{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2015:DCDAY7OW5QT45BI2NL7QGIHKBL","short_pith_number":"pith:DCDAY7OW","schema_version":"1.0","canonical_sha256":"18860c7dd6ec27ce851a6aff0320ea0ad5fa026ae8bb4437a6ef4c22f905c6fd","source":{"kind":"arxiv","id":"1501.05966","version":4},"attestation_state":"computed","paper":{"title":"Radiation Tolerance of 65nm CMOS Transistors","license":"http://creativecommons.org/licenses/by/4.0/","headline":"","cross_cats":["hep-ex"],"primary_cat":"physics.ins-det","authors_text":"A. Shenai, B. Bentele, D. C. Christian, F. Fahim, G. Deptuch, J. Hoff, J. P. Cumalat, M. Krohn, S. R. Wagner","submitted_at":"2015-01-23T21:39:19Z","abstract_excerpt":"We report on the effects of ionizing radiation on 65nm CMOS transistors held at approximately -20C during irradiation. The pattern of damage observed after a total dose of 1 Grad is similar to damage reported in room temperature exposures, but we observe less damage than was observed at room temperature."},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1501.05966","kind":"arxiv","version":4},"metadata":{"license":"http://creativecommons.org/licenses/by/4.0/","primary_cat":"physics.ins-det","submitted_at":"2015-01-23T21:39:19Z","cross_cats_sorted":["hep-ex"],"title_canon_sha256":"9f1318fbfef2a530abc0c256f1739fc490369395d826fe5251738e7c0ad89297","abstract_canon_sha256":"8f9c92900bbabc6832ca311459e36146a9c2d4da95420e8f6d94dde6b153737e"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:22:21.487366Z","signature_b64":"jLrBt1X0cNMNbmMIGgW9wvTLYkk2PZTmK9/rFqGVsTT+uBz7Wn91IIkrFXS5+rzpCjbznwCV8bk8cPYPnFIEDw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"18860c7dd6ec27ce851a6aff0320ea0ad5fa026ae8bb4437a6ef4c22f905c6fd","last_reissued_at":"2026-05-18T01:22:21.486595Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:22:21.486595Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Radiation Tolerance of 65nm CMOS Transistors","license":"http://creativecommons.org/licenses/by/4.0/","headline":"","cross_cats":["hep-ex"],"primary_cat":"physics.ins-det","authors_text":"A. Shenai, B. Bentele, D. C. Christian, F. Fahim, G. Deptuch, J. Hoff, J. P. Cumalat, M. Krohn, S. R. Wagner","submitted_at":"2015-01-23T21:39:19Z","abstract_excerpt":"We report on the effects of ionizing radiation on 65nm CMOS transistors held at approximately -20C during irradiation. The pattern of damage observed after a total dose of 1 Grad is similar to damage reported in room temperature exposures, but we observe less damage than was observed at room temperature."},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1501.05966","kind":"arxiv","version":4},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1501.05966","created_at":"2026-05-18T01:22:21.486715+00:00"},{"alias_kind":"arxiv_version","alias_value":"1501.05966v4","created_at":"2026-05-18T01:22:21.486715+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1501.05966","created_at":"2026-05-18T01:22:21.486715+00:00"},{"alias_kind":"pith_short_12","alias_value":"DCDAY7OW5QT4","created_at":"2026-05-18T12:29:17.054201+00:00"},{"alias_kind":"pith_short_16","alias_value":"DCDAY7OW5QT45BI2","created_at":"2026-05-18T12:29:17.054201+00:00"},{"alias_kind":"pith_short_8","alias_value":"DCDAY7OW","created_at":"2026-05-18T12:29:17.054201+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL","json":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL.json","graph_json":"https://pith.science/api/pith-number/DCDAY7OW5QT45BI2NL7QGIHKBL/graph.json","events_json":"https://pith.science/api/pith-number/DCDAY7OW5QT45BI2NL7QGIHKBL/events.json","paper":"https://pith.science/paper/DCDAY7OW"},"agent_actions":{"view_html":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL","download_json":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL.json","view_paper":"https://pith.science/paper/DCDAY7OW","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1501.05966&json=true","fetch_graph":"https://pith.science/api/pith-number/DCDAY7OW5QT45BI2NL7QGIHKBL/graph.json","fetch_events":"https://pith.science/api/pith-number/DCDAY7OW5QT45BI2NL7QGIHKBL/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL/action/timestamp_anchor","attest_storage":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL/action/storage_attestation","attest_author":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL/action/author_attestation","sign_citation":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL/action/citation_signature","submit_replication":"https://pith.science/pith/DCDAY7OW5QT45BI2NL7QGIHKBL/action/replication_record"}},"created_at":"2026-05-18T01:22:21.486715+00:00","updated_at":"2026-05-18T01:22:21.486715+00:00"}