd5a8d6e-3539-489e-8657-3c1f1be6b6df","resolution":{"observed_at":"2026-08-02T05:30:13.597533Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.651224Z","title":"A fault information-guided variational mode decomposition (fivmd) method for rolling element bearings diagnosis.Mechanical Systems and Signal Processing, 164:108216, 2022","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.651224Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:11b22e137880bda39fe7da60688ed8ce9c4a0ecb0fe7f7ae56972fd09b2523e0","observation_id":"dc591902-7fd4-471e-90d5-ab16e8ff620c","resolution":{"observed_at":"2026-08-02T05:30:13.651224Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.706779Z","title":"A motor bearing fault method using fast optimized signal decomposition-based deep learning model.Journal of Mechanical Science and Technology, 40(2):977–991, 2026","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.706779Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:8c2b1183b5ebba7604d677f351032b8962d34b97f1ff41f23e2b65869dff3149","observation_id":"472b74bf-7714-442d-9c9f-e3631b3357b9","resolution":{"observed_at":"2026-08-02T05:30:13.706779Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.800779Z","title":"Deep-learning-based open set fault diagnosis by extreme value theory.IEEE Transactions on Industrial Informatics, 18(1):185–196, 2021","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.800779Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:febc26ec48fa88cfa76dab1da2ceceeda3eb5e9ea2b11a30e3aac5097e49a616","observation_id":"2c8b40e2-8d7a-4b22-b4c5-fbfe6fd151c6","resolution":{"observed_at":"2026-08-02T05:30:13.800779Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:13.918264Z","title":"Open set fault classification for rotatory machine by dnn’s neuron activation similarity score.IEEE Sensors Journal, 2025","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:13.918264Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:63cdeb9fa19ef0f567694d7edad883f5b6d8d3f8e24282987e7cd1a5d2733b3a","observation_id":"11c37140-4eec-455a-8442-939af78d055e","resolution":{"observed_at":"2026-08-02T05:30:13.918264Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.011300Z","title":"Deep variational autoencoder classifier for intelligent fault diagnosis adaptive to unseen fault categories.IEEE Transactions on Reliability, 70(4):1581–1595, 2021","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.011300Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:045e7e10550d3d7d4dce81e0d4934209041ba6580d42dc20cbd05d6b3a9a49d8","observation_id":"200713d0-4a8f-4168-b3e8-f2175595dd32","resolution":{"observed_at":"2026-08-02T05:30:14.011300Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.075531Z","title":"A simple unified framework for detecting out-of-distribution samples and adversarial attacks.Advances in neural information processing systems, 31, 2018","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.075531Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:b32db123c3f89f675f8fd332caeef213676d0a1ba776e5bfe976cf54bfcf7a82","observation_id":"7e65c992-2fd6-4662-bab0-32ee5006f3bd","resolution":{"observed_at":"2026-08-02T05:30:14.075531Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"1812.02765","last_updated":"2018-12-06T19:34:30Z","snapshot_observed_at":"2026-08-08T09:03:37.393459Z","submitted_at":"2018-12-06T19:34:30Z","title":"Improving Reconstruction Autoencoder Out-of-distribution Detection with Mahalanobis Distance","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1812.02765","snapshot_observed_at":"2026-08-02T05:30:14.153406Z","title":"Improving reconstruction autoencoder out-of-distribution detection with mahalanobis distance.arXiv preprint arXiv:1812.02765, 2018","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.153406Z"},"links":{"cited_paper":"/paper/1812.02765","citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:3834b3404566efa99071720fcf56aedf09554f7560d69fca5fab066b96270146","observation_id":"42d58488-6e80-403c-8c3e-08da69bb5ee2","resolution":{"observed_at":"2026-08-02T05:30:14.153406Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.224284Z","title":"Gaussian latent representations for uncertainty estimation using mahalanobis distance in deep classifiers","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.224284Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:c91433384b220165cf6171be570f3f333492fc94d3e28497f41248b7d25d00cd","observation_id":"58686095-22cc-4f6a-a637-6ef2da6d2944","resolution":{"observed_at":"2026-08-02T05:30:14.224284Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2505.18032","last_updated":"2025-05-23T15:36:22Z","snapshot_observed_at":"2026-08-07T14:34:20.141833Z","submitted_at":"2025-05-23T15:36:22Z","title":"Mahalanobis++: Improving OOD Detection via Feature Normalization","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2505.18032","snapshot_observed_at":"2026-08-02T05:30:14.277852Z","title":"Mahalanobis++: Improving ood detection via feature normalization.arXiv preprint arXiv:2505.18032, 2025","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.277852Z"},"links":{"cited_paper":"/paper/2505.18032","citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:bdfbab997bb09d49600466464144a0ab4e173b9039d80271e8c094b16462bd98","observation_id":"417b084a-b48d-4cd5-b1b9-7c94448ea68b","resolution":{"observed_at":"2026-08-02T05:30:14.277852Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.330220Z","title":"Open-set fault diagnosis for industrial rotating machines based on trustworthy deep learning.IEEE Transactions on Industrial Cyber-Physical Systems, 2025","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.330220Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:8ec457f81e174160ae73eabf52f8614205a17e9487100b7a853185cf0c8114b8","observation_id":"3eef9af9-7450-4d7b-8d85-77bbf9cf845c","resolution":{"observed_at":"2026-08-02T05:30:14.330220Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.381148Z","title":"Implicit supervision for fault detection and segmentation of emerging fault types with deep variational autoencoders.Neurocomputing, 454:324–338, 2021","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.381148Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:a4549a9a2bcc6acf12a5d34eba0a0b391a000e7a8ce69d019fd8e32da8cdbc08","observation_id":"432711aa-6237-41ff-89e5-1f36896dc56c","resolution":{"observed_at":"2026-08-02T05:30:14.381148Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.433517Z","title":"Class-specific semantic recon- struction for open set recognition.IEEE transactions on pattern analysis and machine intelli- gence, 45(4):4214–4228, 2022","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.433517Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:3d91b9c93cf933bbfc3d43a153f971af9c9222d522514888a0ce50ea6099f6a6","observation_id":"36d51fac-37a0-461f-b5c6-022cbf89faa6","resolution":{"observed_at":"2026-08-02T05:30:14.433517Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.494543Z","title":"Towards open- set fault diagnosis for reactor coolant pumps under unknown fault conditions","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.494543Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:f448f20caa82cbd547b4cb710a3037203064b7b5dcd8202062e120432b8dac45","observation_id":"0b4f9672-8f98-4932-892b-5eb4d84e27cd","resolution":{"observed_at":"2026-08-02T05:30:14.494543Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.538891Z","title":"Rousseeuw","venue":null,"work_id":null,"year":1987},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.538891Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:83fa298a7716e210e9de70dfb8d83df61a90b3b8d97e09a9abfd4de0c569cfc3","observation_id":"2a7e102d-336e-421a-b84d-869c1121c97e","resolution":{"observed_at":"2026-08-02T05:30:14.538891Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.604987Z","title":"Devit: Decomposing vision transformers for collaborative inference in edge devices.IEEE Transactions on Mobile Computing, 23(5):5917–5932, 2023","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.604987Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:665f1f81852ec55319083de21b3bc7a2450c4d930e46faa53604c4bbe45caaa8","observation_id":"95438de5-79ff-408c-a53a-a9a4e24e02bb","resolution":{"observed_at":"2026-08-02T05:30:14.604987Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.664916Z","title":"Light-weight cnn enabled edge-based framework for machine health diagnosis.IEEE Access, 9:84375–84386, 2021","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.664916Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:95670cbb21caa4cdc953d669121831de2ef40899b3f0895f139b4213a25521fa","observation_id":"56d84537-97e5-48e7-a99e-334f58efebe9","resolution":{"observed_at":"2026-08-02T05:30:14.664916Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.728232Z","title":"Condition monitoring of bearing damage in electromechanical drive systems by using motor current signals of electric motors: A benchmark data set for data-driven classification","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.728232Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:8af8ba8ac33fc69f250a87e44db1cba2091252e724bf71c90c1fad0857453e2e","observation_id":"ef8f4b4d-a717-4401-a54e-7a9eabc9869e","resolution":{"observed_at":"2026-08-02T05:30:14.728232Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.781524Z","title":"Algorithms for hyper- parameter optimization.Advances in neural information processing systems, 24, 2011","venue":null,"work_id":null,"year":2011},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.781524Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:668aba399cc0b50340b4f24449b3f87a71e35a794acbbe169525fc12a7f259f8","observation_id":"895cc03b-eed1-47eb-82e1-ce57b09a11c0","resolution":{"observed_at":"2026-08-02T05:30:14.781524Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.824929Z","title":"Hy- perband: A novel bandit-based approach to hyperparameter optimization.Journal of Machine Learning Research, 18(185):1–52, 2018","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.824929Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:fa017b1d26d1df43431a3b4c116b1d618645b606f3b59055d629c8ea4e10dbb5","observation_id":"3f3cae58-3304-4964-b9be-54c6f179a3cd","resolution":{"observed_at":"2026-08-02T05:30:14.824929Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.888676Z","title":"Bohb: Robust and efficient hyperparameter optimization at scale","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.888676Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:3e0ac262a43a54b57fab4c98433af03400ce22b08f4e7f18912e0ccb5c3a7831","observation_id":"d85fa434-a2ff-462f-a825-1e3e816a793a","resolution":{"observed_at":"2026-08-02T05:30:14.888676Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:14.943500Z","title":"Optuna: A next-generation hyperparameter optimization framework","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:14.943500Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:22fe49d7fb100e552e8e9e44aeee7b22da2815f00c7d40d7fcae804d923dc606","observation_id":"c37ca6f9-7d1d-450d-a6d9-959908005ed6","resolution":{"observed_at":"2026-08-02T05:30:14.943500Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:15.019110Z","title":null,"venue":null,"work_id":null,"year":1948},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:15.019110Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:f46abda139b878742e999daf210ab04d6b603fb91b6a1e113aebbdbcbd5d2e12","observation_id":"cf500643-4b0f-4a2e-b0a8-2394bfc5ab1f","resolution":{"observed_at":"2026-08-02T05:30:15.019110Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:15.090579Z","title":"A dendrite method for cluster analysis.Communications in Statistics, 3(1):1–27, 1974","venue":null,"work_id":null,"year":1974},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:15.090579Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:5fe6be23a23320d119e261d99faf2fab1df4f66a95e172fa9f5cd754170e9992","observation_id":"f7f3c10b-4de4-44f3-b38c-c85fc0b13da1","resolution":{"observed_at":"2026-08-02T05:30:15.090579Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:15.145403Z","title":"On a measure of divergence between two statistical populations defined by their probability distributions.Bulletin of the Calcutta Mathematical Society, 35:99– 109, 1943","venue":null,"work_id":null,"year":1943},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:15.145403Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:1d229f63463bb5296e248e8b8f6c231b4f3bb6138c371858961927991957240b","observation_id":"468ec429-2ce6-4810-a62c-fc431da27f6c","resolution":{"observed_at":"2026-08-02T05:30:15.145403Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:15.199193Z","title":null,"venue":null,"work_id":null,"year":1974},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:15.199193Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:01db569b83132ad6140b1b897a457a598bc534d75b8d49b5bc6d1b44297d0142","observation_id":"64f3386b-8ae5-461d-9746-0a32e9d23aa8","resolution":{"observed_at":"2026-08-02T05:30:15.199193Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:15.246237Z","title":null,"venue":null,"work_id":null,"year":1936},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:15.246237Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:ad699843d98010324a6b9824f3ebf81aca798d5df59e2e3440d8e0f1503e4b5a","observation_id":"51ff2dfc-72a1-43b5-b2e5-e26fee6fa93f","resolution":{"observed_at":"2026-08-02T05:30:15.246237Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-02T05:30:15.306031Z","title":"Davies and Donald W","venue":null,"work_id":null,"year":1979},"citing_paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-02T05:30:15.306031Z"},"links":{"citing_paper":"/paper/2607.13368"},"observation_digest":"sha256:04e74254bd6d2e56fc8a9a0b21a2385f71ae8ffbed504fc857e9221dc04b0541","observation_id":"c7d232dc-9dcc-4624-97ab-aee142125653","resolution":{"observed_at":"2026-08-02T05:30:15.306031Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"paper":{"arxiv_id":"2607.13368","last_updated":"2026-07-15T01:10:25Z","latest_version":1,"primary_category":"eess.SP","snapshot_observed_at":"2026-08-07T05:45:42.123758Z","submitted_at":"2026-07-15T01:10:25Z","title":"Fine-Grained Open-Set Fault Diagnosis via Metric-Guided Time-Frequency Configuration Selection and Class-Specific Autoencoders"},"reference_resolution":{"displayed":49,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":49,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":49},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-08T06:32:00.761636+00:00","source":"crossref"},{"observed_at":"2026-08-08T06:31:55.24221+00:00","source":"retraction_watch"}],"thesis":"As of 8 August 2026, this Paper Citation Record lists 49 of 49 outbound references and 0 inbound Pith citation observations for arXiv:2607.13368."}