{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2006:BUY2QZOR2B76JFEJT33IFXGK45","short_pith_number":"pith:BUY2QZOR","schema_version":"1.0","canonical_sha256":"0d31a865d1d07fe494899ef682dccae74b93469a53d2892c24cda977ea19f2d5","source":{"kind":"arxiv","id":"cond-mat/0602515","version":1},"attestation_state":"computed","paper":{"title":"An Improved Description of the Dielectric Breakdown in Oxides Based on a Generalized Weibull distribution","license":"","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"E. A. de Vasconcelos, E. F. da Silva, jr, Jr., L. C. Malacarne, R. S. Mendes, S. Picoli, U. M. S. Costa, V. N. Freire","submitted_at":"2006-02-22T12:20:04Z","abstract_excerpt":"In this work, we address modal parameter fluctuations in statistical distributions describing charge-to-breakdown $(Q_{BD})$ and/or time-to-breakdown $(t_{BD})$ during the dielectric breakdown regime of ultra-thin oxides, which are of high interest for the advancement of electronic technology. We reobtain a generalized Weibull distribution ($q$-Weibull), which properly describes $(t_{BD})$ data when oxide thickness fluctuations are present, in order to improve reliability assessment of ultra-thin oxides by time-to-breakdown $(t_{BD})$ extrapolation and area scaling. The incorporation of fluctu"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"cond-mat/0602515","kind":"arxiv","version":1},"metadata":{"license":"","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2006-02-22T12:20:04Z","cross_cats_sorted":[],"title_canon_sha256":"9c057adfaf31baaf88028f1c3536141585d222c9ad67cac4a8f36e836ad9e8be","abstract_canon_sha256":"c20c333e2637d51c38d5037258d2f725bf0ba16975ae43fdbf25e80262f22743"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T03:47:41.993262Z","signature_b64":"vpeg5d3MQddlR4CLoxiU5INn4CPD3tAnPvBpY8bKuxBD9c6yjltTK0VsR6mQrGMIKGRsLXGKFq9omfIf2rmPCA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"0d31a865d1d07fe494899ef682dccae74b93469a53d2892c24cda977ea19f2d5","last_reissued_at":"2026-05-18T03:47:41.992585Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T03:47:41.992585Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"An Improved Description of the Dielectric Breakdown in Oxides Based on a Generalized Weibull distribution","license":"","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"E. A. de Vasconcelos, E. F. da Silva, jr, Jr., L. C. Malacarne, R. S. Mendes, S. Picoli, U. M. S. Costa, V. N. Freire","submitted_at":"2006-02-22T12:20:04Z","abstract_excerpt":"In this work, we address modal parameter fluctuations in statistical distributions describing charge-to-breakdown $(Q_{BD})$ and/or time-to-breakdown $(t_{BD})$ during the dielectric breakdown regime of ultra-thin oxides, which are of high interest for the advancement of electronic technology. We reobtain a generalized Weibull distribution ($q$-Weibull), which properly describes $(t_{BD})$ data when oxide thickness fluctuations are present, in order to improve reliability assessment of ultra-thin oxides by time-to-breakdown $(t_{BD})$ extrapolation and area scaling. The incorporation of fluctu"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"cond-mat/0602515","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"cond-mat/0602515","created_at":"2026-05-18T03:47:41.992700+00:00"},{"alias_kind":"arxiv_version","alias_value":"cond-mat/0602515v1","created_at":"2026-05-18T03:47:41.992700+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.cond-mat/0602515","created_at":"2026-05-18T03:47:41.992700+00:00"},{"alias_kind":"pith_short_12","alias_value":"BUY2QZOR2B76","created_at":"2026-05-18T12:25:53.939244+00:00"},{"alias_kind":"pith_short_16","alias_value":"BUY2QZOR2B76JFEJ","created_at":"2026-05-18T12:25:53.939244+00:00"},{"alias_kind":"pith_short_8","alias_value":"BUY2QZOR","created_at":"2026-05-18T12:25:53.939244+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45","json":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45.json","graph_json":"https://pith.science/api/pith-number/BUY2QZOR2B76JFEJT33IFXGK45/graph.json","events_json":"https://pith.science/api/pith-number/BUY2QZOR2B76JFEJT33IFXGK45/events.json","paper":"https://pith.science/paper/BUY2QZOR"},"agent_actions":{"view_html":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45","download_json":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45.json","view_paper":"https://pith.science/paper/BUY2QZOR","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=cond-mat/0602515&json=true","fetch_graph":"https://pith.science/api/pith-number/BUY2QZOR2B76JFEJT33IFXGK45/graph.json","fetch_events":"https://pith.science/api/pith-number/BUY2QZOR2B76JFEJT33IFXGK45/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45/action/timestamp_anchor","attest_storage":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45/action/storage_attestation","attest_author":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45/action/author_attestation","sign_citation":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45/action/citation_signature","submit_replication":"https://pith.science/pith/BUY2QZOR2B76JFEJT33IFXGK45/action/replication_record"}},"created_at":"2026-05-18T03:47:41.992700+00:00","updated_at":"2026-05-18T03:47:41.992700+00:00"}