{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2013:7G5AO2YIIQQW3ZVV32ZN4LFFKB","short_pith_number":"pith:7G5AO2YI","schema_version":"1.0","canonical_sha256":"f9ba076b0844216de6b5deb2de2ca550546e7bb70f74404e6a322172dc5a3efc","source":{"kind":"arxiv","id":"1302.6077","version":1},"attestation_state":"computed","paper":{"title":"Study of the accumulation layer and charge losses at the Si-SiO2 interface in p+n-silicon strip sensors","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.ins-det","authors_text":"Eckhart Fretwurst, Jiaguo Zhang, J\\\"orn Schwandt, Julian Becker, Robert Klanner, Thomas Poehlsen","submitted_at":"2013-02-25T12:38:39Z","abstract_excerpt":"Using the multi-channel Transient Current Technique the currents induced by electron-hole pairs, produced by a focussed sub-nanosecond laser of 660 nm wavelength close to the Si-SiO2 interface of p+n silicon strip sensors have been measured, and the charge-collection efficiency determined.\n  The laser has been operated in burst mode, with bursts typically spaced by 1 ms, each consisting of 30 pulses separated by 50 ns.\n  In a previous paper it has been reported that, depending on X-ray-radiation damage, biasing history and humidity, situations without charge losses, with hole losses, and with "},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1302.6077","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.ins-det","submitted_at":"2013-02-25T12:38:39Z","cross_cats_sorted":[],"title_canon_sha256":"9aeee43391a8e411963b682a359f035839a002a6fedb22b709512a971883701e","abstract_canon_sha256":"1ef8ec9be93147aa6d8fe5ffd3cfe27dc6ae0d765bceb2148f25efcf2dbaf626"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:51:28.949338Z","signature_b64":"LTNJMhk3n/zhMDAa+UD8hQF661OBp7RBYts2cnRJBr/fQlZKt0WccSNczzNdXI0emxCNIpt7zpWB4rNC8h08Bg==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"f9ba076b0844216de6b5deb2de2ca550546e7bb70f74404e6a322172dc5a3efc","last_reissued_at":"2026-05-18T01:51:28.948873Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:51:28.948873Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Study of the accumulation layer and charge losses at the Si-SiO2 interface in p+n-silicon strip sensors","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.ins-det","authors_text":"Eckhart Fretwurst, Jiaguo Zhang, J\\\"orn Schwandt, Julian Becker, Robert Klanner, Thomas Poehlsen","submitted_at":"2013-02-25T12:38:39Z","abstract_excerpt":"Using the multi-channel Transient Current Technique the currents induced by electron-hole pairs, produced by a focussed sub-nanosecond laser of 660 nm wavelength close to the Si-SiO2 interface of p+n silicon strip sensors have been measured, and the charge-collection efficiency determined.\n  The laser has been operated in burst mode, with bursts typically spaced by 1 ms, each consisting of 30 pulses separated by 50 ns.\n  In a previous paper it has been reported that, depending on X-ray-radiation damage, biasing history and humidity, situations without charge losses, with hole losses, and with "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1302.6077","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1302.6077","created_at":"2026-05-18T01:51:28.948942+00:00"},{"alias_kind":"arxiv_version","alias_value":"1302.6077v1","created_at":"2026-05-18T01:51:28.948942+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1302.6077","created_at":"2026-05-18T01:51:28.948942+00:00"},{"alias_kind":"pith_short_12","alias_value":"7G5AO2YIIQQW","created_at":"2026-05-18T12:27:36.564083+00:00"},{"alias_kind":"pith_short_16","alias_value":"7G5AO2YIIQQW3ZVV","created_at":"2026-05-18T12:27:36.564083+00:00"},{"alias_kind":"pith_short_8","alias_value":"7G5AO2YI","created_at":"2026-05-18T12:27:36.564083+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB","json":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB.json","graph_json":"https://pith.science/api/pith-number/7G5AO2YIIQQW3ZVV32ZN4LFFKB/graph.json","events_json":"https://pith.science/api/pith-number/7G5AO2YIIQQW3ZVV32ZN4LFFKB/events.json","paper":"https://pith.science/paper/7G5AO2YI"},"agent_actions":{"view_html":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB","download_json":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB.json","view_paper":"https://pith.science/paper/7G5AO2YI","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1302.6077&json=true","fetch_graph":"https://pith.science/api/pith-number/7G5AO2YIIQQW3ZVV32ZN4LFFKB/graph.json","fetch_events":"https://pith.science/api/pith-number/7G5AO2YIIQQW3ZVV32ZN4LFFKB/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB/action/timestamp_anchor","attest_storage":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB/action/storage_attestation","attest_author":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB/action/author_attestation","sign_citation":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB/action/citation_signature","submit_replication":"https://pith.science/pith/7G5AO2YIIQQW3ZVV32ZN4LFFKB/action/replication_record"}},"created_at":"2026-05-18T01:51:28.948942+00:00","updated_at":"2026-05-18T01:51:28.948942+00:00"}