{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2021:2JQ7W2VWNQNRD7I27C34HC5XJ7","short_pith_number":"pith:2JQ7W2VW","schema_version":"1.0","canonical_sha256":"d261fb6ab66c1b11fd1af8b7c38bb74fe6e1e158a70ed88a3d4507fe0bba5200","source":{"kind":"arxiv","id":"2112.00705","version":2},"attestation_state":"computed","paper":{"title":"Wafer-Scale Characterization of a Superconductor Integrated Circuit Fabrication Process, Using a Cryogenic Wafer Prober","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall"],"primary_cat":"cond-mat.supr-con","authors_text":"Alex Wynn (2), Arthur Kurlej (2), Boulder, Chad Rogers (1), CO, Joshua T. West (1), Lexington, MA, Mark A. Gouker (2), Massachusetts Institute of Technology, Sergey K. Tolpygo (2) ((1) High Precision Devices, USA), USA (2) Lincoln Laboratory","submitted_at":"2021-12-01T18:31:51Z","abstract_excerpt":"Using a fully automated cryogenic wafer prober, we measured superconductor fabrication process control monitors and simple integrated circuits on 200 mm wafers at 4.4 K, including SQIF-based magnetic field sensors, SQUID-based circuits for measuring inductors, Nb/Al-AlOx/Nb Josephson junctions, test structures for measuring critical current of superconducting wires and vias, resistors, etc., to demonstrate the feasibility of using the system for characterizing niobium superconducting devices and integrated circuits on a wafer scale. Data on the wafer-scale distributions of the residual magneti"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2112.00705","kind":"arxiv","version":2},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.supr-con","submitted_at":"2021-12-01T18:31:51Z","cross_cats_sorted":["cond-mat.mes-hall"],"title_canon_sha256":"6493e2fd0ce568e25de7dc9c8f90f3741fb02f8d02b35d1c837f62a1985fd1bf","abstract_canon_sha256":"a03b9482e7b874b53e19ae0ccc302bd4d357bd996040b44297e323d1306abd01"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T05:38:20.543737Z","signature_b64":"r3Q4yd/Qci5rflv2nE9Cdycz1Itwj/0x6cp15ZlHsfxmfDeEMVGSaw30pQAsR3DQoDXNIa18fEw5OOnF/dRKAw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"d261fb6ab66c1b11fd1af8b7c38bb74fe6e1e158a70ed88a3d4507fe0bba5200","last_reissued_at":"2026-07-05T05:38:20.543310Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T05:38:20.543310Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Wafer-Scale Characterization of a Superconductor Integrated Circuit Fabrication Process, Using a Cryogenic Wafer Prober","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall"],"primary_cat":"cond-mat.supr-con","authors_text":"Alex Wynn (2), Arthur Kurlej (2), Boulder, Chad Rogers (1), CO, Joshua T. West (1), Lexington, MA, Mark A. Gouker (2), Massachusetts Institute of Technology, Sergey K. Tolpygo (2) ((1) High Precision Devices, USA), USA (2) Lincoln Laboratory","submitted_at":"2021-12-01T18:31:51Z","abstract_excerpt":"Using a fully automated cryogenic wafer prober, we measured superconductor fabrication process control monitors and simple integrated circuits on 200 mm wafers at 4.4 K, including SQIF-based magnetic field sensors, SQUID-based circuits for measuring inductors, Nb/Al-AlOx/Nb Josephson junctions, test structures for measuring critical current of superconducting wires and vias, resistors, etc., to demonstrate the feasibility of using the system for characterizing niobium superconducting devices and integrated circuits on a wafer scale. Data on the wafer-scale distributions of the residual magneti"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2112.00705","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2112.00705/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2112.00705","created_at":"2026-07-05T05:38:20.543378+00:00"},{"alias_kind":"arxiv_version","alias_value":"2112.00705v2","created_at":"2026-07-05T05:38:20.543378+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2112.00705","created_at":"2026-07-05T05:38:20.543378+00:00"},{"alias_kind":"pith_short_12","alias_value":"2JQ7W2VWNQNR","created_at":"2026-07-05T05:38:20.543378+00:00"},{"alias_kind":"pith_short_16","alias_value":"2JQ7W2VWNQNRD7I2","created_at":"2026-07-05T05:38:20.543378+00:00"},{"alias_kind":"pith_short_8","alias_value":"2JQ7W2VW","created_at":"2026-07-05T05:38:20.543378+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7","json":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7.json","graph_json":"https://pith.science/api/pith-number/2JQ7W2VWNQNRD7I27C34HC5XJ7/graph.json","events_json":"https://pith.science/api/pith-number/2JQ7W2VWNQNRD7I27C34HC5XJ7/events.json","paper":"https://pith.science/paper/2JQ7W2VW"},"agent_actions":{"view_html":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7","download_json":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7.json","view_paper":"https://pith.science/paper/2JQ7W2VW","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2112.00705&json=true","fetch_graph":"https://pith.science/api/pith-number/2JQ7W2VWNQNRD7I27C34HC5XJ7/graph.json","fetch_events":"https://pith.science/api/pith-number/2JQ7W2VWNQNRD7I27C34HC5XJ7/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7/action/timestamp_anchor","attest_storage":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7/action/storage_attestation","attest_author":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7/action/author_attestation","sign_citation":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7/action/citation_signature","submit_replication":"https://pith.science/pith/2JQ7W2VWNQNRD7I27C34HC5XJ7/action/replication_record"}},"created_at":"2026-07-05T05:38:20.543378+00:00","updated_at":"2026-07-05T05:38:20.543378+00:00"}