{"as_of":"2026-08-14T17:39:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:c98a44619a9120e0d849c59c9e916af949401aa233df4083f7910bc0447fe287","coverage":[{"denominator":10,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":10,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-14T04:15:56.673884Z","state":"measured"},{"denominator":10,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":10,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-14T06:32:32.682623+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2608.10146/citation-record","integrity":"/paper/2608.10146/integrity","json":"/paper/2608.10146/citation-record.json","paper":"/paper/2608.10146"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.827333Z","title":null,"venue":null,"work_id":"62878fa3-50a2-40b3-b65f-aee4503d7ee0","year":2018},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.632477Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:aa139b68dd774b70dfe84856109f44ff1ff8c95c0f6c325d468f7a34230757a5","observation_id":"fef7c61c-9dc9-410e-8ad1-8876a1ac547e","resolution":{"observed_at":"2026-08-14T04:15:56.831365Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.814380Z","title":null,"venue":null,"work_id":"db395639-2217-47f3-9290-b7d011f74bc5","year":2023},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.636435Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:5e21d447127252c0731beb818d31c3adf3e5fcb778af2d898094e3bb2840e9ab","observation_id":"9674cb33-2650-4ba9-ba58-383ed832ab23","resolution":{"observed_at":"2026-08-14T04:15:56.817977Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1007/s42452-019-0866-9","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.720844Z","title":"Quinten, SN Appl","venue":null,"work_id":"5e86177a-91bf-4ff9-9869-863ab022f3f5","year":null},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.645427Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:1e95f30e8744077e4ec2aa3091370571182a60829c43abc6dbb451a53292ff9a","observation_id":"aeb3de6a-97cf-40de-8b29-5425f2fc51bf","resolution":{"observed_at":"2026-08-14T04:15:56.724762Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.796734Z","title":null,"venue":null,"work_id":"45a04fed-8f20-490f-936c-80c8d91ee8c9","year":2019},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.650194Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:672bdf061cb7b9db979509fe2c8344087545ba79a51d5926b9de9b4819b8257c","observation_id":"d815b604-baac-41a6-9bf0-1660488e6f9c","resolution":{"observed_at":"2026-08-14T04:15:56.806007Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1117/1.jmm.24.2.024001","metadata_source":"doi_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.706928Z","title":null,"venue":null,"work_id":"86de5483-88cc-4e6d-a829-6f773e103a6a","year":null},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.654724Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:7d4dfbe47b19d1b674c111e4518322c542ec21f8f07446b5251e669d029f5928","observation_id":"03b92399-e228-46e7-9339-b7988f0001f6","resolution":{"observed_at":"2026-08-14T04:15:56.712239Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.785414Z","title":null,"venue":null,"work_id":"17ed7e9c-b82f-431c-bf11-0dd93122c656","year":2026},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.660183Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:356632a231ee5fbdb98737295d852bd0ebd130da04e1f3a07fa6607eaa0bd1ac","observation_id":"cc586877-7b2a-427a-8c14-fab45edcb884","resolution":{"observed_at":"2026-08-14T04:15:56.789266Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.774944Z","title":null,"venue":null,"work_id":"cea7bf74-354a-4d31-a459-33560ce93b93","year":2026},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.664045Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:3ca786ba564a95ce5e4a57d89fa09ba36eb4fde826e6965756ea165ce7f9efb7","observation_id":"e18b465d-5186-4d82-82c2-54d5b1aab8ab","resolution":{"observed_at":"2026-08-14T04:15:56.778776Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.764553Z","title":"Huang, C","venue":null,"work_id":"a2ef7578-5f8c-4d91-98e2-b02df775f7e1","year":2025},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.667344Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:c7daead0e4957a6b4a7d0ed22e65900b5a74466df1a401fb36e727176037b40d","observation_id":"50ee82ae-8aab-4121-94d7-b1352a98f8e3","resolution":{"observed_at":"2026-08-14T04:15:56.768242Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.752404Z","title":"Angus Macleod, Thin-Film Optical Filters, Fifth Edition (CRC Press, 2017)","venue":null,"work_id":"a034cc94-9097-4b04-b0e9-24a64302ffd8","year":2017},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.670717Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:483294e6c3c038a1f0260277991976446284c90125e9d723f2cad5719fd4f730","observation_id":"6de75659-7014-4793-93f3-d63b4064480a","resolution":{"observed_at":"2026-08-14T04:15:56.757264Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-14T04:15:56.740074Z","title":null,"venue":null,"work_id":"5c5b10af-c7dc-4308-8334-6276995d7b23","year":1978},"citing_paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-14T04:15:56.673884Z"},"links":{"citing_paper":"/paper/2608.10146"},"observation_digest":"sha256:b9abcd343a9fd95da14100aed0e3d05525512afd3000841c81580c265dd15ba3","observation_id":"5d5d3712-4758-4347-baf9-24fcdb9d446d","resolution":{"observed_at":"2026-08-14T04:15:56.744597Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2608.10146","last_updated":"2026-08-10T19:01:10Z","latest_version":1,"primary_category":"physics.optics","snapshot_observed_at":"2026-08-14T17:10:57.946346Z","submitted_at":"2026-08-10T19:01:10Z","title":"Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry"},"reference_resolution":{"displayed":10,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":6,"verified_exact":2,"verified_fuzzy":2},"total_outbound_references":10},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"thesis":"As of 14 August 2026, this Paper Citation Record lists 10 of 10 outbound references and 0 inbound Pith citation observations for arXiv:2608.10146."}