{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2024:2N7CO5KFSCZNG7RK2QQU4JWPZV","short_pith_number":"pith:2N7CO5KF","schema_version":"1.0","canonical_sha256":"d37e27754590b2d37e2ad4214e26cfcd73b3cbb4f809338fbdb6ceefcd4e9551","source":{"kind":"arxiv","id":"2409.07663","version":2},"attestation_state":"computed","paper":{"title":"Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Aaditya Bhat, Colin Gilgenbach, James M. LeBeau, Junghwa Kim, Menglin Zhu, Michael Xu","submitted_at":"2024-09-11T23:33:37Z","abstract_excerpt":"Here, we evaluate multislice electron ptychography as a tool to carry out depth-resolved atomic resolution characterization of point defects, using silicon carbide as a case study. Through multislice electron scattering simulations and multislice ptychographic reconstructions, we investigate the phase contrast arising from individual silicon vacancies, antisite defects, and a wide range of substitutional transition metal dopants (V\\textsubscript{Si} to W\\textsubscript{Si}) and potential detectability. Simulating defect types, positions, and microscope conditions, we show that isolated point de"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2409.07663","kind":"arxiv","version":2},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2024-09-11T23:33:37Z","cross_cats_sorted":[],"title_canon_sha256":"fcc52e9ae96b52c1b3966205a85145f807c4c121c5c0b406bc5f5e93cca80222","abstract_canon_sha256":"a3c731f0603dd0602fedf9545e787a991362962b791b81e1b018d90e6706051c"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T11:02:39.434370Z","signature_b64":"+Owh/pcarDooiVYwrqyooEgiMAsO00ZUfPiXjLos0vt9UDpoZtewmN88sMyY51Fnp4/eU1sFHEltsoe1CaTXDw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"d37e27754590b2d37e2ad4214e26cfcd73b3cbb4f809338fbdb6ceefcd4e9551","last_reissued_at":"2026-07-05T11:02:39.433875Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T11:02:39.433875Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Aaditya Bhat, Colin Gilgenbach, James M. LeBeau, Junghwa Kim, Menglin Zhu, Michael Xu","submitted_at":"2024-09-11T23:33:37Z","abstract_excerpt":"Here, we evaluate multislice electron ptychography as a tool to carry out depth-resolved atomic resolution characterization of point defects, using silicon carbide as a case study. Through multislice electron scattering simulations and multislice ptychographic reconstructions, we investigate the phase contrast arising from individual silicon vacancies, antisite defects, and a wide range of substitutional transition metal dopants (V\\textsubscript{Si} to W\\textsubscript{Si}) and potential detectability. Simulating defect types, positions, and microscope conditions, we show that isolated point de"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2409.07663","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2409.07663/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2409.07663","created_at":"2026-07-05T11:02:39.433939+00:00"},{"alias_kind":"arxiv_version","alias_value":"2409.07663v2","created_at":"2026-07-05T11:02:39.433939+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2409.07663","created_at":"2026-07-05T11:02:39.433939+00:00"},{"alias_kind":"pith_short_12","alias_value":"2N7CO5KFSCZN","created_at":"2026-07-05T11:02:39.433939+00:00"},{"alias_kind":"pith_short_16","alias_value":"2N7CO5KFSCZNG7RK","created_at":"2026-07-05T11:02:39.433939+00:00"},{"alias_kind":"pith_short_8","alias_value":"2N7CO5KF","created_at":"2026-07-05T11:02:39.433939+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV","json":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV.json","graph_json":"https://pith.science/api/pith-number/2N7CO5KFSCZNG7RK2QQU4JWPZV/graph.json","events_json":"https://pith.science/api/pith-number/2N7CO5KFSCZNG7RK2QQU4JWPZV/events.json","paper":"https://pith.science/paper/2N7CO5KF"},"agent_actions":{"view_html":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV","download_json":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV.json","view_paper":"https://pith.science/paper/2N7CO5KF","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2409.07663&json=true","fetch_graph":"https://pith.science/api/pith-number/2N7CO5KFSCZNG7RK2QQU4JWPZV/graph.json","fetch_events":"https://pith.science/api/pith-number/2N7CO5KFSCZNG7RK2QQU4JWPZV/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV/action/timestamp_anchor","attest_storage":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV/action/storage_attestation","attest_author":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV/action/author_attestation","sign_citation":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV/action/citation_signature","submit_replication":"https://pith.science/pith/2N7CO5KFSCZNG7RK2QQU4JWPZV/action/replication_record"}},"created_at":"2026-07-05T11:02:39.433939+00:00","updated_at":"2026-07-05T11:02:39.433939+00:00"}