{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2010:37MCZPPHQQ5TLFB5ADEZLBRM5Z","short_pith_number":"pith:37MCZPPH","schema_version":"1.0","canonical_sha256":"dfd82cbde7843b35943d00c995862cee5d2b634803df08ce8966d9eb11653fa9","source":{"kind":"arxiv","id":"1003.1314","version":2},"attestation_state":"computed","paper":{"title":"Analysis of Trace Impurities in Semiconductor Gas via Cavity-Enhanced Direct Frequency Comb Spectroscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.chem-ph","physics.optics"],"primary_cat":"physics.atom-ph","authors_text":"Florian Adler, Jun Feng, Jun Ye, Kevin C. Cossel, Kris A. Bertness, Mark W. Raynor, Michael J. Thorpe","submitted_at":"2010-03-05T17:08:07Z","abstract_excerpt":"Cavity-enhanced direct frequency comb spectroscopy (CE-DFCS) has demonstrated powerful potential for trace gas detection based on its unique combination of high bandwidth, rapid data acquisition, high sensitivity, and high resolution, which is unavailable with conventional systems. However, previous demonstrations have been limited to proof-of-principle experiments or studies of fundamental laboratory science. Here we present the development of CE-DFCS towards an industrial application -- measuring impurities in arsine, an important process gas used in III-V semiconductor compound manufacturin"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1003.1314","kind":"arxiv","version":2},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.atom-ph","submitted_at":"2010-03-05T17:08:07Z","cross_cats_sorted":["physics.chem-ph","physics.optics"],"title_canon_sha256":"65d37eb8083fae13fdbe37d3e20680db6b61e6f072a5295fdbb316e949ba1ac8","abstract_canon_sha256":"0abdcee538c1c2a5dafa720efd7da6e75265d9b063c0c85a40e0e25b565bae8f"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T02:08:45.572638Z","signature_b64":"K77/aT+6PHbDnaWzUyijseUyLvDu+y5dfBd63nzVE17FySIsLxYJELwGNbG0eHOW07L0/P59OHK5r7AiTNAUCA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"dfd82cbde7843b35943d00c995862cee5d2b634803df08ce8966d9eb11653fa9","last_reissued_at":"2026-05-18T02:08:45.571832Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T02:08:45.571832Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Analysis of Trace Impurities in Semiconductor Gas via Cavity-Enhanced Direct Frequency Comb Spectroscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.chem-ph","physics.optics"],"primary_cat":"physics.atom-ph","authors_text":"Florian Adler, Jun Feng, Jun Ye, Kevin C. Cossel, Kris A. Bertness, Mark W. Raynor, Michael J. Thorpe","submitted_at":"2010-03-05T17:08:07Z","abstract_excerpt":"Cavity-enhanced direct frequency comb spectroscopy (CE-DFCS) has demonstrated powerful potential for trace gas detection based on its unique combination of high bandwidth, rapid data acquisition, high sensitivity, and high resolution, which is unavailable with conventional systems. However, previous demonstrations have been limited to proof-of-principle experiments or studies of fundamental laboratory science. Here we present the development of CE-DFCS towards an industrial application -- measuring impurities in arsine, an important process gas used in III-V semiconductor compound manufacturin"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1003.1314","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1003.1314","created_at":"2026-05-18T02:08:45.571962+00:00"},{"alias_kind":"arxiv_version","alias_value":"1003.1314v2","created_at":"2026-05-18T02:08:45.571962+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1003.1314","created_at":"2026-05-18T02:08:45.571962+00:00"},{"alias_kind":"pith_short_12","alias_value":"37MCZPPHQQ5T","created_at":"2026-05-18T12:26:03.138858+00:00"},{"alias_kind":"pith_short_16","alias_value":"37MCZPPHQQ5TLFB5","created_at":"2026-05-18T12:26:03.138858+00:00"},{"alias_kind":"pith_short_8","alias_value":"37MCZPPH","created_at":"2026-05-18T12:26:03.138858+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z","json":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z.json","graph_json":"https://pith.science/api/pith-number/37MCZPPHQQ5TLFB5ADEZLBRM5Z/graph.json","events_json":"https://pith.science/api/pith-number/37MCZPPHQQ5TLFB5ADEZLBRM5Z/events.json","paper":"https://pith.science/paper/37MCZPPH"},"agent_actions":{"view_html":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z","download_json":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z.json","view_paper":"https://pith.science/paper/37MCZPPH","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1003.1314&json=true","fetch_graph":"https://pith.science/api/pith-number/37MCZPPHQQ5TLFB5ADEZLBRM5Z/graph.json","fetch_events":"https://pith.science/api/pith-number/37MCZPPHQQ5TLFB5ADEZLBRM5Z/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z/action/timestamp_anchor","attest_storage":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z/action/storage_attestation","attest_author":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z/action/author_attestation","sign_citation":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z/action/citation_signature","submit_replication":"https://pith.science/pith/37MCZPPHQQ5TLFB5ADEZLBRM5Z/action/replication_record"}},"created_at":"2026-05-18T02:08:45.571962+00:00","updated_at":"2026-05-18T02:08:45.571962+00:00"}