{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2015:CU7OI25LQJ4SKBRXAHTSAVRBIJ","short_pith_number":"pith:CU7OI25L","schema_version":"1.0","canonical_sha256":"153ee46bab827925063701e7205621427d6bcdc3605f53a2e267b4a6458b7e64","source":{"kind":"arxiv","id":"1504.03064","version":1},"attestation_state":"computed","paper":{"title":"Characterizing the effects of free carriers in fully-etched, dielectric-clad silicon waveguides","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.optics","authors_text":"Felipe Vallini, Hung-Hsi Lin, Matthew W. Puckett, Rajat Sharma, Yeshaiahu Fainman","submitted_at":"2015-04-13T04:57:59Z","abstract_excerpt":"We theoretically characterize the free-carrier plasma dispersion effect in fully-etched silicon waveguides, with various dielectric material claddings, due to fixed and interface charges at the silicon-dielectric interfaces. The values used for these charges are obtained from the measured capacitance-voltage (C-V) characteristics of SiO2, SiNx, and Al2O3 thin films deposited on silicon substrates. The effect of the charges on the properties of silicon waveguides is then calculated using the semiconductor physics tool Silvaco in combination with the finite-difference time-domain (FDTD) method s"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1504.03064","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.optics","submitted_at":"2015-04-13T04:57:59Z","cross_cats_sorted":[],"title_canon_sha256":"f8fd7b7f7d92fb9f835892359f094bfc85e4f656c15c718d3744e1a37b31fa21","abstract_canon_sha256":"98414fb7e12bb505300e4d99d9c7aab7786ded92d4508862374d15b22a8d4761"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:37:44.327239Z","signature_b64":"7vveZmrRrP04qqUshJTZizrIJNEYwiYhoV3+BY3vQJIvtHZ4K2Zf4dQSEVXNHWyx3SWWAA3jmRmYAfue4lvBDA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"153ee46bab827925063701e7205621427d6bcdc3605f53a2e267b4a6458b7e64","last_reissued_at":"2026-05-18T01:37:44.326623Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:37:44.326623Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Characterizing the effects of free carriers in fully-etched, dielectric-clad silicon waveguides","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.optics","authors_text":"Felipe Vallini, Hung-Hsi Lin, Matthew W. Puckett, Rajat Sharma, Yeshaiahu Fainman","submitted_at":"2015-04-13T04:57:59Z","abstract_excerpt":"We theoretically characterize the free-carrier plasma dispersion effect in fully-etched silicon waveguides, with various dielectric material claddings, due to fixed and interface charges at the silicon-dielectric interfaces. The values used for these charges are obtained from the measured capacitance-voltage (C-V) characteristics of SiO2, SiNx, and Al2O3 thin films deposited on silicon substrates. The effect of the charges on the properties of silicon waveguides is then calculated using the semiconductor physics tool Silvaco in combination with the finite-difference time-domain (FDTD) method s"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1504.03064","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1504.03064","created_at":"2026-05-18T01:37:44.326729+00:00"},{"alias_kind":"arxiv_version","alias_value":"1504.03064v1","created_at":"2026-05-18T01:37:44.326729+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1504.03064","created_at":"2026-05-18T01:37:44.326729+00:00"},{"alias_kind":"pith_short_12","alias_value":"CU7OI25LQJ4S","created_at":"2026-05-18T12:29:17.054201+00:00"},{"alias_kind":"pith_short_16","alias_value":"CU7OI25LQJ4SKBRX","created_at":"2026-05-18T12:29:17.054201+00:00"},{"alias_kind":"pith_short_8","alias_value":"CU7OI25L","created_at":"2026-05-18T12:29:17.054201+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ","json":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ.json","graph_json":"https://pith.science/api/pith-number/CU7OI25LQJ4SKBRXAHTSAVRBIJ/graph.json","events_json":"https://pith.science/api/pith-number/CU7OI25LQJ4SKBRXAHTSAVRBIJ/events.json","paper":"https://pith.science/paper/CU7OI25L"},"agent_actions":{"view_html":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ","download_json":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ.json","view_paper":"https://pith.science/paper/CU7OI25L","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1504.03064&json=true","fetch_graph":"https://pith.science/api/pith-number/CU7OI25LQJ4SKBRXAHTSAVRBIJ/graph.json","fetch_events":"https://pith.science/api/pith-number/CU7OI25LQJ4SKBRXAHTSAVRBIJ/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ/action/timestamp_anchor","attest_storage":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ/action/storage_attestation","attest_author":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ/action/author_attestation","sign_citation":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ/action/citation_signature","submit_replication":"https://pith.science/pith/CU7OI25LQJ4SKBRXAHTSAVRBIJ/action/replication_record"}},"created_at":"2026-05-18T01:37:44.326729+00:00","updated_at":"2026-05-18T01:37:44.326729+00:00"}