{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2017:73DD73N3KUMIHYLPWU7KTSHARC","short_pith_number":"pith:73DD73N3","schema_version":"1.0","canonical_sha256":"fec63fedbb551883e16fb53ea9c8e088ad560dcafdf0de24a24c6c89cd28ee5c","source":{"kind":"arxiv","id":"1707.07671","version":1},"attestation_state":"computed","paper":{"title":"E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.LO","authors_text":"Clark Barrett, Eshan Singh, Subhasish Mitra","submitted_at":"2017-07-23T20:56:29Z","abstract_excerpt":"During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1707.07671","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cs.LO","submitted_at":"2017-07-23T20:56:29Z","cross_cats_sorted":[],"title_canon_sha256":"a2347e115c28ff9b99afcb51b44dc61c525b1764e3f7abd1d2687ac93c93af2c","abstract_canon_sha256":"d112290e1b9644a91bc1085cbbd546b312a2e23dbca854852dca08f86a2f7e75"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T00:39:30.720687Z","signature_b64":"MGm+eg7blaO4yEk5PymIxa3JoJdeoDfiTDMZKZLu+73evBpTSsffwr7upEquKmPbDBZZLwXqyhD+15I7iTQqAA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"fec63fedbb551883e16fb53ea9c8e088ad560dcafdf0de24a24c6c89cd28ee5c","last_reissued_at":"2026-05-18T00:39:30.720029Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T00:39:30.720029Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.LO","authors_text":"Clark Barrett, Eshan Singh, Subhasish Mitra","submitted_at":"2017-07-23T20:56:29Z","abstract_excerpt":"During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1707.07671","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1707.07671","created_at":"2026-05-18T00:39:30.720110+00:00"},{"alias_kind":"arxiv_version","alias_value":"1707.07671v1","created_at":"2026-05-18T00:39:30.720110+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1707.07671","created_at":"2026-05-18T00:39:30.720110+00:00"},{"alias_kind":"pith_short_12","alias_value":"73DD73N3KUMI","created_at":"2026-05-18T12:31:03.183658+00:00"},{"alias_kind":"pith_short_16","alias_value":"73DD73N3KUMIHYLP","created_at":"2026-05-18T12:31:03.183658+00:00"},{"alias_kind":"pith_short_8","alias_value":"73DD73N3","created_at":"2026-05-18T12:31:03.183658+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC","json":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC.json","graph_json":"https://pith.science/api/pith-number/73DD73N3KUMIHYLPWU7KTSHARC/graph.json","events_json":"https://pith.science/api/pith-number/73DD73N3KUMIHYLPWU7KTSHARC/events.json","paper":"https://pith.science/paper/73DD73N3"},"agent_actions":{"view_html":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC","download_json":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC.json","view_paper":"https://pith.science/paper/73DD73N3","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1707.07671&json=true","fetch_graph":"https://pith.science/api/pith-number/73DD73N3KUMIHYLPWU7KTSHARC/graph.json","fetch_events":"https://pith.science/api/pith-number/73DD73N3KUMIHYLPWU7KTSHARC/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC/action/timestamp_anchor","attest_storage":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC/action/storage_attestation","attest_author":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC/action/author_attestation","sign_citation":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC/action/citation_signature","submit_replication":"https://pith.science/pith/73DD73N3KUMIHYLPWU7KTSHARC/action/replication_record"}},"created_at":"2026-05-18T00:39:30.720110+00:00","updated_at":"2026-05-18T00:39:30.720110+00:00"}