{"as_of":"2026-08-09T21:13:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:1506dcf4fca7341cdc08307393a2fb4475234eb3cd53eac1d7e7a35eb59d6d9d","coverage":[{"denominator":47,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":47,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-01T09:41:22.184967Z","state":"measured"},{"denominator":47,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":47,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-09T06:31:02.800959+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2607.20701/citation-record","integrity":"/paper/2607.20701/integrity","json":"/paper/2607.20701/citation-record.json","paper":"/paper/2607.20701"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:15.786403Z","title":"Efficient near-field far-field transformation for nonredundant sampling representation on arbitrary surfaces in near-field antenna measurements,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:15.786403Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:82764f3f7db8eb1ad95e9900579b70819913fa7727f9db5e5ef05bb23a381758","observation_id":"6a36876c-8f2a-4d92-9e32-93072c2aa400","resolution":{"observed_at":"2026-08-01T09:41:15.786403Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:15.896740Z","title":"Antenna characterization from a small number of far-field measurements via reduced-order models,","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:15.896740Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:f1333277bf427600418bf468e6d233af679caa038921660c3e192c983d2acf38","observation_id":"a338e34b-bf89-4f2a-89b6-41a8f18ba5b5","resolution":{"observed_at":"2026-08-01T09:41:15.896740Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:16.036996Z","title":"Fast antenna far-field characterization via sparse spherical harmonic expansion,","venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:16.036996Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:1876e19c6b513989a92fdfc2331ed80f625d954ed1947980f517b6d48d2a4625","observation_id":"fb3983fd-d352-4dc7-8115-28e65a84bf75","resolution":{"observed_at":"2026-08-01T09:41:16.036996Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:16.149241Z","title":"Singular value optimization in inverse electromagnetic scattering,","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:16.149241Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:e43ea82de0bff24a5a6c64063589a42dcdbb2c7f7c27b9a0410c4a808fd68281","observation_id":"79bba87b-041a-4238-8aca-3cc35889197a","resolution":{"observed_at":"2026-08-01T09:41:16.149241Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:16.255170Z","title":"A two-step inverse-scattering technique in variable- exponent lebesgue spaces for through-the-wall microwave imaging: Experimental results,","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:16.255170Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:f52621f326545c9b0f959c6f419b68f38cad3d6706b22fea136738057160c87b","observation_id":"f5e03c0f-40ba-455c-89b5-c0219394baea","resolution":{"observed_at":"2026-08-01T09:41:16.255170Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:16.413844Z","title":"Near-field transverse reso- lution in planar source reconstructions,","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:16.413844Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:8619693bb90325ab8a4e23085037db60f813b68a8042d4bcb9864234083d58ff","observation_id":"f19d5826-d36c-445d-83f6-03d88c02a52d","resolution":{"observed_at":"2026-08-01T09:41:16.413844Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:16.561100Z","title":"Inverse source problem and minimum-energy sources,","venue":null,"work_id":null,"year":2000},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:16.561100Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:585b65e487bb9a9c4039b9982e21ead72869bf483a5743276f55f19ff8e86839","observation_id":"36588fc1-cf21-4cde-a0ce-8732770850bb","resolution":{"observed_at":"2026-08-01T09:41:16.561100Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:16.701654Z","title":"Reactive near-field reconstruction via Rayleigh–Sommerfeld integral: Ill-conditioning analysis and regulariza- tion,","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:16.701654Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:82c221e9791a653142dad6b84037f332f8c25893339282c7c297b368ed5f891c","observation_id":"91f4b910-ee7e-45d2-b65f-b46365cbb486","resolution":{"observed_at":"2026-08-01T09:41:16.701654Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:16.879714Z","title":"Inverse source in the near field: The case of a strip current,","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:16.879714Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:0077de57141d549f16adf4eddc543c213633f93c94e8cfa7c65d0bc54e703d25","observation_id":"7e0175c8-3326-4363-8b67-13ea9fe4e737","resolution":{"observed_at":"2026-08-01T09:41:16.879714Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.025275Z","title":"Electromagnetic inverse scattering: Re- trievable information and measurement strategies,","venue":null,"work_id":null,"year":1997},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.025275Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:43e9531226a1ccbf89c437fc37352f6611dd8cba079f3fce57a0f787e4d4c6ea","observation_id":"b8ceea29-b94a-4537-82a3-a1bcc9a501c5","resolution":{"observed_at":"2026-08-01T09:41:17.025275Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.155702Z","title":"An overview of near-field antenna measurements,","venue":null,"work_id":null,"year":1986},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.155702Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:0c18c21d5fb8e8b05152c1e74c74ba2eabe39909c77bad2091801ac65ed43cae","observation_id":"32b10c49-2035-4aa2-9b52-e138d85df015","resolution":{"observed_at":"2026-08-01T09:41:17.155702Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.284970Z","title":null,"venue":null,"work_id":null,"year":1993},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.284970Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:7ace5274daf67740ef51d779e9f64d230962406afd462106cd4c85e0557c529c","observation_id":"60cd0c3c-29f7-49a0-8053-373891cda6e7","resolution":{"observed_at":"2026-08-01T09:41:17.284970Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.410039Z","title":"Communicating with waves between volumes: Evaluating orthogonal spatial channels and limits on coupling strengths,","venue":null,"work_id":null,"year":2000},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.410039Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:acef834d7da13a7af0eb9f09af13db26dd9c80e3673fda02ccefe3b0d21d998a","observation_id":"acca3cd5-030d-4ad1-894d-cf4b11c2e05e","resolution":{"observed_at":"2026-08-01T09:41:17.410039Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.541694Z","title":"IV light and information,","venue":null,"work_id":null,"year":1961},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.541694Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:63aa605cdd0c611698d78cd79c2e00ed48a870b2021300ac2eb25c8b7a8a0678","observation_id":"46e58e10-25b3-4516-86fd-1e8697701d49","resolution":{"observed_at":"2026-08-01T09:41:17.541694Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.696425Z","title":"On the degrees of freedom of scattered fields,","venue":null,"work_id":null,"year":1989},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.696425Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:10dd3788c83fbdbbc0c9621b8f935b6fb1fba6d0859eb6c88b73212294d2bb74","observation_id":"726a75d5-fc2a-4e74-8f34-c3cc053b5a02","resolution":{"observed_at":"2026-08-01T09:41:17.696425Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.811708Z","title":"Franceschetti,Wave Theory of Information","venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.811708Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:f5bc38a5a4cf1bb9d8d948d4c8d08331763c3e202fa457d6a0c5fd69c49957a3","observation_id":"b651adbf-6981-456e-9b5b-745add7e181f","resolution":{"observed_at":"2026-08-01T09:41:17.811708Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:17.960827Z","title":"Degrees of freedom and sampling representation of electromagnetic fields: Concepts and applications","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:17.960827Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:d0bea8c4bc42d18d0fe224c3b588845fe40cadf3148270037001eb328e0e35d1","observation_id":"b0f4a3ab-395f-4692-b9e1-7142869459c6","resolution":{"observed_at":"2026-08-01T09:41:17.960827Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:18.115655Z","title":"Degrees of freedom in multiple-antenna channels: A signal space approach,","venue":null,"work_id":null,"year":2005},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:18.115655Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:848f647feb3773ed312ebbbbb9df58da916c2c734af14309978323b116af2c61","observation_id":"fb0dacd1-89cc-499d-bdd6-4686bb2634e1","resolution":{"observed_at":"2026-08-01T09:41:18.115655Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:18.291952Z","title":"Communicating with large intelligent surfaces: Fundamen- tal limits and models,","venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:18.291952Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:cf72b3f001d30229a7ab4986f4d5b052075fa06ee4f080568deb345d2701f5ba","observation_id":"a3c72677-11d8-4b08-b9e4-38b1cf07fcd6","resolution":{"observed_at":"2026-08-01T09:41:18.291952Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:18.397618Z","title":"Capacity of the continuous-space electromagnetic channel,","venue":null,"work_id":null,"year":2008},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:18.397618Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:aa1cf07e63547b6d98efdd59d74a7e85137064c2b86e172dcfa608fa9824416e","observation_id":"c0219dec-77dd-45a0-a3c1-c706fe3191fb","resolution":{"observed_at":"2026-08-01T09:41:18.397618Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:18.540734Z","title":"Maximizing independent channels and efficiency in BTS array antennas via EM degrees of freedom,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:18.540734Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:6576b41bd8c100d158b9c0abde55dba1ed221c3cb9743dab91c0ca22ae0e6007","observation_id":"e84e9429-0164-43dc-8b47-59ac64fd65fe","resolution":{"observed_at":"2026-08-01T09:41:18.540734Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:18.692088Z","title":"Breaking the degrees-of-freedom limit of holo- graphic MIMO communications: A 3-D antenna array topology,","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:18.692088Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:a4b7dbd07b2b7a0ab1de1c097cfcf5ed9947dddbc8d0fabdf9c0364d93c4e752","observation_id":"15bf6986-79e6-44d2-a3bc-5a84f535fbb8","resolution":{"observed_at":"2026-08-01T09:41:18.692088Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:18.824186Z","title":"Arendt, R","venue":null,"work_id":null,"year":2009},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:18.824186Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:c6842e3e11908f86c05f1f1fbc8bf58baf146c9878e51bcc18b1b7c68c9d2d69","observation_id":"6d40aeb6-0924-4bca-8684-6a00bb7c9db9","resolution":{"observed_at":"2026-08-01T09:41:18.824186Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:18.975509Z","title":"Representation of elec- tromagnetic fields over arbitrary surfaces by a finite and nonredundant number of samples,","venue":null,"work_id":null,"year":1998},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:18.975509Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:7bb978c2e83425016b9a78e4ca31b16823cfda889751b6be0c65a66575e56e39","observation_id":"00524d18-dfa1-41ed-8668-3a529dcd9f0b","resolution":{"observed_at":"2026-08-01T09:41:18.975509Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:19.099991Z","title":"Waves, modes, communications, and optics: A tutorial,","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:19.099991Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:64ef0f5d7a9d6b8d4290fdf7d8accbc0ffb903d25198d644029190ab8a14ab45","observation_id":"c8d2a13f-9170-488e-b602-c6c2d9a26aea","resolution":{"observed_at":"2026-08-01T09:41:19.099991Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:19.256355Z","title":"Electromagnetic degrees of freedom of an optical system,","venue":null,"work_id":null,"year":2000},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:19.256355Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:d3ea35a55ca5bb002419776be2154a92702b4ea6f9ee827bd3d203ddb24f3bba","observation_id":"ab083898-6d3d-4359-b55a-ebbe8303af56","resolution":{"observed_at":"2026-08-01T09:41:19.256355Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:19.403588Z","title":"Shadow area and degrees of freedom for free-space communication,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:19.403588Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:1c4d3a5f8208c2b0e383d79c1483dc1e768308de4c40ba2e7d133ad428fadc13","observation_id":"9da05079-5e34-4d23-96d3-09857e839228","resolution":{"observed_at":"2026-08-01T09:41:19.403588Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:19.548557Z","title":"Degrees of freedom for radiating systems,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:19.548557Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:d32cad4b4578b1c25286788239800acf63844cb69a8959bfa55c85e9285bc3a9","observation_id":"c5ce8646-a132-4c81-88af-0c637cd685f9","resolution":{"observed_at":"2026-08-01T09:41:19.548557Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:19.659207Z","title":"Efficient planar near-field measurements for radiation pattern evaluation by a warping strategy,","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:19.659207Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:4d46a034424d987caae5a3d4bcbaa0f5e7d9dcd843daa30ccfa48eeab34395f5","observation_id":"e465d591-0c60-4452-a6c7-af64f46eefc8","resolution":{"observed_at":"2026-08-01T09:41:19.659207Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:19.774251Z","title":"Asymptotic study of the radiation operator for the strip current in near zone,","venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:19.774251Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:67a6e1aa0996cbec7fc148d09ffd0c6cd500d31195b637c2591cb943094b291a","observation_id":"40014ca6-3de5-4e30-9b01-7a7ad9313a3f","resolution":{"observed_at":"2026-08-01T09:41:19.774251Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:19.893615Z","title":"NDF of the near-zone field on a line perpendicular to the source,","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:19.893615Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:225ddba3838af945494c58b563e46105104a708c651a547374d6d86f83edcf25","observation_id":"70de7961-3e9d-4a6e-87f4-8c6a152d3619","resolution":{"observed_at":"2026-08-01T09:41:19.893615Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.002907Z","title":"Dimension and sampling of the near-field and its intensity over curves,","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.002907Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:2c43f5ac451844d85e403836032ab7e6092bb9d8a82a233d569dda471dbaad61","observation_id":"b87db6e5-ac65-4006-8475-7f1f7a718d13","resolution":{"observed_at":"2026-08-01T09:41:20.002907Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.153055Z","title":"Sampling approach for singular system computation of a radiation operator,","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.153055Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:44f7bdc425aa919575ab3841f511ec3b69426cb4fb1857432078f35fd78f2e32","observation_id":"a81a67a6-adae-4041-9cf9-6476c39c3293","resolution":{"observed_at":"2026-08-01T09:41:20.153055Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.295045Z","title":"An intuitive approach to the optimal sampling of an electromagnetic field,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.295045Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:cb5eeb8dd572fec4c9d159a1f8d4186d3c53081a773651f02394a64317e7cd2b","observation_id":"bcdb647a-fb3b-43a4-a056-0f7ad892e684","resolution":{"observed_at":"2026-08-01T09:41:20.295045Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.408203Z","title":"An introduction to compressive sampling,","venue":null,"work_id":null,"year":2008},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.408203Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:9de8f6b60d02e34a83104822c0149e72044fea1f754fe25fb7898cd9e1d6ee5b","observation_id":"4a7686d0-f880-461c-94dc-86d29ef2d9b4","resolution":{"observed_at":"2026-08-01T09:41:20.408203Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.561241Z","title":"Optimizing sensing matrices for spherical near-field antenna measurements,","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.561241Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:10d17525272734d3b8598a5871c17190b93f1bf2240aef9adda3173b4f9f012b","observation_id":"e353432a-6fb7-4437-b0ff-8459b2b19a4f","resolution":{"observed_at":"2026-08-01T09:41:20.561241Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.703007Z","title":"Interpreting moment matrix blocks spectra using mutual shadow area,","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.703007Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:b62bd474d279216ba82ddaa6ac75a1ff19bdcda5b81d36e25d447f93e4bb5a4a","observation_id":"c2f17c5c-0b24-4547-b28d-45464d72e9ea","resolution":{"observed_at":"2026-08-01T09:41:20.703007Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.839740Z","title":"Ben-Israel and T","venue":null,"work_id":null,"year":1974},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.839740Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:443642cb49cca12f23f760f922362675871b3e2ec808bb1fbd4709d7bfdf5ff5","observation_id":"835d1fec-21a7-4c39-b893-29e7be8bb797","resolution":{"observed_at":"2026-08-01T09:41:20.839740Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.954098Z","title":null,"venue":null,"work_id":null,"year":1968},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.954098Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:e0971dc8b9c231c7793dac901b1c7aac43e86720871c54987886d8140753a072","observation_id":"f0cf6f51-0c86-44c2-b708-821561130f0d","resolution":{"observed_at":"2026-08-01T09:41:20.954098Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:20.988449Z","title":"The approximation of one matrix by another of lower rank,","venue":null,"work_id":null,"year":1936},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:20.988449Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:c89dc9730957978edad4f8b84511183bad9039d324ae113fdfbdb277f3a6c2be","observation_id":"7c928eca-20a2-443c-b221-efe62f5c860d","resolution":{"observed_at":"2026-08-01T09:41:20.988449Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2606.19666","last_updated":"2026-06-18T00:33:41Z","snapshot_observed_at":"2026-07-06T23:54:56.685241Z","submitted_at":"2026-06-18T00:33:41Z","title":"Degrees of Freedom and Beamforming for Large Intelligent Surfaces","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2606.19666","snapshot_observed_at":"2026-08-01T09:41:21.057538Z","title":"Degrees of freedom and beamforming for large intelligent surfaces,","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:21.057538Z"},"links":{"cited_paper":"/paper/2606.19666","citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:8288e2cd434ba07cc921a037d3cc70c58032be34bd40f83e2a704b5f04a0ff5d","observation_id":"f24c26f1-729b-4b34-a6dd-7e098a468857","resolution":{"observed_at":"2026-08-01T09:41:21.057538Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:21.183708Z","title":"Reduced-order models for electromagnetic scattering problems,","venue":null,"work_id":null,"year":2014},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:21.183708Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:8db2a54f80ed178122b94a685ac812231c5f59aa1b9e132f1cf5a01f9bc5de44","observation_id":"7c14f8c1-4335-4fbb-9edf-fd7c603454a8","resolution":{"observed_at":"2026-08-01T09:41:21.183708Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:21.361491Z","title":"The behavior of electromagnetic fields at edges,","venue":null,"work_id":null,"year":1972},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:21.361491Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:ae25b4496fe95811bf195e8f2c7434f8e70246fd0d8a8845c1b7d7283324f3d2","observation_id":"8e640f39-8fe8-48db-8e74-23deabbc2314","resolution":{"observed_at":"2026-08-01T09:41:21.361491Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:21.513835Z","title":"The edge condition in electromagnetics,","venue":null,"work_id":null,"year":1976},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:21.513835Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:622b787e34f5a55d0a9d51830654c1b3439d6fbdc7bab7258a363c35718ba08b","observation_id":"c8825c28-d7c9-4279-a55c-2dec802f749b","resolution":{"observed_at":"2026-08-01T09:41:21.513835Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:21.727753Z","title":"Charge singularity at the corner of a flat plate,","venue":null,"work_id":null,"year":1976},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:21.727753Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:4a251343a7e4f0a33bc93aeb102fd484244bfa2f5e9e6df166dfada0fd90eea3","observation_id":"01950956-b6c6-495b-95f6-994f8bca9302","resolution":{"observed_at":"2026-08-01T09:41:21.727753Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:21.949918Z","title":"Moment-method calculations on apertures using basis singular functions,","venue":null,"work_id":null,"year":1993},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:21.949918Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:f53832c93456b81395b71cf050d6f79e199e53c735e58742a27b46d0f18a0dc5","observation_id":"619f98a3-1fe3-4373-a99e-db906f11cbc1","resolution":{"observed_at":"2026-08-01T09:41:21.949918Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T09:41:22.184967Z","title":"Incorporation of edge conditions in moment method solutions,","venue":null,"work_id":null,"year":2003},"citing_paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources","version":2},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-01T09:41:22.184967Z"},"links":{"citing_paper":"/paper/2607.20701"},"observation_digest":"sha256:0bdc1111d4f8800960a1950282e482700ad73b0606cdcbefbfeba901920baf6c","observation_id":"12d78d31-4b8f-45ab-8408-358c59ede3c2","resolution":{"observed_at":"2026-08-01T09:41:22.184967Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"paper":{"arxiv_id":"2607.20701","last_updated":"2026-07-24T05:39:54Z","latest_version":2,"primary_category":"eess.SP","snapshot_observed_at":"2026-08-07T21:17:51.437363Z","submitted_at":"2026-07-22T20:13:05Z","title":"Near-Field Sampling for Line Sources"},"reference_resolution":{"displayed":47,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":47,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":47},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-09T06:31:02.800959+00:00","source":"crossref"},{"observed_at":"2026-08-09T06:30:57.326959+00:00","source":"retraction_watch"}],"thesis":"As of 9 August 2026, this Paper Citation Record lists 47 of 47 outbound references and 0 inbound Pith citation observations for arXiv:2607.20701."}