{"bundle_type":"pith_open_graph_bundle","bundle_version":"1.0","pith_number":"pith:2010:6H2WG2BITUPSMP3V63E64FMVS3","short_pith_number":"pith:6H2WG2BI","canonical_record":{"source":{"id":"1012.5743","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2010-12-28T12:06:16Z","cross_cats_sorted":[],"title_canon_sha256":"7aaf82c2aa821939ba9c221a9d3177c9b6e83459ab3bd01dfedeea3329d69b11","abstract_canon_sha256":"abf93b0ad45f3db5a62b52c5f4d15ae129c1413162a705ba52024c25462f6867"},"schema_version":"1.0"},"canonical_sha256":"f1f56368289d1f263f75f6c9ee159596e4ad67658261d1008e729b505969ead3","source":{"kind":"arxiv","id":"1012.5743","version":1},"source_aliases":[{"alias_kind":"arxiv","alias_value":"1012.5743","created_at":"2026-05-18T04:32:21Z"},{"alias_kind":"arxiv_version","alias_value":"1012.5743v1","created_at":"2026-05-18T04:32:21Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1012.5743","created_at":"2026-05-18T04:32:21Z"},{"alias_kind":"pith_short_12","alias_value":"6H2WG2BITUPS","created_at":"2026-05-18T12:26:04Z"},{"alias_kind":"pith_short_16","alias_value":"6H2WG2BITUPSMP3V","created_at":"2026-05-18T12:26:04Z"},{"alias_kind":"pith_short_8","alias_value":"6H2WG2BI","created_at":"2026-05-18T12:26:04Z"}],"events":[{"event_type":"record_created","subject_pith_number":"pith:2010:6H2WG2BITUPSMP3V63E64FMVS3","target":"record","payload":{"canonical_record":{"source":{"id":"1012.5743","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2010-12-28T12:06:16Z","cross_cats_sorted":[],"title_canon_sha256":"7aaf82c2aa821939ba9c221a9d3177c9b6e83459ab3bd01dfedeea3329d69b11","abstract_canon_sha256":"abf93b0ad45f3db5a62b52c5f4d15ae129c1413162a705ba52024c25462f6867"},"schema_version":"1.0"},"canonical_sha256":"f1f56368289d1f263f75f6c9ee159596e4ad67658261d1008e729b505969ead3","receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T04:32:21.662152Z","signature_b64":"VJj4tlGFfVtAhA3iEztaYY/7t/LCGEXba9Lw1qgC7UIPJ04bn/VUEVbMdqTFzbBWym3+5TVEyYCPCkt4YSb7Dw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"f1f56368289d1f263f75f6c9ee159596e4ad67658261d1008e729b505969ead3","last_reissued_at":"2026-05-18T04:32:21.661427Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T04:32:21.661427Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"source_kind":"arxiv","source_id":"1012.5743","source_version":1,"attestation_state":"computed"},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-18T04:32:21Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"qf8frN8ZV1Yx2zuFqiEZZIifTU1rTCZN2Vd5xRoYuHCQcL5bkOueMxbwfbt4a7ymasQvWodJpvxW9++t2rsjAQ==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-05-26T20:19:48.031633Z"},"content_sha256":"2b81b2a8e5ae018837f74af8c8b3330d360a591c9f51e24df66a8a64075dee03","schema_version":"1.0","event_id":"sha256:2b81b2a8e5ae018837f74af8c8b3330d360a591c9f51e24df66a8a64075dee03"},{"event_type":"graph_snapshot","subject_pith_number":"pith:2010:6H2WG2BITUPSMP3V63E64FMVS3","target":"graph","payload":{"graph_snapshot":{"paper":{"title":"Transmission Electron Microscopy Studies on RF Sputtered Copper Ferrite Thin Films","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"I. Samajdar, N. Venkataramani, P. D. Kulkarni, R. Krishnan, S. Prasad","submitted_at":"2010-12-28T12:06:16Z","abstract_excerpt":"Copper ferrite thin films were rf sputtered at a power of 50W. The as deposited films were annealed in air at 800{\\deg}C and slow cooled. The transmission electron microscope (TEM) studies were carried out on as deposited as well as on slow cooled film. Significantly larger defect concentration, including stacking faults, was observed in 50W as deposited films than the films deposited at a higher rf power of 200W. The film annealed at 800{\\deg}C and then slow cooled showed an unusual grain growth upto 180nm for a film thickness of ~240nm. These grains showed Kikuchi pattern."},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1012.5743","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"verdict_id":null},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-18T04:32:21Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"uhoobjUlflbETYlFDBguJ4K/cSDCr+Z/GXUuxKQMy1NHF0TFf7+agRkhxXMnl93l5lU1ELjP5vt645mVB3/BDQ==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-05-26T20:19:48.032275Z"},"content_sha256":"e86003a04af6feac7f9ad3605881b80602796ace0c9785bfb5918840cb3c5424","schema_version":"1.0","event_id":"sha256:e86003a04af6feac7f9ad3605881b80602796ace0c9785bfb5918840cb3c5424"}],"timestamp_proofs":[],"mirror_hints":[{"mirror_type":"https","name":"Pith Resolver","base_url":"https://pith.science","bundle_url":"https://pith.science/pith/6H2WG2BITUPSMP3V63E64FMVS3/bundle.json","state_url":"https://pith.science/pith/6H2WG2BITUPSMP3V63E64FMVS3/state.json","well_known_bundle_url":"https://pith.science/.well-known/pith/6H2WG2BITUPSMP3V63E64FMVS3/bundle.json","status":"primary"}],"public_keys":[{"key_id":"pith-v1-2026-05","algorithm":"ed25519","format":"raw","public_key_b64":"stVStoiQhXFxp4s2pdzPNoqVNBMojDU/fJ2db5S3CbM=","public_key_hex":"b2d552b68890857171a78b36a5dccf368a953413288c353f7c9d9d6f94b709b3","fingerprint_sha256_b32_first128bits":"RVFV5Z2OI2J3ZUO7ERDEBCYNKS","fingerprint_sha256_hex":"8d4b5ee74e4693bcd1df2446408b0d54","rotates_at":null,"url":"https://pith.science/pith-signing-key.json","notes":"Pith uses this Ed25519 key to sign canonical record SHA-256 digests. Verify with: ed25519_verify(public_key, message=canonical_sha256_bytes, signature=base64decode(signature_b64))."}],"merge_version":"pith-open-graph-merge-v1","built_at":"2026-05-26T20:19:48Z","links":{"resolver":"https://pith.science/pith/6H2WG2BITUPSMP3V63E64FMVS3","bundle":"https://pith.science/pith/6H2WG2BITUPSMP3V63E64FMVS3/bundle.json","state":"https://pith.science/pith/6H2WG2BITUPSMP3V63E64FMVS3/state.json","well_known_bundle":"https://pith.science/.well-known/pith/6H2WG2BITUPSMP3V63E64FMVS3/bundle.json"},"state":{"state_type":"pith_open_graph_state","state_version":"1.0","pith_number":"pith:2010:6H2WG2BITUPSMP3V63E64FMVS3","merge_version":"pith-open-graph-merge-v1","event_count":2,"valid_event_count":2,"invalid_event_count":0,"equivocation_count":0,"current":{"canonical_record":{"metadata":{"abstract_canon_sha256":"abf93b0ad45f3db5a62b52c5f4d15ae129c1413162a705ba52024c25462f6867","cross_cats_sorted":[],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2010-12-28T12:06:16Z","title_canon_sha256":"7aaf82c2aa821939ba9c221a9d3177c9b6e83459ab3bd01dfedeea3329d69b11"},"schema_version":"1.0","source":{"id":"1012.5743","kind":"arxiv","version":1}},"source_aliases":[{"alias_kind":"arxiv","alias_value":"1012.5743","created_at":"2026-05-18T04:32:21Z"},{"alias_kind":"arxiv_version","alias_value":"1012.5743v1","created_at":"2026-05-18T04:32:21Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1012.5743","created_at":"2026-05-18T04:32:21Z"},{"alias_kind":"pith_short_12","alias_value":"6H2WG2BITUPS","created_at":"2026-05-18T12:26:04Z"},{"alias_kind":"pith_short_16","alias_value":"6H2WG2BITUPSMP3V","created_at":"2026-05-18T12:26:04Z"},{"alias_kind":"pith_short_8","alias_value":"6H2WG2BI","created_at":"2026-05-18T12:26:04Z"}],"graph_snapshots":[{"event_id":"sha256:e86003a04af6feac7f9ad3605881b80602796ace0c9785bfb5918840cb3c5424","target":"graph","created_at":"2026-05-18T04:32:21Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"graph_snapshot":{"author_claims":{"count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","strong_count":0},"builder_version":"pith-number-builder-2026-05-17-v1","claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"paper":{"abstract_excerpt":"Copper ferrite thin films were rf sputtered at a power of 50W. The as deposited films were annealed in air at 800{\\deg}C and slow cooled. The transmission electron microscope (TEM) studies were carried out on as deposited as well as on slow cooled film. Significantly larger defect concentration, including stacking faults, was observed in 50W as deposited films than the films deposited at a higher rf power of 200W. The film annealed at 800{\\deg}C and then slow cooled showed an unusual grain growth upto 180nm for a film thickness of ~240nm. These grains showed Kikuchi pattern.","authors_text":"I. Samajdar, N. Venkataramani, P. D. Kulkarni, R. Krishnan, S. Prasad","cross_cats":[],"headline":"","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2010-12-28T12:06:16Z","title":"Transmission Electron Microscopy Studies on RF Sputtered Copper Ferrite Thin Films"},"references":{"count":0,"internal_anchors":0,"resolved_work":0,"sample":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1012.5743","kind":"arxiv","version":1},"verdict":{"created_at":null,"id":null,"model_set":{},"one_line_summary":"","pipeline_version":null,"pith_extraction_headline":"","strongest_claim":"","weakest_assumption":""}},"verdict_id":null}}],"author_attestations":[],"timestamp_anchors":[],"storage_attestations":[],"citation_signatures":[],"replication_records":[],"corrections":[],"mirror_hints":[],"record_created":{"event_id":"sha256:2b81b2a8e5ae018837f74af8c8b3330d360a591c9f51e24df66a8a64075dee03","target":"record","created_at":"2026-05-18T04:32:21Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"attestation_state":"computed","canonical_record":{"metadata":{"abstract_canon_sha256":"abf93b0ad45f3db5a62b52c5f4d15ae129c1413162a705ba52024c25462f6867","cross_cats_sorted":[],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2010-12-28T12:06:16Z","title_canon_sha256":"7aaf82c2aa821939ba9c221a9d3177c9b6e83459ab3bd01dfedeea3329d69b11"},"schema_version":"1.0","source":{"id":"1012.5743","kind":"arxiv","version":1}},"canonical_sha256":"f1f56368289d1f263f75f6c9ee159596e4ad67658261d1008e729b505969ead3","receipt":{"algorithm":"ed25519","builder_version":"pith-number-builder-2026-05-17-v1","canonical_sha256":"f1f56368289d1f263f75f6c9ee159596e4ad67658261d1008e729b505969ead3","first_computed_at":"2026-05-18T04:32:21.661427Z","key_id":"pith-v1-2026-05","kind":"pith_receipt","last_reissued_at":"2026-05-18T04:32:21.661427Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","receipt_version":"0.3","signature_b64":"VJj4tlGFfVtAhA3iEztaYY/7t/LCGEXba9Lw1qgC7UIPJ04bn/VUEVbMdqTFzbBWym3+5TVEyYCPCkt4YSb7Dw==","signature_status":"signed_v1","signed_at":"2026-05-18T04:32:21.662152Z","signed_message":"canonical_sha256_bytes"},"source_id":"1012.5743","source_kind":"arxiv","source_version":1}}},"equivocations":[],"invalid_events":[],"applied_event_ids":["sha256:2b81b2a8e5ae018837f74af8c8b3330d360a591c9f51e24df66a8a64075dee03","sha256:e86003a04af6feac7f9ad3605881b80602796ace0c9785bfb5918840cb3c5424"],"state_sha256":"fe908b4b4dcc695d4d033f58576cb0c6dad691a2d8ad4bc5215fa923f851e8a2"},"bundle_signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"w9R+6dFlTQMSywO7nHLSSZZ3oaciZ7ra+6ETb59UmQZWaYNTEqy8dhV0W6Un1nq8IO1TkNv1SBN7vNCega1BCw==","signed_message":"bundle_sha256_bytes","signed_at":"2026-05-26T20:19:48.035418Z","bundle_sha256":"37936d2f35a8ac9f6d8d607eba36306d28132f3cacb1ed758c429b36ea8a4369"}}