{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2026:3T26QRDCYG2L3OY7NYPTMXVT7F","short_pith_number":"pith:3T26QRDC","schema_version":"1.0","canonical_sha256":"dcf5e84462c1b4bdbb1f6e1f365eb3f9459e1e5213625cb78971577d7f6cd018","source":{"kind":"arxiv","id":"2605.18444","version":1},"attestation_state":"computed","paper":{"title":"Building Reliable Arithmetic Multipliers Under NBTI Aging and Process Variations","license":"http://creativecommons.org/licenses/by/4.0/","headline":"Selective 2s complement transformations on multiplier inputs redistribute NBTI stress to extend circuit lifetime.","cross_cats":["cs.AI"],"primary_cat":"cs.AR","authors_text":"Biresh Kumar Joardar, Masoud Heidary","submitted_at":"2026-05-18T14:12:01Z","abstract_excerpt":"Hardware aging poses a significant challenge for integrated circuits (ICs), leading to performance degradation and eventual failure. In this work, we focus on the aging of arithmetic multipliers, which are a cornerstone of modern computing systems including in CPUs, GPUs, and FPGAs, as well as AI accelerators like systolic arrays. In particular, AI workloads, which rely predominantly on multiplications, can accelerate Negative Bias Temperature Instability (NBTI) effects in multipliers. This paper presents a novel aging mitigation technique that leverages the signinvariance property of multipli"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":true,"formal_links_present":false},"canonical_record":{"source":{"id":"2605.18444","kind":"arxiv","version":1},"metadata":{"license":"http://creativecommons.org/licenses/by/4.0/","primary_cat":"cs.AR","submitted_at":"2026-05-18T14:12:01Z","cross_cats_sorted":["cs.AI"],"title_canon_sha256":"a23b37f95118f6035293a89c618bbc86b64159ccc69a171bae23b6c8558e1f9c","abstract_canon_sha256":"b838be125f96c60ef718c988cd93c0906eef0a150ee3e5155f5cc777668be84e"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-20T00:06:01.366670Z","signature_b64":"YcKmAS3R4G1YaMk+Wj0+jlJxt1OKVbzRTAYVcbVI8sT5iMvjoeFzHID7moXuD2QpJIr7woGJ61JbL504vuw9Cw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"dcf5e84462c1b4bdbb1f6e1f365eb3f9459e1e5213625cb78971577d7f6cd018","last_reissued_at":"2026-05-20T00:06:01.365877Z","signature_status":"signed_v1","first_computed_at":"2026-05-20T00:06:01.365877Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Building Reliable Arithmetic Multipliers Under NBTI Aging and Process Variations","license":"http://creativecommons.org/licenses/by/4.0/","headline":"Selective 2s complement transformations on multiplier inputs redistribute NBTI stress to extend circuit lifetime.","cross_cats":["cs.AI"],"primary_cat":"cs.AR","authors_text":"Biresh Kumar Joardar, Masoud Heidary","submitted_at":"2026-05-18T14:12:01Z","abstract_excerpt":"Hardware aging poses a significant challenge for integrated circuits (ICs), leading to performance degradation and eventual failure. In this work, we focus on the aging of arithmetic multipliers, which are a cornerstone of modern computing systems including in CPUs, GPUs, and FPGAs, as well as AI accelerators like systolic arrays. In particular, AI workloads, which rely predominantly on multiplications, can accelerate Negative Bias Temperature Instability (NBTI) effects in multipliers. This paper presents a novel aging mitigation technique that leverages the signinvariance property of multipli"},"claims":{"count":4,"items":[{"kind":"strongest_claim","text":"By selectively applying 2s complement transformations to inputs, the method redistributes stress across transistors, reducing the effects of NBTI aging, and when integrated into systolic arrays demonstrates better lifetime compared to natural aging baseline while introducing negligible area and delay overheads.","source":"verdict.strongest_claim","status":"machine_extracted","claim_id":"C1","attestation":"unclaimed"},{"kind":"weakest_assumption","text":"The sign-invariance property of multiplication permits selective 2s complement transformations on inputs that redistribute NBTI stress without changing the multiplication result or introducing functional errors.","source":"verdict.weakest_assumption","status":"machine_extracted","claim_id":"C2","attestation":"unclaimed"},{"kind":"one_line_summary","text":"A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.","source":"verdict.one_line_summary","status":"machine_extracted","claim_id":"C3","attestation":"unclaimed"},{"kind":"headline","text":"Selective 2s complement transformations on multiplier inputs redistribute NBTI stress to extend circuit lifetime.","source":"verdict.pith_extraction.headline","status":"machine_extracted","claim_id":"C4","attestation":"unclaimed"}],"snapshot_sha256":"cf36031cef67aadd44e068db61ea31289a5d18be36b5a7611208672acf7763f6"},"source":{"id":"2605.18444","kind":"arxiv","version":1},"verdict":{"id":"af5dc990-7747-4a8f-9570-579426a0683c","model_set":{"reader":"grok-4.3"},"created_at":"2026-05-19T23:30:22.651079Z","strongest_claim":"By selectively applying 2s complement transformations to inputs, the method redistributes stress across transistors, reducing the effects of NBTI aging, and when integrated into systolic arrays demonstrates better lifetime compared to natural aging baseline while introducing negligible area and delay overheads.","one_line_summary":"A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.","pipeline_version":"pith-pipeline@v0.9.0","weakest_assumption":"The sign-invariance property of multiplication permits selective 2s complement transformations on inputs that redistribute NBTI stress without changing the multiplication result or introducing functional errors.","pith_extraction_headline":"Selective 2s complement transformations on multiplier inputs redistribute NBTI stress to extend circuit lifetime."},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2605.18444/integrity.json","findings":[],"available":true,"detectors_run":[{"name":"doi_title_agreement","ran_at":"2026-05-20T00:01:20.193615Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"citation_quote_validity","ran_at":"2026-05-19T23:49:44.094696Z","status":"completed","version":"0.1.0","findings_count":0},{"name":"doi_compliance","ran_at":"2026-05-19T23:40:55.206057Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"ai_meta_artifact","ran_at":"2026-05-19T23:33:25.256985Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"external_links","ran_at":"2026-05-19T23:31:24.232073Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"claim_evidence","ran_at":"2026-05-19T23:21:58.618461Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"cited_work_retraction","ran_at":"2026-05-19T23:21:57.648214Z","status":"completed","version":"1.0.0","findings_count":0}],"snapshot_sha256":"cc66397355a855d0556b07c9261fed9f5c49716bdb80e9f089d7f69e78f7cffb"},"references":{"count":39,"sample":[{"doi":"","year":2018,"title":"Device aging: A reliability and security concern,","work_id":"fe7bd875-4819-4ed1-94a6-37a7fa5d3114","ref_index":1,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":2019,"title":"Modeling the Interdependences between Voltage Fluctuation and BTI Aging,","work_id":"87718352-896f-4e71-9eed-a86094d18b8b","ref_index":2,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":2014,"title":"System -level modeling of microprocessor reliability degradation due to BTI and HCI,","work_id":"b35cedfd-8f81-4a7e-86e2-dd653a291b37","ref_index":3,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":2023,"title":"Three -Dimensional Mechanistic Modeling of Time - Dependent Dielectric Breakdown in Polycrystalline Thin Films,","work_id":"84f0338e-38e3-4ae0-b0b7-637969fd03db","ref_index":4,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":2023,"title":"Understanding and Mitigating Hardware Failures in Deep Learning Training Accelerator Systems,","work_id":"fe5ca538-5ee6-4f15-ab2d-61f5888e7bd5","ref_index":5,"cited_arxiv_id":"","is_internal_anchor":false}],"resolved_work":39,"snapshot_sha256":"eed9f5f3060b3cd51f443ace769a9d72f87bff4c98465eeb1f7ea2751927408e","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2605.18444","created_at":"2026-05-20T00:06:01.366007+00:00"},{"alias_kind":"arxiv_version","alias_value":"2605.18444v1","created_at":"2026-05-20T00:06:01.366007+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2605.18444","created_at":"2026-05-20T00:06:01.366007+00:00"},{"alias_kind":"pith_short_12","alias_value":"3T26QRDCYG2L","created_at":"2026-05-20T00:06:01.366007+00:00"},{"alias_kind":"pith_short_16","alias_value":"3T26QRDCYG2L3OY7","created_at":"2026-05-20T00:06:01.366007+00:00"},{"alias_kind":"pith_short_8","alias_value":"3T26QRDC","created_at":"2026-05-20T00:06:01.366007+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F","json":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F.json","graph_json":"https://pith.science/api/pith-number/3T26QRDCYG2L3OY7NYPTMXVT7F/graph.json","events_json":"https://pith.science/api/pith-number/3T26QRDCYG2L3OY7NYPTMXVT7F/events.json","paper":"https://pith.science/paper/3T26QRDC"},"agent_actions":{"view_html":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F","download_json":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F.json","view_paper":"https://pith.science/paper/3T26QRDC","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2605.18444&json=true","fetch_graph":"https://pith.science/api/pith-number/3T26QRDCYG2L3OY7NYPTMXVT7F/graph.json","fetch_events":"https://pith.science/api/pith-number/3T26QRDCYG2L3OY7NYPTMXVT7F/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F/action/timestamp_anchor","attest_storage":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F/action/storage_attestation","attest_author":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F/action/author_attestation","sign_citation":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F/action/citation_signature","submit_replication":"https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F/action/replication_record"}},"created_at":"2026-05-20T00:06:01.366007+00:00","updated_at":"2026-05-20T00:06:01.366007+00:00"}